平板状構造を有するエレクトロニクス実装基板のマイクロ接合部における

2007A1904
BL20XU
ᐔ᧼⁁᭴ㅧࠍ᦭ߔࠆࠛ࡟ࠢ࠻ࡠ࠾ࠢࠬታⵝၮ᧼ߩ
ࡑࠗࠢࡠធวㇱߦ߅ߌࠆ X ✢ਇቢో CT ߦࠃࠆ↹⾰ะ਄ߩ⎇ⓥ
Quality improvement on X-ray micro-CT images obtained by incomplete
projection data of microjoints on electronic packaging with planer structure
ጟᧄ૫ਯ*1㧘㜞ᩉ Პ*1㧘㊒⼱ᶈਯ*2㧘૒ጊ೑ᒾ*2㧘਄᧖ஜᄥᦶ*3㧘᫪ቁ↵*4
Yoshiyuki Okamoto*1, Takeshi Takayanagi*1, Hiroyuki Tsuritani*2, Toshihiko Sayama*2,
Kentaro Uesugi*3, Takao Mori*4
*1
ࠦ࡯࠮࡞ᩣᑼળ␠, *2 ንጊ⋵Ꮏᬺᛛⴚ࠮ࡦ࠲࡯, *3 㜞ノᐲశ⑼ቇ⎇ⓥ࠮ࡦ࠲࡯, *4 ንጊ⋵┙ᄢቇ
*1
Cosel Co., Ltd., *2Toyama Industrial Technology Center, *3SPring-8/JASRI,
*4
Toyama Prefectural University
1. ߪߓ߼ߦ
ࠆታⵝၮ᧼ߦ߅ߌࠆࡑࠗࠢࡠធวㇱߩቢోߥ㕖
㔚ሶၮ᧼ߩࡑࠗࠢࡠធวㇱߦ߅޿ߡߪ‫∋ޔ‬ഭ
⎕უᬌᩏߢ޽ࠆ‫ޕ‬
៊்߇‫ޔ‬㔚ሶၮ᧼ߩା㗬ᕈߦᄢ߈ߥᓇ㗀ࠍਈ߃
ߘߎߢ‫⎇ᧄޔ‬ⓥߢߪ‫ޔ‬㔚ሶၮ᧼ߩᒻ⁁⊛ߥ․
ࠆ࿃ሶߢ޽ࠆ‫ޔߡߞ߇ߚߒޕ‬㔚ሶᯏེߩା㗬ᕈ
ᓽ㧔㕙Ⓧߪᐢ޿߇⭯޿㧕ࠍ⠨ᘦߒ‫ޔ‬ਇቢోߥㅘ
ะ਄߅ࠃ߮ታⵝߩ㜞ᐲൻߦࠃࠆᣂߒ޿㔚ሶᯏེ
ㆊ↹௝࠺࡯࠲߆ࠄ CT ↹௝ࠍౣ᭴ᚑߔࠆߚ߼ߦ‫ޔ‬
ߩ㐿⊒ߩߚ߼‫ޔ‬ᓸ⚦ߥᰳ㒱߿៊்ࠍ㕖⎕უߢᬌ
ᛩᓇᣇᴺ߿ౣ᭴ᚑᣇᴺࠍᬌ⸛ߒߚ‫ޔߜࠊߥߔޕ‬
಴‫⹏ޔ‬ଔߔࠆᛛⴚࠍ㐿⊒ߔࠆߎߣ߇‫࠻ࠢ࡟ࠛޔ‬
㔚ሶၮ᧼ࠍടᎿߔࠆߎߣߥߊ‫ޔ‬SP-PCT ࠍ↪޿ߡ
ࡠ࠾ࠢࠬ㑐ㅪ↥ᬺߦ߅޿ߡߪᕆോߣߥߞߡ޿ࠆ‫ޕ‬
ቢోߥ㕖⎕უߢⷰኤߒ‫ޔ‬ታ↪ߦ⠴߃߁ࠆࠃ߁ CT
ߎࠇ߹ߢ‫ޔ‬ᚒ‫⎇ߩޘ‬ⓥࠣ࡞࡯ࡊߢߪ‫ޔ‬LSI㧔Large
↹௝ߩ↹⾰ะ਄ࠍ࿑ߞߚ‫ޕ‬
Scale Integrated circuit㧕߇ࡈ࡝࠶ࡊ࠴࠶ࡊ㧔FC‫ޔ‬
Flip Chip㧕ታⵝߐࠇߚ㔚ሶၮ᧼ࠍኻ⽎ߣߒ‫ߩߘޔ‬
2. X ✢ࡑࠗࠢࡠ CT ⵝ⟎ߩ᭴ᚑߣ․ᓽ
ࡑࠗࠢࡠߪࠎߛធวㇱߩᾲ∋ഭߦࠃࠆ៊்㧔ᓸ
SP-PCT ߢߪ‫ߩࠄ߆࠲࡯࡟ࡘࠫࡦࠕޔ‬᡼኿శࠍ‫ޔ‬
⚦⚵❱ߩᄌൻ߿∋ഭ߈ⵚ㧕ࠍ‫ޔ‬᡼኿శࠍశḮߣ
Si ߩੑ⚿᥏ಽశེߦࠃࠅන⦡ൻߒߚ X ✢ࠍ⹜ᢱ
ߔࠆ X ✢ࡑࠗࠢࡠ CT ⵝ⟎㧔એਅ‫ޔ‬SP-PCT㧕
ߦᾖ኿ߔࠆ‫ ߩߎޕ‬X ✢ߪ‫ޔ‬ᡆૃ⊛ߦᐔⴕశߣ⷗
ࠍ↪޿ߡ⹏ଔߔࠆ⎇ⓥࠍⴕ޿‫⹏ޔ‬ଔᛛⴚߩታ↪
ߥߖࠆ߶ߤ㜞޿ᜰะᕈࠍ᦭ߒߡ߅ࠅ‫ޔ‬㜞ಽ⸃⢻
น⢻ᕈࠍ㜞߼ߡ߈ߚ
‫ޔߒ߆ߒޕ‬ቢోߥㅘㆊ↹
ߩ 3 ᰴర↹௝ࠍౣ᭴ᚑߔࠆߎߣ߇น⢻ߢ޽ࠆ‫ޕ‬
௝࠺࡯࠲߆ࠄ CT ↹௝ࠍౣ᭴ᚑߔࠆߚ߼ߦߪ‫ޔ‬ᬌ
߹ߚ‫ޔ‬න⦡శൻߦࠃࠅ‫ ߩߘޔ‬X ✢ࠛࡀ࡞ࠡߦኻ
ᩏኻ⽎ߩᄢ߈ߐ߿ᒻ⁁ߦ೙⚂߇޽ࠅ‫ޔ‬න৻ߩធ
ߔࠆ X ✢✢ๆ෼ଥᢙ㧔LAC, Linear Attenuation
ว૕߿㔚ሶၮ᧼ߩ৻ㇱࠍಾᢿߒߚ⹜㛎૕ࠍⷰኤ
Coefficient㧕ߩ 3 ᰴరಽᏓࠍቯ㊂⊛ߦ⹏ଔߔࠆߎ
ߖߑࠆࠍᓧߥ߆ߞߚ‫৻ޕ‬ᣇ‫ࠬࠢ࠾ࡠ࠻ࠢ࡟ࠛޔ‬
ߣ߇น⢻ߢ޽ࠆ‫ ߩߎޔߦࠄߐޕ‬X ✢ߩࠦࡅ࡯࡟
㑐ㅪ↥ᬺߦ߅ߌࠆ࠾࡯࠭ߪ‫ޔ‬ᐔ᧼⁁᭴ㅧࠍ᦭ߔ
ࡦ࠻ߥ․ᕈࠍ೑↪ߒ‫࡞ࡀ࡟ࡈޔ‬࿁᛬ߦࠃߞߡࠛ
࠶ࠫࠍᒝ⺞⴫␜ߐߖࠆߎߣ߽น⢻ߢ޽ࠆ‫ޕ‬
4. ਇቢో CT ߦࠃߞߡᓧࠄࠇࠆ↹௝ߩ↹⾰ะ਄
SP-PCT ᧄ૕ߪ‫♖ޔ‬ኒ࿁ォࠬ࠹࡯ࠫ‫ ߮ࠃ߅ޔ‬X
Fig.㧝ߪ‫ޔ‬ౣ᭴ᚑߒߚ޿ߊߟ߆ߩ CT ↹௝ߩ଀
✢ᬌ಴ⵝ⟎ߦࠃߞߡ᭴ᚑߐࠇࠆ‫ޕ‬X ✢ᬌ಴ⵝ⟎
ࠍ␜ߔ‫↹ޕ‬௝
aߪ‫ޔ‬180q࿁ォߩߔߴߡߩㅘㆊ
㧔ᵿ᧻ࡎ࠻࠾ࠢࠬ␠⵾ AA50 ߅ࠃ߮ C4880-41S㧕
↹௝ࠍߘߩ߹߹↪޿ߡ‫ޔ‬ౣ᭴ᚑࠍⴕߞߚ߽ߩߢ
ߪ‫⹜ޔ‬㛎૕ࠍㅘㆊߒߚ X ✢ࠍⰯశ᧼ߢนⷞశߦ
޽ࠆ‫⹜ޕ‬㛎૕ࠍ࿁ォߐߖࠆߣ‫ޔ‬X ✢ࡆ࡯ࡓߣၮ
ᄌ឵ߒ‫ޔ‬㗼ᓸ㏜↪ኻ‛࡟ࡦ࠭ߦࠃߞߡ᜛ᄢߒߚ
᧼ߩ㐳ᚻᣇะߣ߇ᐔⴕߦㄭߊߥࠆ࿁ォⷺߩ▸࿐
ᓟ‫ޔ‬CCD ࠞࡔ࡜ߢ᠟ᓇߔࠆ߽ߩߢ޽ࠆ‫ޕ‬
ߦ߅޿ߡߪ‫ޔ‬X ✢߇ၮ᧼ߩ㐳ᚻᣇะߦߪㅘㆊߒ
ߒ߆ߒ‫⃻ޔ‬ታ⊛ߦ‫ޔ‬1Pm ⒟ᐲߩ㜞޿ಽ⸃⢻ࠍ
ߦߊ޿ߩߢ‫ޔ‬ㅘㆊ↹௝ߩ S/N Ყ߇㕖Ᏹߦዊߐߊ
ታ⃻ߔࠆߚ߼ߦߪ‫⹜ޔ‬㛎૕ࠍ X ✢ᬌ಴ⵝ⟎ߦน
ߥࠆ‫ޔ߼ߚߩߎޕ‬CT ↹௝ߦߪ‫ޔ‬ᢳ߼ᣇะߩ⋥✢
⢻ߥ㒢ࠅㄭߠߌࠆᔅⷐ߇޽ࠆ‫ޔߚ߹ޕ‬ᄢ߈ߥ㔚
⊛ߥᒝ޿ࠕ࡯࠹ࠖࡈࠔࠢ࠻߇⊒↢ߒ‫ࡃߛࠎߪޔ‬
ሶၮ᧼ࠍ࿁ォߐߖࠆ႐ว‫ޔ‬X ✢߇ၮ᧼ߩ㐳ᚻᣇ
ࡦࡊౝߩᓸ⚦⚵❱ࠍ߁߹ߊ್೎ߢ߈ߥ޿↹⾰ߣ
ะߦߪㅘㆊߒߦߊ޿‫⹜ޔߡߞ߇ߚߒޕ‬㛎૕ࠍዊ
ߥߞߚ‫ޕ‬
ߐߥኸᴺߦടᎿߖߑࠆࠍᓧߥ޿႐ว߇ᄙ޿‫ޕ‬
ߎߩ໧㗴ࠍ⸃᳿ߒ‫ࠍ⾰↹ޔ‬ะ਄ߐߖࠆߚ߼ߦ‫ޔ‬
޿ߊߟ߆ߩᚻᴺࠍᬌ⸛ߒߚ‫ޔߕ߹ޕ‬චಽߦ X ✢
3. ⹜㛎ᣇᴺ
߇ㅘㆊߒߡ޿ߥ޿⚂ 20qߩ࿁ォⷺߦኻᔕߔࠆㅘ
ⷰኤ↪ߩ⹜㛎૕ߪ‫ޔ‬Si ࠴࠶ࡊߣ FR-4 ၮ᧼߇‫ޔ‬
ㆊ↹௝ࠍ↪޿ߕߦ‫ޔ‬CT ↹௝ߩౣ᭴ᚑࠍⴕߞߚ‫ޕ‬
ࡑࠗࠢࡠߪࠎߛࡏ࡯࡞㧔Sn-37wt%Pb ౒᥏‫ޔ‬એਅ‫ޔ‬
↹௝
bߪ‫ ߩߎޔ‬CT ↹௝ࠍ␜ߔ‫ࠔࡈࠖ࠹࡯ࠕޕ‬
౒᥏ߪࠎߛ㧕ߦࠃߞߡ‫ࡊ࠶࠴ࡊ࠶࡝ࡈޔ‬ធวߐ
ࠢ࠻ߪᄢ᏷ߦૐᷫߐࠇ‫࡞࡯ࡏߛࠎߪޔ‬ౝߦ߅ߌ
ࠇߚ᭴ㅧߢ޽ࠆ‫⋥ޕ‬ᓘ⚂ 150Pm ߩߪࠎߛࡏ࡯࡞
ࠆ Sn ࡝࠶࠴⋧‫ޔ‬Pb ࡝࠶࠴⋧ߩฦ⋧߇್೎น⢻ߥ
߇‫ ⚂ޔ‬250Pm 㑆㓒ߢජ㠽ߦ㈩೉ߐࠇߡ޿ࠆ‫߹ޕ‬
߹ߢ↹⾰߇ᡷༀߐࠇߚ‫ޔߚ߹ޕ‬චಽߦ X ✢߇ㅘ
ߚ‫⹜ޔ‬㛎૕ߩᄖᒻኸᴺߪ‫ޔ‬㐳ߐ 35mm˜᏷ 35mm
ㆊߒߡ޿ߥ޿㗔ၞߦኻߒߡ‫ࠛ࡝࡯ࡈޔ‬ᄌ឵ߦࠃ
˜ෘߐ 1.0mm ߢ޽ࠆ‫ޕ‬
ࠆ๟ᵄᢙⓨ㑆਄ߢᒝᐲࠍᓢ‫ߦޘ‬ᷫዋߐߖࠆࡈࠖ
SP-PCT ࠍ↪޿‫࡞࡯ࡏߛࠎߪޔ‬ౝߩᓸ⚦⚵❱ߩ
࡞࠲࡝ࡦࠣࠍታᣉߒߚ‫↹ޕ‬௝
cߪ‫ ߩߎޔ‬CT ↹
ⷰኤࠍ⹜ߺߚ‫⹜ޕ‬㛎૕ߣ X ✢ᬌ಴ⵝ⟎ߣ߇ᐓᷤ
௝ࠍ␜ߔ‫ޕ‬චಽߣߪ޿߃ߥ޿߇‫ޔ‬ᢳ߼ᣇะߩࠕ
ߒߥ޿ࠃ߁ߦ‫ޔ‬20mm ⒟ᐲߩ〒㔌ࠍ߅޿ߡ⹜㛎૕
࡯࠹ࠖࡈࠔࠢ࠻ߪ‫ⷰ❱⚵ޔ‬ኤߦᄢ߈ߥᓇ㗀ࠍਈ
ࠍ࿁ォࠬ࠹࡯ࠫߦ࿕ቯߒߚ‫ޔߡߞ߇ߚߒޕ‬ᓧࠄ
߃ߥ޿࡟ࡌ࡞߹ߢૐᷫߐࠇߚ‫ޕ‬
ࠇࠆ CT ↹௝ߪ‫ࠍࠫ࠶ࠛ߿߿ޔ‬ᒝ⺞ߒߚ↹௝ߣߥ
ᰴߦ‫ޔ‬චಽߦ X ✢߇ㅘㆊߒߡ޿ߥ޿㗔ၞߢߩ
ࠆ‫⹜ߩߎޕ‬㛎૕ࠍ 180q࿁ォߐߖߡ 900㨪3600 ᨎ
ᖱႎ㊂ਇ⿷ࠍ⵬߁ߚ߼‫ోޔ‬ᛩᓇᢙࠍჇ߿ߒߡ CT
ߩㅘㆊ↹௝ࠍ᠟ᓇߒߚ‫ޕ‬
ㅘㆊ↹௝৻ᨎ޽ߚࠅߩ X
↹௝ߩ↹⾰ࠍᡷༀߔࠆߎߣࠍ⹜ߺߚ‫ޕ‬Fig.2 ߪ‫ޔ‬
✢ߩ㔺శᤨ㑆ߪ 0.3 sec ߢ޽ࠆ‫ޔߚ߹ޕ‬ㅘㆊ↹௝
ోᛩᓇᢙࠍ 900 ߆ࠄ 3600 ߩ▸࿐ߢᄌ߃ߚߣ߈ߩ
ߩ᠟ᓇ㗔ၞߪ‫ޔ‬1000Pm˜656Pm ߣߒߚ‫ޕ‬ㅘㆊ↹
CT ↹௝ߩᲧセࠍ␜ߔ‫ోޕ‬ᛩᓇᢙࠍჇ߿ߔߎߣߦ
௝߆ࠄ CT ↹௝ߩౣ᭴ᚑߦߪ‫ߺ⇥ޔ‬ㄟߺㅒᛩᓇᴺ
ࠃࠅ‫ޔ‬ᓸ⚦⚵❱߇᣿⏕ߦߥࠅ‫ߚ߹ޔ‬ᢳ߼ᣇะߩ
㧔Convolution back-projection method㧕ࠍ↪޿ߚ‫ޕ‬
ࠕ࡯࠹ࠖࡈࠔࠢ࠻߽ૐᷫߔࠆലᨐ߇޽ߞߚ‫ޕ‬
CT ↹௝ߦ߅޿ߡߪ‫ޔ‬LAC ୯ߩಽᏓࠍ⴫␜ߔࠆߎ
ߣߢ‫ޔ‬Pb ࡝࠶࠴⋧߅ࠃ߮ Sn ࡝࠶࠴⋧ߩᒻ⁁ࠍน
5. ߹ߣ߼
ⷞൻߔࠆߎߣ߇ߢ߈ࠆ‫ޔ߅ߥޕ‬X ✢ࠛࡀ࡞ࠡߣ
᡼኿శశḮࠍ೑↪ߒߚ X ✢ࡑࠗࠢࡠ CT ⵝ⟎
ߒߡ‫ޔ‬Sn ߩ K ๆ෼┵ࠃࠅ߽߿߿ૐ޿ 29.0keV ࠍ
㧔SP-PCT㧕ࠍ↪޿ߡ‫ޔ‬㔚ሶၮ᧼㧔ࡈ࡝࠶ࡊ࠴࠶
ㆬᛯߒߚ‫ޕ‬
ࡊߪࠎߛធว᭴ㅧ૕ߩߪࠎߛធวㇱ㧕ࠍ‫ޔ‬㕖⎕
უߢⷰኤߒߚ‫ޕ‬㔚ሶၮ᧼ߩᒻ⁁⊛ߥ․ᓽ㧔㕙Ⓧ
ߪᐢ޿߇⭯޿㧕ࠍ⠨ᘦߒ‫ޔ‬ਇቢోߥㅘㆊ↹௝࠺
ෳ⠨ᢥ₂
࡯࠲߆ࠄ⚵❱ⷰኤࠍⴕ߁ߚ߼ߦචಽߥ↹⾰ߩ CT
1) Uesugi, K. et al., Nucl. Instr. Method., Sec. A,
Vol. 467-468 (2001), 853-856.
↹௝ࠍౣ᭴ᚑߔࠆߎߣ߇น⢻ߣߥߞߚ‫੹ޕ‬ᓟ‫ޔ‬
ታ㓙ߩ㔚ሶၮ᧼᭴ㅧߩⷰኤߦኻߒߡ‫ޔ‬SP-PCT ࠍ
2) Tsuritani, H. et al., Proc. of InterPACK’07,
ㆡ↪ߔࠆߎߣ߇ᦼᓙߐࠇࠆ‫ޕ‬
Fig.1
Fig.2
ASME, New York (2007), IPACK2007-33170
Quality improvement of CT images reconstructed using imperfect projection data
CT images reconstructed using various set of projections with different angular
increments