Key Specifications Link
E2150B 43G Electrical/Optical BER Test System
Wavelength range – Optical Output
Wavelength range – Optical Input
Wavelength resolution
Mode-hop free tuning range
Absolute wavelength accuracy
Relative wavelength accuracy
Wavelength repeatability
Wavelength stability
(typ., 24 h at const. temp.)
Optical output power range
Optical input data format
Optical output data format
Power stability
Target Receive Sensitivity
Extinction ratio
Benefits for Applications
Agilent E2150B
C Band wavelengths from 1530-1565 nm
L Band wavelengths from 1570-1608 nm
C+L Band wavelengths from 1530-1565 & 1570-1608nm
1510-1610 nm
0.1 pm
Full wavelength range
+/- 0.015 nm, typ
+/- 7 pm
+/- 1 pm
< 1 pm
-40 to +5 dBm
RZ, RZ-CS or NRZ
RZ, RZ-CS or NRZ
~ .05 dB
-5 dBm typical, PRBS 223-1, BER 1E-10
> 8dB

Capability of measuring either electrical or optical inputs
or outputs, to allow the testing of:

Systems

MUX’s/DeMUX’s

Electrical to Optical Devices

Optical to Electrical Devices

Optical only Devices

Electrical only Devices

OR any combination of the above

Fully integrated, scaleable bit-error-ratio test system that
gives optical or electrical data streams at up to 43.2Gb/s

Modular, VXI-based system which can adapt to fit a
variety of testing needs

Works from 38 to 43.2Gb/s

Generates standard pseudo random binary sequences
(PRBS) and user-defined patterns on serial interfaces and
can analyze bit error ratios with user-defined patterns or
PRBS

Simple editor allows the setup of data as a static frame

Computer, software and all of the electrical and optical
instrumentation and required cables are supplied in one
fully tested two-meter rack

Optimized system rack layout, cables, instrument
placement, thermal flow, and DUT interface panel