Ion beam assisted deposition of thin films on solid and nonrigid

Ion beam assisted
deposition of thin films on
solid and nonrigid substrates
I.S.Tashlykov, S.M.Baraishuk
Belarusian State Pedagogical University,
220050 Minsk Sovetskaya 18
Schematic representation of SIAD: 1—vacuum
arc ion source, 2—ionized fraction, 3—neutral
fraction, 4—target, 5—target holder, 6—modified
surface, 7—current integrator, 8—high voltage
power supply, 9—electric field.
. RBS spectra of the initial rubber (1) and a sample
upon which the Mo coating was deposited and also
irradiated with 3 keV Mo+ ions (2)
The depth distribution of indicated components in the
rubber sample (a) and in the silicon sample (b) with Mo
coatings.
RBS spectra of untreated Si – curve (1); and with
deposited Ti-based thin film – curve (2).
Relative content of species in SIAD Ti-based thin film on
Si (4 hours deposition).
H – content in SIAD Ti-based layer deposited on Si (2
hour deposition).
Cross-section high-resolution TEM micrograph of (100)
Si sample with SIAD constructed Zr/Si structure
(accelerated voltage of 5 keV). Image of the interface
area of the Zr-based film and Si substrate (a), image of
the central area of the film [9]. The Low scale Zr
crystal inserts in the coating are shown in circuits.
AFM images of surface morphology and view profiles of
topography of rubber: untreated surface (a), the surface
after 3 hours of Mo-based coating deposition (b).
AFM images of surface morphology and view profiles of
topography of silicon: untreated surface (a), the surface
after 3 and a half hours titanium-based coating
deposition (b).
Changes of average surface roughness (rave), the root
mean square value of the surface roughness (means
square) and (square area)/(projected area) (rho) of
rubber and silicon surfaces, modified by means of SIAD
of coatings.
SEM image of rubber surface modified by Cr.
ECr+ = 10 keV.
Thicknesses of the coatings.
PPT-curves for SIAD Me-based coatings on rubber. R-pin
fixed on virgin rubber.
Adhesion of Me SIAD coatings on rubber measured
using the Pin Pull Test. ETi+ ,Mo+ ,W+ =20 keV, ECr+
,Zr+ = 10 keV. R-Pin Pull Test on initial rubber.
Contact angle of water to Me-based SIAD coatings on
rubber.
Thank you for your attention!
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