Document Revision No.: 1 Revised: 07/31/17 RIT KGCOE MSD Program P11011 Modular Motion Tracking Knee Device Sensor Test Plans By: Brittany Bochette, Maya Ramaswamy, Lindsey Clark, Andrei Stihi and Michael Ostertag Table of contents 1. MSD I: WKS 8-10 PRELIMINARY TEST PLAN .......................................... 2 1.1. Introduction; Problem Statement, Objectives/Scope, and Purpose. .................2 1.2. Project Description; Sub-Systems/ Critical Components Being Tested ...........2 1.3. Approval; Guide, Sponsor: Pending Approval ....................................................4 1.4. Test Strategy ...........................................................................................................4 RIT KGCOE MSD Program Page 1 Document Revision No.: 1 Revised: 07/31/17 RIT KGCOE MSD Program P11011: Modular Motion Tracking Sensors Knee Motion Tracking Subteam Sensor Test Plans & Test Results 1. MSD I: WKS 8-10 PRELIMINARY TEST PLAN 1.1. Introduction; Problem Statement, Objectives/Scope, and Purpose. 1.1.1. Problem Statement 1.1.1.1. P11011 will create a series of sensors that will measure the flexion of the knee. 1.1.2. Objectives/Scope 1.1.2.1. Identify sensor solutions for portable motion tracking of the knee. 1.1.2.2. Identify microcontroller and auxiliary component solutions for portable motion tracking system. 1.1.2.3. Identify and employ test methods to quantitatively validate system performance 1.1.3. Purpose 1.1.3.1. Dr. JJ Mowder-Tinney is the Director of Clinical Education at Nazareth College. Dr. Mowder will primarily be using this device with stroke victims to track and ensure their increased range of motion after physical therapy treatments. 1.2. Project Description; Sub-Systems/ Critical Components Being Tested Figure 1: P10011 Knee Flexion Sensor Block Diagram RIT KGCOE MSD Program Page 2 Document Revision No.: 1 Revised: 07/31/17 RIT KGCOE MSD Program 1.2.1. Sensor Subsystem 1.2.1.1. The critical objectives of sensor testing are validation of published accuracy and precision. 1.2.1.2. The second aspect of sensor testing is verifying successful interface circuitry between the sensor and microcontroller. 1.2.1.3. Sensor dimensions and weight will also be evaluated for compliance with customer ideal and marginal values. 1.2.2. Microcontroller Subsystem 1.2.2.1. Data acquisition, analysis and conversion, A/D Conversion and transmission of data to the base unit are the four primary objectives of the microcontroller unit, and will be the focus of our microcontroller testing. 1.2.2.2. The second aspect of microcontroller testing is ensuring the compatibility and functionality of peripheral devices, including batteries, zero mechanisms and communication interfaces, when appropriate. 1.2.2.3. Microcontroller dimensions and weight will also be evaluated for compliance with customer ideal and marginal values. 1.2.3. Software Subsystem 1.2.3.1. Non Functional Software Testing Software load testing - Perform testing to ensure the software can be loaded onto the microcontroller. Stability testing - Test software with erroneous data to determine bugs and correct behavior Usability testing - Test user interface and output medium to make sure system delivers usable results Security testing - RIT KGCOE MSD Program Test system against overflows and data corruption Page 3 Document Revision No.: 1 Revised: 07/31/17 1.2.3.2. RIT KGCOE MSD Program Divide software design testing into 4 steps: - Data acquisition a. Test ADC channels b. Test channel between sensor and microcontroller c. Test sampling speed and precision d. Test precision 1.3. Approval; Guide, Sponsor: Pending Approval 1.4. Test Strategy 1.4.1. Product Specifications and Pass/ Fail Criteria Note: Pass/Fail Criteria is determined by Marginal Value, where: For values where a high number is desirable: Pass >MarginalValue; Fail < Marginal Value For values where a low number is desirable: Pass <MarginalValue; Fail > Marginal Value Engineering Spec. Precision Range of Motion Derives from Customer Needs CN3, CN4 CN2, CN5 Relative Importance 9 Description Measure of Performance Units Angle that the device is able to measure. Ability of device to measure consistently within a certain degree. (degrees) Marginal value Ideal Value +/- 5-10 +/-5 3 Ability of device to measure knee flexion. Angle that the unit is able to measure. (degrees) X: +/- 60 Y: +/- 60 Z: +/- 60 X: +/100 Y: +/100 Z: +/100 How far the device shifted or rotated during use. (cm, degrees) cm: 1.3 deg: 5 cm: 0 deg: 0 Displacement from attachment point on body. CN3 9 Ability of the device to remain stationary during use. Speed of attachment CN7, CN8, CN12 3 The time it takes to place the device on the patient and set it up. Time it takes to put on the patient and activate. (minutes) 3 2 Speed of removal CN7, CN8, CN12 1 The time it takes to take the device off of the patient. Time it takes to remove device. (minutes) 2-3 1 Protective enclosures CN1, CN9, CN11 3 Keeping the sensitive devices properly protected. Force of impact that it can withstand. (m of drop) 2.5 6 3 Device still allows patient to move knee joint naturally. Surveying patients to determine level of obstruction to (survey) marginal None Does not impede natural motion CN2, CN6, CN10 RIT KGCOE MSD Program Page 4 Document Revision No.: 1 Revised: 07/31/17 RIT KGCOE MSD Program knee. 3 Ensuring that the patient is as comfortable as possible. Surveying patients to determine level of discomfort. (survey) marginal none CN1 9 Keeping the cost of the device down as much as possible. The cost of all of the components. ($) $300 $200 Weight CN9, CN10 3 Keep the weight of the device down. The weight of the final device. (kg) 1 0.5 Device must be sanitizable CN13 3 The device needs to be sanitizable. The device needs to be washable. (T/F) True True Size CN9 9 Keep the size of the device down. How far the device sticks outside of the leg. (mm) 50 70 Minimize patient discomfort CN6, CN10 Cost of components 1.4.2. Test Equipment available 1.4.2.1. EE Lab: Oscilloscopes, Multimeters, varied resistors and capacitors, Soldering irons, Excel, Circuitry Software, PSpice, Altera, Breadboard, PC, Power Supply, Signal Generator, MATLAB 1.4.2.2. ME Machine Shop: Mills, Lathes, Drill Presses, SolidWorks. 1.4.3. Phases of Testing 1.4.3.1. Device Acquisition (wks 10-11) Finalize Bill of Materials upon meeting with EE Advisors, order all final components as soon as possible. Identify other needed laboratories, equipment, or auxiliary devices, and ensure that RIT has a presence of needed items. 1.4.3.2. Component/ Device (wks 12-13) (1-2, MSDII) RIT KGCOE MSD Program Sensors: Receive sensor, solder and prepare sensor for evaluation. Measure dimensions and weight of sensor, connect sensor to standard EE laboratory equipment to evaluate for basic power/signal metrics. Ensure sensor is in full working order. Mate with needed auxiliary items such as buffers, diodes, as needed. (T) Page 5 Document Revision No.: 1 Revised: 07/31/17 RIT KGCOE MSD Program Microcontrollers: Receive microcontroller, record weight and dimension metrics. Prepare needed interface circuitry and filtering with sensors. Employ EE laboratory to test for basic signal metrics, ensure microcontrollers are in full working order. (T) 1.4.3.3. Integration (wks 14-15) (3-4, MSDII) System: Evaluate power distribution between sensors and microcontrollers. Ensure signal strength and quality are up to par, and interface circuitry is functional. Test data acquisition and analysis metrics. (T) 1.4.3.4. System Performance (wks 16-19)(5-8, MSDII) System: o Mate sensor with attachment method and ensure full functionality. (T) o Work with P10010 to test the sensor system with the base unit system. (T) 1.4.3.5. Final Evaluation (wks 20-22)(9-11, MSDII) RIT KGCOE MSD Program Redo any erroneous tests; explore random results that deviate from the norm to ensure measurements were correct. Complete Final Publication outlining final decision and components for future RIT MSD Motion Tracking Projects. Complete Final Spreadsheet containing technical information, including available vendors, for all components. Page 6 Document Revision No.: 1 Revised: 07/31/17 RIT KGCOE MSD Program 1.4.4. List of Test Methods: Test Category Spec Component Measurement of Interest T1 EE E1 Sensors Output Signal T2 EE E1 Sensors Power T3 EE E1 Sensors Output Signal Quality EE E1 Sensors Precision of Individual Measurements EE E1 Sensors Precision over Time EE E2 Sensors T7 EE E1, E2, E3, E4, E5, E6 Sensors T8 EE E1, E2 Microcontroller Read T9 EE E1, E2 Microcontroller Precision T10 EE E1, E2 Microcontroller Functionality T11 EE E1, E2 Microcontroller Data Format T12 EE E1, E2 Microcontroller Data T13 EE E7, E8, E10, E12, T14 EE E1 Sensors & Microcontrollers Microcontroller /Sensor T15 EE E1 Microcontroller /Sensor Filter T16 EE E1 Microcontroller /Sensor Power T4 T5 T6 RIT KGCOE MSD Program Degrees of Freedom & Range Precision with Enclosures Dimensions, Weight Amplify Signal Page 7 Test Description Connect the sensors to an Oscilloscope and do basic testing Test that the sensors are being powered correctly. Test signal quality using an oscilloscope and perform basic filtering if necessary. Compare sensor measurements to known values. Compare sensor measurements over time to known values. Compare sensor degrees of freedom and range measurements to known values. Test effect of sensor enclosures on prerecorded sensor accuracy Test the functionality of being able to read raw data from ADCs Calibrate the ADC Ensure basic functions-being able to program, load a file, timing, sampling frequency, I/O, etc., can be performed Test the ability to convert the data acquired into USB. Test data acquisition using microcontroller programming and sample data Record weight and dimensions of sensors and microcontrollers. Test signal strength and apply amplifiers where necessary. Test signal quality and add filters where necessary with regarding to the microcontroller being used. Test the ability to power the sensors through the base unit (microcontroller as a backup before base unit is complete)
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