DynaSpect is the name for a series of spectroscopic devices.
Absolute PL Quantum Yield Measurement System
C9920-01,-02
Absolute value of the photo-luminescence quantum yield can be instantaneously measured for thin films, solutions, and powders.
An ultra-high sensitivity CCD sensor is used in the detector, making instantaneous measurements possible.
The C9920-01 and -02 Absolute PL Quantum Yield Measurement System
measure the photo-luminescence (PL) quantum yield for photo-luminescent materials using a PL method.
Improvements in the luminous efficiency of photo-luminescent materials themselves are indispensable when aiming at application of them for industrial field,
etc. Therefore, there must be an accurate means for measuring the PL quantum yield (the ratio of the number of photons of light radiated from the photo-luminescent materials to the number of photons of light the materials absorbs).
The C9920-01 and -02 are systems that answer this need by measuring absolute values for PL quantum yield.
The system is made up of an excitation light source that uses a xenon lamp,
(monochromator (-02) and a band-pass filter(-01), an integrating sphere capable of nitrogen gas-flow and a multi-channel spectrometer capable of simultaneously measuring multiple wavelengths. Measurements can be made not only on
thin film samples, but also on solutions and powders. Therefore, C9920-01 and
-02 are possible to apply in various fields, like industry (such as organic/inorganic LED materials, fluorescent materials for white light LED and for flat panel
displays), biology (such as fluorescent probes, quantum dots), and academic
research (fluorescent, phosphorescent, and other photo-luminescent samples).
The C9920 series also includes the C9920-12 which measures external quantum efficiency of electro-luminescent device, and the C9920-11 which measures
brightness and light distribution of the device. By adding the optional parts,
power source meter, and dedicated measurement software to the C9920-01
and -02 configurations, it is possible to shift to the C9920-11 and C9920-12.
Applications
Fundamental research on photo-luminescence in the field of
physics, chemistry etc.
- Fluorescence quantum yield
- Phosphorescence quantum yield
- Other PL quantum yield
Measurement of PL quantum yield for photo-luminescent materials
- Organic LED (fluorescent/phosphorescent) materials
- Fluorescent probes
- Quantum dots
Measurement of internal quantum efficiency for fluorescent
materials
- Inorganic LED materials
- Fluorescent materials for white light LED
- Fluorescent materials for flat panel displays (plasma display, field
emission display etc.)
Photo-luminescence quantum yield (internal quantum efficiency)
is instantaneously measured using photo-luminescence method
The PL quantum yield (internal quantum efficiency) for photo-luminescent materials is measured using
a photo-luminescence method (PL method). Excitation at various wavelengths is possible through the
use of a band-pass filter or a monochromator. Various sample holders can be attached, so measurements can be made not only on thin films, but also on solutions and powders.
C9920-01 filter type
C9920-02 monochromator type
excitation wavelength is fixed
excitation wavelength is varied using a monochromator
Multi-channel detector
Multi-channel detector
HAMAMATSU
C7473
HAMAMATSU
SIGNAL INPUT
Power supply
(for Xenon light source)
POWER
Power supply
(for Xenon light source)
Fiber probe
150 W CW Xenon light source
Integrating
sphere
Integrating
sphere
Data Analyzer
280 mm
280 mm
150 W CW Xenon light source
Excitation
light guide
Data Analyzer
Excitation
light guide
Band-pass filter
130 mm
PL measurement
sample holder
(for solid samples)
FEATURES
Fiber probe
Monochromator
Fiber input
optics
165 mm
C7473
SIGNAL INPUT
POWER
PL measurement
software
350 mm
Nitrogen gas (flow)
PL measurement
software
130 mm
PL measurement
sample holder
(for solid samples)
Nitrogen gas (flow)
The PL quantum yield for light emitting materials is measured through PL measurements using an integrating sphere
It is possible to measure the sample instantaneously, employing an ultra high sensitive sensor
Since a highly stable xenon light source is used, stable measurements are possible
Excitation at various wavelengths is possible through the choice of band-pass filters or the use of monochromator
Since an integrating sphere is used, the measurement is not influenced by the variance in the light emission radiation pattern
from sample to sample
Measurements of electro-luminescence efficiency are possible through the use of the optional power source meter
A variety of samples, such as thin films, solutions and powders, can be measured
SPECIFICATIONS
PL measurement wavelength range
Excitation wavelength and bandwidth
300 nm to 950 nm
C9920-01 : 325 nm , ±15 nm (Other wavelength are handled using the options.)
C9920-02 : 250 nm to 700 nm, FWHM 10 nm
Xenon light source
guaranteed life = 1800 hours
Sample holder
thin film (16 mm x 10 mm x 1 mm for substrates)
powders (φ17 mm dish, option)
solution cell (option)
Nitrogen gas connector included Tube diameter
outside diameter 4 mm, inside diameter 2.5 mm (In integrating sphere)
Excitation spot size
8 mm diameter
Power supply shutter for preventing sample deterioration included (In optical system)
Simple and easy operativity is realized with the
dedicated analysis software.
Quantum yield measurement software
Measurements can be made from Windows using PL quantum yield measurement software.
Screen showing emission spectrum
Screen showing x-y coordinates
This is the basic screen for PL quantum yield measurements. PL quantum yield
value is automatically calculated by making adjustments to the excitation light and
emissions range with the cursors following measurement (PL quantum yield values are shown in the table.) In addition, the emission intensity for the excitation
light and sample, peak wavelength, peak count and peak band (FWHM) are
shown in the table other than the PL quantum yield.
Besides the function for displaying the emissions spectrum, the
software includes a function for displaying the x-y coordinates.
Besides the chromaticity coordinates (x, y) of the measured
sample, the three stimulus values (X, Y, Z) are displayed.
MEASUREMENT EXAMPLES
Phospholuminescent material: this can be used in determining the emission
layer composition by measuring the absolute PL quantum yield of the host film.
Fluorescent powder material: Measurement of internal quantum efficiency for blue-colored fluorescent material, BaMg2Al16O27:Eu2+ (BAM)
PL quantum yield (%)
(Dopant)
BAM
Concentration of Ir(ppy)3 (wt%)
2wt% by weight doping:PL quantum yield
6wt% by weight doping:PL quantum yield
Efficiency reduction
(Host)at 100% film
Effect of concentration quenching
Measurement result of the internal quantum efficiency for BAM is
shown in the figure above. The internal quantum efficiency was obtained as ca. 0.92. Excitation light intensity of the reference (blue
line) is found to decrease compared to that of the sample (green line)
due to absorption of the excitation light by the sample.
Data provided by Adachi laboratory,
Kyushu University
Phosphorescent material for organic LED: this can be used in determining the emission layer composition by measuring the absolute PL quantum yield
of the thin films.
The emission layer is made up of a dopant compound (light emitting material) and a host compound. The luminous efficiency of the emission layer depends on the concentration of the dopant compound in the host one. If the dopant concentration is increased, the luminous efficiency decreases because there is an exchange of energy among the dopant compound molecules themselves when the dopant compound is excited (concentration
quenching). When the optimized composition of the emission layer is determined so that concentration quenching does not occur, a thin film of the emission layer could be produced and measured the PL quantum yield. The figure shows dependency of the PL quantum yield for a dopant compound
(Ir(ppy)3) doped in a host compound (CBP) on the dopant concentration. From this figure, we can also see that the PL quantum yield decreases with an
increase in the Ir(ppy)3 concentration. Therefore, the composition of the emission layer can be determined.
A wide variety of measurement targets can be accommodated
by adding optional parts and components.
OPTIONS
Monochromator
Replacement xenon lamp bulb
A10080-01
L8474
Monochromator: this is a monochromator for selecting the wavelength
of the xenon lamp. In the C9920-02 monochromator light source type,
this is standard equipment. It can be added to the C9920-01.
This is a replacement bulb for the xenon excitation light
source.
Band-pass filter
PL measurement sample holder (solution)
A9923
A9924-02
This is an additional excitation filter to the C9920-01 (bandpass filter type). Please specify the wavelength. The C992001 comes equipped with one for 325 nm as standard.
This is used for making measurements on solution samples.
PL measurement sample holder (thin film / powder)
This is used for making measurements on solution samples. This is a three-piece
set made of synthetic quartz, which suppresses fluorescent emissions. This is
used with the A9924-02 sample holder.
A9924-01
This is an additional sample holder. The C9920-01 and
C9920-02 come standard with one.
PL powder measurement dish with cover (powder)
A10095-01, -03
This is used for making measurements on powders. This is a set
of A10095-01 and the cover. The cover can be used for prevention of powder scattering in the integrating sphere.
Related Products
PL solution measurement side-arm cell (solution)
A10095-02
PMA-11/C7473-36 detector shutter addition
When using a PMA-11 / C7473-36 detector that you already have for measuring
organic electro-luminescence quantum yields, the addition of a function for external shutter control is necessary.
Sensitivity calibration
To maintain high-precision measurements, we recommend periodically reacquiring sensitivity correction data.
There are many products for combined configurations in the C9920 series,
and expansion to the following products is easy.
External Quantum Efficiency Measurement System
C9920-12
Brightness Light Distribution Characteristics Measurement System
C9920-11
Highly precise measurement of emission efficiency does not depend on the
emission angle distribution characteristics by using an integrating sphere.
Measurements such as brightness for each emission angle, emission
spectrum and color coordinates are possible using a rotating stage.
Measurements of emissions versus the current applied can be
made, inclusive of elements related to the efficiency, such as absorption by the light emitting part and glass substrate, and reflective mirror efficiency, so on.
The light emitting device emission brightness, spectrum and emission angle distribution are measured for each of the angle steps
that has been set.
Block Diagram
Block Diagram
C9920-12 + OPTION (supplementing for sample absorption)
150 W CW
Xenon light source
Multi-channel detector
Power supply
(for Xenon light source)
C7473
SIGNAL INPUT
POWER
Software for
measuring external
quantum efficiency
270 mm
HAMAMATSU
Fiber probe
Halogen
light source
Data Analyzer
Nitrogen gas
(flow)
Power source meter
Multi-channel detector
Brightness
Simple
sample holder measurement
optics
Fiber input
optics
Integrating Sphere Adaptor
Integrating sphere
Sample holder for
EL measurement sample
Sample holder
light-shielding cover
HAMAMATSU
C7473
SIGNAL INPUT
POWER
Fiber probe
Software for measuring
brightness light
distribution characteristics
Automatic rotating stage
540 mm
Rotating stage controller
Power source
meter
Data Analyzer
Light shield adaptor
★ DynaSpect is a registered trademark of Hamamatsu Photonics K.K.
• Subject to local technical requirements and regulations, availability of products included in this promotional material may vary.
Please consult with our sales office.
• Information furnished by HAMAMATSU is believed to be reliable. However, no responsibility is assumed for possible inaccuracies or omissions.
Specifications and external appearance are subject to change without notice.
© 2006 Hamamatsu Photonics K.K.
www.hamamatsu.com
HAMAMATSU PHOTONICS K.K., Systems Division
325-6, Sunayama-cho, Hamamatsu City, Shizuoka Pref., 430-8587, Japan, Telephone: (81)53-452-2148, Fax: (81)53-452-2139, E-mail:[email protected]
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Cat. No. SSMS0015E04
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OCT/2006 HPK
Created in Japan (100)