Providing Light Source Solutions Dense Plasma Focus as a Light Source for Production EUV Lithography I.V. Fomenkov, W.N. Partlo, R.M. Ness, R.I. Oliver S.T. Melnychuk, J.E. Rauch Return to Index TM Outline ! Research areas and personnel ! Intermediate and Ultimate Specifications ! 4th Generation DPF System Description ! Measured 13.5nm In-band Absolute Emission with Xenon ! Measured Out-of-band Emission with Xenon ! Pinhole Camera EUV Source Images ! Grazing Incidence Collector update ! Initial results with foil trap debris mitigation ! Conclusions Return to Index TM Cymer EUV Program Personnel Resources Overall and Metrology: Igor Fomenkov, ~ 9 years Pulse power: Richard Ness, ~ 5 years Plasma initiation: Steve Melnychuk, ~ 1 year Thermal engineering: Roger Oliver, ~ 4 years Collector development: John Rauch, ~ 1 year Debris mitigation : Oleh Khodykin, ~ 1/2 year European scientific liaison: Norbert Bowering, ~ 1/4 year Return to Index TM Intermediate and Ultimate Specifications Dem onstrated collectable EUV power in a 2% bandwidth Available collection solid angle Source em ission volum e dim ensions Dem onstrated m axim um repetition rate Dem onstrated steady-state repetition rate Dissipated total power at steadystate repetition rate Now In 1 year In 2 years Ultim ate 0.23 W @ 50Hz (CW ) 2.3 W @ 500Hz (CW ) 9 W @ 2000Hz (CW ) 60W @ 5000Hz (CW ) 4.5 W @ 1000Hz (burst) 2π str (1.8 str planned) 9 W @ 2000Hz (burst) 2π str (1.8 str planned) 18 W @ 4000Hz (burst) 2π str (1.8 str planned) 2π str (1.8 str planned) 0.25m m X 1.7m m 0.25m m X 1.7m m 0.10m m X ?? m m 0.10m m X ?? m m 2500Hz 2500Hz 4000Hz 5000Hz 50Hz 500Hz 2000Hz 5000Hz 500W 5000W 20,000W 50,000W Return to Index TM Com m erc ial tool Requirem ents 50-150W ≥5000Hz Intermediate and Ultimate Specifications Source-facing condenser lifetime (pulses to 10% reflectance loss) Pulse-to-pulse spatial stability Pulse-to-pulse energy stability Pulse-to-pulse angular stability Pulse-to-pulse pointing stability Key risk areas 0.6M >>60M Unknown Unknown > 100% >100% <100% <100% 3σ=27% 3σ=27% 3σ=5% 3σ=2% isotropic isotropic isotropic isotropic isotropic isotropic isotropic isotropic Debris & Thermal Debris & Thermal Debris & Thermal Debris & Thermal Return to Index TM 1 year or 160B pulses ≤2% Schematic of 4th Generation DPF System Pinch Buffer Gas (He) Anode Cathode Initial Plasma Sheath Insulator Return to Index TM Source Gas (Xe) HV Principle of Operation ! The higher forces near the central axis form a cone shaped plasma sheath. ! Once plasma reaches end of the anode, inward forces cause compression. F t3 > t2 > t1 J F t3 t2 t1 Return to Index TM F J J J F F J J Waveshapes for 4th Generation DPF 1.2 6 12.8J Input 1.0 4 0.8 3 0.6 2 0.4 1 0.2 0 0.0 -1 -2 -3 -100 BLACK: C2 Voltage RED: Anode Voltage BLUE: EUV Emission -0.2 -0.4 2.7J Recovered -0.6 -50 0 50 100 150 Time (ns) Return to Index TM 200 250 300 350 EUV Emission (Normalized) Voltage (kV) 5 Experimental Setup He Gas Feed Xe Gas Feed Mass Flow Controller Solid State Pulsed Power Pi Ca nho m le er a Pressure Monitor Spectrometer Anode Pre-ionization Electrodes 6”TurboPump Pump Return to Index TM oot e h P iod oil d eF B w/ ! Vessel kept at constant pressure ! Xe controlled through MFC ! Measurement region differentially pumped Experimental Setup Return to Index TM Measured EUV Spectrum of Xenon 1.0 2.5 Spectrometer EMT Signal (V) 2.0 Xe IX 0.8 Xe XI Lines Xe X Lines 1.5 0.6 1.0 0.4 0.5 0.2 0.0 0.0 11 12 13 14 W avelength (nm) Return to Index TM 15 16 17 Published Reflectivity of Mo/Si Mirror Ionization Energy for Xe X = 202eV 13.5 nm In-band Energy Measurement Xe Gas Feed He Feed ML dielectric mirror. Radius of curvature= 1m IRD un-coated photodoide Assumed Ref=67% Mass Flow Controller 5 cm P=6.0 mTorr P=1.4 Torr 6” TurboPump 5 mm Diameter Aperture Aperture 1 µm Be Foil on linear motion feedthru Pump T(calc)=17.4% T(meas)=25.1% 92 cm Return to Index TM In-band Emission Efficiency vs. Input Energy 30 0.30 Emission into 2π Str, 2% Bandwidth (20 Hz operation) 20 0.20 15 0.15 Maximum Input Energy of 3rd Generation DPF 10 0.10 5 0.05 0 0.00 4 5 6 7 8 Input Energy (J) Return to Index TM 0.25 BLACK: Energy RED: Efficiency 9 10 11 Efficiency (%) Measured Energy (mj) 25 Emission Stability at 20Hz 140 Energy at 13.5 nm (a.u) 120 100 80 60 Standard Deviation = 9.5 % 40 20 0 0 20 40 60 Pulse number Return to Index TM 80 100 In-Band Emission at 1KHz 140 EUV Energy (Norm). 120 100 80 60 Burst Power = 25 Watt 40 20 Emission into 2π Str, 2% Bandwidth 0 0 50 100 150 Pulse Number Return to Index TM 200 250 Setup to Measure Out of Band Emission ! Emission into all Wavelengths: 211mJ (2.0%) Xe Gas Feed He Feed ! Emission into 11nm - 20nm band: 110mJ (1.0%) ! Emission into 130nm - 1300nm band: 0.8mJ 1.6 mm2 Aperture UV + VIS Emission is only 0.4 % of all radiation Mass Flow Controller 1 µm Be Foil CaF2 Open 2” TurboPump 6” TurboPump Pump 208 cm Return to Index TM 1 cm2 IRD un-coated photodoide Setup to Measure Out of Band Emission Return to Index TM Pinhole Imaging Setup CCD Detector Variable angle between 0 and 30° Pixel size = 24 µm Scale = 8 µm / pixel Be Filter, Thickness = 2.0 µm DPF Return to Index TM Pinhole Diameter = 50 µm Magnification = 3.0 EUV Source Images with Xenon 10 deg. Angle = 0 deg. 20 deg. 0 0 0 50 50 50 50 100 100 100 100 150 150 150 150 200 200 200 200 250 250 250 250 300 60 100 150 200 FWHM = 0.26 mm 50 100 150 190 0.29 mm 55 100 150 195 0.29 mm FWHM along the axis = 1.7 mm Return to Index TM 30 deg. 60 100 150 200 0.25 mm Grazing Incidence Collector Design ! ! ! ! ! ! ! Collector Output: Imaging (Elliptical Shells) Source to Image Distance = 400 mm Focal Length = 200 mm Distance to Entrance = 50 mm Number of Reflections = 1 Mirror Coating Material: Ruthenium Grazing Angle (Outer Shell): 19.6° - 26.8° (Inner Shell): 7.4° - 11.0° ! Collector Length = 150 mm ! Geometrical Collection = 28.6% of 2π (two shells) ! Overall Collection Efficiency = 18.6% of 2π (two shells) Return to Index TM Ellipsoid Collector Tests (Visible Light) Measured 9 mm from focal point Measured at focal point 305 305 500 500 300 300 450 450 295 295 400 400 290 290 350 350 285 285 300 300 280 250 250 275 200 200 150 150 4 100 100 280 275 270 270 265 4 4 265 260 260 255 0 20000 30000 255 215 220 30000 2 0 0 215 220 FWHM (mm) Return to Index TM 50 0 230 240 250 260 265 0 20000 35000 00 0 100 200 300 100 -2 200 0 2300 2 400 500 400 500 35000 -2 -2 20000 10000 2 50 20000 -4 -4 0 230 -4 -4 240 -2 X 0.074 -0.12 250 0 Y 0.081 260 2 265 4 0 -4 -4 -2 0 4 4 Debris Mitigation Foil Trap Concept Foil Trap Xenon Supply Grazing Incidence Collector Helium Supply Return to Index TM Pump Foil Trap Concept Light rays pass through foil trap Debris sticks to walls of a foil trap Return to Index TM First Foil Trap Exposure Experiment Return to Index TM Example of foil Trap Geometry PHILIPS research Return to Index TM Initial Results of foil Trap Efficiency - Ru samples supplied almost perfect - Source as is: after 0.5 M shots W coating (~> 5nm ) due to electrode erosion - after 2 M shots, no W deposition behind trap, no reflection loss - Ru coating on electrode may help as well. - Higher rep rate needed to demonstrate realistic lifetime (~1000M shots, i.e. 250 h at 1 kHz) PHILIPS research Return to Index TM Differential Pumping Across Foil Trap Inside: channel array Gas flow controller - diff pump over array of 80x 80 channels: 0.5 mm diam., 2 cm length Turbo pump - using effectively 500 l/s turbo pump speed we achieve 0.013 mbar N2 behind foil with 1.4 mbar N2 in front of foil (pressure needed for DPF) - prediction and measurement agree: 100x pressure reduction - Therefore, ~0.002 mbar Xe and 0.01 mbar He behind array, near first collector seems reachable. Roughening pump PHILIPS research Return to Index TM Results of Differential Pumping Across Foil Trap Operating range - results indicate that at lower pressure in front of array, even lower pressures behind array can be realised. PHILIPS research Return to Index TM Preferred Foil Trap Configuration Foil Trap Xenon Supply Grazing Incidence Collector Pump Return to Index TM Helium Supply 13.5nm Transmission Through 400 mm of He 1.0 0.9 Operating Range 0.8 Transmission 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0.0 0.00 0.25 0.50 0.75 1.00 1.25 Pressure (Torr) Return to Index TM 1.50 1.75 2.00 Cooling Concepts Under Evaluation Cooling Concept Direct water cooling Direct helium cooling Water heat pipe Advantages High heat flux removal Low cost cooling system Compact design High heat flux removal Safe and inert Lithium compatible Passive design Minimizes contamination Lithium evaporation cooling Simple, compact anode design Radiation-cooled lithium heat pipe Passive design Minimizes contamination risk Simplifies electrical isolation Simple, compact anode design Passive design Minimizes contamination risk Compact design Direct liquid lithium cooling Lithium heat pipe with integral heat exchanger Return to Index TM Disadvantages Safety issue with lithium Thermal shock issue De-ionized water required Helium loop required Limited to <1kW heat load Pressure containment issue at high temperatures Removal of excess lithium Removal of heat still needed Not compact [large condenser surface required] Lithium pumped loop required Helium loop required Heat Transfer Modeling Temperature Distribution Highest Temperature Return to Index TM Direct Water Cooling Tungsten, Molybdenum Free Machining Copper Cooling Water Cooling Water 304L Stainless Steel Welds Cooling Water Return to Index TM 13.5 nm EUV Power with Cymer’s Collector ! Conversion Efficiency with Xenon = 0.25 % " Electrical Energy Input per Pulse: 10J " In-band Emission into 2π per Pulse: 25 mJ ! Collection Efficiency with Grazing Incidence Collector = 18 % " Fraction of 2π Subtended by Collector: 28.5% (1.8 str) " Average Grazing Incidence Reflectivity of Ru: 65% ! Maximum collectable, in-band (2% BW), 13.5nm emission power with Xenon source gas in burst mode: 4.5 W ! Maximum collectable, in-band (2% BW), 13.5nm emission power with Xenon source gas in continuous mode: 11 W " Maximum Expected Thermal Extraction Capability = 25 kW " Limit is based on exposed surface area and use of heat pipe technology. Return to Index TM Conclusions ! Conversion efficiency with Xenon comparable to other direct plasma sources has been demonstrated, CE = 0.25 %. ! Out-of-band UV/Vis emission is very low. " Eliminate 50% throughput hit " Avoid SPF heating issues ! Foil trap experiments show effectiveness: " Debris mitigation " Differential pumping ! Current output energy stability of ~ 10% still needs improvement. ! Due to present thermal limits, ultimate in-band (2% BW) collectable 13.5nm optical power with Xenon as a source gas is approximately 11 W. Return to Index TM
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