All headsets are
not created equal.
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WHITEPAPER
All Headsets Are Not Created Equal.
Introduction
Telephone headsets and amplifiers are a significant core expense for call centers. With economic pressures forcing companies to chisel as much cost as possible from their operations,
some call centers may feel tempted to make initial purchase price the primary factor in their
headset buying decisions.
Most call centers, however, recognize that a more important buying criteria than initial price
is headset performance over time—that is, the total cost of owning a headset. Obviously, when
price points are reasonably comparable, headsets that need fewer repairs and general service,
and that last longer, will in the long run, cost less than headsets that are less durable.
But it has been difficult for call centers to find an objective measure of headset durability. Until
now, they have had to rely on their experience with different headset models—a valuable guide
for the future, but one that doesn’t prevent costly buying errors today.
This is why Plantronics recently completed, and is now publishing, the results of an exhaustive test of headset durability. Plantronics has conducted these durability tests on its own
headsets for many years as part of its rigorous quality assurance program. The particular
tests discussed in this white paper include Plantronics headsets and headsets from another
vendor—GN Netcom—to give call centers an overall headset durability benchmark.
The test results show clear evidence that Plantronics headsets perform significantly more
reliably than those from GN Netcom, and that buying Plantronics headsets can significantly
reduce the amount call centers must spend on headsets overall. The bottom line is that all
headsets are not created equal and Plantronics headsets are the most cost-effective headsets
for call centers to own over time.
Test Methodology
The headset durability tests discussed in this white paper were conducted by Plantronics’
Product Assurance Labs at its test laboratory in Santa Cruz, California. Wherever possible, the
test design incorporates recognized industry standards. In instances where standards have
not been set, the test design uses metrics that represent reasonable headset performance
expectations as identified by call center managers.
Each headset underwent seven tests. All headsets were tested using the same methodology
and equipment. The tests, described below, are constructed to simulate headset usage in a
real call center environment over a period of four years. The only exception is the electrostatic
discharge test, which simulates headset usage over a period of two years.
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PLANTRONICS
©2006 PLANTRONICS, INc.
1. Drop test: Headsets are dropped from a height of 60 inches (average wearing height while
standing for headsets) and 30 inches (average desk height for amplifiers) until a failure occurs
or until each piece is dropped 72 times, simulating 18 drops per year over four years. This
standard is set by FCC part 68 and Bellcore GR-314-CORE.
2. Cable flex test: Headset cables (the cord connecting the telephone to the headset) are
flexed at the boot until a failure or 400,000 flexes, simulating 100,000 flexes per year over
four years.
3. Boom rotation test: The headset boom is rotated until a failure or 40,000 rotations, simulating 10,000 rotations per year over four years.
4. Headset/handset switch cycling test: The headset/handset switch is activated until a
failure or 200,000 times, simulating 50,000 activations per year over four years.
5. Volume control cycling test: The headset volume control is rotated end to end until failure
or 20,000 rotations, simulating 5,000 rotations per year over four years.
6. Electrostatic discharge (ESD) test: Voltages of plus and minus 8 kV are discharged into the
product until failure or 20 discharges, simulating 10 ESD hits in each polarity per year over two
years. This standard is specified in the European Union standard EN55024 (1998).
7. Storage/thermal shock test: This test simulates temperature and humidity extremes that
a headset may experience during shipment. Each headset is tested for performance after
experiencing several temperature cycles from -20°F to 150°F and being stored at 90°F /90%
humidity. This standard is set by Bellcore GR-314-CORE.
Four headset/amplifier combinations were tested: two from Plantronics and two from GNNetcom. These headsets and amplifiers were chosen to be tested for two key reasons: they
are models that directly compare and compete against each other and they each represent a
combination of headset/amplifier that are commonly used in the call center environment.
Table 1: Four amplifier/
headset combinations
were tested.
Style
Plantronics Headset
GN Netcom Headset
Convertible style with noise-canceling
microphone.
DuoPro® H181N-M12
405 Flex Profile SF-GN8000
Suggested price:$264
Suggested price: $228
ADDvantage Plus ADP II-
Dual earpiece headband
Encore® H101N-M12
style with a noise-canceling GN8000
microphone.
Suggested price: $268
Suggested price: $228
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PLANTRONICS
©2006 PLANTRONICS, INc.
Test Results
The Plantronics and GN Netcom headset models performed comparably on three tests:
• Cable flex*
• Headset/handset switch cycling
• Volume control cycling
Full results of these tests are included in Appendix A.
* Note that two of the four GN Netcom ADPII-GN8000 models tested did not pass the cable flex test at the 400,000 mark, the
threshold passed by the other models tested. Full results are shown in Appendix A.
However, significant differences between the Plantronics and GN Netcom models were shown
in four of the seven tests:
• Drop test
• Boom rotation
• ESD
• Storage/thermal shock
The results of these studies are discussed here.
Drop test
In the drop test, a “failure” is defined as the headset ceasing to function or the headset being
so mechanically changed that the call center would not be able to reassemble the product.
As shown, both Plantronics headset models and the GN8000-Profile passed the 18-dropsper-failure standard (FCC part 68 and Bellcore GR-314-CORE) simulated by Plantronics to
72-drops-per-failure to represent for four years of use; the GN8000-ADP II, however, had a
drops-to-failure score of 18.
Figure 1. Drop Test
100
Figure 1:
Results of the
drop test
90
80
Drops to failure
70
P = Passed
P
P
P
P
P
P
P
P
60
50
40
30
20
10
0
GN8000-Profile GN8000-ADP II
M12-H181N
M12-H101N
Figure 2. Boom Rotation Test
45000
40,000
P = Passed
P P
P
P P
P
P P P
P
P P
P
Cycles
35,000
30,000
25,000
20,000
15,000
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PLANTRONICS
10,000
GN8000-Profile GN8000-ADP II
M12-H181N
M12-H101N
©2006 PLANTRONICS, INc.
Figure 1. Drop Test
100
90
P
P = Passed
P
P
P
P
P
80
70
Drops to failure
Boom rotation test
60
As figure 2 illustrates, the Plantronics DuoPro H181N-M12 and seven of eight Plantronics
50
Encore H101N-M12 models tested met the 40,000 cycles-to-failure standard outlined in the
40
boom rotation test. The GN8000-ADP II model—the model that failed the drop test—also met
30
Figure 1. Drop
the 40,000 rotation measure. However,
theTest
GN Netcom model that passed the droptest—the
20
100
GN8000-Profile—had two failures at the 20,000 mark and a third at just under27,000. In this
P
P
P
P
P
P
10
90
P = Passed
test,
a failure is defined
as a notable difference is the operation of the boom, as demonstrated
0
80 noise, static or intermittent function.
by
GN8000-Profile GN8000-ADP II
M12-H181N
M12-H101N
Drops to failure
70
Figure 2: Boom rotation
test. A failure is defined
as a notable difference in
the operation of the boom,
as demonstrated by noise,
static, or intermittent
function.
60
Figure 2. Boom Rotation Test
45000
50
40
40,000
30
P = Passed
P P
P
P P
P
P P P
P
P P
P
Cycles
35,000
20
10
30,000
0
25,000
GN8000-Profile
GN8000-ADP II
20,000
M12-H181N
M12-H101N
Figure 2. Boom Rotation Test
45000
15,000
40,000
10,000
P
P P
P
GN8000-Profile GN8000-ADP II
35,000
Cycles
P P
P = Passed
P P P
P
P P
M12-H181N
P
M12-H101N
30,000
Electrostatic discharge test
The ESD test measures the headset’s response to receiving an electrostatic shock. The
Figure 3. Electrostatic Discharge Test
20,000
25
European
Union standard, EN55024, requires headsets to be able to withstand at least
ten shocks, which is typically what a headset
will
in one
15,000
P
P receive
P
P year.
P
P
25,000
20
P = Passed
10,000
Discharges
Figure
3 illustrates the results of the ESD testing. The GN Netcom headset models failed
15 GN8000-Profile GN8000-ADP II
M12-H181N
M12-H101N
at 15 electrostatic shocks, while Plantronics headset continued to operate normally at 20
10
shocks,
a number simulating the number of shocks expected in a two-year period.
5
Figure 3. Electrostatic Discharge Test
25
Figure 3: Illustrates
the results of the
ESD testing.
0
GN8000-Profile GN8000-ADP II
P = Passed
Discharges
20
P
M12-H181N
P
P
M12-H101N
P
P
P
15
10
Figure 4. Thermal Shock Test
5
P
P
P
P
P
P
1
0
M12-H181N
M12-H101N
Cycles
GN8000-Profile
GN8000-ADP II
P = Passed
GN8000-Profile
Figure 4. Thermal Shock Test
GN8000-ADP II
M12-H181N
P
P
P
P
M12-H101N
P
P
1
4
PLANTRONICS
Cycles
P = Passed
©2006 PLANTRONICS, INc.
GN8000-Profile
GN8000-ADP II
M12-H181N
M12-H101N
15,000
10,000
GN8000-Profile GN8000-ADP II
M12-H101N
Figure 3. Electrostatic Discharge Test
25
20 Storage/Thermal
P = Passedshock
Discharges
M12-H181N
test
P
P
P
P
P
P
15
As noted previously, this test is designed to measure a headset’s ability to withstand the
extremes of temperature and humidity it may experience during shipment. (Therefore, as
10
product shipment generally occurs a limited number of times—and possibly only once—a
5 four-year-equivalency test design is not applicable here.)
0
The storage/thermal shock test measures a single shipment “cycle.” A cycle consists of four
stages:
First each
headsetIIis stored M12-H181N
for six hours at -20°F
and six hours at 150°F; then the
GN8000-Profile
GN8000-ADP
M12-H101N
headset is stored—twice—for two hours at -20°F and two hours at 150°F. Finally the headset
is stored for six hours at 90°F/90% humidity. In this test, failure is defined as the unit no longer
functioning for a simple user test.
Figure 4. Thermal Shock Test
P
P
P
P
P
P
1
P = Passed
Cycles
Figure 4: Neither of
the GN Netcom headsets passed a storage/
thermal shock cycle.
GN8000-Profile
GN8000-ADP II
M12-H181N
M12-H101N
Summary: your headset choice makes a difference
to your bottom line
The results of the above headset reliability tests conducted by Plantronics demonstrate clearly
that the cost of a headset is much more than its initial purchase price. When you calculate
the total cost of ownership over the life of a headset, the durability of Plantronics products
clearly illustrate that all headsets are not created equal—Plantronics headsets do not break as
often as the competition. Fewer failures allow agents to stay on task, increasing productivity.
Fewer failures also mean you need less inventory on hand to run your call center and less
time managing broken inventory, which lowers your total cost of ownership.
The following is a short list of categories where Plantronics headset durability can improve
cost of ownership measurements:
• Security stock—Fewer spare headsets on hand to run your center.
• Spare parts—Fewer accessories required to keep agents operational.
•
•
•
•
•
Storage—Less space required to store additional headsets and accessories.
Accumulated agent uptime—Fewer failures increases agent availability
and performance metrics.
Handling—Time and effort spent obtaining a replacement headset:
from collection, to storage, to purchase order routing through the organization, etc.
Shipping expenses—Cost to return the headset to the vendor for service.
Repair Charges—The cost to have the headset repaired.
Regardless of the size of a call center, these cost savings can make a substantial contribution
to trimming bottom line expenses.
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PLANTRONICS
©2006 PLANTRONICS, INc.
Appendix A
Appendix. Test 2: Cable Flex Test
500,000
P = Passed
Appendix. Test 2: CableNetcom
Flex Test performed comparably.
Results of the tests in which Plantronics/GN
500,000
400,000
P
P
P P
P = Passed
P
P
P
P
P
P P =PPassed
P
P
P
P
P
P
P
P
P
P
P
P
P
P
P
P
P
P
P
P
P
P
P
P
P
P
P
P
P
Flexs
Flexs
Flexs
Appendix. Test 2: Cable Flex Test
500,000
400,000
300,000
400,000
300,000
200,000
P
P
300,000
200,000
100,000
GN8000-Profile
GN8000-ADP II
M12-H181N
M12-H101N
GN8000-Profile
GN8000-ADP II
M12-H181N
M12-H101N
200,000
100,000
100,000
GN8000-Profile
250,000
250,000
200,000
GN8000-ADP II
M12-H181N
Appendix. Test 4: Headset/Handset Switch Cycling
M12-H101N
P = Passed
P
P
P
P = Passed
Appendix. Test 4: Headset/Handset Switch Cycling
P P P
P P P
P
P
P
Cycles
Cycles
Cycles
Appendix. Test 4: Headset/Handset Switch Cycling
250,000
200,000
150,000
200,000
150,000
100,000
P
P P =PPassed
P
P
P
P
P
P
P
P
P
P
P
P
P
P
P
P
P
P
P
P
P
150,000
100,000
50,000
GN8000-Profile
GN8000-ADP II
M12-H181N
M12-H101N
GN8000-Profile
GN8000-ADP II
M12-H181N
M12-H101N
GN8000-Profile
GN8000-ADP II
M12-H181N
M12-H101N
100,000
50,000
50,000
Appendix. Test 5: Volume Control Cycling
25,000
25,000
20,000
P = Passed
P
P
P
P = Passed
Appendix. Test 5: Volume Control Cycling
P P P
P P P
P
P
P
Cycles
Cycles
Cycles
Appendix. Test 5: Volume Control Cycling
25,000
20,000
15,000
20,000
15,000
10,000
P
P P =PPassed
P
P
P
P
P
P
P
P
P
P
P
P
P
P
P
P
P
P
P
P
P
15,000
10,000
5000
GN8000-Profile
GN8000-ADP II
M12-H181N
M12-H101N
GN8000-Profile
GN8000-ADP II
M12-H181N
M12-H101N
GN8000-Profile
GN8000-ADP II
M12-H181N
M12-H101N
10,000
5000
5000
Sound innovation for missions to the moon. And for everyday life on this planet, too.
In 1969, a Plantronics headset carried the historic first words from the moon: “That’s one small step
for man, one giant leap for mankind.” Today, we’re the headset of choice in mission-critical applications
such as air traffic control and 911 dispatch. This history of proven sound innovation is the basis for every
product we build—whether it’s for work, for home or on the go.
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PLANTRONICS
©2006 PLANTRONICS, INc.