idLUX
Application
idLUX is an high accurate color illuminator. It provides a 4 channel LED light source for application
specific wavelength (e.g. R/G/B/NIR). It can be used for flat field illumination or target projection.
Image sensor characterisation
Camera characterisation
Production
Optical Features
up to 4 different wavelength
intensity control for wavelengths
separately
internal spectrometer for light
measurement
FOV (field of view) can be varied
by configuration of optics.
Light Measurement
calibrated light measurement for DC
operation
Lux and µW/cm²
color temperature adjust (°K)
color measurement (CIE1931)
Mechanical Features
adaptable mechanical interface for
system integration
rechangeable LEDs, easy and fast
preliminary
Options
modulated light up to 25MHz.
2 additional channels for corner
illumination for detection of window
artefacts (contamination)
variable F# for detection of window
artefacts or contamination
pattern projection
automatic pattern chart changer
dedicated design for
handler or test cell integration (ATE)
www.aSpect-sys.com
February 2009
idLUX
Color Illumination
Software Overview
remote operation by RS232
stand alone control software
DLL for remote operation
Photometric Mode
Radiometric Mode
LabVIEW drivers
idVIEW turn key solution with
image acquisition and data
processsing
automatic sequencer available
preliminary
Hardware Overview
illumination head with changeable
LED array
4 channel power supply
certiefied optometer for calibration
spectrometer for intensity
monitoring
www.aSpect-sys.com
February 2009
idLUX
Typical Specifications
Area, uniformity and intensity condition
each other and can be optimized to fit
appplication specific requirements.
preliminary
(Intensities for DC operation)
www.aSpect-sys.com
February 2009
idLUX
preliminary
Color Calibration
automatic calibration routine
accredited calibration detector
compensation of non linearities
calibration in DC operation
www.aSpect-sys.com
February 2009
idLUX option
Dark Box
Application
Laboratory equipment
Low volume manual production
preliminary
Features
Light shielded cable through
Al base plate
Al stage for optics and holders
www.aSpect-sys.com
February 2009
idLUX option
Modulated light
Application
3D Cameras
VIS - IR
LED configuration
Application specific configuration and
combination.
e.g.:
- 2x NIR DC + 2x NIR AC
- RGB + 1x NIR AC
Typical IR-LED Specs: OSRAM SFH
4250, Peak = 850nm, Width = 35nm
RS232
idLUX Power
idLUX modula
RS232
Trig in
Trig out
µC
Modulation
Digital
I/O
Offset
Amplitude
Phase
shift
Filter
LVDS in
preliminary
Electrical specification
www.aSpect-sys.com
Modudulation type is sine wave
External input for LVDS signal
Programmable phase shift (0…360°
for 15-25MHz)
Phase shift in steps of 250ps
Programmable offset and gain
Optional: internal signal generation
February 2009
idLUX option
Window measurement (glass artefacts)
Application
Camera production
Optics assembly
Method 1: High F# and diffuse
programmable: high F# and diffuse light
optional automatic detection algorithm
detection size down to µm range (depending on
DUT)
Method 2: Corner Illumination
programmable
optional automatic detection algorithm
detection size down to µm range (depending on DUT)
artefacts detectable down to 2%of intensity decrease
preliminary
Raw image
www.aSpect-sys.com
Contamination Defects
Pixel Defects
February 2009
idLUX option
Integration (probe station, handler)
Application
Waver production test
Waver characterisation
Suss PA200 Illuminator
Rotation of Mikroscope tower enables direct illumination
Mechanical integration
Optional z-Lift
Probe card interface
Electrical integration
preliminary
Agilent 93000 Internal Illuminator
Temperature barrier and active air cooling
www.aSpect-sys.com
February 2009
idLUX option
Autofocus (SFR measurement)
Product
Test Integration
idLUX autofocus is a projection unit to test the
SFR (spatial frequency response), pixel defects
and noise of digital cameras.
production test
manual handling
automatic handling
Applications
mobile phone cameras
small footprint (700x300x300 mm³)
automotive cameras
medical cameras
adaptable mechanical interface for
system integration
machine vision cameras
mechanical unit for focus adjust
available
Measurements
Optic Features
SFR measurement according to ISO 12233
different zoom positions
sagital and meridional measurements
different working distances
application specific pattern available
up to 70 measurement fields
Uniform illumination
defect detection (pixel, cluster, blotch, line)
vignetting
Dark measurements
preliminary
Mechanical Features
leakage pixels
dark current
read noise, temp. noise
FPN
www.aSpect-sys.com
Software
LabVIEW drivers for remote control
idVIEW turn key solution with image
acquisition and data processsing
automatic sequencer available
API for implementation of application
specific libraries
API for device driver implementation
February 2009