www.spectralproducts.com
SPECTRAL
PRODUCTS
INTRODUCTION
111 Highland Drive, Putnam, CT 06260, USA (East Office)
2659A Pan American Freeway NE, Albuquerque, NM 87107, USA (West Office)
Technical Leader in
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SPECTRAL PRODUCTS 2015
INTRODUCTION
1972
2007
 Founded CVI Laser Corp in Albuquerque, NM to make high power laser
 Provided SPOES (Self Plasma Optical Emission Spectroscopy) systems to
coatings near Sandia and Los Alamos National Labs.
semiconductor industry (SAMSUNG, LG-Philips, Hynix)
1980
 Developed analyzing system for measuring the concentration of total N, total P,
 Won the US National Small Business of the Year Award.
and total K from livestock’s liquid type waste using IR spectrometers.
1987
 Began to provide NPK analyzers to the Rural Development Administration of S.
 Started CVI Instruments Division producing computer controlled
Korea and its national labs through KSP
monochromators (the first total microprocessor-controlled and direct drive
2009
scanning type).
 Developed high performance spectrometer systems f or in-situ measurement of
2000
LED characteristic on wafer stage and provided them to semiconductor industry
 Started Spectral Products division producing miniature spectrometers.
(SAMSUNG) through KSP
2003
2010
 Sold CVI Laser
 Developed the UV-VIS spectroscopic system for measuring maturity of liquid
 Continued Spectral Products in Putnam, CT & Albuquerque, NM
type fertilizer (livestock’ waste)
 Founded Korea Spectral Products (KSP) in Seoul, S. Korea
2011
2004
 Provided the liquid fertilizer maturity measurement systems to the Rural
 Developed OES systems for in-situ monitoring plasma deposition process
Development Administration of S. Korea and its national labs through KSP
control in semiconductor industry.
2012
2005
 Developed the SROES (Spatially Resolvable Optical Emission Spectrometer)
 Provided multi-channel OES systems to SAMSUNG Electronics production
and provided them to semiconductor industry (SAMSUNG) through KSP
lines (~800-1000 sets, ~2500-3000 spectrometers) through KSP.
2014
 Developing High-speed screening apparatus for a Raman analysis-based highspeed multiple drug with Korea Research Institute of Chemical Technology in S.
Korea through KSP
Technical Leader in
Spectroscopy World
SPECTRAL PRODUCTS 2015
INTRODUCTION
Semiconductor
LED & OLED
OES, EPD
Field Of Business
NIRS
Color
UV/VIS
Mid-IR
Raman
BT & NT
Environment
Technical Leader in
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NIST
Traceable Optical Alignment
& Calibration
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Manufacturing
& Quality Control
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Technical Leader in
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SPECTRAL PRODUCTS 2015
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Mechanical Design
and Optimization
Opto
Technical Leader in
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Electronics Design
for Sensor and
Optical System
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Technical Leader in
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Optical System Design and Simulation
Technical Leader in
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Measurement and Analysis Software
Technical Leader in
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SPECTRAL PRODUCTS 2015
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R&D of Optical Measurement System
Technical Leader in
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SPECTRAL PRODUCTS 2015
INTRODUCTION
SPEA™400A
Commercial and Applicable SPEA System in Real Production
Physical
Dimensions
248.5mm X 103.04mm X 86.5mm
Weight
3.2 Kg
& In-Situ Monitoring Plasma Uniformity Based OES & EPD
Optical Input system
Measurement Scanning range
Field Automatic SPEA System for Diagnosis
350mm ~ 4000mm
Spatial Resolution
20mm ~ 70mm @500mm
(Depends on Setup & Distance)
Wavelength Range
Max. 320~1050nm @ VIS
Max. 200~1050nm @ UV
Spatial Resolution by location
Power requirement
Source voltage
100 - 240V, 47 - 64Hz
Power consumption
Less than 50W
Environment condition
Temperature range
0℃ - 50℃
Maximum Humidity
<40℃ : ≤80%, >40℃ - 50℃ : ≤60%
Spatial Resolution
Technical Leader in
Spectroscopy World
SPECTRAL PRODUCTS 2015
INTRODUCTION
OES & EPD
In semiconductor manufacturing, spectrometers
are used for measuring the emission spectrum
from a plasma chamber in real time and for
diagnosis of manufacturing processes and analysis
of materials such as optical emission spectrometer
(OES) and end point detection (EPD).
Technical Leader in
Spectroscopy World
Colorimetry &
Photometry
As the LED, OLED and display business grows, it becomes
very important to measure and analyze the colorimetric and
photometric characteristics of them. Spectral Products have
been providing the measurement systems for analyzing the
colorimetric and photometric values of various samples. With
SP's spectrometers and some accessories, the optical
properties of various colors in the CIE color coordinates can be
achieved easily.
SPECTRAL PRODUCTS 2015
INTRODUCTION
Technical Leader in
Spectroscopy World
SPECTRAL PRODUCTS 2015
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Film Thickness
Measurement
Spectrometers are being used in the
manufacturing of semiconductor and display
devices, optical monitoring system of optical
coatings, and surface plasma resonance (SPR)
systems. Wide range of selections for our
spectrometers and monochromators makes it
possible to build spectroscopic ellipsometer
systems efficiently.
Technical Leader in
Spectroscopy World
SPECTRAL PRODUCTS 2015
INTRODUCTION
Raman
Spectroscopy
Fluorescence
The measurements of fluorescence,
phosphorescence, and opto-chemical
emission spectrum are required in
many applications like organic and
inorganic fluorescence property
studies, chemical property analysis,
and the research for the components
and their lifetimes of some gases.
Spectrometer systems are the
basic instruments for
measuring Raman scattering
in the chemical components
analysis, the researches for
the structure, stability and
biological properties of various
materials.
Technical Leader in
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SPECTRAL PRODUCTS 2015
INTRODUCTION
• No need for physical and/or chemical pre/post
treatment
• Can measure the total N, total P, and total K in
a couple minutes at the same time
SM301-FCM
• Compact and portable
[NPK Analyzer for liquid fertilizer]
Environment
• Measuring maturity of liquid type fertilizer
• Manufactured for the first time in the
world and can be industrial standard
• Can measure “ammonia” and “hydrogen
sulfide” in real time
LMQ2000
[Liquid Fertilizer Maturity measurement system]