Experience faster time to first fix with GPS LNAs Look at BGU7005, chapter 2.1 2. Focus applications & products NXP RF applications: http://www.nxp.com/rf 2.1 Get the fastest TTFF* with GPS LNA that use proven QUBiC4X SiGe:C NXP GPS LNA BGU7005 Manufactured in NXP’s breakthrough QUBiC4X SiGe:C process technology and available in the industry’s smallest package, this highly integrated GPS LNA reduces cost while delivering better sensitivity, greater immunity against jamming signals, and higher linearity. This LNA designed for GPS receiver applications, is produced in NXP’s industry-leading QUBiC4X process, a 0.25-µm SiGe:C technology. It has very low noise figures and superior linearity performance, so it helps to improve overall sensitivity, which in turn leads to faster Time-To-First-Fix (TTFF) and better tracking. The proven QUBiC4Xi process improves overall RF performance and means the LNAs are less expensive and offer higher, more flexible performance than their GaAs counterparts. Features Requires only 4 external components (including decoupling) to build complete GPS front-end. Small, 6-pin SOT886 leadless package (1.45 x 1.0 x 0.5 mm) Requires only one external matching component Low current consumption (5 mA) It restores sensitivity, provide greater immunity against outof-band cellular signals, reduce filtering requirements, and lower overall cost. It can be placed close to the GPS antenna, minimizing the noise figure. Additional gain amplifies the GPS signal and raises the on-board signal-to-jammer ratio. The GPS receiver can be put close to the primary phone antenna, for the best GSM/UMTS performance, while the GPS antenna can be placed far away. This improves antenna-to-antenna isolation and results in higher performance. Low noise figure (NF): 0.9 dB at 1.575 GHz High insertion power gain: 16 dB at 1.575 GHz Low current consumption in power-down mode (<1 μA) ESD protection on all pins Supply voltage: 1.5 to 2.85 V, optimized for 1.8 V The BGU7005 has an enable function. In power-down mode, it consumes less than 1 µA. Proven, robust QUBiC4X SiGe:C process technology (fT = 110 GHz) * TTFF = Time-To-First-Fix @ 1.575 GHz supply current insertion power gain noise figure input power at 1 dB gain compression Vcc Icc |s 21|2 NF PI(1dB) IP3i V mA dB dB dBm dBm supply voltage Type Package Min BGU7005 34 SOT886 1.5 Max 2.85 Typ Typ 5 NXP Semiconductors RF Manual 12th edition 16 Typ 0.9 Vcc = 1.8 V, Min Vcc = 1.8 V, Typ -14 -10 Vcc = 2.85 V, Min Vcc = 2.85 V, Typ -11 -8 input third-order intercept point f1 = 1713 MHz, f2 = 1851 MHz Vcc = 1.8 V, Min Vcc = 1.8 V, Typ 5 10 Vcc = 2.85 V, Min 5 Vcc = 2.85 V, Typ 12 2.3 NXP wideband LNA MMIC BGU7003 in SiGe:C process High-quality reception at high RF frequencies Manufactured in NXP’s latest SiGe:C process, this high-frequency RF MMIC delivers high-quality reception with extended battery life. It is a cost-effective, siliconbased alternative to GaAs devices, and offers higher integration and easier design-in than discrete bipolar transistors. The BGU7003 is designed for high-speed, low-noise mobile applications. In GPS units, for example, it delivers high-quality reception with maximum battery life. That means consumers always know where they are, and can receive continuous directions, between high rises and under heavy overcast skies. It also means having a GPS device that can run for days, instead of hours. The BGU7003 gets its outstanding performance from NXP’s innovative silicon-germanium-carbon (SiGe:C) BiCMOS process, called QUBiC4X. This groundbreaking process technology was designed specifically to meet the needs of real-life, high-frequency applications and delivers an unrivalled fusion of high power gain and excellent dynamic range. It combines the performance of gallium-arsenide (GaAs) technologies with the reliability of a silicon-based process. Features Low-noise, high-gain microwave MMIC Minimum noise figure is 0.8 dB at 1.575 GHz Maximum stable gain = 20 dB at 1.575 GHz 110-GHz fT-Silicon Germanium Carbon technology Optimized performance at low (5-mA) supply current ESD protection on all pins Extemely thin, leadless 6-pin SOT891 package The BGU7003 includes an integrated bias generator that simplifies the application and makes design-in easier. Biasing is done away from the RF input line, and the device offers the same full flexibility as the working range of the NXP BFU725F. The bias adapts over temperature to ensure the gain is well controlled. There is no matching on the die, and no limit to the application area. Benefits Integrated biasing and shutdown for easy integration Power-down mode consumes less than 1 μA Temperature-stabilized bias Applications GPS E-metering WLAN and CDMA wireless communication Satellite radio Analog/digital cordless applications (DECT) Microwave communications systems As the latest member of NXP’s growing SiGe:C portfolio, the BGU7003 joins the highly successful BFU725F device. It is available in a demo board that lets the designer evaluate noise figures, gain, input and output reflection coefficients, and reverse isolation. Symbol Parameter Conditions Typ Unit VCC supply voltage RF input AC coupled 2.5 V ICC supply current 3.3 5 mA Gp(max) maximum power gain VCC= 2.5 V;ICC= 5.0 mA; f = 1.575 GHz; Tamb=25 °C 19 dB NF noise figure VCC= 2.5 V;ICC= 5.0 mA; f = 1.575 GHz; S= opt 0.8 dB PL(1dB) output power at 1 dB gain compression VCC= 2.5 V;ICC= 15.0 mA; f = 1.575 GHz; Tamb=25 °C 8 dBm IP3O output third-orderintercept point VCC= 2.5 V;ICC= 15.0 mA; f = 1.575 GHz; Tamb=25 °C 18 dBm 36 NXP Semiconductors RF Manual 12th edition (1)
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