Gert Hohenwarter GateWave Northern Effect of ground return path on timing accuracy Company Logo June 8-11, 2008 San Diego, CA USA Objective • Review problem of ground path • Identification of trouble spots • Assessment of individual impact • Demonstrate significance • Summary June June 88 to to 11, 11, 2008 2008 IEEE IEEE SW SW Test Test Workshop Workshop 22 Approach • Examine complete signal path in a probecard • Develop models (FEA, SPICE) • Use models to evaluate impact of changes • Provide select measurement results to corroborate models June June 88 to to 11, 11, 2008 2008 IEEE IEEE SW SW Test Test Workshop Workshop 33 Problem • Signal in transmission line needs a return path • This path must be located physically close to the signal • Disruptions/detours add inductance and therefore delay June June 88 to to 11, 11, 2008 2008 IEEE IEEE SW SW Test Test Workshop Workshop 44 Probe card signal path June June 88 to to 11, 11, 2008 2008 IEEE IEEE SW SW Test Test Workshop Workshop 55 Probe card signal path • The signal path in the probecard begins at the perimeter with a tester connection and ends at the probe tip with a connection to the DUT Alongside the signal path a ground return must be provided June June 88 to to 11, 11, 2008 2008 IEEE IEEE SW SW Test Test Workshop Workshop 66 Follow the signal….. • Timing verification begins at the tester connection with a time domain reflectometer and a test probe….. June June 88 to to 11, 11, 2008 2008 IEEE IEEE SW SW Test Test Workshop Workshop 77 …through the probe….. • Common probes often have a fixed signal contact and movable connection at ground: June June 88 to to 11, 11, 2008 2008 IEEE IEEE SW SW Test Test Workshop Workshop 88 Consequences • Ground path inductance changes • Signal path capacitance changes June June 88 to to 11, 11, 2008 2008 IEEE IEEE SW SW Test Test Workshop Workshop 99 Consequences • • Ground path inductance changes Signal path capacitance changes • Delay changes FEA analysis SPICE model dT [ps] dL probe [nH] 2 dT [ps] 1 0 ‐1 ‐2 ‐3 60 50 40 30 20 10 0 0 ‐50 0 50 4 6 Lg [nH] Ang le June June 88 to to 11, 11, 2008 2008 2 IEEE IEEE SW SW Test Test Workshop Workshop 10 10 Verification • Measurement at actual probecard PCB • At first glance everything is fine…. Multiple TDR 1.2 1.0 0.8 0.6 0.4 0.2 0.0 -0.2 -0.4 -0.6 1.000 straight long inline short inline ortho 30 gnd2 gnd3 0.800 rho rho Multiple TDR 0.600 0.400 0.200 gnd4 0.000 0 1 2 3 t [ns] June June 88 to to 11, 11, 2008 2008 4 3 3.5 t [ns] IEEE IEEE SW SW Test Test Workshop Workshop 11 11 Delay extraction • When processing the data, differences become noticeable Delay variations Delay variations 2.0 8.0 0.0 6.0 -2.0 4.0 -4.0 dt [ps] 10.0 0.0 -6.0 -8.0 -10.0 -2.0 -12.0 -4.0 -14.0 meas 1 meas 2 meas 3 meas 4 meas 5 Measurement to measurement (probe straight) fa vo ra bl e gn d4 gn d3 gn d2 30 or th o Condition le as t -10.0 nl in e -8.0 sh or ti in lin e -6.0 lo ng dt [ps] 2.0 For different probe positions dT counter: -> dT = dT tot= 5 5 ps ps (average, not max. dT) June June 88 to to 11, 11, 2008 2008 IEEE IEEE SW SW Test Test Workshop Workshop 12 12 Follow the signal….. Ground via selection (only one ground via present for each case): dL for 0.5 mm pitch 0.4 dL [nH] • 0.3 0.2 0.1 0 near side side far Inductance difference for 0.5 mm pitch dT = dT tot= June June 88 to to 11, 11, 2008 2008 IEEE IEEE SW SW Test Test Workshop Workshop 3 8 ps ps 13 13 Follow the signal….. • The signal travels into the PCB through a connector and returns through an array of vias: Disorganized Organized dT = dT tot= June June 88 to to 11, 11, 2008 2008 IEEE IEEE SW SW Test Test Workshop Workshop 10 ps 18 ps 14 14 Follow the signal….. PCB via position (vias must be provided near level shifts): dT [ps] dT [ps] • 12 10 8 6 4 2 0 0 50 100 dy [mils] Inductance change as a function of lateral via position dT = dT tot= June June 88 to to 11, 11, 2008 2008 IEEE IEEE SW SW Test Test Workshop Workshop 5 ps 23 ps 15 15 Follow the signal….. • Ground planes are disrupted in LGA/interposer area Inductance per unit length changes If traces get close to via antipads, capacitance per unit length changes, too Example (inductance only): Uniform array of 1mm pitch vias Ground path inductance changes by 12% for a 40 mm long path dT = dT tot= June June 88 to to 11, 11, 2008 2008 IEEE IEEE SW SW Test Test Workshop Workshop 16 ps 39 ps 16 16 Follow the signal….. • Ground via positions in the interposer contact array Inductance [nH] 5 4 0.5 1 3 2 1.5 2 1 mm 0 1 2 # g nds 3 4 Inductance as a function of via distance from signal and number of ground vias dT = dT tot= June June 88 to to 11, 11, 2008 2008 IEEE IEEE SW SW Test Test Workshop Workshop 10 ps 49 ps 17 17 Follow the signal….. Delay change as a result of branch imbalance in ground path 150 dT [ps] 100 dT top 10k 50 dT bot 10k dT top 50 0 -50 dT bot 50 -100 -150 0 0.5 1 Lg [nH] 1.5 2 Different load conditions result in different delay changes dT = dT tot= June June 88 to to 11, 11, 2008 2008 IEEE IEEE SW SW Test Test Workshop Workshop 30 ps 79 ps 18 18 ….to the DUT Delay change as a result of grounding configuration at the DUT Dense ground With typical dimensions assumed the inductance difference for the two different configurations is 0.88 nH Sparse ground dT = dT tot= June June 88 to to 11, 11, 2008 2008 IEEE IEEE SW SW Test Test Workshop Workshop 5 ps 84 ps 19 19 Overall changes Graphic representation of relative change as a function of where change occurs Delay as a function of location Comment: os er rp vi os as er gp Sp ho ac le e s TR -S D pr R ob es /D U T Line length matching to within 20 mils results in an inaccuracy of 3.5 ps vi as s rp in te in te tra ce vi a TR po s vi a ea s Sum Individual m ps 90 80 70 60 50 40 30 20 10 0 June June 88 to to 11, 11, 2008 2008 IEEE IEEE SW SW Test Test Workshop Workshop 20 20 The impact of location Delay change as a result of inductance change at different locations along the signal path Approximate equivalent circuit of signal path June June 88 to to 11, 11, 2008 2008 IEEE IEEE SW SW Test Test Workshop Workshop 21 21 The impact of location Delay change as a result of inductance change at different locations along the signal path dT at different positions (50%) 50 1n 2n 3n dt [ps] 40 30 20 10 0 1 Signal at DUT (SPICE simulation) June June 88 to to 11, 11, 2008 2008 2 Pos # 3 4 Delay change IEEE IEEE SW SW Test Test Workshop Workshop 22 22 Waveform change Wave form changes as a result of inductance change dT at different positions (85%) 50 dt [ps] 0 -50 1n 2n 3n -100 -150 1 Signal at DUT (SPICE simulation) June June 88 to to 11, 11, 2008 2008 2 Pos # 3 4 Delay change IEEE IEEE SW SW Test Test Workshop Workshop 23 23 Different loads Delay change for 3 different cases (10kOhm 2pF, 150 Ohm 2pF, 50 Ohm) dT all loads (50%) 50.0 dt [ps] 40.0 30.0 20.0 10.0 0.0 1 2 Pos # 3 4 Load has additional impact on skew June June 88 to to 11, 11, 2008 2008 IEEE IEEE SW SW Test Test Workshop Workshop 24 24 Shared resources Delay change as a result of inductance change in case of split lines/ shared drivers Simplified equivalent circuit June June 88 to to 11, 11, 2008 2008 Signal change IEEE IEEE SW SW Test Test Workshop Workshop 25 25 Shared resources Delay change as a result of inductance change in case of split lines/ shared drivers Delay change at 85% level Delay change at 85% level (10kOhm/2pF load) June June 88 to to 11, 11, 2008 2008 IEEE IEEE SW SW Test Test Workshop Workshop 26 26 Summary • • • • • • Overview to problem of ground path provided Timing accuracy is sensitive to location of ground discontinuity Timing accuracy depends on architecture of signal delivery system Budgeting should be performed Compensation seems possible, if trends are known Other contributions to timing arise from line length matching, fabrication variances such as dielectric constant changes, coupled sections, transitions and other discontinuities on the signal itself and must be accounted for separately. These contributions have NOT been taken into account here, yet a significant skew has already accumulated ….. Thank you! June June 88 to to 11, 11, 2008 2008 IEEE IEEE SW SW Test Test Workshop Workshop 27 27
© Copyright 2026 Paperzz