Raw Data Measurement - JETI Technische Instrumente GmbH

Application Note 8
JETI Technische Instrumente GmbH
Tatzendpromenade 2
D - 07745 Jena
Germany
Tel.
: +49 3641 225 680
Fax
: +49 3641 225 681
e-mail : [email protected]
Internet: www.jeti.com
JETI SCPI commands – schematic and in examples
JETI´s instruments can be operated directly by the user via DLLs, VIs or with firmware commands.
The following paragraphs show how to use the firmware commands.
Scheme of possible command sequences
In general there exist three methods to get measuring results, which are shown in the following chart.
Method 1 distinguishes between the configuration of measuring parameters (CONFIGURE), the start
of measurement (INIT) and the data output (FETCH). In method 2 the configuration is also necessary,
but the measurement start is combined with the data output (READ). Method 3 combines all three
steps (MEASURE, only selected parameters and measuring conditions have to be configured before).
It is also possible to start with method 1, followed by method 3, using the already configured
parameters.
Afterwards it is possible to get (FETCH) other data already available, calculate new data
(CALCULATE) or start a new measurement. The following chart shows these possibilities.
Application Note 8 – JETI SCPI commands – schematic and in examples
The following charts show the several commands more in detail.
All specifications of the commands can be found in the command list (see operation manual).
CONFIGURE
2
Application Note 8 – JETI SCPI commands – schematic and in examples
FETCH
3
Application Note 8 – JETI SCPI commands – schematic and in examples
MEASURE
4
Application Note 8 – JETI SCPI commands – schematic and in examples
CALCULATE
5
Application Note 8 – JETI SCPI commands – schematic and in examples
6
Examples of program flows
Raw Data Measurement
Task:
Measurement with a fixed integration time of 100 ms
Execution of two measuring scans for averaging
Dark measurement with internal shutter closed
Light measurement with internal shutter opened
Output of reference spectrum (difference between light and dark spectra) as data row
with pixel wavelengths
*CONF:TINT 100 <CR>
*CONF:EXPO 2 <CR>
*CONF:FORM 7 <CR>
*CONF:AVER 2 <CR>
*CONF:FUNC 2 <CR>
*INIT <CR>
*CONF:FUNC 3 <CR>
*INIT <CR>
*FETCH:REFER <CR>
Task:
Measurement with integration time adaption
One measuring scan
Included dark measurement with internal shutter closed
Output of dark and light data in lines with space as separator
*CONF:EXPO 1 <CR>
*CONF:FORM 2 <CR>
*CONF:FUNC 1 <CR>
*READ <CR>
*CONF:FUNC 2 <CR>
*READ <CR>
Task:
// Set the integration time to 100 ms
// Set the exposure mode to use the
configured integration time
// Set the output format to raw data
with wavelengths
// Set the averaging to 2 scans
// Set the measuring function to dark
measurement
// Start the dark measurement
// Set the measuring function to
reference measurement
// Start the reference measurement
// Output of reference spectrum
// Set the exposure mode to
integration time adaption
// Set the output format to space
separated values
// Set the measuring function to light
measurement
// Start of light measurement and data
output
// Set the measuring function to dark
measurement
// Start of dark measurement and data
output
Measurement with fixed integration time
Dark measurement only before a light measurement sequence (dark compensation)
Measurement of reference and transmission data
Output of measured raw data in a selected wavelength range in steps of 10 nm
*CONF:TINT 500 <CR>
*CONF:EXPO 2
*CONF:DARKMODE 0 <CR>
*CONF:FUNC 3 <CR>
*MEAS:COMPDARK <CR>
*INIT <CR>
*CONF:FUNC 4 <CR>
*INIT <CR>
*CALC:LINT:TRANS 400 700 10
// Set the integration time to 500 ms
// Use the configured integration time
// Use the dark compensation method
// Set the measuring function to
reference
// Run the dark measurement in
advance (dark compensation method)
// Start a reference measurement
// Set the measuring function to
transmission
// Start the transmission measurement
// Output of linear interpolated data
between 400 and 700 nm in steps of
10 nm
Application Note 8 – JETI SCPI commands – schematic and in examples
7
Radiometric Data Measurement
Task:
Basic radiometric measurement
Adaption of integration time to lightning conditions
Output of basic values (radiometric, photometric and colorimetric values)
Output of measured radiometric spectrum
*CONF:EXPO 1 <CR>
*MEAS:ALLVA <CR>
*FETCH:SPRAD <CR>
Task:
Radiometric measurement
Adaption of integration time
Included dark measurement
Wavelength range 380 … 780 nm
Wavelength step 5 nm
Output of radiometric spectrum in wavelength/ value rows
Output of radiance in W/ sr m2 (if no measuring head is attached)
Output of chromaticity u´v´
*CONF:EXPO 1 <CR>
*CONF:FUNC 6 <CR>
*INIT <CR>
*FETCH:SPRAD <CR>
*FETCH:RADIO <CR>
*FETCH:CHROMUV <CR>
Task:
// Set the exposure mode to automatic
adaption of integration time
// Start a radiometric measurement
and data output
// Output of radiometric data
// Set the exposure mode to automatic
adaption of integration time
// Set the measuring function to
radiometric spectrum
// Start a measurement
// Output of radiometric spectrum in
default wavelength range and step
width
// Output of calculated radiance
// Output of u´v´
Radiometric measurement
Waiting time of 1 s after initination
Adaption of integration time between 80 % and 90 % of full scale
Output of spectral data in ASCII format (wavelength step 1 nm)
Output of radiance of full wavelength range and of selected wavelength range 720 …
760 nm
Output of CRI with a fixed reference color temperature of 2856K
*PARA:SDEL 1000 <CR>
*PARA:BORD 80 90 <CR>
*PARA:SAVE <CR>
*CONF:EXPO 1 <CR>
*CONF:FUNC 6 <CR>
*CONF:WSTP 1 <CR>
*READ <CR>
*FETCH:PHOTO <CR>
*CALC:PHOTO 720 760 <CR>
*CALC:CRI 2856 <CR>
// Set the delay time to 1 s
// Set the borders for the integration
time adaption
// Save the new parameters
// Set the exposure mode to adaption
of integration time
// Set the measuring function to
radiometric measurement
// Set the wavelength step to 1 nm
// Start a measurement and output of
radiometric spectrum
// Output of photometric value
// Calculation of photometric value in
selected wavelength range and data
output
// Calculation of CRI at specified CCT
and data output