MultiView 400™
Product
Presentation
Nanonics
MultiView 400™
MultiView 400™
Product
Presentation
MultiView 400 ™ Complete System
MultiView 400™
Product
Presentation
Modes of Operation
SPM modes:
• AFM contact
• AFM Intermittent
contact mode
• STM
•Electrical Measurements
Far Field Methods:
• Standard Microscope Imaging
• Fluorescence
• Confocal
MultiView 400™
Easy Integration with Optical Microscopes
Product
Presentation
Dual - Upright /Inverted
Optical Microscope
MultiView 400™
MultiView 400 ™ fits any Optical Microscope
Product
Presentation
Olympus
Inverted
Zeiss Dual
Olympus
Dual
Zeiss Upright
MultiView 400™
Product
Presentation
Normal Force Feedback
• Standard AFM and cantilevered glass probes
• Easy to use - standard beam-bounce feedback
• All standard AFM imaging modes available
• Free optical axis above and below
MultiView 400™
Standard NSOM/SPM Technology
Product
Presentation
Cylindrical
Piezo
Probe
is not
Optical, microRaman or Electron/Ion Beam Friendly
neither from the top nor bottom
MultiView 400™
The MultiView 400 ™ Technology
Product
Presentation
Flat
Scanner
Probe
is
Optical, microRaman or Electron/Ion Beam Friendly
from the top and the bottom
MultiView 400™
Product
Presentation
Nanonics 3D-Flatscan™
• Only 7 mm thick
• 70 mm X-Y-Z scan range
• Central opening providing clear optical axis
• Inertial motion positioning of sample (6 mm)
MultiView 400™
Product
Presentation
Nanonics 3D-Flatscan™
with Closed Loop Sensors
Nanonics 3D-Flatscan ™ with
X-Y closed loop sensors
• Capacitive displacement sensors
• Precise positioning and scanning
• Additional Z-sensor available
• Central opening providing clear optical axis
• Inertial motion positioning of sample (6 mm)
MultiView 400™
Product
Presentation
Magnetic tip placement
• Easy & repeatable magnetic tip mounting
• Easy magnetic attachment of the mount
to the scan head
• Large selection of specialized tips
• Non-magnet holders available