Supplementary Material Reducing Conduction Losses In High Energy Density Polymer Using Nanocomposites Yash Thakur1, Meng H. Lean2, Q.M. Zhang1* 1 School of Electrical Engineering and Computer Science, Materials Research Institute, The Pennsylvania State University, University Park, PA 16802, USA 2 QEDone LLC, 4174 Marston Lane, Santa Clara, CA 95054, USA *Contact authors: [email protected] Figure S1. Dielectric data of neat THV as a function of temperature. Multiscale Modeling Multiscale simulations involve both continuum 1D and particle 3D models and use empirical data together with consistent sets of parameters adjusted for the appropriate dimensional treatments to predict results suited for comparison with measurement and for cross-validation with each other. Continuum Model (a) Anode (b) Computational Cell for Particle Simulation Anode โ๐ = THV+Al2O3 ๐ฝ๐ด โ๐ก ๐ Anode Film ๐๐๐๐ก๐๐๐๐ ๐ ๐๐๐ ๐ค๐๐๐๐ : ๏ถ๏ฆ/๏ถ๐ = 0 Dielectric Fluid Cathode Amorphous polymer Cathode โ๐ = ๐ฝ๐ด โ๐ก ๐ Cathode Figure S2: Simulation geometry for: (a) 1D continuum model; (b) 3D particle model. A. 1D Continuum Model The drift-diffusion equations are used to simulate bipolar charge transport resulting in the creation of a robust and rapid hybrid time-dependent algorithm. More details on the continuum 1D simulation model, including axisymmetric versions for divergent field configurations with gaseous voids and charge packet formation are available in the literature.1โ3 This comprehensive, selfconsistent, simulation method is used for the continuum solution through the nanocomposite THV film shown in Figure S2(a) assuming an effective permittivity from the Lichtenecker logarithmic rule:4 ๐๐ ๏ฅ = ๏ฆ๐ ๐๐ ๐๐ + (1 โ ๏ฆ๐ ) ๐๐ ๐๐ (S1) where ฮตf and ฮตb are, respectively, the permittivities of the filler and polymer binder, and ๏ฆf is the volume fraction of inorganic filler. Measured I-V data, setup geometry, and measurement conditions such as Voltage-time diagrams are used to infer J-E curves as input with mobility derived from Hopping Conduction parameters extracted from the empirical fit. Direct Tunneling injected charges migrate with hopping mobility and undergo bulk charge trapping/de-trapping, and trap-assisted Shockley-Read-Hall species recombination. A 4th order total variation diminishing Runge-Kutta (TVD-RK4) method with upwind differencing is used to integrate the current continuity and rate equations for trapping, de-trapping, and recombination. The drift-diffusion, charge conservation, and current continuity equations are given by: ๐n = ฯโ ฮผn ๐ โ Dn โ๏ฒ๏ญ (S2) ๐p = ฯ+ ฮผp ๐ + Dp โ๏ฒ+ ๏ถ๏ฒโ = โ๏ท๐n + Un ๏ถt (S3) ๏ถ๏ฒ+ = โโ๏ท๐p + Up ๏ถt โ๏ท(๏ฅโ๏ฆ) = โ(๏ฒ+ + ๏ฒโ + ๏ฒi ) (S4) where ๏ฒ+ and ๏ฒ๏ญ are the positive and mobile negative charge densities, Up and Un are the recombination rates, ๏ญp and ๏ญn are the positive and negative hopping charge mobilities derived from measurement, Dp and Dn are the positive and negative charge diffusion coefficients, ๏ฒi is the intrinsic impurity charge density, ๏ฅ (=๏ฅo๏ฅr) is the permittivity, and the other notations have the usual meanings. The mobility and diffusion coefficients are related by the Einstein equation at equilibrium: Dn ๏ญn = kB T q = Dp ฮผp (S5) with kB (=1.38065x10๏ญ23 m2kg/s2K) as the Boltzmann constant, T the absolute temperature, and q the Coulomb charge. This set of equations is similar to those used in conventional semiconductor device modeling where a suitable choice of variables include the natural set: ๏ฆ, p, and n with the latter two being, respectively, the positive and negative charge number densities. Using a Gummellike method, the drift-diffusion equations are decoupled and solved sequentially.5 ๐ท=3 1 2 3 ๐โ1 ๐ฌ ๐+2 P E E P: Induced polarization Figure S3: Illustration of mobile charge interaction with dielectric fillers and meandering through interspaces. B. 3D Particle Model In the 3D particle model shown in Figure S2(b), spherical Al2O3 nanofillers are randomly dispersed in the THV binder. More details on the particle model are available in the literature.6โ8 The classical electrical double layer (EDL) representation is modified for the filler by substitution of a dipolar core where the induced polarization is aligned with the bias electric field as shown in Figure S3. Charge motion through the dielectric nanofillers follow a logic where incoming charge is repelled by the end of the dipole with similar polarity and attracted towards the opposite polarity end and vice-versa. Initial charge is assumed to attach on impact forming the bound Stern-Helmholtz layer. Sequential incoming charges are repelled to form the diffuse outer Gouy-Chapman transport layer. Cumulative charge buildup on opposing ends of the dipole contributes to the Maxwell-WagnerSillars (MWS) polarization. The interaction zone is created by gradual charge deposition and formation of the diffuse layers as charge migrates while undergoing bulk charge trapping/detrapping, and recombination with Monte Carlo selection through the polymer film. Conduction paths are formed due to overlap of the diffuse double layers by increase in nanoparticle loading within the dielectric composite. Charges that make it through the film to the counter-electrode have trajectories that are curvilinear paths which meander through the interspaces. Arriving charges at the counter-electrode are neutralized and therefore only contribute to the conduction of the film, but not to the field. The electrodynamic simulation of 3D charge particle migration through the nanocomposite film involves the time-dependent integration of the two following equations of motion: ๐๐ ๐ ๐๐ก = ๐๐ฌ (S6) ๐๐ ๐๐ก =๐ (S7) where m and q are the mass and the charge of the particle, v is its velocity and E is the electric field at the particle location. The equations above are followed in time as they evolve in velocity and position (phase space) to determine the trajectory of each particle in an ensemble. The driving term in (S6) is the Coulomb force on the particle with contributions to the E field from point and dipolar charge, and applied bias. Due to the short acceleration time and small mean free path, implementation of (S6) and (S7) is typically simplified by assuming that charges migrate with a drift velocity, v=๏ญE, where ๏ญ is the hopping mobility in the polymer inferred from fits to measurement. At each time interval, a two-step field solve-particle push procedure solves the Poisson equation for charge conservation and integrates the equations of motion for particle simulation in the computational cell. A random distribution of nanofillers is dispersed within the cell to the prescribed wt% loading using โhard sphereโ logic; i.e. allowing contact but no over-lap. Using this 3D particle-in-cell (PIC) model, charge particle-particle interactions and particlenanofiller attachments are tracked from injection through the amorphous polymer and nanocomposite layers until arrival at the counter-electrodes. A self-consistent particle-particle, particle-mesh (P3M) scheme may be implemented for very large numbers of particles.9โ11 The computational cell used for the nano-scale simulations is comprised of sandwiched layers of 500 nm thick nanocomposite between two 250 nm thick amorphous polymer layers. The cuboid of linear dimension 1 ๏ญm is bounded by 4 vertical zero flux condition (๏ถ๏ฆ/๏ถn = 0) side walls, and top (anode) and bottom (cathode) electrodes at assigned potentials to maintain E field bias. Following the empirical J-E curves, discrete numbers of charge particles are continuously injected from the electrodes during each time-step from injection locations that are randomly dispersed over the electrode surface. Periodic boundary conditions are imposed on the 4 vertical walls to force exiting particles to re-enter at the opposite side walls. C. Field Solution with the BIEM A source distribution technique (SDT) based on physically intuitive charge species is used to solve the inhomogeneous Poisson equation with the boundary integral equation method (BIEM) and the free space Green function. Instead of deriving a custom geometry and material dependent Green function, an equivalent problem is solved where conducting and insulating boundaries and material interfaces are represented by free and bound charge distributions of unknown magnitude that collectively satisfy all local and far-field boundary conditions. Fields and potentials are defined by superposing integral contributions from all these source types and their distributions. Once the charge distributions are ascertained, field parameters are evaluated by superposition of the integral contributions from all sources. A Green function method is used where G, the free space Green function, is the fundamental solution to a point charge, or Dirac delta, ๏ค: ๏2G = โ ๏ค(r ๏ญ rโ) (S8) The solution to the Poisson equation given by ๏2๏ฆ = โ ๏ฒ/๏ฅ (S9) in 1D is the free space Green function: (bโx)(xโa) (bโa) ; (๐ โค x < x โฒ ) G[x๏ผx โฒ ] = {(xโฒ โa)(bโx) (bโa) (S10) ; (xโฒ < x โค b) where x โ [a, b] denotes the observer, a and b are the edges of the layer, and xโ is the source location or distribution. The E field is derived from the potential by: E = โ ๏๏ฆ (S11) with potential, ๏ฆ, given by: (bโx) ๐ฅ (bโx) (xโa) ๐ (xโa) ๏ฆ(x) = (bโa) โซ๐ (x โฒ โ a)f(x โฒ )dxโฒ + (bโa) ๏ฆ(a) + (bโa) โซ๐ฅ (b โ x โฒ )f(x โฒ )dxโฒ + (bโa) ๏ฆ(b) (S12) where f(xโ) are the trapped and mobile bipolar charge distributions. The normal derivative is given by: d๏ฆ(x) dx 1 ๐ฅ ๏ฆ(a) 1 ๐ ๏ฆ(b) = โ (bโa) โซ๐ (x โฒ โ a)f(xโฒ)dxโฒ โ (bโa) + (bโa) โซ๐ฅ (b โ x โฒ )f(x โฒ )dxโฒ + (bโa) (S13) which allow computation of the E field within the layer by integration of the analytically differentiable kernels. The integrals in (S12) and (S13) are evaluated using numerical integration by mapping Gauss-Jacobi quadrature into the two partial integrals.12 For the 3D particle model, the composite field due to the bias voltage, space charge, and polarization charge is given by: ๐ฌ = ๐ฌ๐๐๐๐ + ๐ฌ๐ + ๐ฌ๐๐๐๐๐๐ (S14) where the second and third terms are due, respectively, to point charges and filler polarization. For small to moderate particle counts, n, fields from the space charge are computed from superposing or summing the point source solutions for all particles considered: 1 1 0 0 ๐ฌ๐ = โ โซ๐ โฒ โ๐บ ๐ ๐(๐ฃ โฒ ) ๐๐โฒ๏ป โ โ๐๐=1 โ๐บ ๐ ๐๐ (S15) with G=1/4๏ฐ๏ผr-rโ๏ผ as the 3D Green function fundamental solution to a point charge as shown in (S8). The polarization, P, from sphere-shaped dielectric materials in a dielectric medium is: ๏ฅโ1 ๐ท = 3 ๏ฅ+2 ๐ฌ (S16) where ๏ฅ is the ratio of the permittivity of the sphere to the polymer matrix, and (๏ฅ๏ญ1)/(๏ฅ+2) is the Clausius-Mossotti factor which vanishes when the material and medium permittivities are identical. The material dipole moment is given by: ๐= ๏ฅโ1 4 ๐๐3 ๐ท = 4๐ ๏ฅ+2 ๐3 ๐ฌ 3 (S17) and the corresponding dipole field is: ๐ฌ๐๐๐๐๐๐ = ๏ญ 1 4๏ฐ๐0 ( 3(๐๏ท๐)๐โ๐ ๐3 ) (S18) where r is the distance of evaluation, a is the nanofiller radius, and (S18) is evaluated at the centroids and summed over all nanofillers. Ebias arises from the free charge, ๏ณ, distributed on the electrodes and bound charge on the zero flux side walls. The expressions for potential and normal derivatives are given by: ๏ฆ(๐) = โซ๐โฒ ๐บ ๐๏ฆ(๐ ) ๐๐ ฯ(๐,๐ โฒ) ๐0 ๐๐บ ฯ(๐ โฒ) = {โซ๐โฒ ๐๐ ๐0 1 1 ๐โ๐๐ 0 0 ๏ฝ๐โ๐๐ ๏ฝ ๐๐ โฒ + โ๐๐=1 ๐บ ๐ ๐๐ + โ๐ ๐=1 ๐บ ๐ ๐๐ โ ๐๐ โฒ โ ฯ(๐ ) ๐๐บ 1 ๐๐บ 1 2๐0 0 0 (S19) 3 } + โ๐๐=1 ๐๐ ๐ ๐๐ + โ๐ ๐=1 ๐๐ ๐ ๐๐ โ ๐โ๐๐ ๏ฝ๐โ๐๐ ๏ฝ 3 (S20) Enforcement of boundary conditions for potential and flux result in integral equations for Dirichlet and Neumann conditions, respectively, which are then solved simultaneously. These equations incorporate superposition of contributions from sources that include: free charge on electrodes; bound charge on vertical walls; trapped charge on nanofillers; and mobile and trapped volume space charge, ๏ฒ. The collocation method is used to discretize these equations resulting in a matrix that is inverted to determine the magnitude of the free and bound source distributions. Kernel functions, including the Green function and its analytic derivatives (G, ๏ถG/๏ถn, and ๏G), are integrated numerically using Gauss-Legendre quadrature.12 Singular kernels are accurately computed using minimum order sampling by tying the quadrature weight function to the singularity. Details on the computation of these integrals are discussed in detail for axisymmetric and 2D geometries.8,13 Large portions of the discretized matrices may be saved and reused in matrix algebra for rapid computation of the sources, or independent variable, ๏ณ.13 With A as electrode area, and empirical J-E, finite numbers of positive and negative charge particles, ๏n, are injected at each time-step, ๏t, from randomized locations on the surface of the cathode and the anode into the respective adjacent polymer according to: โ๐ = ๐ฝ๐ด ๐ โ๐ก (S21) For large numbers of particles, n, and spatially varying distributions, a โscatter-gatherโ method may be implemented to scatter the space charge, ๏ฒ, to qi on the vertices of the inscribed volume mesh using, for example, trilinear interpolation: ๐= โ8๐=1 ๐ผ๐ ๐๐ ๐ (S22) where ๏กi are the trilinear interpolation functions and V is the mesh volume. This particle-mesh scheme facilitates integration by gathering the contributions from the vertices, i, of all volume meshes, j: 1 1 0 0 ๐ฌ = โซ๐ โฒ โ๐บ๐(๐ฃ โฒ ) ๐ ๐๐ โฒ โ โ๐๐=1 โ8๐=1 โ๐บ ๐ ๐ผ๐ ๐๐ (S23) to compute the E field at the ๏ฒ position. This method requires only nk (<<n2) calculations for a mesh of size k<<n. Following (S22), the current density, J, can be similarly expressed as: ๐ฑ= โ๐ ๐ผ๐ ๐๐ ๐๐ ๐ (S24) with vi (=๏ญE) as the drift velocity. Contributions of these volume sources to the E-field are evaluated as the algebraic summations of the field from each volume mesh as shown in (S23). D. Time Integration Strategy A total variation diminishing version of the 4th order Runge-Kutta scheme that guarantees convergence is used to integrate the current continuity and recombination equations for the continuum model.14 The upwind scheme which has guaranteed stability is implemented for spatial differencing.15 The TVD-RK4 scheme is also used for bulk trapping/de-trapping. To illustrate, the 1st order upwind scheme for ๏ถu/๏ถt + a๏ถu/๏ถx=0 is given by: (un+1 โ uni ) (uni โ uniโ1 ) i +a = 0 for a > 0 โt โx (S25) (un+1 โ uni ) (uni+1 โ un ) i +a = 0 for a < 0 โt โx where a is the velocity, u is the independent variable, subscript i refers to spatial grid index, and superscript n refers to iteration time level. The TVD-RK4 advances temporal integration as: u(1) = un + โt L(un ) (S26) with u(1) as the first of the 4th order terms, and du/dt = L(u), where L is an operator.16 The total variation (TV) is given by: ๏ถu TV = โซ |๏ถx | dx โ โ|ui+1 โ ui | (S27) which integrates the incremental change ๏ผ๏ถu/๏ถx๏ผ over the entire range of x, and is a property that ensures that TV(un+1) ๏ฃ TV(un). The TVD scheme prevents spurious oscillations in the solution by preserving monotonicity, enabling sharper shock predictions on coarse grids thereby saving computation time. The continuum algorithm proceeds through: (1) bipolar current injection; (2) solve Poisson equation with the BIEM; (3) temporal integration of continuity and recombination equations using TVD-RK4 and upwind scheme; (4) compute changes in bulk trapping/de-trapping; and (5) update charge arrays and return to (1). To minimize local error, mesh size, ๏h < LD, the Debye length, where LD = โ๏ฅk B Tโq2 Ni , and Ni is the largest charge number density. The time step, ๏t < ๏ด, the dielectric relaxation time, where ๏ด=๏ฅ/qNi๏ญ, characteristic of charge fluctuations to decay. The stability criterion of the explicit algorithm is given by the Courant-Friedrichs-Levy (CFL) limit, c: vโt c = | โh | โค 1 (S28) representing the ratio of mobile charge velocity, ๏ฎ, to mesh velocity, ๏h/๏t, where for stability, the mesh velocity cannot be faster than the charge speed.17 For the particle model, the two differential equations given by (S6) and (S7) are solved numerically using a predictor-corrector method of order ๏t2, or 2nd order accurate in time. The dependent variable, x, is iteratively improved at each time level. To start at time level n, the set (xn-1, xn) is assumed to be known. Then, the predictor-corrector equations are: Predictor: ๐๐ = ๏ญ ๐ฌ๐ ๐๐+1 = ๐๐โ1 + 2โ๐ก ๐๐ 1 ๐๐โ1โฒ = ๐๐ + (๐๐+1 โ ๐๐โ1 ) 4 Corrector: (S29) ๐๐+1 = ๏ญ๐ฌ๐+1 1 ๐๐+1 = ๐๐โ1โฒ + ๏๐ก ๐๐+1 2 Update: ๐๐โ1 = ๐๐ ๐๐ = ๐๐+1 The initial location for the (n-1) iteration level is improved in the predictor stage, and used in the corrector stage to obtain the updated location for the next time level. The tacit assumptions are: the field is โfrozen-inโ relative to the time step of charge migration, and the transient time to attain terminal velocity is much shorter than the mean free path or the time between collision events of oppositely charged particles Charge Transport and Interactions Bipolar charge transport incurs trapping/de-trapping and recombination. A. Charge Attachment/Detachment Trapping and de-trapping of space charge in polymeric materials are related to the microstructure and morphology of the materials. Charge trapping takes place at a hopping site that requires energy substantially greater than the average energy to release charge carriers. Trapping mechanisms include: physical defects such as dangling bonds which lead to shallow traps; โselfโ traps due to field modification which alters the length of the polymer chain and their potential well; and chemical defects or impurities which result in deep traps. De-trapping mechanisms may be: photon-assisted by illumination; phonon-assisted through lattice vibration; impact ionization; and tunneling, with the latter two occurring at high fields. For the continuum model, bulk trapping and de-trapping of bipolar mobile charge are given by: ๏ฒt+ ๏ถฯt+ + + = k+ ฯ (1 โ ) โ k+ t d ฯt ๏ถt ๏ฒโ (S30) ๏ฒtโ ๏ถฯtโ โ โ โ = k t ฯ (1 โ ) โ k โ d ฯt ๏ถt ๏ฒโ where the density of trapping states is given by ๏ฒ๏ฅ, and kt is the trapping rate: kt = J(t)๏ก q (S31) with ๏ข as the trapping cross-section. The de-trapping rate is given by: k d = Nc ๏ฎth ๏ข eโEa /kB T (S32) where Nc is the effective density of states in the LUMO, vth is the thermal velocity, and Ea is the trap depth. The trapping and de-trapping time constants are the inverse of the rate coefficients. For the particle model, attached charge on nanofiller surfaces are considered to be trapped charge. In this modified EDL model, initial charge is assumed to attach on impact, or probability Pt(t)=1. Subsequent drop-off has Pt(t)๏ 0 as the limiting behavior due to Coulomb force and dipole field repulsion from build-up of the attached charge following the MWS effect. Charge detachment is physically controlled by comparing the local field to the trap depth used in the de-trapping rate, kd, in (S32). Bulk trapping is implicitly assumed in the use of the Hopping Conduction mobility. B. Recombination In the continuum model charge recombination is trap-assisted, analogous to the Shockley-ReedHall (SRH) model, involving four possible combinations of positive and negative mobile and trapped charge. The recombination equations are given by: Up = S2 ๏ฒ+ ๏ฒtโ + S3 ๏ฒ+ ๏ฒโ (S33) Un = S1 ๏ฒโ ๏ฒ+ + S 3 ๏ฒโ ๏ฒ+ t where S1, S2, and S3 are recombination coefficients for mobile negative charge and trapped positive charge, mobile positive charge and trapped negative charge, and mobile positive and negative charge, respectively. For the particle model, Monte Carlo collision is used to describe particle-particle events between oppositely charged entities resulting in recombination. The probability of collision of the ith charge particle with an opposite polarity particle in a time step ๏t is given by: ๐๐ = 1 โ ๐ โ๐0 ๏บ(๐ธ๐ )๐ฃ๐ โ๐ก (S34) where n0 is the number density of the opposite polarity mobile charge, ๏บ(Ei) is the total collision cross-section which in general depends on the kinetic energy of the ith particle (and could be larger than the geometrical cross-section given by ๏บ = ๐(๐๐ + ๐๐ )2 ), and vi is the relative velocity of this particle to the opposite polarity particle. Physically, no๏บ represents the number of collisions per unit length, 1/no๏บ is the mean free path between collisions, and no๏บvi is the collision frequency. The probability of a collision within a finite ๏t, is determined by comparing Pi with Ri๏[0,1], a uniformly generated random number. 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