Application Note SC-XRD 51 Complete characterization of a series of MOF structures using a X8 PROSPECTOR Introductions Metal Organic Framework (MOF) structures are well known for their many interesting applications, such as gas storage and separation, chemical sensing, and catalysis [1]. The same structural features that allow for such excellent chemical properties [2] cause difficulty in characterization by crystallographic methods. Owing to the highly porous nature of MOFs, crystalline samples tend to lose solvent rapidly, degrading the quality of diffraction. Additionally, a high degree of disorder over long ranges frustrates single crystal structure determination efforts. In assessing the suitability of a certain MOF system for various applications, it is necessary not only to elucidate the structural features via single-crystal diffraction, but also to confirm the purity of the bulk sample by comparative PXRD techniques. In order to completely characterize difficult MOF samples, our lab has investigated the complementary techniques of single crystal and powder diffraction utilizing only a CuKα IμS Kappa geometry diffractometer, equipped with QUAZAR MX optics and an APEX II detector, the X8 PROSPECTOR. X8 PROSPECTOR diffraction system Single Crystal Structure Determination Single crystals of two new, highly porous MOF structures (NU-108-Cu and NU-108-Zn, (Figure 1) were grown via literature methods [3]. Individual crystals were mounted in oil in the cold stream (225K) of the CuKα IμS equipped X8 PROSPECTOR diffractometer. Crystals were on the order of 200-300 μm in their largest dimensions. The highly porous nature of these materials resulted in very weak diffraction intensities, which could only be observed to approximately 1.5-1.0 Å resolution, necessitating the use of our QUAZAR MX optics equipped microfocus source. Each structure exhibits a non-catenated framework: a 3,24 network rht-topology for NU-108-Cu (Figure 2), and a new 3,3,6 network for NU-108-Zn (Figure 3). The rht-topology of NU-108-Cu forms three porous cages ranging in size from 1.9-2.8nm, resulting in a total void space of over 87% of the structure volume (Figure 4). The new topology exhibited in the Zn structure yields three distinct channels, the largest of which with a size of 1.0 × 1.1nm2. This results in a total void space of nearly 80% of the structure volume (Figure 5). Figure 1: Single crystals of NU-108-Cu (A) and NU-108-Zn (B), and the organic strut ligand (center). Figure adapted from [3]. Figure 2: Packing diagrams of NU-108-Cu showing A) the cage structure around one ligand and B) the long-range packing of the MOF. Figure adapted from [3]. Figure 4: The various pores (large purple spheres) in NU-108-Cu. Figure adapted from [3]. Figure 3: Structural diagram of NU-108-Zn showing A) the atoms of the metal nodes, B) a polyhedral view of the node, and C) the arrangement around on ligand. Figure adapted from [3]. Figure 5: Packing diagram perpendicular (A) and parallel (B) to the channels in NU-108-Zn. Figure adapted from [3]. Powder Diffraction on a X8 PROSPECTOR To determine the purity of the bulk syntheses of NU-108-Cu, and –Zn, it is necessary to employ Powder X-Ray Diffraction techniques. Single crystals of the NU-108 MOFs will decompose rapidly when pulled from the mother liquor. Consequently, it is imperative to perform the PXRD data collections in capillaries with crystals suspended in solvent. The QUAZAR MX optics equipped on the X8 PROSPECTOR produce a small high-flux X-Ray beam which in turn yields narrow peaks in the PXRD scan which can be resolved and matched to known unit cells and predicted patterns, or indexed using TOPAS. Samples are loaded into borosilicate glass capillaries with a Figure 6: Some MOF samples loaded in borosilicate capillaries under solvent. Figure 7: A representative powder pattern taken on the X8 PROSPECTOR. PXRD pattern from NU-108-Cu (A) and -Zn (B) minimal amount of mother liquor. Capillaries are sealed with wax and mounted on the X8 PROSPECTOR at room temperature. Data are collected as rotation frames over 180° in φ at 2θ values of 12°, 24°, 36°, and 48° and exposed for 10 minutes for each frame. At a distance of 150 mm, the APEX II detector area covers 24° in 2θ. Overlapping sections of data are matched and the resulting pattern integrated using the Bruker APEX2 Phase ID program. Powder pattern data were treated for Figure 8: PXRD patterns for NU-108-Cu (A) and –Zn (B) generated from amorphous background scatter using EVA for visual the X8 PROSPECTOR (red) compared to calculated patterns based on comparison to simulated patterns. Unit cell indexing can the single crystal XRD structures (black). Figure adapted from [3]. be carried out with TOPAS by allowing for a background PXRD pattern from NU-108-Zn correction during the calculation. Figure 9: An indexed PXRD pattern from NU-108-Zn (solid blue trace) showing the indexed peak positions (blue lines) and their deviation from refined values (red lines). Conclusion The X8 PROSPECTOR diffraction system provides an excellent combination of a high intensity CuKα IμS microfocus source with the sensitive APEX II detector for the efficient characterization of Metal Organic Framework (MOF) structures. Structures that could previously only be elucidated at synchrotron facilities or using high powered rotating anode X-ray generators can now be reliably determined in the home lab using low maintenance diffraction systems. The X8 PROSPECTORS experimental flexibility and the APEX2 software also allow for powder diffraction experiments on the same diffractometer for confirming the purity of the bulk sample. [1] (a)Murray, L. J.; Dinca, M.; Long, J. R. Chem. Soc. Rev. 2009, 38, 1294-1314. (b) Li, J.-R.; Kuppler, R. J.; Zhou, H.-C. Chem. Soc. Rev. 2009, 38, 1477-1504. (c) Allendorf, M. D.; Bauer, C. A.; Bhakta, R. K.; Houk, R. J. T. Chem. Soc. Rev. 2009, 38, 1330-1352; (d) Kreno, L. E.; Hupp, J. T.; Van Duyne, R. P. Anal. Chem. 2010, 82, 8042-8046. (e) Lee, J.-Y.; Farha, O. K.; Roberts, J.; Scheidt, K. A.; Nguyen, S. T.; Hupp, J. T. Chem. Soc. Rev. 2009, 38, 1450-1459; (f) Ma, L.; Abney, C.; Lin, W. Chem. Soc. Rev. 2009, 38, 1248-1256. [2] (a) Ferey, G. Chem. Soc. Rev. 2008, 37, 191-214; (b) Tranchemontagne, D. J.; Mendoz-Cortes, J. L.; O’Keeffe, M.; Yaghi, O. M. Chem. Soc. Rev. 2009, 38, 1257-1283. [3] Eryazici, I.; Farha, O.K.; Hauser, B.G.; Yazaydın, A.Ö.; Sarjeant, A.A.; Nguyen, S.T.; and Hupp, J.T. Cryst. Growth Des. 2012, 12, 1075–1080; Dr. Amy Sarjeant, Senior Research Associate, X-Ray Crystallography, Department of Chemistry, Northwestern University. www.bruker.com Bruker AXS GmbH Karlsruhe, Germany Phone+49 721-50997-0 Fax +49 721-50997-5654 [email protected] Bruker AXS Inc. Madison, WI, USA Phone+1 800 234-XRAY Phone+1 608 276-3000 Fax +1 608 276-3006 [email protected] Bruker AXS is continually improving its products and reserves the right to change specifications without notice. Order No. DOC-A86-EXS0051. © 2012 Bruker AXS Inc. References
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