UMS UNIQUE SPACE SOLUTION
A complete selection of catalogue Class S products
For many years, UMS has served the needs of the
international space community by offering an
extensive selection of space evaluated processes:
• Low Noise PHEMT (PH25, PH15)
• Power MESFET (HP07)
• Power PHEMT (PPH25X, PPH15, ...)
• Power HBT (HB20S, HB20P)
• Analog & Digital HBT (HB20M)
• Schottky Diode (BES)
UMS is now pleased to extend this offer with the introduction of Hi-Rel MMIC products
for space use. The new Class S space product selection is certified and qualified as Flight Model
according to ESA specifications and MIL-PRF-38534.
CND2047
CHS5100
CHP6013
CHX2089
LNA
MPA
HPA
VVA
Misc.
Non-Exhaustive List of Available Products for Space Applications
CHT4016
CHA2294
CHT4690
CHT4694
CHT3091
CHA7012
CHA7215/CHA7115
CHA3666
CHA3023
CHA3063
CHA2066
CHA3801
10-20GHz
CHA3093
CHA3689
CHA2190
CHA2090
CHA2063
DC-10GHz
CHA2098
CHA2069
CHA2095
CHA2092
20-30GHz
CHA2194
CHA2394
30-40GHz
CHA2157
40-65GHz
Complete datasheets and additional information on Class S products are available at:
www.ums-gaas.com
Contact us:
UMS SAS France,
91401 Orsay - FRANCE
Ph: +33 1 69 33 02 26
e-mail: [email protected]
UMS USA Inc.,
Lowell, MA 01851 - USA
Ph: +1 978 905 3162
e-mail: [email protected]
UMS (Asia - Pacific),
Shanghai 200040 - PR China
Ph: +86 21 6103 1703
e-mail: [email protected]
Worldwide Distributor: Richardson Electronics - www.rell.com
Hi-Rel Space Qualification Flow
UMS is offering catalogue products, ASIC’s and Foundry for
space use. The Class S space products are qualified for Flight
Model and processed on ESA evaluated technologies.
Discrete Die Lot Qualification based on ESA/SCC 9010 and MIL-PRF-38534, Table C-II
WAFER ACCEPTANCE TEST
TEST
TEST CONDITIONS
TESTED SAMPLES
100% DC & RF testing
As per data sheet or detail specification
100%
Visual inspection
MIL-STD-883 Method 2010, Cond.A
100%
Wire bond evaluation
MIL-STD-883 Method 2011
(1 failure allowed)
Die shear test
MIL-STD-883 Method 2019
(0 failure allowed)
SEM
MIL-STD-883 Method 2018
4
20
5
LOT ACCEPTANCE TEST
TEST
TEST CONDITIONS
TESTED SAMPLES
Device mounting
Sampling for element evaluation
12
Internal visual inspection
MIL-STD-883 Method 2010, Cond.A
12
Temperature cycling (note 1)
MIL-STD-883 Method 1010, Cond.C
12
Initial electrical test
As per data sheet or detail specification
12
Burn in
240H @ Tj=175°C (or Ta max=125°C), DC biased
12
Post burn in electrical test
As per data sheet or detail specification
12
Steady-state life
1000H @ Tj=175°C (or Tamax=125°C), DC biased
10
Final electrical test
As per data sheet or detail specification
(0 failure allowed)
Note 1: performed when the element evaluation can be packaged.
All UMS products can be ordered with the generic extension S.
For example: • CHA2066-99S space grade
• CHA2066-99F commercial grade
10