Visual Field Digest Teaching Kit Chapter 7 HAAG-STREIT AG Teaching Kit Copyright The Visual Field Digest Teaching Kit includes all figures and illustrations from the Visual Field Digest. They can be used for non-commercial presentations free of charge. Haag-Streit AG allows the use of this figures for personal or academic use under the conditions that (i) it is used without commercial purpose and (ii) the content is reproduced exactly as the original by mentioning Haag-Streit AG, Switzerland as the owner of the copyright. Non-academic, non-personal or commercial users might only use this figures in whole or in part after a written authorization by the copyright holder. “Haag-Streit”, “900” and “Octopus” are either registered trademarks or trademarks of Haag-Streit Holding AG. The following are either registered trademarks or trademarks of Carl Zeiss Meditec: “Guided Progression Analysis”, “GPA”, “Humphrey”, “HFA”, “SITA”, “SITA Fast”, “SITA Standard”, “Visual Field Index”, and “VFI”. Copyright © 2016 HAAG-STREIT AG Fig. 7-1: Relationship among different visual field representations Fig. 7-2: Values representations display display sensitivity thresholds Fig. 7-3: Values Fig. 7-4: Grayscale (Values) Fig. 7-5: Comparison representation display deviations from the normal visual field Fig. 7-6: Comparison Fig. 7-7: Grayscale (Comparison) Fig. 7-8: Inverse relationship between values and comparison representations Fig. 7-9: Distribution of sensitivity thresholds of the normal population Fig. 7-10: Probabilities Fig. 7-11: Defect curve Fig. 7-12: Cluster analysis displays ten cluster mean defects Fig. 7-13: Cluster analysis Fig. 7-14: Design of polar analysis Fig. 7-15: Polar analysis Fig. 7-16: Corrected comparison and its relationship with other corrected representations Fig. 7-17: Corrected comparison Fig. 7-18: Corrected probabilities Fig. 7-19: Corrected cluster analysis Fig. 7-20: Square root of loss variance (sLV) Fig. 7-21: False positive (FP) answers Fig. 7-22: False negative (FN) answers Table 7-1: Global indices available for OCTOPUS perimeters Table 7-2: Reliability indices available on OCTOPUS perimeters Box 7A: Defect curve Box 7B-1: Design of cluster analysis Box 7B-2: Cluster analysis for different test patterns Box 7C: Diffuse defect (DD) Box 7D: Local defect (LD)
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