XIS Meeting 2004Mar16
FMS0 Door Open Failure
& AE/TCE0 TCE Card Problem
K. Hayashida, Osaka University
FMS0 Door Open Failure on Feb27
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Nominal Door Open Sequence
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Actuator current Start
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Current =0.35-0.37A/+29V
Door open
M-SW Off / Current stop / LED on
Actuator shrink
M-SW on / LED off
Door Open Time
2min-3min at RT
4min at -20degC
6min at -40degC
9min at -70degC
2004/2/27 FMS0
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Installed in Vacuum Chamber / LN2 Cooling started
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Accutuator 18degC / BNT Pressure Sensor 0degC
175sec after the Actuator current start, LED on for 2-3sec
At the time of LED on, the chamber pressure increased by one
order of magnitude, indicating the Door at least partly opened.
No X-rays detected even when CCD= -60degC !
Warm up/Leak … Door was closed !!
FMS0 Installed in the chamber
FMS0 Door Closed!
Upward
XIS-BNT GSE
FMS0 Door Opened
Door
Open
Mechanism
Side View (View from the inside BNT)
Top View
Actuator
Lod
Latch
M-SW
Door Completely
Close (O-ring
compressed)
Ball-baring on the Door
Door Half Close
(O-ring not
compressed)
Door Open !
M-SW off
/current off
/LED on
Post Failure Test
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De-installed from the Chamber
Manually move the latch to open the Door
Door Open test in the Air at RT using GSE + actuator; no
problem Door Open Time 165sec
Various Inspections and Measurements
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Scratch on the Latch surface to which M-SW contacts
Stroke between the Door Open Position to M-SW off position
~0.58mm
Margin of the Latch part to the Bonnet Housing; That should not
make inversion of Door Open and M-SW off
M-SW stroke
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Free(off) position to On position :0.32mm
On position to the most compressed position: 0.06mm
On position to off position: 0.14mm
By touching the M-SW lever, the M-SW was easily on/off.
NOT YET RESOLVED
FMS0 Door Opened
Scratch on FMS0 Latch
M-SW (FMS1)
Scratch on FMS1 Latch
Possibilities
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Actuator and/or GSE problem
Actuator worked properly but door did not open (O-ring
stick to the body; The springs are too weak etc)
Latch part problem
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M-SW problem
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Various margins of the Latch/Door are short to reproduce the
inversion Door Open and M-SW off timing.
Strokes of M-SW of FMS0 BNT is systematically different from
other BNTs.
*) FMS0 failure occurred at cooling down phase BNT
temperature of 0degC 19degC. Test at such low
temperature has not yet been done.
Schedule
FMS0 bonnet was disconnected from the
FMS0 base on Mar1. FMspare Bonnet wa
s connected to FMS0 base on Mar6.
 FMS0 bonnet is now inspected in detail at
NTS.
 Other bonnets in Osaka/Kyoto were
inspected by NTS people (Mar12-13).
 Re-adujstement and/or replacement of MSW is considered.
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AE/TCE0 TCE Card Trouble (Mar10)
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FMS0 Test with AE/TCE0
EGSE-software on Sun-WS and QL started 11:57
PSU-on 12:11 PSU voltage/currents were nominal
AE/TCE Reset (pulse) 12:18
Hk_all 12:18
Hk_routine 12:19
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Temp Set=30.76degC/SCL=0.0% … could not set into TCE CR
AE/TCE Reset (pulse) 12:21
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Strange HK from TCE card / Timeout for CR read to TCE card.
CR / HK values from other cards were nominal.
The situation did not change.
AE/TCE Reset (pulse) 12:34
PSU-off 12:36
*)No problems in Mar9 experiment with the same configuration. No
problems in Mar11 test of AE/TCE0 with dummy CCD and dummy
TEC
Strange HK / Timeout CR
in capture log
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The strange HK values of the TCE card is like
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T_READ_HK T_HK_CHAN0 (0x310000) => 0xc8fc (SC Bus Voltage=56.056 Volts)
T_READ_HK T_HK_CHAN1 (0x310100) => 0xcd4f (SC GND=9.900 Volts)
T_READ_HK T_HK_CHAN2 (0x310200) => 0xd182 (TCE +12 Volts=31.301 Volts)
T_READ_HK T_HK_CHAN3 (0x310300) => 0xd590 (TCE +5 Volts=10.956 Volts)
T_READ_HK T_HK_CHAN4 (0x310400) => 0xd98b (TCE TEC Voltage=11.466 Volts)
T_READ_HK T_HK_CHAN5 (0x310500) => 0xdd5e (TCE +24 Volts=35.855 Volts)
T_READ_HK T_HK_CHAN6 (0x310600) => 0xe11a (TCE GND=12.433 Volts)
T_READ_HK T_HK_CHAN7 (0x310700) => 0xe4b8 (TCE Temp=6173.000 Deg(C))
The timeout of the CR values of TCE card is as follows
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T_READ_CR T_CR_CHAN0 (0x210000) => 0x0000 (Operating Mode=0) (READ GENERATED
NO RESPONSE)
T_READ_CR T_CR_CHAN1 (0x210100) => 0x0000 (CCD Temp=-257.790 deg(C)) (READ
GENERATED NO RESPONSE)
T_READ_CR T_CR_CHAN2 (0x210200) => 0x0000 (HeatSink Temp=-255.770 deg(C)) (READ
GENERATED NO RESPONSE)
T_READ_CR T_CR_CHAN4 (0x210400) => 0x0000 (CCD Temp Set Point 1.714T + 177.26 (T
is desired setpoint in degrees C)=0) (READ GENERATED NO RESPONSE)
T_READ_CR T_CR_CHAN5 (0x210500) => 0x0000 (Current Soft Limit 1.27P (P is desired
percentage of max current=0)(READ GENERATED NO RESPONSE)
Points to be considered
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What is the cause of this “rare” failure ? PSU-on
procedure problem? TCE card trouble ? Command
decoder trouble in Control Card ?
Shouldn’t “AE/TCE reset” initialize the AE/TCE status to
its “reset” state? There might be two or more states for
the reset ? Cf. High/Low states in +5V current reported
by Tsuru-san.
In the SC operation
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The XIS PSU is almost always on. We have to turn off all the XIS
system, if this event occur ?
*) The DE forces the AE/TCE reset line assert when the
DE is off or in initializing state. We can assert the reset
line when we turn on the PSU in the ground operation.
TCE Card Replacement Schedule
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Mar 20 Current (Old) TCE Card test
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AE/TCE01 with dummy CCD + dummy TEC test (1.5hr / one
AE/TCE ? ) @Osaka
AE/TCE23 (+BNT GSE?) Kyoto-> Osaka, the same test for
AE/TCE23
Mar21 AE/TCE01 Card replacement and Test ?
Mar22 AE/TCE23 Card replacement and Test ?
Mar23 Sumo; Setup XIS-EU sensor to the chamber
Mar24 XIS-EU cooling down/TEC performance
Test/55Fe Data at -90degC Heatsink Temp <-45degC
Mar25 Spare
Mar26 MIT members leave Japan
Mar29 – FM-Sensors cooling test @Osaka/Kyoto