Estimation and Validation of Mechanical Properties of Single Crystal Silicon by Atomic- Level Numerical Model Chun-Te Lin, Chan-Yen Chou, and Kuo Ning Chiang Advanced Microsystem Packaging and Nano-Mechanics Research Laboratory Department of Power Mechanical Engineering, National Tsing Hua University 101, Sec. 2, Kuang-Fu Rd., HsinChu Taiwan 300 [email protected] Abstract In this research, an atomistic-continuum mechanics (ACM) conjunction of the finite element method (FEM) is applied to investigate the elastic constant of the nanoscale single crystal silicon in different crystallography planes of (100), (110), and (111) under uniaxial tensile and vibration loading. The ACM transfers an originally discrete atomic structure into an equilibrium continuum model by atomistic-continuum transfer elements. The mean positions of each atom of the metallic elements can be treated as the positions which achieve the minimum total energy. All interatomic forces, which are described by the empirical potential function, can be transferred into atomic springs to form the lattice structure. The spring network models were also widely utilized in finite element method based nanostructure studies [1-3]. The ACM model simplifies the complexities of interaction forces among atoms, while the calculation accuracy can be remained with affordable computational time. Based on the atomistic-continuum mechanics, a series of atomic level tensile testing and modal analysis are conducted to estimate the mechanical properties of single crystal silicon, and the results are validated with bulk properties with good agreements. Introduction Single crystal silicon (SCS) is one of the most common structure materials used in microelectro- mechanical and nanoelectromechanical systems (MEMS/NEMS). Rapid development in the file of MEMS/NEMS, particularly in the design of mechanical devices, requires an accurate value of the mechanical properties include Young’s modulus, Poisson’s ratio, tensile strength and so on. Tests of MEMS materials have been carried out for evaluating their mechanical properties, such as the tensile tests [4,5], bending tests [6]. However, the material properties have been estimated only on a micrometer to millimeter scale structure because of difficulties in fabrication of a nanoscale test specimens and problems associated with measuring ultrasmall physical phenomena in an experiment. An alternate method, such as simulation techniques, would be used to investigate the nature of deformation and the material properties of nanoscale devices. The atomistic-continuum mechanics (ACM) [1] conjunction of the classic finite element method (FEM) is proposed herein to explore the mechanical properties of nanoscale single crystal silicon (SCS) under uniaxial tensile and vibrational loading condition. Mechanical properties such as the Young’s modulus and Poisson’s ratio are evaluated from the ACM simulation and compared with the experiment data. Different from the molecular dynamics (MD) simulation, the ACM considered the minimization of the total potential energy to analyze and simulate the mechanical behaviors of the nanoscale structure. Compared with MD simulation, The ACM can be very efficient and it can provide results quickly in an accurate range. Theory of Atomistic-Continuum Mechanics Figure1 shows that the schematic of the atomistic- continuum mechanics (ACM) conjunction of the classic finite element method. This figure represents a simple model for a crystal where an orderly array of spheres represents the atoms linked one-with-other by nonlinear spring elements to represent the interatomic bonds (interatomic force). Moving one atom aside from its equilibrium position implies stretching/compressing or attractive/repulsive behavior. The ACM considered the minimization of the total potential energy. The total potential energy of an elastic body Π is defined as: Π = U-W (1) where U is the strain energy and W is the energy of the external loads, respectively. The minimization of total potential energy with respect to the nodal displacement {D} requires that: ∂Π =0 ∂{D} (2) Atom Nonliner spring Fig.1 Schematic of ACM. Fig.2 Single crystal silicon structure and Boundary conditions. Interatomic Potential for Silicon The single crystal silicon structure can be represented as two interpenetrating face-centered cubic (FCC) lattices with one displaced (1/4 1/4 1/4) crystal lattice with respect to the other, as shown in Fig. 2. The chemical bonding forces considered for the interaction between the silicon atoms in this investigation are a general form of Stillinger-Weber potential function [7]. The Stillinger-Weber potential is a combination of two-body and three-body potentials, f2 and f3. The two-body potential describes the formation of a chemical bond stretching between two atoms while the three-body potential represents the angle formation between two bonds. The two-body potential is described as a Lennard-Jones potential form as shown in eq. (3): ( ) [ ] ⎧A Br -p - r -q exp (r - a )-1 , r < a f 2 (r) = ⎨ 0, r ≥ a ⎩ (3) Note that f2(r) is a function of the rescaled bond length r only, and it vanishes without discontinuities at r=a. this function 1/6 1/6 exhibits a minimum which equals to -1 at r=2 , (i.e. the ideal bond length is given by R0=2 σ). Here the distance a sets the range of potential, B is adjusted so that the minimum potential occurs at desired value, and A is set so that the value of f2(r) at the potential minimum is -1. The three-body potential f3 which describes the interaction of atoms i, j, and k is given by: f 3 (ri , rj , rk ) = h (rij , rik ,θ jik ) + h (rji , rjk ,θijk ) + h (rki , rkj ,θikj ) (4) Originally, the parameters of the Stillinger-Weber potential function were fitting to the simulation results including the total energy and the lattice constant from experimental data. The energy and the distance units are deduced from the observed atomic energy and lattice constant at 0 K in the silicon diamond structure: σ=0.20951 nm. The parameters A, B, p, q, a, λ and γ are constant used in the Stillinger-Weber potential function for single crystal silicon (see Table1 for detail) [7]. Table1: Parameters used in the Stillinger-Weber potential function for silicon [7] Parameter Parameter A 7.049556277 a 1.8 B 0.602224558 λ 21 p 4 γ 1.2 q 0 SCS Atomistic-Continuum Mechanics Models The ACM method transfers the interatomic potential function into a force-displacement curve so as to create an equivalent atomistic-continuum transfer element. Afterward, the equivalent nano-scaled model could be analyzed by FEM. According to the theory of ACM simulation described above, the nonlinear spring elements replace the covalent bond s (interatomic forces) between two atoms while the silicon atoms were described as the node position. Moreover, in order to describe the two-body and three-body interaction completely in ACM simulation, two kinds of nonlinear spring elements of different behaviors were applied to represent the chemical bonding interactions. One illustrates the stretching motion, and the other defines the bond angle behavior between the two atoms and two covalent bonds, i.e., the spring constant was derived from second order derivative of the two-body and three-body terms of the Stillinger-Weber potential. The stretch motion between the two atoms is defined by Eq. (3), and the configuration of stretch mechanisms is shown in Fig. 3. Similarly, the formation of the angle motion of the two covalent bonds is defined by Eq. (4), and it is shown in Fig. 4. 2.5 Interatomic energy of three-body 6 4 2 0 -0.02 0.00 -2 -4 -6 Interatomic force of two-body (nN) -0.04 0.02 0.04 0.06 0.08 0.10 0.12 0.14 Elongation (nm) 2.0 109.50 1.5 1.0 0.5 0.0 0 20 40 60 80 100 120 140 160 180 200 Angle (Degree) Fig.3 The mechanisms of stretch motion between two silicon atoms Fig. 4 The mechanisms of angle motion between two silicon covalent bonds In this research, a straight spring element is applied to equivalent the in-plane angle motion based on the small deformation assumption. Therefore, the rotational movement was transformed into translational motion. The geometry arrangement of transformation is shown in Fig. 5. According to the law of cosine, this transformation is given by: L2 = 2r12 - 2r22 cos(θ ) (5) where L is the length of equivalent spring which corresponds to angle θ, the r1 and r2 represent the bond length, and θ is the angle between the two bonds. According to small deformation assumption, Eq. (5) can be rewritten with r1 = r2 = r as shown in Eq. (6): cos(θ ) = 1 - L2 2r 2 (6) Fig.5 The geometry arrangement of transformation from angle motion to stretch motion According to the above-mentioned transformation, the original single lattice crystal silicon structure in Fig. 2 was reconstructed to the new model which has two kinds of nonlinear spring element in ACM simulation. Tensile Test for SCS Structure by ACM Models ® In this research, the SCS structure was built by the commercial finite element code (ANSYS ). Half symmetry models of the (100), (110) and (111) crystallographic planes are established. The SCS model composes of two parts, one is the two-body spring element characterization, and the other is the three-body spring element description. Besides, the tensile prescribed displacement loading ε is applied as shown in Fig.6, and the Young’s modulus Et of the SCS structure could be estimated by the following equation: Et = σ Ftotal = ε A ⋅ε (7) where Ftotal is the total reaction force, ε represents the applied tensile strain loading, and A represents the equivalent area in the ACM model. Fig.6 Schematic of the model used in the ACM simulations of uniaxial tensile testing of SCS structure (a=5.43Å: Lattice constant) Modal Analysis for SCS Structure by ACM Models Following, the modal analysis for SCS structure is accomplished to validate the results of tensile loading test. Through modal analysis, the elastic modulus of single crystal silicon is calculated by first mode resonant frequency. The SCS structure is built as a cantilever beam with fixed end, and let mass element joint into the position of silicon atom (atomic mass of silicon is 4.665*10-26 kg). Fig. 7 shows the ACM model and the boundary condition of the SCS structure. After the resonant frequency is obtained, the Young’s modulus E of this structure could be calculated by the following equation from the Euler-Bernoulli beam theory as shown in eq. (8). Notably, the atomic level modal analysis differs from those simulations of continuum structure. We could estimate the Young’s modulus of the nano cantilever beam by the input of two-body and three-body potentials rather than the simulations of continuum models which input the Young’s modulus from experimental data. ⎡ 2π f 1 ⎤ 12 ρL ⎢ (1.875)2 ⎥⎦ ⎣ E= t2 2 4 (8) where ρ is the density, L represents the length, and f1 represents the first resonant frequency of the SCS structure. Fig.7 The ACM model and boundary condition of the SCS structure modal analysis Results and Discussions Figure8 shows the simulation results and table2 lists the simulated elastic modulus from both tensile test and modal analysis and then compared with those values in the literature measured for bulk silicon [8]. It could be observed that the estimated elastic modulus of SCS along the (100), (110), and (111) planes are in agreement with the values reported in the literature based on macro- and micro-scale experimental work. There are two reasons why the Young’s modulus of the simulation method agreed with the experiment data. First, the single crystal silicon was defect free material as well as the structure constructed in the ACM model. Therefore, the silicon material reveal identical behaviors whether in the simulation method or in experimental testing. Second, the parameters of the Stillinger-Weber potential function were reliable, since the parameters were fitted and deduced from the experimental data of bulk material and quantum mechanics calculation. Furthermore, the simulation results of resonant frequency analysis also agree with the analytical solution of resonant frequency based on the Euler-Bernoulli beam theory. Through these results, one could reduce the complexity of the real bulk silicon and an agreement between the predicted elastic modulus and the corresponding bulk value is achieved. (b) (a) Fig.8 (a) Displacement distribution of tensile static testing. (b) First mode shape in modal analysis. Table2. Calculation results comparison. The bulk value are obtained from Sato et al. [8] Crystallography planes Tensile testing results (GPa) Modal analysis results (GPa) Bulk Value (GPa) Plane (100) 121.8 128.7 125 Plane (110) 153 154.7 140 Plane (111) 174.6 179.8 180 In this research, a novel atomistic-continuum mechanics (ACM) conjunction of the finite element method (FEM) has been proposed to investigate the mechanical properties of a nanoscale single crystal silicon in the different crystallography planes of (100), (110), and (111) under uniaxial tensile and vibration loading. One thing should be noted that the same simulation model is applied in both tensile testing and modal analysis and then the Young’s modulus of the nano SCS structure is estimated in reasonable range compared with bulk values. According to the methodology of ACM, one could conduct a systematic approach, which does not involve any parameter fitting, to estimate mechanical properties of nano structures by an appropriate potential energy. References [1] K. N. Chiang, C. Y. Chou, and C. J. Wu, and C. A. Yuan, “Prediction of The Bulk Elastic Constant of Metals Using AtomicLevel Single-Lattice Analytical Method” Appl. Phys. Lett. 88, 171904, 2006. [2] K. N. Chiang, C. H. Chang and C. T. Peng, “Local-Strain Effects in Si/SiGe/Si Islands on Oxide” Appl. Phys. Lett, 87, 191901, 2005. [3] Andrei A. Gusev, ”Finite Element Mapping for Spring Network Representations of the Mechanics of Solids” Phys. Rev. Lett. 93, 034302, 2004. [4] K. Sato, T. Yoshioka, T. Ando, M. Ahilida and T. Kawabata, ” Tensile testing of silicon film having different crystallographic orientation carrier out on a silicon chip” Sen. Actu. A 70 (1998), p. 148. [5] T. Yi, L. Lu, and C. J. Kim, “Microscale material testing of single crystalline silicon: process effects on surface morphology and tensile strength” Sen. Actu. A 83 (2000), p. 172. [6] C. J. Wilson, A. Oremggi, and M. Narbutovskih, “Fracture testing of bulk silicon microcantilever beams subjected to a side load” J. Appl. Phys. 79 (1996), p. 2386. [7] F. H. Stillinger, and T. A. Weber, “Computer simulation of local order in condensed phases of silicon” Phys. Rev. B 31 (1985), p.5262. [8] K. Sato, T. Yoshioka, T. Ando, M. Ahilida, and T. Kawabata, ”Tensile testing of silicon film having different crystallographic orientation carrier out on a silicon chip,” Sensor & Actuator A, vol. 70, pp. 148-152, 1998.
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