445
Part C
Nonconta
Part C Noncontact Methods
18 Basics of Optics
Gary Cloud, East Lansing, USA
24 Holography
Ryszard J. Pryputniewicz, Worcester, USA
19 Digital Image Processing for Optical
Metrology
Wolfgang Osten, Stuttgart, Germany
25 Photoelasticity
Krishnamurthi Ramesh, Chennai, India
20 Digital Image Correlation for Shape
and Deformation Measurements
Michael A. Sutton, Columbia, USA
26 Thermoelastic Stress Analysis
Richard J. Greene, Sheffield, UK
Eann A. Patterson, East Lansing, USA
Robert E. Rowlands, Madison, USA
21 Geometric Moiré
Bongtae Han, College Park, USA
Daniel Post, Blacksburg, USA
27 Photoacoustic Characterization of Materials
Sridhar Krishnaswamy, Evanston, USA
22 Moiré Interferometry
Daniel Post, Blacksburg, USA
Bongtae Han, College Park, USA
28 X-Ray Stress Analysis
Jonathan D. Almer, Argonne, USA
Robert A. Winholtz, Columbia, USA
23 Speckle Methods
Yimin Gan, Kassel, Germany
Wolfgang Steinchen (deceased)