XXVII
List of Abbreviations
A
AASHTO
ABS
ACES
AC
AFM
AFNOR
AISC
ALT
AREA
ASTM
Association of State Highway
Transportation Officials
American Bureau of Shipping
analytical, computational, and
experimental solution
alternating current
atomic force microscopy
Association Française de National
American Institute of Steel Construction
accelerated lift testing
American Railway Engineering
Association
American Society for Testing and
Materials
B
bcc
BGA
BHN
BIL
BSI
BS
BrUTS
body-centered cubic
ball grid array
Brinell hardness number
boundary, initial, and loading
British Standards Institute
beam-splitter
bromoundecyltrichlorosilane
C
CAD
CAE
CAM
CAR
CBGA
CCD
CCS
CDC
CD
CGS
CHS
CMC
CMM
CMOS
CMP
CMTD
CNC
CNT
COD
COI
CP
computer-aided design
computer-aided engineering
computer-aided manufacturing
collision avoidance radar
ceramic ball grid array
charge-coupled device
camera coordinate system
Centers for Disease Control
compact disc
coherent gradient sensing
coefficient of hygroscopic swelling
ceramic matrix composite
coordinate measuring machine
complementary
metal–oxide-semiconductor
chemical–mechanical polishing
composite materials technical division
computer numerical control
carbon nanotube
crack opening displacement
crack opening interferometry
conductive polymer
CSK
CSM
CTE
CTOD
CVD
CVFE
CW
CZM
cytoskeleton
continuous stiffness module
coefficient of thermal expansion
crack-tip opening displacement
chemical vapor deposition
cohesive-volumetric finite elements
continuous wave
cohesive zone model
D
DBS
DCB
DCPD
DC
DEC
DGL
DIC
DIN
DMA
DMD
DMT
DNP
DPH
DPN
DPV
DRIE
DR
DSC
DSPI
DSPSI
DSP
DTA
DTS
DTS
directional beam-splitter
double-cantilever beam
dicyclopentadiene
direct current
diffraction elastic constant
Devonshire–Ginzburg–Landau
digital image correlation
Deutsches Institut für Normung
dynamical mechanical analyzers
digital micromirror device
Derjaguin–Muller–Toporov
distance from the neutral point
diamond pyramid hardness
dip-pen nanolithography
Doppler picture velocimetry
deep reactive-ion etching
deviation ratio
digital speckle correlation
digital speckle-pattern interferometry
digital speckle-pattern shearing
interferometry
digital speckle photography
differential thermal analyzer
distributed temperature sensing
dodecyltrichlorosilane
E
EAP
ECM
ECO
EDM
EDP
EFM
EFPI
EMI
ENF
EPFM
EPL
electroactive polymer
extracellular matrix
poly(ethylene carbon monoxide)
copolymer
electric-discharge machining
ethylenediamine pyrochatechol
electrostatic force microscopy
extrinsic Fabry–Pérot interferometer
electromagnetic interference
end-notched flexure
elastic–plastic fracture mechanics
electron-beam projection lithography
XXVIII
List of Abbreviations
ESIS
ESPI
ESSP
ES
ET
EW
EXAFS
European Structural Integrity Society
electronic speckle pattern interferometry
electrostatically stricted polymer
expert system
emerging technologies
equivalent weight
extended x-ray absorption fine structure
IEC
IFM
IMU
IPG
IPMC
IP
IR-GFP
ISDG
ISO
focal adhesion complex
fine-pitch ball grid array
fiber Bragg grating
flip-chip ball grid array
face-centered cubic
flip-chip plastic ball grid array
Food and Drug Administration
finite element modeling
finite element
fast Fourier transform
full field of view
functionally graded material
focused ion beam
force modulation microscopy
Fillers–Moonan–Tschoegl
frequency modulation
friction stir welds
Fourier-transform method
field of view
ISTS
IT
F
FAC
FBGA
FBG
FC-BGA
fcc
FC-PBGA
FDA
FEM
FE
FFT
FFV
FGM
FIB
FMM
FMT
FM
FSW
FTE
FoV
G
GF
GMR
GPS
GRP
GUM
G&R
growth factor
giant magnetoresistance
global positioning sensing
glass-reinforced plastic
Guide for the Expression of Uncertainty
in Measurement
growth and remodeling
H
HAZ
hcp
HDI
HEMA
HFP
HNDE
HRR
HSRPS
HTS
heat-affected zone
hexagonal close-packed
high-density interconnect
2-hydroxyethyl methacrylate
half-fringe photoelasticity
holographic nondestructive evaluation
Hutchinson–Rice–Rosengreen
high strain rate pressure shear
high-temperature storage
I
IBC
IC
International Building Code
integrated circuits
ion exchange capacity
interfacial force microscope
inertial measurement unit
ionic polymer gel
ionomeric polymer–metal composite
image processing
infrared grey-field polariscope
interferometric strain/displacement gage
International Organization for
Standardization
impulsive stimulated thermal scattering
interferometer
J
JIS
Japanese Industrial Standards
L
LAN
LASIK
LCE
LDV
LED
LEFM
LFM
LIGA
LMO
LORD
LPCVD
LPG
LVDT
LVDT
local area network
laser-based corneal reshaping
liquid crystal elastomer
laser Doppler vibrometry
light-emitting diode
linear elastic fracture mechanics
lateral-force AFM
lithography galvanoforming molding
long-working-distance microscope
laser occlusive radius detector
low-pressure CVD
long-period grating
linear variable differential transformer
linear variable displacement transducer
M
MBS
MEMS
MFM
micro-CAT
MITI
MLF
MMC
MOEMS
MOSFET
MO
M-TIR
μPIV
MPB
MPCS
MPODM
MW(C)NT
model-based simulation
micro-electromechanical system
magnetic force microscopy
micro computerized axial tomography
Ministry of International Trade and
Industry
metal leadframe package
metal matrix composites
microoptoelectromechanical systems
metal-oxide semiconductor field-effect
transistor
microscope objective
modified total internal reflection
microparticle image velocimetry
morphotropic phase boundary
most probable characteristics strength
multipoint overdeterministic method
multiwalled (carbon) nanotubes
List of Abbreviations
N
NA
NC-AFM
NCOD
NC
NDE
NDT/NDE
NEMS
NEPA
NHDP
NIST
NMR
NSF
NSOM
NVI
numerical aperture
noncontact AFM
normal crack opening displacement
nanocrystalline
nondestructive evaluation
nondestructive testing/evaluation
nanoelectromechanical system
National Environmental Policy Act
The National Highways Development
Project
National Institute of Standard and
Technology
nuclear magnetic resonance
National Science Foundation
near-field scanning optical microscopy
normal velocity interferometer
OFDR
OIML
OIM
OMC
ONDT
OPD
OPS
OSHA
optical/digital fringe multiplication
object coordinate system
orientation distribution function
optoelectronic holography
optoelectronic laser interferometric
microscope
optical frequency-domain reflectometry
Organisation Internationale de
Metrologie Legale
orientation imaging microscopy
organic matrix composites
optical nondestructive testing
optical path difference
operations per second
Occupational Safety and Health
Administration
P
PBG
PBS
PCB
PCF
PDMS
PECVD
PE
PID
PIN
PIV
PLA
PLD
PLZT
PL
PM fiber
PMC
photonic-bandgap
phosphate-buffered saline
printed circuit board
photonic-crystal fiber
polydimethylsiloxane
plasma-enhanced CVD
pulse-echo
proportional-integral-derivative
p-type intrinsic n-type
particle image velocimetry
polylactic acid
path length difference
Pb(La,Zr,Ti)O3
path length
polarization maintaining fiber
polymer matrix composites
phase-measurement interferometry
polymethyl methacrylate
Pb(Mgx Nb1−x )O3
polarization maintaining
power meter
plastic quad flat package
photorefractive crystal
point spread function
phase shifting technique
plated-through holes
polyvinyl chloride
polyvinylidene fluoride
physical vapor deposition
phase velocity scanning
Pb(Zr,Ti)O3
Q
QC
QFP
QLV
O
O/DFM
OCS
ODF
OEH
OELIM
PMI
PMMA
PMN
PM
PM
PQFP
PRC
PSF
PST
PTH
PVC
PVDF
PVD
PVS
PZT
quality-control
quad flat pack
quasilinear viscoelastic theory
R
RCC
RCRA
RF
RIBS
RMS
RPT
RSG
RSM
RS
RVE
R&D
reinforced cement concrete
Resource Conservation and Recovery Act
radiofrequency
replamineform inspired bone structures
root-mean-square
regularized phase tracking
resistance strain gage
residual stress management
residual stress
representative volume element
research and development
S
S-T-C
S/N
SAC
SAM
SAM
SAR
SAW
SCF
SCS
SC
SDF
SD
SEM
SEM
SHPB
SIF
SI
SLC
self-temperature compensation
signal to noise
Sn–Ag–Cu
scanning acoustic microscopy
self-assembled monolayer
synthetic-aperture radar
surface acoustic wave
stress concentration factor
sensor coordinate system
speckle correlation
structure data files
standard deviation
scanning electron microscopy
Society for Experimental Mechanics
split-Hopkinson pressure bar
stress intensity factor
speckle interferometry
surface laminar circuit
XXIX
XXX
List of Abbreviations
SLL
SMA
SNL
SNR
SOI
SOTA
SPATE
SPB
SPM
SPSI
SPS
SP
SQUID
SRM
SSM
STC
STM
SThM
ST
SW(C)NT
surface laminar layer
shape-memory alloy
Sandia National Laboratories
signal-to-noise ratio
silicon on insulator
state-of-the-art
stress pattern analysis by thermal
emissions
space–bandwidth product
scanning probe microscope
speckle pattern shearing
interferometry
spatial phase shifting
speckle photography
superconducting quantum interface
device
sensitivity response method
sacrificial surface micromachining
self-temperature compensated
scanning tunneling microscope
scanning thermal microscopy
structural test
single-walled (carbon) nanotubes
TIG
TIM
TIR
TMAH
TM
TPS
TSA
TS
TWSME
Terfenol-D
TrFE
thermal barrier coatings
temperature coefficient of expansion
temperature coefficient of resistance
transverse displacement interferometer
time division multiplexing
thermoelectric cooler
transmission electron microscopy
thermal evaluation for residual stress
analysis
tetrafluoroethylene
VLE
T
TBC
TCE
TCR
TDI
TDM
TEC
TEM
TERSA
TFE
tungsten inert gas
thermal interface materials
total internal reflection
tetramethylammonium hydroxide
thermomechanical
temporal phase shifting
thermoelastic stress analysis
through scan
two-way shape memory effect
Tb0.3 Dy0.7 Fe2
trifluoroethylene
U
UCC
UDL
UHV
ULE
UP
ultrasonic computerized complex
uniformly distributed load
ultrahigh vacuum
ultralow expansion
ultrasonic peening
V
VCCT
VDA
VISAR
virtual crack closure technique
video dimension analysis
velocity interferometer system for any
reflector
vector loop equations
W
WCS
WDM
WFT
WLF
WM
WTC
world coordinate system
wavelength-domain multiplexing
windowed Fourier transform
Williams–Landel–Ferry
wavelength meter
World Trade Center