XV
List of Abbreviations
2D-BZ
2P-PES
2-dimensional Brillouin zone
2-photon photoemission spectroscopy
FEM
FIM
A
AES
AFM
AISI
APS
ARUPS
ARXPS
ASTM
ATR
Auger electron spectroscopy
atomic force microscope
American Iron and Steel Institute
appearance potential spectroscopy
angle-resolved ultraviolet photoemission
spectroscopy
angle-resolved X-ray photoemission
spectroscopy
American Society for Testing
and Materials
attenuated total reflection
B
BBZ
BIPM
BZ
bulk Brillouin zone
Bureau International des Poids et Mesures
Brillouin zone
C
CB
CBM
CISS
CITS
CMOS
CODATA
CVD
conduction band
conduction band minimum
collision ion scattering spectroscopy
current imaging tunneling spectroscopy
complementary
metal–oxide–semiconductor
Committee on Data for Science and
Technology
chemical vapour deposition
D
DFB
DFG
DOS
DSC
DTA
distributed-feedback
difference frequency generation
density of states
differential scanning calorimetry
differential thermal analysis
E
EB
ECS
EELS
ELEED
ESD
EXAFS
F
electron-beam melting
electron capture spectroscopy
electron-energy loss spectroscopy
elastic low-energy electron diffraction
electron-stimulated desorption
extended X-ray absorption fine structure
field emission microscope/microscopy
field ion microscope/microscopy
G
GMR
giant magnetoresistance
H
HAS
HATOF
HB
HEED
HEIS
helium atom scattering
helium atom time-of-flight spectroscopy
Brinell hardness number
high-energy electron diffraction
high-energy ion scattering/high-energy ion
scattering spectroscopy
HK
Knoop hardness
HOPG
highly oriented pyrolytic graphite
HPDC
high-pressure die casting
HR-EELS
high-resolution electron energy loss
spectroscopy
HR-LEED
high-resolution LEED
HR-RHEED high-resolution RHEED
HREELS
high-resolution electron energy loss
spectroscopy
HRTEM
high-resolution transition electron
microscopy
HT
high temperature
HTSC
high-temperature superconductor
HV
Vicker’s Hardness
I
IACS
IB
IBAD
ICISS
ICSU
IPE
IPES
ISO
ISS
IUPAC
International Annealed Copper Standard
ion bombardment
ion-beam-assisted deposition
impact ion scattering spectroscopy
International Council of the Scientific
Unions
inverse photoemission
inverse photoemission spectroscopy
International Organization for
Standardization
ion scattering spectroscopy
International Union of Pure and Applied
Chemistry
J
JDOS
joint density of states
XVI
List of Abbreviations
K
KRIPES
R
K-resolved inverse photoelectron
spectroscopy
L
LAPW
LB
LCM
LCP
LCs
LDA
LDOS
LEED
LEIS
LPE
linearized augmented-plane-wave
method
Langmuir–Blodgett
liquid crystal material
liquid crystal polymer
liquid crystals
local-density approximation
local density of states
low-energy electron diffraction
low-energy ion scattering/low-energy ion
scattering spectroscopy
liquid phase epitaxy
M
MBE
MD
MEED
MEIS
MFM
ML
MOCVD
MOKE
MOSFET
MQW
molecular-beam epitaxy
molecular dynamics
medium-energy electron diffraction
medium-energy ion
scattering/medium-energy ion scattering
spectroscopy
magnetic force microscopy
monolayer
metal-organic chemical vapor deposition
magneto-optical Kerr effect
MOS field-effect transistor
multiple quantum well
NIMs
neutral impact collision ion scattering
spectroscopy
National Institutes for Metrology
O
OPO
reflectance anisotropy spectroscopy
rare earth
reflection electron microscope/
microscopy
reflection high-energy electron diffraction
reactive ion etching
random-phase approximation
room temperature
room temperaure and standard pressure
S
SAM
SAM
SARS
SAW
SBZ
SCLS
SDR
SEM
SEXAFS
SFG
SH
SHG
SI
SIMS
SNR
SPARPES
SPIPES
SS
STM
STS
SXRD
self-assembled monolayer
scanning Auger microscope/microscopy
scattering and recoiling ion
spectroscopy
surface acoustic wave
surface Brillouin zone
surface core level shift
surface differential reflectivity
scanning electron microscope
surface-sensitive EXAFS
sum frequency generation
second harmonic
second-harmonic generation
Système International d’Unités
secondary-ion mass spectroscopy
signal-to-noise ratio
spin polarized angle-resolved
photoemission spectroscopy
spin-polarized inverse photoemission
spectroscopy
spin-polarized
surface photovoltage spectroscopy
superconducting quantum interference
devices
surface state
scanning tunneling microscope/
microscopy
scanning tunneling spectroscopy
surface X-ray diffraction
optical parametric oscillation
T
P
PDS
PED
PES
PLAP
PLD
PSZ
PZT
RHEED
RIE
RPA
RT
RTP
SPLEED
SPV
SQUIDS
N
NICISS
RAS
RE
REM
photothermal displacement spectroscopy
photoelectron diffraction
photoemission spectroscopy
pulsed laser atom probe
pulsed laser deposition
stabilized zirconia
piezoelectric material
TAFF
TEM
TFT
TMR
TMT
TOF
TOM
thermally activated flux flow
transmission electron
microscope/microscopy
thin-film transistor
tunnel magnetoresistance
thermomechanical treatment
time of flight
torsion oscillation magnetometry
List of Abbreviations
TRS
TTT
truncation rod scattering
time-temperature-transformation
VBM
VLEED
U
UHV
UPS
UV
V
ultra-high vacuum
ultraviolet photoemission spectroscopy
ultraviolet
valence band maximum
very low-energy electron diffraction
X
XPS
X-ray photoemission spectroscopy
XVII