Flexible PV Technology Development Program at IIT Bombay Siddhartha P. Duttagupta Department of Electrical Engineering, Indian Institute of Technology Bombay Mumbai, India, Pin Code 400 076 Abstract-This paper describes the ongoing flexible PV technology program at the Indian Institute of Technology Bombay. Flexible solar cells are fabricated by depositing amorphous silicon (a-Si) on stainless steel substrate. We have relied on hot-wire CVD technology to deposit fdms at 110 C, since conventional PECVD processes have proven to he inadequate at that temperature. The primary requirement was a high doping concentration of the p-type and n-type a-Si layers. The efficiency of the single-junction PV cells under simulated AM1.5 global radiation initially was Z.S%, which improved to 4.8% following optimization. Further improvements in efficiency will require development of a technique for low temperature texturing of the transparent conducting oxide film. I. INTRODUCTION Currently, the efficiency of commercial amorphous silicon (a-Si) based PV technology is in the range of 6-9% [l]: Thus a-Si technology can pose a challenge to the dominant crystalline silicon (c-Si) technology only by offering radically lower costs or application advantages. Such a possibility is through the development of flexible PV technology. The a-Si films are deposited on stainless steel [2] or polymer substrates [3]. Flexible PV is lightweight and can be easily integrated with various substrates. This can be a distinct advantage as an energy source for space and military applications as well as for Building Integrated PV (BIPV) systems. Currently, PECVD based a-Si on polymer technology has been commercialized with efficiencies of about 4% [4]. We are investigating the application of low temperature hotwire CVD (HWCVD) based processes for fabricating PV cells. HWCVD of a-Si:H films was firstly reported by Wiesmann et al. [5] in 1979. At low deposition rates HWCVD yields stable and dense films. At very high deposition rates, as well at low temperature (< 250 "C) the quality of the deposited films is superior to PECVD (no plasma instability or powder formation). This makes it easier to optimize device fabrication by slow growth of sensitive components such as the thin window layer of solar cells on one hand, while increasing the deposition rate to 1 n d s or more in less critical parts, such as the intrinsic layer. Such high deposition rates lead to lower module fabrication costs. Also PV cells fabricated using HWCVD at low temperature are expected to have higher efficiencies compared to those fabricated using PECVD. The first PV cell fabricated using HWCVD was reported by Papadopulos et al. in 1993 [6]. They used a so-called superstrate (pin) structure where only the intrinsic layer was deposited by HWCVD. The device performance was q = 4.3%. In the following years the conversion efficiency of pin (superstrate) as well as in nip (substrate) solar cells with intrinsic H W C W absorber films has improved considerably. The conversion efficiency was enhanced to q = 6.8 % in 1996 [7, 81 and q = 10.2 % [9] or q = 9.8 % [lo] in 1998 for the pin or nip structure, respectively. In the nip cell yielding q = 9.8 % the i-layer was deposited with a very high rate of 1.6 n d s [IO]. The a-Si:H films deposited by HWCVD at high substrate temperatures (> 3 0 0 T ) also show enhanced stability against light-induced degradation [9] as per the StaehlerWronski effect, which causes single-junction a-Si solar cells to lose efficiency by as much as 30%. Therefore the HWCVD method tums out to be a likely alternative to the industry standard plasma-enhanced chemical vapor deposition (PECVD). 11. EXPERIMENTAL A . Facilifies The Microelectronics Center at IIT Bombay has excellent simulation, fabrication, and characterization facilities. The PV cells were fabricated using a single-chamber HWCVD tool which permits deposition of a-Si:H, pc-Si:H or a-Si-alloy films (intrinsic, p-type, and n-type). It is also possible to deposit very low-stress silicon nitride with the same tool. B. Process details The substrates used were Indiun Tin Oxide (ITO) coated glass and ZnO coated Stainless Steel (SS). The polysilicon films show excellent crystallinity and large grain size at high filament temperatures (Figure 1). The a-Si films are grown at 110 OC. The doped films showed excellent conductivity (Figure 2 ) . The final device structure is shown in Figure 3. 362 0-7803-7972-1103/$17.00 C 2003 IEEE Authorized licensed use limited to: INDIAN INSTITUTE OF TECHNOLOGY BOMBAY. Downloaded on December 4, 2008 at 06:45 from IEEE Xplore. Restrictions apply. Figure 4. PV I-V characteristics of flexible PV cell C.Device Characteristics 10 20 30 40 28 50 60 The PV I-V characteristics of the devices were measured under simulated AM1.5 (global) radiation (Figure 4). The efficiency of the PV cells deposited on glass was 9.5%. The efficiency of the PV cells deposited on Stainless Steel was initially 2.8%. Further optimization increased the efficiency to 4.8%. It was observed t h t further improvement in performance would come from developing a low temperature texturing technique on flexible substrates which would improve the current collection efficiency (higher Jsc) and bring it on par with the glass substrate based cells 70 Figure 1. Polysilicon and a-Si films deposited by HWCVD 111. CONCLUSION Flexible PV cells with an efficiency of 4.8% have been fabricated. We have also demonstrated high quality a-Si films deposited at low temperatures (100 "C). Future work will involve texturing of the TCO film in order to realize a 10% efficient cell. 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