Surface Science 571 (2004) L305–L310 www.elsevier.com/locate/susc Surface Science Letters Ion-induced electron emission from MgO by exciton decay into vacuum P. Riccardi a,b , M. Ishimoto a,c , P. Barone b, Raul A. Baragiola a,* a b Material Science and Engineering, Laboratory for Atomic and Surface Physics, Thornton Hall B-103, University of Virginia, Charlottesville, VA 22904, USA Dipartimento di Fisica, Laboratorio IIS, Universitá della Calabria, and INFM Unità di Cosenza, 87036 Arcavacata di Rende, Cosenza, Italy c Fujitsu Laboratories Ltd., Akashi, Hyougo, 674-8555, Japan Received 14 April 2004; accepted for publication 22 July 2004 Available online 8 August 2004 Abstract We report observations of electron emission from MgO surfaces induced by impact of 100 eV–4 keV He+, Na+, Ne+, Ar ions. The energy distribution of emitted electrons is nearly independent of ion type and energy, showing that it is caused by the decay of an intrinsic electronic state of the solid excited by the ions. The similar yields and energy distributions for incident Na+ and Ne+ ions rule out the potential mechanism of electron emission. The results are consistent with a novel model in which excitation occurs when electrons centered at the oxygen anions are promoted during a collision with the projectile (kinetic mechanism), and transferred to a surface exciton that can autoionize since it lies above the vacuum level, as determined by combining measurements of electron energy loss and photoelectric threshold. Ó 2004 Elsevier B.V. All rights reserved. + Keywords: Electron emission; Magnesium oxides; Ion–solid interactions Electron emission, a fundamental consequence of the interaction of slow ions with solid surfaces, results from kinetic and potential emission mecha* Corresponding author. Address: Material Science and Engineering, Laboratory for Atomic and Surface Physics, Thornton Hall B-103, University of Virginia, Charlottesville, VA 22904, USA. Tel.: +1 4349241059; fax: +1 4349241353. E-mail address: [email protected] (R.A. Baragiola). nisms [1], in which the electron excitation energy is provided, respectively, by the motion of the incoming ion or by its potential energy. The vast majority of the studies on ion-induced electron emission have used metal samples while insulator surfaces, of high relevance in both basic research and technology, have received little attention [2,3] due to experimental difficulties. Electron emission is most interesting for ion energies below a few keV where 0039-6028/$ - see front matter Ó 2004 Elsevier B.V. All rights reserved. doi:10.1016/j.susc.2004.07.031 CE RF A LE C E TT S E R C IE S N SU L306 P. Riccardi et al. / Surface Science 571 (2004) L305–L310 kinetic emission becomes very small and potential electron emission dominates if energetically allowed. In the Auger neutralization (AN) process responsible for potential emission, an electron from the solid neutralizes the projectile and the excess energy is taken by another electron, which may escape the surface potential barrier. For ionic insulators of large ionization energy I (sum of band-gap Eg and electron affinity A), Auger neutralization cannot occur for ions like Na+ that have a neutralization energy En < 2I + e, where e is the interaction energy between the final two holes in the valence band. However, the yield of electrons ejected from these ionic solids by slow ions has been found to be surprisingly larger than for metals [2–5], even though less energy is required to remove an electron from metals (the work function). In addition, strong electron emission from ionic insulators has been observed at impact energies below 100 eV [4–10], showing no indication of a kinetic energy threshold as observed in metals at energies below 0.5–2 keV [1]. To examine the question of enhanced electron emission in the interactions of slow ions with insulators, we measured the energy distributions of electrons emitted from an MgO surface under the impact of slow noble gas and sodium ions. The study of MgO, a simple ionic crystal, is justified not only from the point of view of fundamental physics––interactions of ions with insulator surfaces are poorly understood––but also because of advantageous properties of this material for use in plasma display panels: a large ion-induced electron yield (and therefore a low discharge voltage) [8,11,12] and high stability under ion bombardment [13]. Our results show that the energy distribution of electrons emitted by slow He+, Na+, Ne+, Ar+, and Xe+ are very similar. This remarkable behavior, which was first reported by us before in a brief form [8], is explained with a model in which oxygen-2p electrons are promoted in a close collision between the projectile and the anion, populating an exciton level that decays into vacuum due to the negative electron affinity of MgO. The experiments were performed in an ultrahigh vacuum (10 10 Torr) system used in previous electron emission studies [14]. Electrons ejected from the MgO samples were energy analyzed with a double-pass cylindrical mirror spectrometer operated inside a magnetic shield at constant pass energy of 50 eV and a resolution of 0.2 eV. The surface of the samples was normal to the ion beam and at 78° with respect to the spectrometer axis. Sodium ions were produced in a thermal ionization source, and noble gas ions in an electron impact source, operated with 58 eV electrons. Similar results were obtained using 30 eV electrons in the ion source, indicating negligible contamination of the ion beam with doubly charged ions. The MgO films, about 100 nm thick, were prepared by electron beam deposition on a highly doped Si substrate. They are polycrystalline with the grains oriented such that they present an oxygen-terminated (1 1 1) surface, as determined by X-ray diffraction. The samples were sputter cleaned with 1 keV Ar+ and the cleaning was monitored by Auger Electron Spectroscopy (AES) and Electron Energy Loss Spectroscopy (EELS). Weak features in the EELS spectra due to band-gap states disappeared after cleaning [13], also indicating negligible ion bombardment damage. AES and EELS spectra for the sputter cleaned MgO surfaces were in excellent agreement with published spectra [15–17] of clean MgO. Normal methods for electron emission measurement are not possible with insulators such as MgO since the surface electrostatic potential becomes positive as ions deposit their charge on the surface and electrons are emitted into vacuum. This positive surface potential produces a timedependent distortion in the energy spectra. To minimize this problem we used low ion fluxes (<100 nA/cm2) and neutralized the surface charge immediately before the acquisition of each spectrum by flooding the surface with low energy electrons from a nearby hot W filament (an electron flood gun used routinely for charge compensation in photoelectron spectroscopy of insulators). The neutralization procedure reduced the surface potential below 0.2 V. This is demonstrated by the quick rise in the energy distributions of electrons very close to the voltage at which the sample is biased ( 4.9 V), and by the constancy of the AES energies measured after exposing the sample to the electron flood gun. Repeated energy spectral SU N IE SC RS CE E A TT R F LE CE P. Riccardi et al. / Surface Science 571 (2004) L305–L310 scans showed that, at the ion current densities used, neither surface charging nor damage had significant effects over the 20 s spectrum acquisition time. Fig. 1 shows N(E), the energy spectra of electrons emitted from MgO by 200 eV He+, Ne+, and Ar+ ions, and 500 eV Na+ ions. The total electron yields c, shown in Fig. 2, were obtained from the currents measured on the sample under positive and negative bias, with an uncertainty of 30%. The fact that the yields for He+ are larger than for Ar+ (which sputters much more effectively) clearly indicates that emission of negative ions has a negligible contribution to the yields (the O yields are below 0.06 for 250 eV He+, Ne+, Ar+ and other ions incident on oxidized Mg) [18]. The increase of the total electron yield above unity for high energy He+ signals the contribution of multiple excitation collisions during ion penetration. Fig. 1. Normalized energy distribution of electrons ejected from a MgO surface under impact of 200 eV noble gas ions and 128 eV electrons. The sample was biased at 4.9 eV. L307 Fig. 2. Energy dependence of the total electron yields from a MgO(1 1 1) surface at normal incidence. Also shown are representative statistical uncertainties. Fig. 1 shows that the shape of the energy distributions is nearly the same for the different ions, in remarkable contrast with the large variations observed for collisions with metal samples [1,19]. This finding allows us to exclude emission mechanisms that involve the electron levels of the projectile ions, such as Auger neutralization (AN) [1], that have been often invoked as a source of electrons in slow ion interactions with MgO [20]. In Auger neutralization, the maximum electron energy is En 2I [1,19], where the ionization energy of MgO is I = 5.5 eV at the surface (Fig. 3), and En the ionization potential of the parent atoms, varies from 24.58 to 5.14 eV going from He to Na. If AN does not occur outside the surface, the incident projectile will penetrate and the energy levels will be modified by the strong electric fields inside MgO. The available energy for AN will increase for ion trajectories close to Mg2+ cations but electron emission from such events is already improbable for Ar+ [10] and therefore even more unlikely for Na+, due to its much lower potential energy. The independence of the spectra on the type of projectile also rules out other mechanisms, such as double electron capture to a negative ion followed by electron detachment in a third collision [21], and the decay of a transient autoionization complex of the incident ion and two adjacent target atoms [22]. CE RF A LE C E TT S E R C IE S N SU L308 P. Riccardi et al. / Surface Science 571 (2004) L305–L310 Fig. 3. Photoelectric threshold of a MgO(1 1 1) surface. The electron energy spectra, which is nearly identical for different ions, is different to that excited by electron impact (Fig. 1), indicating that the shape of N(E) does not result from a peculiar density of final electronic states. This suggests that ion-induced electron emission results from the preferential excitation by ions of a state intrinsic to the solid, i.e., not involving the electronic properties of the projectile. An intrinsic mechanism was suggested recently by Matulevich et al. [10]. These authors measured electron yields c induced by 40 eV noble gas ions on very thin (1–5 nm) MgO(1 0 0) films grown on oxidized Mo, obtaining c much higher than reported here and not finding the independence of N(E) on the type of ion. They proposed, in addition to AN for He+ and Ne+ on the MgO surface, an intrinsic mechanism for He+ and Ar+, in which electrons are emitted by AN of valence holes at the substrate and transported to the surface. The valence holes, assumed to be produced by neutralization of the projectiles at the surface, are highly immobile in MgO but drift to the interface in the high electric field produced by electrostatic charging (the surface charges by 2 eV, as judged from their energy diagram). This high electric field (4–20 MV/cm) alters electron transport [23], and may even produce field emission at the interface; both effects enhance electron yields, in particular in MgO thin films [24], and can explain the higher yields obtained by these authors compared to those reported here. Justification of the model by Matulevich et al. on the base of their experiments is diminished by the fact that two of their nearly concurrent papers [8,10] show inconsistent energy distributions. On the other hand, we cannot rule out that the differences between their and our c and N(E) result from different experimental conditions besides charging (e.g., ion energy, MgO growth conditions, crystalline orientation, film thickness) or measurement techniques. From the point of view of the present discussion, we note that AN can be ruled out even for He+ and Ne+ since experiments do not show the 3 eV shift in the high energy edge of N(E) expected (and calculated) [10] for those ions. The strongest argument against the hypothesis [25] that AN dominates electron emission from MgO is, of course, the very similar electron yields for Ne+ and Na+, which have vastly different neutralization energies. The electronic excitation mechanism that is consistent with our results is the well-known electron promotion effect in atomic collisions, which results from electron-electron interactions in the interpenetration of the valence shells of the projectile and a target atom (oxygen anion) during a close collision, forming a transient quasi molecule. This description of ion-surface interactions as binary collisions is adequate in ionic solids because the valence charge is localized at the anion sites. Collisions with oxygen anions promote oxygen2p electrons along quasi-molecular orbitals (MOs), above a threshold projectile energy which has been determined to be 50 eV for the analogous case of Na+ exciting oxidized Al [26]. The O-2p electrons can be promoted by all the projectiles studied, as follows from calculations for these and similar systems [27,28], and from Barat–Lichten MO correlation rules [29]. The promoted MO are 3dr(He–O), 3dp and 4fr(Ne–O, Na–O), and 4fr(Ar–O), where nl indicates the atomic orbital of the united atom in the limit of zero internuclear separation, and r(p) indicate the projection, 0 (1) of the angular momentum on the internuclear axis. The promoted MO cross empty levels, such as the 3sr, 4sr for He, Ne, and Na projectiles and the 3dd, 4sr for Ar, which correlating with O-3s and O-4s excitons. We note that this excitation model is somewhat similar to the idea of Vogan et al. [18] SU N IE SC RS CE E A TT R F LE CE P. Riccardi et al. / Surface Science 571 (2004) L305–L310 that, in a collision with a MgO surface, electrons result from excitation of a (MgO) pair, but we do not need to invoke oxide molecules and it is uncertain what role one or more Mg2+ ions play except to shift the electrostatic potential at the anion site. We disagree with Vogan et al. [18] in their opinion that this process is not kinetic emission because of the low projectile energy. Electron promotion is allowed by the kinetic energy of the projectile and hence the electron emission process it affords is indeed of the kinetic type. Once promoted, the O-2p electrons can transfer to excited states at the crossings of the promoted MO with unfilled MOs that correlate to excitons and conduction band states. The population of the final levels will decrease with excitation energy DE; and therefore will favor excitonic to continuum states. Electron promotion to continuum states [7,8] and MO autoionization may give a significant contribution to the weak high-energy tail of the electron spectrum. We propose that the excitons populated by electron promotion contribute to electron emission because they decay into vacuum. Excitons are normally considered to be bound states of solids but, in MgO (and in LiF), the negative electron affinity of the (1 1 1) surface causes the exciton to be above the vacuum level [30]. The band gap of MgO (7.8 eV in the bulk) [13] drops at the surface due to the decrease in the Madelung potential, by more than 1 eV, with variations among different crystal faces [31,32]. EELS measurements show a minimum surface excitation energy of 5.5 eV [30], and a decrease in the exciton energy from a bulk value of 7.7 to 6.2 eV, for MgO(1 0 0) [13]. The surface exciton exists in a region of changing surface potential extending from outside the solid to the first atomic layers [30]. To establish the location of the vacuum level, we determined the ionization energy of our samples (energy difference between the top of the valence band and the vacuum level) by measuring the photoelectron threshold (Fig. 3). The value of 5.3 eV is nearly the same as the minimum excitation energy measured in EELS, showing that the surface exciton is above the vacuum level, which can explain its unusually large width. With this information we construct the approximate energy level diagram for the L309 Fig. 4. Schematic energy levels for a MgO(1 1 1) surface, showing how the decay of an exciton, allowed by the negative electron affinity, gives rise to the observed energy distribution of emitted electrons. The block labeled Ôsurface excitonÕ represents the range of surface energy losses measured in EELS, and its extension from outside the solid to the first surface layer [30]. MgO surface, shown in Fig. 4, which includes the decrease in conduction band energies and increase in valence band energies at the surface that have resulted from detailed calculations [32,33]. The negative electron affinity of the surface (vacuum level below the bulk conduction band minimum) allows excitons to couple to the continuum of states outside the solid, which explains the considerable width of surface excitons [30]. The decay of the excitons into vacuum (or exciton break-up) [34,35] then produces electrons with an energy distribution peaked at the observed low energies, due to the small (positive) difference in energy between the peak exciton energy and the vacuum level. In conclusion, the electrons emitted from MgO surfaces by slow ions have energy distributions remarkably independent of the type of projectile, suggesting that they originate from the decay of an intrinsic excitation in the solid, i.e. excitons, which are populated by promotion of O-2p electrons in binary projectile-oxygen collisions. The position of the surface exciton above the vacuum level, demonstrated by measurements of the photoelectric threshold, is likely the cause of the high electron yields from MgO compared to other oxides. CE RF A LE C E TT S E R C IE S N SU L310 P. 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