22nd International Symposium on Plasma Chemistry July 5-10, 2015; Antwerp, Belgium Plasma-assisted etching of “incipient” carbon nanotubes: a hybrid molecular dynamics / Monte Carlo study U. Khalilov, A. Bogaerts and E.C. Neyts Research Group PLASMANT, department of Chemistry, University of Antwerp, 2610 Antwerpen-Wilrijk, Belgium Abstract: Hydrogen either enhances or slows down carbon nanotube growth, depending on its concentration in the plasma. While the negative effect of H species due to etching has been broadly investigated, its etching behavior is not fully understood at the atomic level. We thus comparatively studied etching stages of ideal and defective nanotubes in the hydrogenation process using combined MD/MC simulations. Three distinguished etching stages are analyzed. Also the effect of H 2 plasma on the cap nucleation is investigated in detail. Keywords: carbon nanotubes, hydrogenation, molecular dynamics, Monte-Carlo, ReaxFF 1. Introduction Thanks to the extraordinary properties and applications of carbon nanotubes (CNTs), understanding how to control their growth is of prime importance. The role of H atoms in plasmas used for CNT growth can be significant in that respect. It is known that hydrogen helps in the activation of the catalyst particles and thus enhances the yield of CNT growth. In contrast, it may also hinder the formation of graphite-like carbon, if its concentration is too high [1]. Furthermore, plasma including H atoms causes the breaking of the sp2 C-C bonds and the formation of sp3 C-H bonds, resulting in CNT etching [2]. In spite of a large number of studies [1-3], however, the precise influence of H on the early stages of CNT growth and its etching behaviour is still not fully understood. Therefore, this work is devoted to study the H etching mechanisms for ideal and defective nanotubes as well as to understand the H effect on the cap nucleation stage of the CNT growth. 2. Simulation details The hydrogenation and etching processes are investigated by combined (reactive) molecular dynamics (MD) and force-bias Monte Carlo (tfMC) [4, 5] simulations at 1600 K. In the simulations, all atomic interactions are described by the ReaxFF force field, using parameters developed by Mueller et al. [6]. Prior to hydrogenation, defect-free (5,5) and defective CNTs are positioned on a Ni 55 nanoparticle as a surface-bound cluster, which itself is physisorbed on a virtual Al surface [7], thereby mimicking catalyzed tip growth experiments. During the MD simulations, some H atoms are added in the vacuum surrounding the catalyst and tube, and their concentration is kept constant at any moment in time. When a H atom adsorbs on the nanotube or the cluster, the resulting structure is allowed to relax by application of tfMC. During this relaxation stage, no new atoms are allowed to impinge on the tube. We remove gas phase etching products every 106 MD steps to limit their O-18-5 influence. 3. Results and discussions In Fig. 1, successive etching stages of defective (a) and ideal (b) nanotubes during the hydrogenation are shown. There are four specific types of structures that can be distinguished for both cases, i.e., 1) structures prior to hydrogenation; 2) structures in the beginning of hydrogenation; 3) structures with initially broken C-C bonds (onset of a hole creation or etch pit formation); and 4) damaged or H-etched carbon nanotubes. In the first stage of the hydrogenation process, H atoms adsorb on the surface of both a nanotube and a catalyst cluster and they try to coalesce, leading to the occupation of neighbouring sites. On the other hand, H atoms may also desorb either by the Langmuir–Hinshelwood (LH) recombinative desorption or the Eley–Rideal (ER) abstraction mechanisms during the hydrogenation [8]. Due to H adsorption and clustering on both tube surfaces, some regions contain sp3 C atoms or adsorbed H atoms and become locally amorphous. While such amorphous sites are mostly found on the cap region in the ideal structures, they can be found in any part of the defective tubes. Consequently, C-C bonds at those sites elongate and can eventually break, due to pyramidalization and misalignment of the π-orbitals of the C atoms [9]. The second stage is characterized by the appearance of the first defect due to breaking of the now more elongated C-C bonds. In the third stage, additional H-atoms rapidly occupy nearby (neighbouring) C atoms, leading to the formation of a hole or so-called etch pit. Their borders are indicated by pink coloured C atoms as shown in Fig. 1. The carbon-carbon bonds connecting these sites are consecutively broken, which closely resembles the experimental evidence on graphite and MWNT etching [3] showing the formation of holes and etch pits upon H-atom exposure. Moreover, as can be seen in the figure, the resulting hole in our simulations is surrounded by H-atoms, as was previously also demonstrated 1 experimentally by EELS measurements [3]. This indicates that the carbon atoms in that region remain purely sp3-bonded. After the first etch pit formation, the ideal short tube is gradually destroyed starting from its cap toward to the end of the tube. Its defective counterpart, on the other hand, is disorderly destroyed due to its interaction with the H-atoms from the plasma, as shown in Fig. 1. Fig. 2. (a) Initial and final structures of three different carbonated Ni clusters (Ni 55 C 89 , Ni 55 C 100 , Ni 55 C 110 ) in the hydrogenation process; (b) evolution of the number of carbon and hydrogen atoms in the three structures during H etching. Fig. 1. Hydrogenation and etching stages of (a) defective, and (b) ideal (5,5) nanotubes on a Ni cluster (green atoms). C atoms of damaged regions are in pink. Hydrogen-assisted etching of CNT caps can give also valuable information to understand the H effect in the early stages of CNT nucleation. In Fig. 2a, three cap-like carbon structures and the final structures after hydrogenation are depicted. Due to the hydrogenation, cap structures can convert to vertical graphene patches [7]. During the hydrogenation process, cap C atoms are continuously etched from the cluster surface and therefore the number of C atoms linearly decreases as shown in Fig. 2b. On the other hand, the concentration of hydrogen atoms at the surface initially increases: H atoms easily adsorb on both the carbon cap and the Ni-catalyst cluster, binding with C and Ni atoms, respectively. As a result, the number of adsorbed H quickly saturates. However, their amount gradually decreases afterward due to either the cap etching or LH/ER desorption. Fig. 2b shows that the overall adsorption/desorption and etching trends are the same for all three cap cases and the rates do not depend on the amount of C atoms in the initial cap-cluster structure. During the hydrogenation/etching process, different types of etching C x H y species in addition to desorbed H 2 molecules are found in the gas phase (Fig. 3a). As can be seen in Fig. 3b, CH 4 molecules and CH 3 radicals are the most abundant species in the gas phase for all cases. Moreover, the number of formed C 2 H 4 , C 2 H 2 molecules and C 2 H radicals is also significant for the third structure. The results show that the occurrence of various gas-phase C x H y species is due to etching/pyrolysis processes. 4. Conclusion In this work, the etching of Ni catalyzed carbon nanotubes by H 2 plasma is investigated. The simulations indicate three successive hydrogenation/etching stages. 2 Fig. 3. (a) H-containing cap-cluster structure and desorbed/etched species in the gas phase during the hydrogenation; (b) Relative concentration of the etched hydrocarbon C x H y species. We found that an ideal short (5,5) nanotube is etched from its cap to its base which binds with the Ni cluster, whereas a defective tube, on the other hand, is disorderly destroyed. The etching rate and adsorption/desorption rates are found not to depend on the amount of C atoms in the CNT cap in the early growth stage. Due to the etching process, CH 4 molecules and CH 3 radicals are abundantly found in the gas phase, besides H atoms and H 2 molecules. 5. Acknowledgement U. Khalilov gratefully acknowledges financial support from the Fund of Scientific Research Flanders (FWO). This work was carried out in part using the Turing HPC infrastructure at the CalcUA core facility of the Universiteit Antwerpen (UA), a division of the Flemish Supercomputer Center VSC, funded by the Hercules Foundation, the Flemish Government (department EWI) and the UA. This research was carried out in the framework of the network on Physical Chemistry of Plasma-Surface Interactions - Interuniversity Attraction Poles, phase VII (http://psi-iap7.ulb.ac.be/), and supported by the Belgian Science Policy Office (BELSPO). O-18-5 6. References [1] G. Zhang, et al. PNAS, 102, 16141 (2005) [2] G. Zhang, et al. Science, 314, 974 (2006) [3] M.J. Behr, et al. J. Vac. Sci. Technol. B, 28, 1187 (2010) [4] M.J. Mees, G. Pourtois, E.C. Neyts, B.J. Thijsse and A. Stesmans. Phys. Rev. B, 85, 134301 (2012) [5] K.M. Bal and E.C. Neyts. J. Chem. Phys., 141, 204104 (2014) [6] J.E. Mueller, et al. Journal name missing, 114, 5675 (2010) [7] U. Khalilov, A. Bogaerts and E.C. Neyts. 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