22nd International Symposium on Plasma Chemistry July 5-10, 2015; Antwerp, Belgium Reactive adsorption of molecules and radicals on surfaces D. Marinov, O. Guaitella, J.-P. Booth and A. Rousseau Ecole Polytechnique, LPP, CNRS, UPMC, Université Paris-Sud, Palaiseau, France Abstract: Chemisorbed atoms are believed to play a key role in surface-catalysed reactions in plasmas. Heterogeneous losses and formation of new molecules on surfaces are controlled by the coverage and the reactivity of species on the surface. Usual plasma diagnostics are mainly focused on the kinetics of gas phase species interacting with surfaces and very little is known about the properties of atoms on the surface. In this work we summarize results obtained using an original approach allowing in-situ characterization of stable chemisorbed atoms grafted to surfaces under N 2 /O 2 plasma exposure. The role of these atoms in surface reactivity of silica under plasma exposure is investigated. The importance of weakly-bonded atoms is demonstrated. Keywords: adsorption and recombination of atoms, production of molecules on surfaces, isotopic exchange 1. Introduction Surface kinetics plays a central role in many plasma applications. Low pressure technological plasmas, plasma-catalyst systems and thermal protection for space re-entry are just few examples. Regardless of the great number of works devoted to the study of plasma-surface interactions, there is still a lot of uncertainty. For example, the recombination probabilities of atoms on nominally the same materials determined in different studies can scatter over orders of magnitude [1, 2]. Uncertainties of the rates of surface processes limit the accuracy and the predictive capability of the kinetic models. In this paper, surface processes occurring in N 2 /O 2 plasmas in contact with dielectric surfaces will be discussed. Previous experimental and modelling studies [3-5] resulted in a well established model of surface recombination mechanisms. It is widely accepted that the recombination of atomic species on dielectric surfaces proceeds in two steps. First, atoms from the gas phase are captured by surface active sites. In the second step, these adatoms recombine either with impinging gas phase atoms (Eley-Rideal mechanism) or with physisorbed atoms diffusing along the surface (Langmuir– Hinshelwood mechanism). It is usually supposed that active sites represent only a small fraction of surface atoms (~1%) and adsorbed atoms are irreversibly trapped (chemisorbed) by the active sites. The aim of this study is to challenge the existing models and to provide a realistic picture of the processes taking place on the surface. The properties (coverage, binding energy, reactivity) of chemisorbed atoms on real surfaces remain barely studied. One of the reasons for this is that classical techniques of the surface science are not applicable in the harsh plasma environment. While the plasma science approach is more general and it is mostly focused on the kinetics of species in the gas phase. In this work, we IN-05 present results obtained using an original experimental technique that allows in-situ probing of the coverage and the reactivity of atoms adsorbed on real surfaces exposed to a low pressure plasma [6-9]. 2. Experimental The main idea of the experimental approach used in this work is based on the assumption that chemisorbed atoms are stable and they remain on the surface even after the end of the plasma exposure. Thus we perform a pretreatment of the inner surface of a silica discharge tube with a flowing discharge in normal N 2 (or O 2 ) at p = 0.53 mbar. The schematic of the setup and the experimental sequence are shown in Fig. 1. After the pre-treatment, the reactor is evacuated and the pre-treated surface is probed with a pulsed plasma in a corresponding heavy isotope 30N 2 (38O 2 ) in static (no gas flow) conditions. Fig. 1. Schematic of the set-up (upper panel) and the experimental sequence of the N 2 isotopic study (lower panel). 1 Nads (cm-2) 1E16 XPS 14 1E15 1E14 0.1 1 10 100 1000 28 N2 pretreatment time (s) Fig. 2. Adsorption kinetics of N on silica discharge tube. Discharge in 28N 2 p = 0.53 mbar, P = 17 W. Results of XPS measurements of the N surface coverage are shown for comparison. A question may arise, if nitrogen atoms grafted to the surface by N 2 plasma do indeed play a role of active sites for surface recombination. In order to get an insight in the reactivity of N ads the duration of the probe discharge 2 1016 Ndes (cm-2) 3. Results and discussion 3.1. Adsorption and reactivity of N on silica Fig. 2 shows the density of 14N ads as a function of the Excellent duration of 28N 2 plasma treatment. sub-monolayer sensitivity of the isotopic exchange technique (LOD ≈ 2·1013 cm-2) allowed us to follow the adsorption kinetics for pretreatment times as short as 100 ms. The maximum 14N ads coverage reached after 1 h treatment time is 6·1015 cm-2, which is close to a monolayer coverage on silica. The N ads density obtained by the ex-situ XPS agrees reasonably well with the isotopic study. Both techniques indicate that a SiO x N y layer is formed on clean SiO 2 surface under N 2 plasma exposure. Surface treatment with a flowing afterglow doesn’t result in noticeable nitrogen incorporation, which means that low energy (~ 15 eV) ion bombardment is essential for nitridation and nitrogen atoms alone are inefficient. We have found that the surface can be restored to pure SiO 2 state after a 1 h oxygen plasma treatment. One can conclude that the effect of the N 2 plasma on the silica surface is not limited to a mere occupation of a few surface active sites; the chemical composition of the surface is modified. was varied in the range of 5·10-3 - 103 s. Fig. 3 shows the evolution of the number of adsorbed atoms picked up from the surface [14N des ] as a function of the probe 30N 2 discharge duration. These measurements indicate that groups of 14N ads having different reaction probabilities exist on the SiO x N y surface. The most reactive N ads with the coverage of 2·1015 cm-2 are exchanged with a characteristic time of 10 seconds, while the reactivity of the remaining group of atoms (4·1015 cm-2) is two orders of magnitude smaller. Observed distribution of reactivity may be explained by a distribution of binding energies of atoms on the surface; strongly-bonded surface species have a smaller probability to react with atoms from the gas phase. Fig. 3clearly demonstrates that different groups of N ads have different “efficiency” as active site for recombination. These results demonstrate the advantage of the isotopic exchange technique compared to classical surface diagnostics that do not provide information about the reactivity of species on the surface. τ=0.42 s τ=316 s τ=6.7 s 1015 14 Molecules 14N15N (16O18O) produced on the surface in the probe discharge are detected using a QMS. The coverage of atoms picked up from the surface during the probe discharge is determined from the known surface-tovolume ratio of the discharge tube. By varying the duration of the probe discharge the kinetics of surface reactions catalysed by adsorbed 14N ads (16O ads ) is investigated. In-situ isotopic exchange measurements are compared with the result of ex-situ XPS diagnostics of the pre-treated silica surface. 1014 0.1 30 1 10 100 1000 N2 plasma duraτion (s) Fig. 3. Evolution of the density of 14N ads atoms picked up from the surface as a function of the probe 30N 2 discharge duration. Silica discharge tube was pre-treated by 28N 2 plasma during 60 minutes. Multi-exponential fit with is shown by a solid line. By using short dc pulsed in 30N 2 have found that the rate of 15N recombination on the surface was much smaller than the rate of 14N15N release [6]. This means that even the most reactive 14N ads are not the main sites for 15N recombination. One can conclude that in spite of assumptions usually made in mesoscopic models [3-5], surface recombination of N on silica takes place on weakly bonding active sites. Atoms adsorbed on these sites are not stable and therefore they are not detectable in our experiments. 3.2. Adsorption and reactivity of O on silica Similar isotopic exchange experiments were performed with oxygen plasmas containing 36O 2 . Fig. 4 shows the evolution of the density of 16O atoms picked up by a discharge in 36O 2 from the surface of the discharge tube made of silica. The saturation is reached at a level close IN-05 Odes [cm-2] 16 6.0x1014 O3 3.0x1014 p=6.7 mbar E=0.16 J/pulse 0 50 t [ms] 4x1015 Fig. 5. Time evolution of the absolute number density of O and O 3 measured in the afterglow of a pulsed dc discharge in O 2 at p = 6.7 mbar in the presence of high specific surface silica material on the reactor walls. 2x1015 0 0 100 200 300 400 500 36 duration O2 plasma [s] Fig. 4. Evolution of the density of 16O atoms picked up from the surface as a function of the probe discharge duration in 36O 2 . Silica discharge tubes were initially cleaned by Ar plasma during 30 minutes. 3.3. Ozone production from surface recombination of O The important role of weakly bonded O atoms is confirmed by observation of an efficient O 3 production by surface recombination (O+O 2 ) wall [10]. This reaction occurs spontaneously if the binding energy of the species is below 1 eV. Fig. 5 shows the decay of atomic O concentration in the post discharge of a pulsed discharge in O 2 in the presence of high specific surface silica material on the reactor walls. The removal of O is accompanied by a rapid production of O 3 which can only be explained by the surface mechanism because the 3-body gas phase recombination is too slow. In the conditions shown in the graph below, ozone productions accounts for 25% of the oxygen atom loss rate on the silica surface. 4. Conclusions In this work, interaction between N and O atoms and silica surface was investigated using isotopic exchange technique. In addition to an excellent sensitivity (~1013 cm-2), the advantage of this technique compared to the standard surface analysis is that it provides information about the reactivity of adsorbed species. The point of departure of our study was based on the concept of surface kinetics proposed in the mesoscopic models such as [3-5]. The experimental results obtained in the present work demonstrate that the realistic picture of IN-05 O 0.0 Silica 6x1015 9.0x1014 O, O3 [cm-3] to a full monolayer as in the SiO 2 -N 2 case shown in Fig. 3. These experiments demonstrate that under O 2 plasma exposure O atoms on the outmost layer of oxide materials are continuously replaced by oxygen atoms coming from the gas phase. This observation points to a fact that from the viewpoint of plasma-surface interactions there is no fundamental difference between adsorbed O-atoms and surface atoms of the material itself. The parameter that controls the reactivity is the binding energy of these atoms to the surface. interaction between N 2 /O 2 plasmas and silica surfaces is much more complex. The major findings of this study can be summarized as follows: 1. Dynamic nature of silica surface under plasma exposure. The surface in contact with the plasma is not static. Atoms of the material are continuously exchanged due to the bombardment by ions and radicals. 2. Distribution of reactivity. Atoms adsorbed on real surfaces have different reactivities depending (most probably) on their binding energy and local adsorption configuration. 3. The important role of weakly bonded atoms. We have found that unstable weakly-bonded N and O atoms are the main recombination sites on silica. These weekly bonded species may be either physisorbed or chemisorbed with the binding energy smaller than approximately 1 eV. We believe that the relevance of above observations is not limited to the case of the N 2 /O 2 -SiO 2 system and similar behaviour is expected for different surfaces and plasma chemistries. These general phenomena have to be taken into account in models for a realistic description of surface kinetics in plasmas. 5. Acknowledgement Financial support from the French National Research Agency (ANR) and from Ecole Polytechnique is gratefully acknowledged. 6. References [1] A. Vesel. Mater. Technol., 46, 7-12 (2012) [2] V.M. Donnelly, et al. J. Vac. Sci. Technol. A, 29, 010801 (2011) [3] V. Guerra. IEEE Trans. Plasma Sci., 35, 1397-412 (2007) [4] G. Cartry, et al. J. Phys. D: Appl. Phys., 33, 1303 3 (2000) Y.C. Kim and M. Boudart. Langmuir, 7, 2999-3005 (1991) [6] D. Marinov, et al. J. Phys. D: Appl. Phys., 47, 475204 (2014) [7] D. Marinov, et al. J. Phys. D: Appl. Phys., 43, 115203 (2010) [8] V. Guerra, et al. J. Phys. D: Appl. Phys., 47, 224012 (2014) [9] O. Guaitella, et al. Appl. Phys. Lett., 97, 011502 (2010) [10] D. Marinov, et al. J. Phys. D : Appl. Phys., 46, 032001 (2013) [5] 4 IN-05
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