22nd International Symposium on Plasma Chemistry July 5-10, 2015; Antwerp, Belgium How remote r.f. plasmas can aid graphene technology? M. Losurdo, M.M. Giangregorio, G.V. Bianco, A. Sacchetti, P. Capezzuto and G. Bruno Institute of Inorganic Methodologies and of Plasmas, CNR-IMIP, via Orabona 4, 70126 Bari, Italy Abstract: This paper reports on advantages and limits of plasmas in remote configuration in graphene chemical vapor deposition and processing. The effect of plasma-CVD by direct CH 4 -H 2 -Ar and remote CH 4 -H 2 -Ar is compared to conventional CVD by CH 4 -H 2 of graphene on copper and nickel, investigating the quality of the grown graphene. We demonstrate that although plasma activation presents some limits in the CVD growth of graphene, the full advantages of H 2 remote plasmas can be exploited in the processing of substrates to improve the subsequent growth and graphene quality, in tailoring graphene optical and electrical properties by post growth plasma doping, as well as in nanopatterning graphene, minimizing the defects in graphene basal plane. Keywords: graphene, CVD, H 2 remote plasmas, plasma nanopatterning, ellipsometry 1. Introduction Incorporation of graphene [1] into devices requires large-scale fabrication of high-quality graphene, which remains a significant challenge despite years of effort. The method that shows the capability of large area graphene is chemical vapour deposition (CVD), which, however, requires high temperatures (generally over 1000 °C) and a metal catalyst (e.g., Cu [2], Ni [3], Ru) to decompose and dehydrogenate C-precursors, e.g., CH 4 . Plasma-enhanced CVD approach has been proposed by various authors [4-6] to grow graphene at a low substrate temperature (as low as 475 °C) [6]. Indeed, all previous studies on plasma-CVD have shown the formation of defects in graphene. Indeed there are other important applications of plasmas in graphene processing, which include etching and patterning graphene [7], Cl 2 , CF 4 , SF 6 plasma-assisted doping [8], O 2 and H 2 plasmaassisted surface cleaning [9, 10], plasma functionalization and/or surface modification for bandgap engineering [11]. Noteworthy, there are potential benefits of remote plasmas in graphene technology related to processing of growth substrates as well as post-growth tailoring of graphene properties that have not been duly considered. This contribution aims at: 1) evaluating and discussing the effect of H 2 , H 2 -Ar and H 2 -Ar-CH 4 remote plasmas on the graphene plasmaCVD growth. We discuss the limits of the plasma activation during the growth on the graphene quality. 2) demonstrating the huge advantage of the H 2 remote plasma in processing of the growth substrates to improve graphene homogeneity and quality. 3) discussing the capability of H 2 remote plasmas in tailoring the optical/electrical properties of graphene. 4) showing the potential of H 2 remote plasmas in forming graphene nanoribbons which must be etched laterally without damaging the graphene basal plane. Specifically, we show significant improvement in the control and reproducibility of CVD graphene growth and O-8-4 quality by a H 2 remote plasma processing of the main catalytic metal substrates of nickel (Ni) and copper (Cu) as thin films and foils. The main difference between the Ni and Cu is in the growth of number of layers of graphene, typically a monolayer on Cu, while multiple layers can be grown on Ni depending on the growth time. Implementation of CVD reactors with a simple remote plasma configuration is presented, which is also applicable to other 2D materials. 2. Processing and Deposition Details We conducted CVD of graphene using a UHV (base pressure 10-8 Torr) vertical reactor that can be fed with Ar, H 2 and CH 4 flows [12]. This reactor has the unique peculiarity of being equipped with a remote plasma source for the in-situ cleaning and processing of substrates and graphene, and with an in-situ spectroscopic ellipsometer for the graphene deposition and processing real time monitoring (see Fig. 1) [13]. We used as substrates for CVD graphene Cu foils and Cu and Ni 300 nm films sputtered on a thermallyoxidized Si substrate. All those substrates were placed in the 13.56 MHz remote plasma system, and the following treatments were run and compared: - Annealing in H 2 at 1000 °C (1 Torr) (conventional); - H 2 plasma (5 W - 160 W, 300 - 800 °C, 1 Torr) - H 2 -Ar plasmas (φ Ar /φ H2 = 1 - 10; 1 Torr, 60 Watt, 800 °C). The CVD graphene was grown in a mixture of CH 4 -H 2 at 950 °C. The total gas pressure was fixed at 1 Torr. After deposition, the sample was rapidly cooled to room temperature at a cooling rate of about 10 °C/s by turning off the heater and filling the chamber with a flow of H 2 to promote carbon segregation and graphene formation. This conventional CVD was compared with a: - CH 4 -H 2 -Ar plasma CVD growth; - CH 4 introduced in the downstream of H 2 -Ar plasma. 1 Fig. 1. Picture of the Remote Plasma CVD reactor with an in situ spectroscopic ellipsometer for monitoring in real time graphene growth kinetics and plasma surface modifications. The obtained graphene samples were characterized by Raman spectroscopy, ellipsometry, van der Paw and Hall measurements, and Kelvin probe microscopy. 3. Results and Discussion 3.1 Effect of plasma activation on CVD of graphene on Cu Representative Raman spectra obtained for graphene on Cu using a direct plasma of CH 4 -H 2 -Ar (at 800 °C) , a plasma of H 2 -Ar for the afterglow activation of CH 4 (introduced in the plasma downstream), and thermal CH 4 :H 2 (at 1000 °C) are shown in Fig. 2. The spectrum of CVD graphene shows only the G and 2D peaks in a ratio I 2D /I G ∼2.5 characteristic of single layer graphene [14]. Conversely, all samples grown in presence of plasmas exhibit the additional distinct D peak, which is characteristic for defective graphene [14]. The higher quality of the CVD sample reflects in the lower sheet resistance, as also indicated in Fig. 2. The sheet resistance strongly correlates to the defect level (I D /I G ) of graphene. These characteristics have been described previously and attributed to nanographene [15]. The diameter, L, of the nanographene grains can be calculated from the D and G peak intensities as L = [I G C(λ)]/I D , with C (λ) a variable scaling coefficient that depends on the excitation wavelength [15]. This yields a plasma grown nanographene with dimension of 10 - 20 nm. Those results can be explained considering that, when CH 4 is directly decomposed in the plasma, the formation of C-atoms and methyl radicals are adsorbed on the Cu rapidly, and such a fast graphene synthesis results in defective graphene with amorphous and nanographitic inclusions. Then, atomic H in the plasma acts as an etchant for the C layer with creation of structural defects. 2 Fig. 2. Raman spectra of graphene on copper grown by (a) conventional thermal CVD, (b) plasma of H 2 -Ar with CH 4 introduced in its downstream, and (c) CH 4 -H 2 -Ar plasma. Inclusion of graphitic nanoclusters is avoided when the CH 4 is introduced in the downstream of an Ar/H 2 plasma. Indeed, the high density of plasma produced H-atoms appear to be also a dominant factor in C etching by the H atoms creating structural defects, such as re-hybridization from C-sp2 to C-sp3 by C-H formation, as seen in Fig. 2. Thus, although the plasma grown films have typically a higher defect density compared to graphene obtained by CVD, they can be suitable for applications such as catalysis and composites not requiring high mobility. 3.2. Advantages of H 2 remote plasmas in graphene substrates treatments Various pre-treatments of Cu and Ni substrates are being applied aimed at improving size and quality of graphene domains. The substrate pre-treatments serve several functions including removal of Cu and Ni native oxide that reduces catalytic activity of CH 4 dehydrogenation. The conventional treatment is an annealing in H 2 at 1000 °C for hours, which is also important for increasing the Cu and Ni grain size and rearranging surface morphology [16]. Indeed, the annealing results in irreproducible graphene quality. In this context, we demonstrate that H 2 remote plasmas of Cu and Ni substrates are effective in improving graphene quality. The role of the plasma produced hydrogen species in the interaction with Cu and Ni surfaces is discussed in detail at the conference. Here we provide evidences of the technological advantages of the plasmas in the graphene growth. Specifically, Fig. 3 shows that O-8-4 H 2 remote plasmas are effective in increasing the grain size and smoothing of Cu and Ni surfaces, which are necessary conditions to increase grain size of graphene. This is because atomic hydrogen enhanced the reflow of sputtered Cu films; an atomic hydrogen environment, self-diffusion of Cu is enhanced due to the weaker Cu–Cu interaction [17] reconstructing the Cu (or Ni) surface. “as-received” 150µmx150µm -30 H2 annealing H2 remote plasma 50 -25 50 -20 40 40 -15 30 30 20 20 -10 10 10 -5 0 0 0 5 -10 -10 10 -20 -20 15 -30 20 -40 -30 -40 -50 -50 25 -35 -30 -25 -20 -15 -10 -5 0 X (µm) 5 10 15 20 25 30 35 2 µm 2 µm 1 µm 30 -70 -60 -50 -40 -30 -20 -10 0 X (µm) 10 20 30 40 50 60 70 -70 -60 -50 -40 -30 -20 -10 0 X (µm) 10 20 30 40 50 60 70 300 H-plasma 250 200 150 H2 annealing Transverse Grain Size (µm) 350 100 50 0 Cu/SiO2/Si volatile products [18], leaving surface sites available for carbon nucleation. Similarly, we performed H 2 plasma pre-treatments of the Ni substrate, and we found a fast removal of residual oxygen/contaminants and atomic hydrogen surface chemisorption at Ni surface that passivates grain boundaries [12] and anneal dangling bonds at elevated temperatures. This atomic hydrogen passivation blocks surface site for C-nucleation, so that a more homogeneous graphene monolayer can be grown on Ni as shown in Fig. 5a as compared to a more non-homogeneous monolayer/bilayer (the dark spot in the micrograph in Fig. 5b) obtained by CVD. Furthermore, Fig. 5c shows that the deleterious addition of Ar to the H 2 plasma introduces a more significant ion bombardment by the long-living Ar metastable and ions that introduces structural defects in the Ni substrates, increasing the random nucleation of carbon. (a) H2 remote plasma at 850°C Cu-foil 900°C Cu-foil_400°C Fig. 3. 150 µm x 150 µm optical microscopy images of copper substrates as received and after a conventional H 2 annealing and an improved H 2 remote plasma; the effectiveness of the H 2 plasma in improving Cu grain size, necessary for growing high-quality graphene, is shown in the stick diagram. (b) H2 Annealing at 850°C 50 45 35 30 25 Intensity (a.u.) 20 15 10 5 Y (µm) We also show through Raman spectra of Cu foils after various treatments and of the graphene grown on them, the effectiveness of the H 2 plasma in removing all carbon and oxides impurities that inhibit graphene growth, improving the quality of the graphene, as shown in Fig. 4. 55 40 0 -5 -10 -15 -20 -25 -30 -35 -40 -45 -50 2 µm -55 (c) Ar/H2=100:10 plasma at 850°C Graphene-on-Cu foils Graphene on Cu foil H2 annealed but still with C-contamination -70 -60 -50 -40 -70 -60 -50 -40 -30 -20 -10 0 10 20 30 40 50 60 50 60 70 55 D 50 45 40 35 G 30 25 20 15 10 Graphene on Cu foil H 2 annealed Cu foils Cu foil as received Cu foil after H2 plasma Y (µm) 5 2D 0 -5 -10 -15 -20 -25 -30 -35 Contaminants -40 D -45 -50 2 µm -55 Cu foil #A 2D Intensity (a.u.) Wavenumber (cm-1) 150µmx150µm -30 -20 -10 0 10 20 30 40 70 Cu-oxides Graphene on Cu foil treated by H 2 plasma Cu foil #B G H2 Plasma 0 1200 1400 1600 1800 2000 2200 2400 2600 2800 250 500 750 1000 1250 1500 1750 2000 Raman shift (cm-1) 500 1000 1500 2000 2500 Raman Shift (cm-1) 3000 Fig. 4. (a) Raman spectra of various Cu foils after common annealing and after developed H 2 plasma treatment (blue line); (b) Raman spectra of the graphene-on-Cu foils (same as in (a)). Therefore, hydrogen radical produced from the remote plasma can penetrate into the Cu film and subsequently, impurities inside the film such as carbon, oxygen and sulphur that may cause local variations in the carbon dissolvability, can be removed by the formation of O-8-4 Fig. 5. Raman spectra and corresponding 150 µm x 150 µm optical micrographs of graphene grown on Ni substrates pre-treated by (a) a remote H 2 plasma (500 sccm, 60 W, 1Torr, 850 °C), (b) the conventional annealing in 1 Torr of H 2 at 850 °C, (c) an Ar/H 2 remote plasma (Ar/H 2 = 10, 60 W, 1 Torr, 850 °C). This results in a more defective graphene as shown by the D-peak in Fig. 5c and the higher density of multilayers graphene flakes (dark spots in the micrograph 5c image). Thus simple low power H 2 remote plasma is effective in improving Cu and Ni substrates and the resulting graphene quality. 3 22 20 18 π-Plasmon Photon Energy (eV) 4.75 4.70 C 4.65 4.60 4.55 4.50 B D 16 Graphene on Various Substrates 14 B D Ä_i 12 A 10 8 C 6 4 2 1 2 3 4 5 Photon Energy (eV) 6 Fig. 6. Spectra of the imaginary part, ε i , of the dielectric function of graphene on A) H 2 plasma treated Ni, B) H 2 annealed Ni, C) Ar/H 2 plasma treated Ni (the same samples as in Fig. 5). For comparison sample D is the reference exfoliated graphene on SiO 2 from ref. [20]. Therefore, H 2 plasma treatment of substrate is useful for control the degree of isolation of graphene from the substrate, and consequently graphene optical properties. 3.4 H 2 Plasma for graphene nanoribbons Recent studies [21] indicate that graphene nanoribbons can be achieved by using downstream H 2 plasmas, in which H atoms attack preferentially the edges of the ribbons. The remote H 2 plasma approach is of primary interest because it could allow the patterning of various 4 0.0 200 1.0 2.0 25 3.0 20 150 4.0 15 Si/SiO2 30 100 5.0 10 50 5 0.4 µm 6.0 0 6 4 2 0 X (µm) -5 2D -10 -15 -20 G -25 1 µm -30 -35 -30 -25 -20 -15 -10 -5 0 X (µm) 5 10 15 20 25 30 35 D Fig. 7. 70 µm x 70 µm optical micrography of nanoribbons of graphene on SiO 2 ; the corresponding Raman mapping in a selective area after the H 2 etching process and a representative spectrum show that graphene is not damaged by the H 2 remote plasma at low power (60 W), as indicated by the small contribution of the defects-related D-peak. A 4.80 graphene nanostructures with desired placements, controlled sizes/shapes. Among experimentalists, we have recently explored various low temperature H 2 remote plasma activated reactions to selectively etch graphene at edges without damaging the basal plane, showing the potential of remote H 2 plasma in achieving selective etching of graphene. An example is given in Fig. 7. Graphene 3.3 Tailoring optical properties of graphene by H 2 plasma In most cases, the strong hybridization of the electronic states and the charge transfer between graphene and the metal substrates modify the intrinsic hybridization between the Ni-3d and C-2pz orbitals, leading to the appearance of interface states at the K and M points of the Brillouin zone and to the loss of the Dirac cones at K [19]. In this respect, the surface hydrogen atoms introduced into the graphene/Ni(111) interface by the H 2 remote plasma processing of the Ni surface offer an appealing possibility to control the degree of hybridization between the Ni-3d and C-2pz orbitals. We derived the optical properties for the graphene films grown on the different processed substrates as in Fig. 5. The main feature observed in all spectra is the interband π-plasmon at photon energies > 4.8 eV. However, we observe a clear difference in the measured energies, being the π plasmon peak shifted toward higher energy upon the atomic hydrogen at the graphene/Ni interface, as shown in Fig. 6. We assume this trend as an evidence of a transition from an interacting to a quasi non-interacting regime. 4. Conclusions We have been showing how “old” and apparently well known H 2 remote plasmas can aid and implement the “new” graphene technology. Although this manuscript focused on providing various technological aspects of surface cleaning, substrate pre-treatment, growth, tailoring of optical and electrical properties and nanopatterning of graphene to emphasize the renewed interest in H 2 remote plasmas applications, aspects related to the chemistry of the plasma phase in relation to the various surface processes will be further elucidated at the conference presentation. 5. 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