st 21 International Symposium on Plasma Chemistry (ISPC 21) Sunday 4 August – Friday 9 August 2013 Cairns Convention Centre, Queensland, Australia Experimental investigations on helium APPJ characteristics and effects on photo-resist etching Wenjun Ning, Lijun Wang, Mingzheng Fu, Shenli Jia State Key Laboratory of Electrical Insulation and Power Equipment, Xi’an Jiaotong University, Xi’an, 710049, China Email: [email protected] Abstract: He-APPJ generated by 10 kHz sinusoidal voltage source in a quartz tube was studied on its electric and optical properties and then applied to Photo-resist (PR) etching. Despite the stable and uniform appearance, the discharge was actually composed by a series of fast ionization waves with the maximum speed of ~104 m/s. Optical emission spectrum (OES) contained rotational band of OH and second positive system of N2, which could be used to estimate the gas temperature and electron temperature. PR could be removed by He-APPJ, which might be mainly contributed to simple physical impaction rather than chemical collisions, because the energy of detected emission photos was insufficient to break the carbon-bonds such as C-H, C-C and C-O. Keywords: He-APPJ, plasma bullet, Optical emission spectrum, Photo-resist etching. 1. Introduction The process of stripping unnecessary photo-resists was important in large scale integrated circuit (LSIC) fabrication industry. Conventional ways such as low pressure plasma or wet chemicals for photo-resist removal had some essential drawbacks: the low pressure plasma called for expensive vacuum system while the wet chemicals could cause environment issues [1]. As a promising substitution, atmospheric pressure plasma jet (APPJ) had proved to be clean, safe and economic, which was widely investigated on variety applications in the areas of medical treating and material processing in recent years [2]. Several devices had been developed for generating APPJ [2]. APPJ was a kind of highly-collisional micro-discharge in which energetic species quenched by molecules from ambient air, thus the non-equilibrium state of plasma was sensitive to the injection power, the electrode structure, the working gas and the flow rate [3]. Electrodes with large curvature such as needle or fine wire driven by high frequency or short pulsed voltage were apt to ignite plasma, but the induced high energy ions usually caused ion bombardment damage to the silicon wafer [4]. Dielectric barrier discharge (DBD) could prevented from intense discharge such as spark or arc, meanwhile large amounts of active species could be carried by working gas downstream to several centimeters, which made it suitable for sensitive material processing. Noble gases were the preferred working gases for their comparatively stable chemical forms, since monatomic gas only had excitation level, more energy could be transferred to electrons and ions. In this study, we investigated He-APPJ on its electric and optical properties, and then it was applied to etch photo-resist coated on silicon substrate. Polarizing microscope and X-ray photoelectron spectroscopy (XPS) were used to study the etching effect. 2. Experiment setup The applied APPJ system was a DBD structure, which contained a quartz tube as the dielectric barrier and gas channel with inner and outer diameters to be 4mm and 6mm, respectively. Two coaxial copper sheets wrapping around the tube separated by 2mm were used as the electrodes, which connected directly to a 10 kHz sinusoid voltage source since matching network was unnecessary in this case. Highly pure helium (99.99%) was controlled by mass flow meter with constant flow rate of 3000 standard cubic centimeter per minute (sccm). Optical spectrometer (Andor SR750, Andor Ltd, UK) equipped with iCCD (Andor’s iStar, Andor Ltd, UK) was used to detect the active species in plasma and capture the temporal and spatial development of the discharge. Current in the circuit was taken from a sample resistance (50 Ω) in series with the ground electrode, while the input voltage was monitored by a capacitive divider in series with the power electrode. An oscilloscope (DPO 3014, Tektronix Inc., USA) was employed to evaluate the I-V curve; moreover, with the help of digital delay generator (DG535, Stanford, USA), it gave the trigger signal st 21 International Symposium on Plasma Chemistry (ISPC 21) Sunday 4 August – Friday 9 August 2013 Cairns Convention Centre, Queensland, Australia to iCCD based on the current waveform. The system was illustrated in Fig. 1. 3. Results and Analysis 3.1 Electric property Based on the Paschen’s law, helium can be ignited in relatively low voltage (Vp-p=6 kV in this case). With the increasing of power supply, the APPJ could go through three distinct modes, namely the chaos mode, bullet mode and the continuous mode [5]. In this studied case bullet mode was preferred since chaos mode was weak and unstable, whereas continuous mode could easily transfer to spark discharge because of plasma heating. Fig. 1 showed the I-V curves of the jet operating in bullet mode. DBD structure assigned the capacitive nature of discharge that the phase shift was around 90o, even when the discharge was ignited; Discharge current which was defined as the subtracting displacement current (plasma off) from the total current (plasma on) showed two isolated peaks in a voltage period, which indicated that the discharge was discontinuous. Displacement current was the main component in total current, thus the discharge was stable and low power consumed, which was approximate 0.5W as shown in Fig. 2. 3.2 Optical investigation Despite the uniform and stable appearance of the He-APPJ, research had pointed out that the discharge was actually a series of ionization waves travelling with speed of 104~105m/s ,known as the ‘plasma bullet’[2]. With the help of intensified Charge Coupled Device (iCCD), the temporal and spatial evolution of He-APPJ could be clearly observed. Fig. 2 (a) showed the plasma bullet evolution during the time section ∆t1 corresponding to Fig. 1. It was worth noting that the bullets was firstly generated on both edge of the power electrode, and then travelled independently into the DBD zone or the open space downstream. Plasma bullet was actually ionization wave which was familiar with positive streamer; Large amounts of positive ion moved fast towards the cathode and collided with molecules and metastable species, while electrons quickly recombined with positive ions behind the streamer head to form quasi-neutral plasma channel. The applied voltage then mainly dropped at streamer head, resulting in very high electric field. There were different opinions on the mechanism of positive streamer propagation; Lu et al proposed a photo-ionization model which emphasized the importance of photo-ionization before the streamer head supplying seed electrons [6], while Sakiyama et al argued that the Penning ionization might play a crucial role [7]. Optical emission spectrum (OES) shown in Fig. 3 supported Sakiyama’s theory. The first negative system (FNS) of N2+ at 391.4nm was detected, which was generated by Penning process: He*+N2=>N2++He+e (1) He2*+N2=>N2++2He+e (2) Fig. 2 (b) was the measured bullet speed in the jet where the zero position corresponding to the exit nozzle. The bullets were firstly accelerated by the electric field to a maximum speed of 1.38x104 m/s, and then slowed down until completed quenched by the ambient air. The jet length in our study was about 1.5cm, which could be manipulated by the input power, the gas flow rate and the tube size [8]. Because of the interaction with ambient air, abundant of N-contained spectrum lines were detected in the OES; In addition, OH (308.4nm) line was obvious, since the moisture in air could be decomposed in collisional process. The electron temperature and gas temperature were then evaluated from the vibrational level of N2 second positive system (SPS) and the rotational level of OH, respectively [9]. Spectrum Analyzer 1.7 was used to calculate the spectrum assuming the populations following Boltzmann distribution [10].Three emission lines of N2 (C→B, ∆ν=-2) at 371.05nm, 375.54nm, 380.49nm were used for vibrational temperature, and four emission lines of OH (A → X, ∆ν=0) at 307.84nm, 308nm , 308.33nm and 308.52nm was used for rotational temperature. Under the experiment conditions mentioned above, the electron temperature and gas temperature were estimated to be around 3000 K (0.26 eV) and 320 K by. The results revealed that He-APPJ was typically non-equilibrium plasma, which was suitable for sensitive material interaction. 3.3 Photo-resist Etching Commercial available EPG-533 negative photo-resist coated on silicon substrate with thickness ≈ 1µm was used in the experiment. When silicon substrate was placed underneath the He-APPJ, the discharge was more st 21 International Symposium on Plasma Chemistry (ISPC 21) Sunday 4 August – Friday 9 August 2013 Cairns Convention Centre, Queensland, Australia intense and the interaction area was concentrated, which could be explained by that the silicon wafer acted as suspended electrode thus the electric field was intensified in the jet [11]. The distance between the exit nozzle and the substrate was maintained to be 5 mm. Fig. 5 showed the surface morphology of the photo-resist after 5 minutes etching. Photo-resist was removed from the central spot out spread to about 0.85 mm, resulting in ring-shape appearance. The surface was clean and little ion bombardment burning was observed. PR was mainly composed by C, O and H, the mechanism of He-APPJ removing PR could be explained as follows. The detected emission photos (Emax=4.1eV at 308nm) were insufficient to break the carbon bonds such as C-O (3.6 eV) , C-C (3.8 eV) and C-H (4.2 eV) [12], so it was reasonable to assume that simple physical impaction was the dominated process. As mentioned before, He-APPJ was composed by a series of high-speed (104 m/s) ionization waves, the kinetic energy carried by ions such as N2+ and He+ was sufficiently high (estimated to be hundreds eV) to scissors the carbon bonds, then O radicals combined with hydrocarbon fragments to produce volatile CO2 and H2O. After the etching, XPS analysis revealed that C was reduced, whereas N, O and Si were increased. During the photo-resist etching process, C was converted to volatile CO2 and silicon was exposed st 21 International Symposium on Plasma Chemistry (ISPC 21) Sunday 4 August – Friday 9 August 2013 Cairns Convention Centre, Queensland, Australia to the air; On the other hand, N and O could be trapped by complex N, O-containing structures such as C-NO bonds [1]. References [1] H.H. Chen, C.C. Weng, J.D. Liao, K.M. Chen, B.W. Hsu, Journal of Physics D: Applied Physics 42,135201 (2009). [2] X. Lu, M. Laroussi, V. Puech, Plasma Sources Science and Technology 21,034005 (2012). [3] D. Mariotti, Applied Physics Letters 92,151505 (2008). [4] T. Hattori, Y.-J. Kim, C. Yoon, J.-K. Cho, Semiconductor Manufacturing, IEEE Transactions on 22,468 (2009). [5] J.L. Walsh, F. Iza, N. Janson, V. Law, M.G. Kong, Journal of Physics D: Applied Physics 43, 075201 (2010). [6] X. Lu, M. Laroussi, Journal of Applied Physics 100,063302 (2006). [7] Y. Sakiyama, D.B. Graves, Plasma Sources Science and Technology 18,025022 (2009). 4. Conclusion He-APPJ was investigated on electrical and optical properties and the effect on PR etching. The discharge was actually discontinuous but a series of fast ionization waves (known as the ‘plasma bullet’) with the maximum speed to be 1.38x104 m/s in our device. Power consumed in the discharge was relatively low and the gas remained approximate room temperature, which was suitable for heat-sensitive material processing. He-APPJ was able to remove PR with little burning damage left. The optical emission spectrum could only detect lines with energy that was insufficient for breaking carbon bonds such as C-H and C-O, so it was reasonable to assume that the dominant mechanism of PR etching by He-APPJ was simple physical impaction. Acknowledge This research was supported by the Fundamental Research Funds for the Central Universities of China. [8] E. Karakas, M. Koklu, M. Laroussi, Journal of [9] D. Staack, B. Farouk, A.F. Gutsol, A.A. Fridman, Physics D: Applied Physics 43,155202 (2010). Plasma Sources Science and Technology 15,818 (2006). [10] Z. Navratil, D. Trunec, R. Šmíd, L. Lazar, Czechoslovak Journal of Physics 56,B944 (2006). [11] Y. Sakiyama, D.B. Graves, E. Stoffels, Journal of Physics D: Applied Physics 41,095204 (2008). [12] M. Iwasaki, Y. Matsudaira, K. Takeda, M. Ito, E. Miyamoto, T. Yara, T. Uehara, M. Hori, Journal of Applied Physics 103,023303 (2008).
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