Supplement of Atmos. Meas. Tech., 8, 1–18, 2015 http://www.atmos-meas-tech.net/8/1/2015/ doi:10.5194/amt-8-1-2015-supplement © Author(s) 2015. CC Attribution 3.0 License. Supplement of Application of high-resolution time-of-flight chemical ionization mass spectrometry measurements to estimate volatility distributions of α-pinene and naphthalene oxidation products P. S. Chhabra et al. Correspondence to: P. S. Chhabra ([email protected]) 1 Average Relative Sensitivity An average sensitivity factor was applied for species detected by the acetate-CIMS based upon literature data from Veres et al. (2010); Yatavelli et al. (2012); Aljawhary et al. (2013). Sensitivities measured for various acids normalized to the formic acid sensitivity are compiled in Supplemental Table 1. The average relative acetate-CIMS sensitivity, 1.3 ± 0.8, is multiplied to the measured 5.5 ± 0.9 Hzppt−1 sensitivity of formic acid. Thus, to all acid signals (except formic), we apply a total sensitivity of 7.1 ± 4.6 Hzppt−1 . Supp. Table 1. Relative sensitivities of various organic acids and their corresponding references. Since pyruvic acid appears twice, the average is used the in the determination of the average relative acetate-CIMS sensitivity. Organic Acid Relative Sensitivity to Formic Acid Reference succinic acid 2.20119 Aljawhary et al. (2013) malonic acid 2.09693 Aljawhary et al. (2013) glyoxylic acid 1.861 Aljawhary et al. (2013) 1.24072 Aljawhary et al. (2013) oxalic acid pyruvic acid 1.39841 Aljawhary et al. (2013) tartaric acid 0.892451 Aljawhary et al. (2013) citric acid 0.53865 Aljawhary et al. (2013) pinonic acid 1.76795 Aljawhary et al. (2013) pyruvic acid 1.45291 Veres et al. (2010) glycolic acid 1.79056 Veres et al. (2010) methacrylic acid 0.233644 Veres et al. (2010) acrylic acid 0.695613 Veres et al. (2010) propionic acid 0.0348808 Veres et al. (2010) palmitic acid 0.54 Yatavelli et al. (2012) azelaic acid 0.88 Yatavelli et al. (2012) tricarballyic acid 2.6 Yatavelli et al. (2012) 2 2 Estimation of Uncertainty in Vapor Pressures and Partitioning We derive a correlation of uncertainty as a function of vapor pressure from Figure 12 of Pankow and Asher (2008), reproduced here as Supplemental Figure 1. The parameter σF IT represents the average of the absolute Supp. Fig. 1. Figure 12 reproduced from Pankow and Asher (2008) illustrating decadally binned averages of σF IT as a function of the log of experimental vapor pressure. deviations between the logarithm of predicted and experimental pressures, decadally binned according to the log of the experimental vapor pressure: σF IT = NC N T ,i X 1X log10 p0L,i (Tj,i )P − log10 p0L,i (Tj,i )E N i=1 j=1 (1) To estimate σF IT as a function of vapor pressure, data from Response Figure 1 from temperatures 273.15 to 333.15K were extracted and fitted with an exponential function (σCORR ) as shown in Response Figure 2, where: σCORR = y0 + Ae −(p0 L,i −x0 ) τ (2) The average absolute deviation from the mean is less than or equal to the standard deviation, and for a normal p distribution the ratio of the mean absolute deviation to the standard deviation is 2/π (Geary, 1935). Thus, 3 1.6 Coefficient values ± one standard deviation y0 = 0.21115 ± 0.045 A = 1.5042 ± 0.0814 τ = 4.0382 ± 0.478 X0 = -13.1307 1.4 σFIT 1.2 1.0 0.8 0.6 0.4 -12 -10 -8 -6 -4 -2 Averaged Log pL,i0 (atm) - experimental 0 Supp. Fig. 2. Exponential correlation between σF IT and average log of vapor pressure binned to the nearest integer to provide a more conservative estimate of the error, we divide σCORR by −(p0 L,i −x0 ) y0 + Ae p σSIM = τ p 2/π: 2/π (3) where σSIM represents the uncertainty in SIMPOL vapor pressure (in log(atm)) used in our analysis. σSIM is propagated through the analysis and from which uncertainties in c∗ and ξi are calculated using standard error propagation rules. Because log10 (p0L,i ) and log10 (c∗i ) differ by a constant, σlog10 c∗i = σSIM (4) Thus: ∗ σc∗i = 10log10 ci σlog10 c∗i (ln10) (5) and σξi = σc∗i c∗ i COA 1 + COA 4 2 (6) C11H21O3 C12H21O4 0.14 0.12 C11H19O2 C11H19O3 0.0 0.2 0.4 0.6 0.8 1.0 Fraction of Mass Moved C10H17O4 C9H15O2 Mass Defect C11H19O6 C9H17O3 0.10 C10H15O3 C10H15O4 C6H9O 0.06 C8H9O4C9H9O4 C7H9O4 C9H9O5 C8H9O5 C5H9O4C6H9O4 C4H5O2C5H5O2 C2H3O C3H3O C6H5O3 C3H5O3 C4H5O3 C5H5O3 C2HO C2HO2 C6H5O4 C3H5O4 C5H5O4 C3H3O3 C5H3O3 C2H3O3C2H3O4 C4H3O3 C5H3O4 C3H3O4 C4H3O4 C4H3O5 C2HO3 50 C10H11O7 C7H9O5 C7H9O6C8H9O6 C8H7O5 C7H7O5 C6H7O6C7H7O6 C2H5O4 C4H3O2 C3H3O2 0.00 CHO2 C10H17O7 C8H11O3 C7H7O3 C6H7O3 C4H7O3 C5H7O3 C6H7O4 C7H7O4 C5H7O4 C3H5O C4H5O C11H17O6 C11H15O6 C10H15O6 C10H13O3 C7H13O3 C8H13O3 C10H15O7 C7H13O4 C8H13O4 C10H13O4 C9H13O4 C8H13O5 C7H11O2 C10H13O5 C8H11O2 C9H13O5 C9H13O6 C10H13O6 C6H11O3 C7H11O3 C9H13O7 C10H13O7 C7H11O4 C9H11O4 C8H11O4 C7H11O5 C9H11O5 C7H9O2 C8H11O5 C8H11O6 C6H9O3 C7H9O3 C4H7O2C5H7O2C6H7O2 0.04 C11H17O5 C12H17O5 C10H15O5 C9H13O3 0.08 0.02 C12H19O5 C10H17O2 C5H5O5 C7H5O5 C6H5O5 C7H5O6 C6H3O5 α-pinene/O3 C6H3O6 C2HO4C3HO4 100 150 m/z 200 Supp. Fig. 3. Mass defect plot of α-ozonolysis CIMS spectra (Expt. 1). The text of each marker represents the chemical formula of the identified CIMS anion. The size of each marker represents the mass fraction of that ion in the spectra. The color of each ion is scaled to indicate how much of its signal is subtracted and given to its base ion (molecular formula less C2 H4 O2 ). A gray color indicates less than 1% of the signal is moved. 5 -2 Mass Defect 8x10 0.00 0.05 0.10 0.15 0.20 0.25 Fraction of Mass Moved 6 C13H11O3 C5H11O5 C5H9O3 C4H7O2 4 C9H7O3 C10H7O3 C3H5O2 C7H5O3 C8H5O3 C3H5O3 2 C4H5O4 C3H5O4 C3H3O C3H3O2 C4H3O2 C2H3O3 0 C9H7O4 C10H7O4 C9H7O5 C10H7O5 C8H5O2 C4H3O3 C10H5O4 C9H5O4 C7H5O4 C8H5O4 C7H5O5 C8H5O5C9H5O5 C10H5O5 C7H5O6 C6H3O3 C3H5O6C4H5O6 C4H3O5 CHO2 C10H5O6 C7H5O7 C4H3O4C5H3O4 C6H3O5 C2HO3 naphthalene C6H3O6 C2HO4 50 100 150 m/z 200 Supp. Fig. 4. Mass defect plot of naphthalene photooxidation CIMS spectra (Expt. 12). The text of each marker represents the chemical formula of the identified CIMS anion. The size of each marker represents the mass fraction of that ion in the spectra. The color of each ion is scaled to indicate how much of its signal is subtracted and given to its base ion (chemical formula less C2 H4 O2 ). A gray color indicates less than 1% of the signal is moved. 6 2.0 1.8 1.6 H/C 1.4 6 1324 5 8 9 7 0.5 1.0 1.2 1.0 0.8 0.6 0.0 1.5 2.0 O/C 1. 2. 3. 4. 5. 6. 7. 8. 9. pinonic acid hydroxy pinonic acid norpinonic acid pinic acid norpinic acid 3-hydroxy-2,2-dimethylglutaric acid 3-hydroxyglutaric acid 3-methyl-1,2,3-butanetricarboxylic acid terebic acid Supp. Fig. 5. Van Krevelen plot of tracer acids from the α-pinene system, as shown in Figure 3, Panel A. Tracers are numbered, corresponding to their proposed identities shown below. Tracers identified by Yu et al. (1999) are in black and tracers identified by Claeys et al. (2013) are in red. 7 2.0 1.8 1.6 H/C 1.4 1.2 1.0 0.8 13 42 56 7 8 9 10 0.6 0.0 0.5 1.0 1.5 2.0 O/C 1. cinnamic acid 2. dihydroxy cinnamic acid 3. benzoic acid 4. hydroxy benzoic acid 5. formyl cinnamic acid 6. carboxycinnamic acid 7. phthaldehydic acid 8. phthalic acid 9. hydroxy phthalic acid 10. dihydroxy phthalic acid Supp. Fig. 6. Van Krevelen plot of tracer acids from the naphthalene system, as shown in Figure 3, Panel B (Kautzman et al., 2009). Tracers are numbered, corresponding to their proposed identities shown below. 8 10 10 0.6 0.8 1.4 0.6 0 -5 A 1.4 0 B 10 8 6 4 2 0 Gas 12 Carbon Number ×5 10 8 6 4 2 0 2 0 Carbon Number ×20 10 10 0.6 0.8 5 1.0 1.2 O/C 0.6 1.4 Log c* Log c* 1.0 1.2 O/C -5 Gas 12 0.8 5 Log c* Log c* 5 1.0 1.2 O/C 0 0.8 5 1.0 1.2 O/C 1.4 0 -5 -5 C 12 D Particle Particle 10 8 6 4 2 12 0 10 8 6 4 Carbon Number Carbon Number Supp. Fig. 7. Estimated Log c* as a function of carbon number and O/C for two different naphthalene photooxidation experiments. Panels A and C represent extracted gas and particle spectra of Expt. 12 respectively, and Panels B and D represent the same of Expt. 15. Marker size is proportional to the fraction of mass. The factor and arrow in red represents the relative mass scale between gas and particle spectra. For example ×20 between panels B and D indicate that markers of equal area represent equal fractions in their respective phases and 20 times more mass in the gas-phase spectrum. 9 References Aljawhary, D., Lee, A. K. Y., and Abbatt, J. P. D.: High-resolution chemical ionization mass spectrometry (ToFCIMS): application to study SOA composition and processing, Atmos. Meas. Tech., 6, 3211–3224, doi:10.5194/ amt-6-3211-2013, aMT, 2013. 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