Chemical Physics Letters 414 (2005) 107–110 www.elsevier.com/locate/cplett Synthesis and photoluminescence property of nanostructured sol–gel indium tin oxide film on glass Susmita Kundu, Prasanta K. Biswas * Sol–Gel Division, Central Glass and Ceramic Research Institute, 196 Raja S.C. Mullick Road, Kolkata 700032, West Bengal, India Received 3 August 2005 Available online 2 September 2005 Abstract Sol–gel dip coated indium tin oxide film of In:Sn = 90:10 was prepared on glass at 350 °C from aqueous precursor. Nanostructured feature and cubic phase of the film were characterized by scanning electron microscopy and X-ray diffraction studies, respectively. Average cluster of 4.7 nm diameter was measured by the transmission electron microscopy and it is near to Bohr radius of In2O3. The evaluated bandgap of the nanocluster (Eg = 4.0 eV) is consistent with the absorption band appearing for quantum confinement. The confinement phenomenon resulted in photoluminescence (PL) when excited at different photoluminescence excitation wavelengths. The PL bands have been identified as the emissions of bound and free excitons. Ó 2005 Elsevier B.V. All rights reserved. 1. Introduction Quantum confinement effect of nanostructured semiconductors having size close to Bohr radius [1–5] presently leads to the development of nonlinear optical (NLO) materials. These materials have large potentiality for photonic devices [6,7]. Transparent conducting oxides (TCO) can be promising NLO materials if their nanoclusters are suitably confined to generate excitons. Usually the excitons formed by the combination of electron and hole on exposure to electromagnetic radiation have photoluminescence property [7]. The added advantage of these materials is visible transmissivity due to their wide bandgap values [8]. Attempts have been made by various research groups [9–14] to study nanosized TCO such as indium tin oxide (ITO) and its base materials. They have concentrated on the quantum confinement study [6,15] of the nanostructured SnO2, In2O3 with little emphasis on indium tin oxide. Hence, we have been interested in synthesizing nanostructured ITO close to Bohr radius and characterizing photoluminescence behavior to understand its quantum confinement effect. * Corresponding author. E-mail address: [email protected] (P.K. Biswas). 0009-2614/$ - see front matter Ó 2005 Elsevier B.V. All rights reserved. doi:10.1016/j.cplett.2005.08.062 Regarding the synthesis of nanostructured ITO, thrust has been given to its development in nanocluster, nanorod and nanowire forms using co-precipitation [11], microemulsion [12], solvothermal [13] or carbon assisted processes [14]. We have carried out a new synthesis route to prepare ITO, i.e. Sn doped In2O3 (In:Sn = 90:10) nanoclusters in thin film form using sol–gel precursor starting from an aqueous solution of metal salts and an organic binder. We also studied their photoluminescence exciting at different wavelengths. 2. Experimental The precursor sol for the indium tin oxide film was prepared from the aqueous solution of hydrated In(NO3)3 and SnCl4 Æ 5H2O. The indium nitrate solution was synthesized starting with indium ingots (SRL, India) and concentrated nitric acid (A.R.). Then aqueous solution of SnCl4 Æ 5H2O (A.R.) was added to the above, maintaining [16,17] In:Sn = 90:10. Hydrolysis and condensation reaction was accomplished by refluxing the mixed solution for 4 h. To improve the wettability of the precursor, aqueous solution of an organic binder, polyvinyl alcohol (PVA) (molecular weight 22 000, BDH, UK) [–CH2–CH(OH)–]n was added. S. Kundu, P.K. Biswas / Chemical Physics Letters 414 (2005) 107–110 Desired concentration of the sol (6.0 wt% equivalent In2O3) was maintained by addition of deionized water and the sol was aged for 48 h. Film of 2000 ± 5 Å thickness (measured by Autogain L116B ellipsometer) was developed on Heraus make (Germany) suprasil grade pure silica glass by the dipping technique (Chemat 200, USA). The film was initially dried up to 100 °C in an air oven and then cured at 350 °C with a soaking of 30 min when the nanocluster of ITO was formed through the decomposition of PVA. The surface morphology and the cluster size distribution of nanostructured indium tin oxide film were studied by scanning electron microscopy (SEM) (Leo 400C) and transmission electron microscopy (TEM) (Jeol 2110), respectively. Carbon coated 300 mesh Cu grid were used for TEM images. Crystalline phase was identified by XRD pattern obtained from a X-ray diffractometer [Philips PW-1730 (Ni-filtered Cu Ka radiation)]. UV–Vis absorption and photoluminescence (PL) spectra were recorded using Shimadzu UV–Vis–NIR (model 3101PC) spectrophotometer and Perkin Elmer fluorimeter (LS55), respectively. 222 Intensity (a.u.) 108 400 440 25 30 35 40 45 50 622 55 60 65 2θ (degree) Fig. 1. X-ray diffraction pattern of the ITO film cured at 350 °C. 3. Results and discussion It is interesting to note that two specific functions of the organic binder, PVA are in operation in the synthesis. These are: (i) to increase wettability of the precursor due to the increase of hydroxyl groups and (ii) to generate nanoclusters through its decomposition. During thermal curing of the sol–gel layer, decomposition of PVA starts at 250 °C when the bond, C–O is possibly broken (Eq. (1)) and the nanoclusters of the metal oxides are formed in the PVA decomposed area. Fig. 2. SEM image of the nanostructured ITO film. > 250˚C [-CH2-CH-]n O-M [-CH2-CH-]n ~ O-M (M = In/Sn) ð1Þ It is also not unlikely to generate oxygen deficient entities during the removal of PVA. All the diffraction lines in XRD pattern (Fig. 1) are assigned to the bixbyite cubic structure [16] of ITO with close resemblance to oxygen deficient In2Sn2O7x entities [18]. Microstructure of the film as depicted by SEM image (Fig. 2) reveals the nanostructured feature of ITO. The TEM image (Fig. 3a) has been utilized to estimate the nanocluster size of ITO. The average size of 4.7 nm diameter was obtained from the size distribution of the clusters depicted in the histogram (Fig. 3b). As we understand, the Bohr radius of In2O3 is 2.14 nm [19] and the dopant Sn4+ replaces the In3+ site in ITO having almost similar size, it can be stated that the nanocluster size is approaching to the Bohr radius of ITO. Hence, there is large possibility of quantum confinement of the nanoclusters which results in formation of hydrogen like excitons with the interaction of electromagnetic radiation. The absorption spectrum in Fig. 4a gives a broad band at around 310 nm (4.0 eV) which is due to the excitonic transition of the ITO nanoclusters from highest occupied molecular orbital (HOMO) in the valence band to the low- est unoccupied molecular orbital (LUMO) in the conduction band. The excitonic peak is in good agreement with earlier reported results of In2O3 nanoclusters encapsulated in mesoporous silica host [15]. We have also recorded absorption spectra (not shown here) of pure silica glass substrate and pure PVA film deposited on pure glass substrate in the same region. But we did not find any absorption behavior near 300 nm. This experiment confirmed that the absorption band of ITO film at 310 nm is due to the nanostructured feature. The excitonic transition displays parabolic absorption and the relation (Eq. (2)) fits well to the direct bandgap of typical semiconductors, where a is the absorption co-efficient of the film, hm is the photon energy and E is the bandgap. We evaluated effective bandgap of the nanoclusters from the plot, (ahm)2 vs. hm. From the inflexions of the plot (Fig. 4b) it is clear that two entities are present in the film. ahm / ðhm EÞ 1=2 . ð2Þ We obtained two bandgap values at 3.60 and 4.0 eV as per the selected regions, (3.50–3.90 eV) and (3.90–5.50 eV). The 3.60 eV corresponds to the bandgap of the bulk ITO (Eg (bulk), Eq. (3)) [8], whereas the blue shift 4.0 eV (Eg, Eq. S. Kundu, P.K. Biswas / Chemical Physics Letters 414 (2005) 107–110 109 Fig. 3. (a) TEM image of ITO nanoclusters. Inset shows the corresponding high-resolution image of single crystal showing the lattice resolved planes, (b) histogram showing the size distribution of nanoclusters. b a 2.0 120 1.5 2 (αhν) x 10 Intensity (a.u.) 10 80 1.0 40 0.5 0.0 200 0 300 400 500 600 700 800 3 4 5 6 7 hν(eV) Wavelength (nm) Fig. 4. (a) Absorption spectrum of ITO film, (b) plot of (ahm)2 vs. hm. (3)) is resembling to the absorption band due to excitonic transition. It is expected that some amount of ITO are of larger cluster size which is responsible for the appearance of inflexion in the 3.50–3.90 eV region of the plot, (ahm)2 vs. hm. However, this value is useful to calculate the nanocluster size. According to Brus formula (Eq. (3)) on exciton transition [1], the nanocluster size can be evaluated if the effective bandgap of nanocluster and that of bulk are known. Eg ¼ Eg ðbulkÞ þ h2 ð1=me þ 1=mh Þ=8R2 1.8e2 =eR þ ; ð3Þ where Eg is effective bandgap of nanocluster (quantum dot), Eg (bulk) is the direct bandgap energy of bulk system, R is the nanocluster radius, e is the dielectric constant of the system, me and mh are the effective masses of electron and hole of exciton. Using the evaluated bandgap values in Eq. (3) and considering e, me and mh of In2O3 [15] as 9, 0.3 m0 (m0 = mass of electron) and 0.6 m0, respectively, we calculated nanocluster size (diameter) because ITO retains its crystalline structure even with dopant incorporation in In2O3. The evaluated cluster size is 3.7 nm which is quite close to the average value, 4.7 nm measured from the TEM image. To understand the confinement behavior we have recorded the photoluminescence (PL) spectra (Fig. 5a) of the film excited at the bandgap energy (Eg = 4.0 eV, i.e. 310 nm, kex) of the excitons. Three PL bands appeared at 423, 486, 529 nm with a shoulder at 439 nm. If the PL be fixed at 423 nm, we obtained four photoluminescence excitation (PLE) bands at 270, 278, 290 and 310 nm. It is already noted by other workers [20,21] that in the nanoclusters of semiconductors associated with defect 110 S. Kundu, P.K. Biswas / Chemical Physics Letters 414 (2005) 107–110 a b (B) 290 310 423 362 (A) λ1 λ d 2 c λ3 b a Intensity (a.u) Intensity (a.u) 270 278 439 486 λ1=387 nm λ2=394 nm λ3=403 nm 280 320 (B) 420 439 (A) 486 529 529 a b c,d 360 400 440 480 Wavelength (nm) 520 300 350 400 450 500 Wavelength (nm) 550 600 Fig. 5. (a) Photoluminescence (PL) spectra (A) of the ITO film excited at: a, 310 nm; b, 290 nm; c, 278 nm; d, 270 nm, Photoluminescence excitation (PLE) spectra (B) of the ITO film fixing the PL band at 423 nm. (b) PL spectrum (A) of the ITO film excited at 362 nm; PLE spectrum (B) of the same film fixing the PL band at 439 nm. centers, emissions for both bound and free excitons would appear when kex is equivalent to Eg and emissions for only free excitons in the case kex is >Eg or <Eg. Hence, we may predict that the PL bands at 423, 486 and 529 nm are for bound excitons trapped in the defect centers of ITO. We also excited at other PLE wavelength, kex = 270, 278, 290 nm which are >Eg and obtained one additional PL band at 400 nm which shifts to lower energy with decreasing excitation energy. This band may be ascribed to the free excitons and the shift with variation of excitation energy is due to the change in nanocluster size [22] as revealed from the histogram of the TEM picture. In the case of excitation at kex = 362 nm, <Eg two prominent PL bands appeared (Fig. 5b) at 420 and 439 nm with two shoulders at 486, 529 nm. The 439 nm band is possibly due to the defect of In–O vacancy [23]. 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