Materials Express 2158-5849/2014/4/159/006 Copyright © 2014 by American Scientific Publishers All rights reserved. Printed in the United States of America doi:10.1166/mex.2014.1159 www.aspbs.com/mex Structural and optical investigations of In doped ZnO binary compound Yarub Al-Douri1, ∗ , Ali H. Reshak2, 3 , Waleed K. Ahmed4 , and Alaa J. Ghazai5 1 Institute of Nano Electronic Engineering, University Malaysia Perlis, 01000 Kangar, Perlis, Malaysia Institute of Complex systems, FFPW, CENAKVA-South Bohemia University CB, Nove Hrady 37333, Czech Republic 3 Center of Excellence Geopolymer and Green Technology, School of Material Engineering, University Malaysia Perlis, 01007 Kangar, Perlis, Malaysia 4 Faculty of Engineering, ERU, United Arab Emirates University, 15551, Al Ain, UAE 5 Physics Department, College of Science, Thi-Qar University, 55055, Thi-Qar, Iraq 2 Delivered by Ingenta to: ? The structural and optical properties of indium (In) in zinc oxides15:33:13 (ZnO) are investigated. Chemical spray IP: 5.10.31.211 On:doping Sun, 18 Jun 2017 deposition technique is used for doping ZnOAmerican by In. X-ray diffraction (XRD) studies have shown a change in Copyright: Scientific Publishers preferential orientation from (002) to (101) crystal plane with increasing in In dopant concentration. The transmission spectra, absorption coefficient, energy band gap, refractive index and optical dielectric constant utilizing specific models for In doped ZnO are investigated. The measured and calculated results are in agreement with experimental and theoretical data. Keywords: ZnO, Chemical Synthesis, Optical Properties, Doping, Analysis. 1. INTRODUCTION Zinc oxide has attracted interest due to its electronic properties, i.e., semiconducting band gap is about 3.4 eV, and the possibilities of application in optoelectronics, directly or as a substrate for the growth of other semiconductors such as GaN and SiC is available.1 Moreover, because of its superior electronic, optical and piezoelectronic properties, it is an attractive candidate for applications in ultraviolet light emitters, transparent field-effect transistors, ultraviolet nanolasers, photodetectors, surface acoustic wave devices, sensors and piezoelctronic devices.2–4 Low resistive zinc oxides have been achieved by doping with different group-III elements like Al, B, In and Ga or with group-VII elements like fluorine.5 The essential phase of crystallization for ZnO is hexagonal wurtzite phase.6 Theoretical7 and experimental8 studies have been focused on ZnO, with an interest to study the ∗ Author to whom correspondence should be addressed. Email: [email protected] properties of ZnO in its cubic phase.9 In the last few years there were tremendous efforts on understanding the physical and optical properties of ZnO with particular attention on fabrication devices such as UV lasers.10 Rezapour and Talebian11 have synthesized crystalline ZnO with different morphologies by solvothermal and sol– gel synthesis methods in various solvents as the reaction medium. X-ray diffraction (XRD) data has shown hexagonal single-phase ZnO with the wurtzite crystal structure for all solvents. The optical properties of synthesized ZnO were investigated by UV-vis absorption and room temperature photoluminescence (RTPL) and well-defined relationship with solvent viscosity. Photocatalyticactivity (PCA) of ZnO with different morphologies has been examined toward photodegradation of phenol by the same group.11 Also, Lu et al.12 have investigated the optical transmittance of Al-doped ZnO improved using ZnO nanorods prepared by the aqueous chemical growth method, where the length and diameter of the rods were controlled by the OH– concentration of hexa-methenamine in the solution. Mater. Express, Vol. 4, No. 2, 2014 159 Article ABSTRACT Materials Express Structural and optical investigations of In doped ZnO binary compound Al-Douri et al. They have improved the transmittance of Al-doped ZnO with post-grown ZnO nanorods at wavelengths between 400 and 850 nm by modulating the air volume ratio of rod densities and diameters. Spray pyrolysis technique has been profited due to its simplicity and possibility to produce large areas. The properties of the deposited material can be varied and controlled by proper optimization of spraying conditions. The purpose of this work is to investigate the effect of In doped ZnO on the structural and optical properties. The organization of this work is as the following: Section 2 displays the experimental process. The structural and optical properties are stated in Section 3. Last one is the conclusion. Article 2. EXPERIMENTAL PROCESS In doped ZnOs were deposited on glass substrates using spray pyrolysis technique. The deposition method involves the decomposition of an aqueous solution of zinc acetate. To achieve indium doping, indium trichloride (InCl3 ) was added to the solution. The In/Zn ratio was varied from zero to 1.6 at.%. The resulting solution was sprayed onto heated substrate sheld at 723 ± 5 K. The upper limit for doping concentration was fixed at 1.6 at.%. Compressed air was used as the carrier. To enhance electrical conductivity as-deposited, it was annealed at 573 K for 90 min Delivered under a vacuum of 10−5 mbar. From zinc acetate solutionsby Ingenta to: ? IP:also 5.10.31.211 Sun, 18 Jun 2017 15:33:13 having molarity 0.2 and 0.4 M were deposited atOn: optiAmerican Scientific Publishers mum doping level keeping the otherCopyright: process parameters constant.13 The apparatus and the deposition details have already been reported.14 Thicknesses were measured using the multiple beams interferometric technique.15 The structure of the samples was studied using XRD, (Philips PW 1710). The optical transmission studies were carried out using Ultra-Violet (UV-vis) spectroscopy, (Shimadzu UV-240) in the range Fig. 1. XRD patterns of In doped ZnO deposited at 723 ± 5 K using 300–900 nm. 0.1 M zinc acetate solution for different concentrations. 3. RESULTS AND DISCUSSION 3.1. Structural Properties The XRD patterns of In doped ZnO with different In concentrations deposited at substrate temperature of 723 ± 5 K using 0.1 M zinc acetate solution is shown in Figure 1. All the peaks in the pattern correspond to hexagonal structure of ZnO. No phase corresponds to indium/indium oxide or other indium compounds were detected by XRD. Significant changes are observed in XRD patterns which have shown a decrease of peak intensity corresponding to (002) crystal plane, increase of peak intensity corresponding to (101) crystal plane and disappear (112) crystal plane due to increasing doping concentration. Undoped effect was reported in the literature19 which has shown that 5 at.% In doping will lead to the formation of samples with preferential orientation along (101) crystal plane. The lattice constants found from the most prominent peaks in the diffraction patterns of ZnOs for different 160 doping concentrations are given in Table I. The lattice constants are found to be in good agreement with experimental and theoretical results.11 17 Figure 2 shows the XRD pattern of 0.8 at.% In doped ZnO prepared at 723 ± 5 K using zinc acetate precursor solutions of different molarities. All the peaks in the diffraction patterns coincide well with the patterns observed for hexagonal structure of ZnO powder sample. All the samples prepared at 0.8 at.% In doping concentration exhibited c-axis orientation which is found improved with increasing in molarity of the spraying solution.13 The lattice constants measured from the most prominent peaks in the diffraction patterns of In doped ZnO using zinc acetate precursor solutions of 0.8 at.% of different molarities are given in Table I. The measured lattice constants, a and c, are in good agreement with experimental value11 and theoretical one.17 Mater. Express, Vol. 4, 2014 Structural and optical investigations of In doped ZnO binary compound Al-Douri et al. Materials Express Table I. Lattice constants of In doped ZnO deposited at 723 K using zinc acetate solutions of different concentrations (first part) and of different molarities (second part). In dopant concentration (at.%) 0 0.4 0.8 1.2 1.6 a (Å)∗ c (Å)∗ 0.1 M 3.249 3.249a 3.222b 3.247 3.253 3.251 3.261 5.205 5.204a 5.193b 5.206 5.210 5.208 5.208 0.8 at.% Molarity of solution (M) 0.1 0.2 0.4 3.253 3.242 3.249 5.210 5.202 5.200 Notes: ∗ Measured value, a Ref. [11] Exp., b Ref. [17] Theo. Mater. Express, Vol. 4, 2014 161 Article 3.2. Optical Properties The transmittance and optical band gap of zinc oxides prepared using 0.1 M zinc acetate solution for different dopant concentrations are given in Table II. The upper limit for doping concentration was fixed at 1.6 at.% of In as deposited at higher doping concentrations were of less transmittance. The transmittance and optical band gap ofby Ingenta to: ? Delivered 0.8 at.% In doped ZnOs prepared at substrate temperature IP: 5.10.31.211 On: Sun, 18 Jun 2017 15:33:13 723 ± 5 K, using precursor solutions Copyright: of differentAmerican molari- Scientific Publishers ties are given in Table II. The investigated energy gap at 0 at.% shows good agreement with experimental value18 and better than theoretical ones.19 The transmittance is decreased due to increasing of growth rate with concentration of the spraying solutions. It is expected that the high growth rate induces other atmospheric impurity contamination to be lower and incorporation of zinc at interstitial sites to be greater.20 Fig. 2. XRD patterns of 0.8 at.% In doped ZnO prepared at 723 ± 5 K The optical transmission spectra of zinc oxide prepared using zinc acetate solutions of different molarities. at substrate temperature 723 ± 5 K, for different indium concentrations is shown in Figure 3. The high transmittance is a direct consequence of the wide band gap. The using 0.1 M zinc acetate solution. As mentioned upon, the transmittance is found to decrease at 1.2 at.% In dopoptical band gap is increased from 3.24 to 3.28 eV with In ing concentration. The decrease of transmittance at higher doping concentration from 0 to 1.6 at.% (see Table II). The doping concentrations may be due to the increased scattransmission spectra of 0.8 at.% In doped ZnOs deposited tering of photons by crystal defects created by doping. at substrate temperature 723 ± 5 K using zinc acetate preThe free carrier absorption of photons may also contribute cursor solutions of different molarity is shown in Figure 5. to the reduction of optical transmittance.21 The absorpThe decreasing in transmittance at higher molarities is tion coefficient is deduced from the transmission spectrum due to increase of thickness.13 The optical band gap using the relation, was found to be 3.29 eV for the deposited using precursor solutions of molarity 0.2 and 0.4 M as given in = ln1/T /t (1) Table II. The refractive index n is a very important physical where T is the transmittance and t is the thickness. The parameter related to the microscopic atomic interactions. optical band gap was calculated using (hv2 versus hv The refractive index will be related to the density and graph. the local polarizability of these entities.22 Consequently, Figure 4 shows the typical variation of (hv2 versus hv for 0% and 0.8 at.% In doped ZnO deposited at 723 ± 5 K many attempts have been made in order to relate the Materials Express Structural and optical investigations of In doped ZnO binary compound Al-Douri et al. Table II. Transmittance, energy gap, refractive index and optical dielectric constant of In doped ZnO (∼ 175 nm thickness) prepared at 723 ± 5 K using zinc acetate solutions of different concentrations (first part) and of different molarities (second part). In dopant concentration (at.%) 0 0.4 0.8 1.2 1.6 Transmittance at 550 nm (%) Eg∗ (eV) n 98 96 94 86 70 0.1 M 3.24 3.44a 1.57b 3.26 3.27 3.27 3.28 2.039c 2.279d 1.052e 2.008f 2.026c 2.273d 1.0519e 2.020c 2.271d 1.0511e 2.020c 2.271d 1.0511e 2.014c 2.268d 1.0508d 4.157c 5.193d 1.106e 3.72g 4.104c 5.166d 1.104e 4.080c 5.157d 1.104e 4.080c 5.157d 1.104e 4.056c 5.143d 1.104e 2.020c 2.271d 1.0511e 2.008c 2.265d 1.0504e 2.008c 2.265d 1.0504e 4.080c 5.157d 1.104e 4.032c 5.130d 1.103e 4.032c 5.130d 1.103c 0.8 at.% Molarity of solution (M) 0.1 0.2 0.4 94 80 76 3.27 3.29 3.29 Notes: ∗ Measured value, a Ref. [21] Exp., b Ref. [22] Theo., c Ref. [25], d Ref. [26], e Ref. [27], f Ref. [31] Exp., g Ref. [32] Exp. Ravindra et al.25 had been presented a linear form of n as a function of Eg : n = + Eg (2) Article −1 where = 4048 and = −062 eV . Herve and Vandamme26 proposed an empirical relation as follows: 2 A n = 1+ (3) Delivered by Ingenta to: ? Eg + B IP: 5.10.31.211 On: Sun, 18 Jun 2017 15:33:13 Copyright: American Scientific where APublishers = 136 eV and B = 34 eV. For group-IV semiconductors, Ghosh et al.27 have published an empirical relationship based on the band structure and quantum dielectric considerations of Penn28 and Van Vechten:29 A Fig. 3. Optical transmission spectra of In doped ZnO deposited at a n2 − 1 = (4) substrate temperature of 723 ± 5 K using 0.1 M zinc acetate solution Eg + B2 for different concentrations: (1) 0%, (2) 0.4 at.%, (3) 1.2 at.% and (4) 1.6 at.%. refractive index and the energy gap Eg through simple relationships.23–25 However, these relations of n are independent of temperature and incident photon energy. Here the various relations between n and Eg will be reviewed. where A = 82Eg + 134, B = 0225Eg + 225 and (Eg + B) refers to an appropriate average energy gap of the material. The refractive indices of the end-point compounds are investigated and listed in Table II. This is verified by the calculation of the optical dielectric constant which depends on the refractive index. Fig. 4. Typical variation of (hv2 versus hv of In doped ZnO deposited at 723 ± 5 K using 0.1 M zinc acetate solution for different concentrations (a) 0% and (b) 0.8 at.%. 162 Mater. Express, Vol. 4, 2014 Structural and optical investigations of In doped ZnO binary compound Al-Douri et al. Materials Express Mater. Express, Vol. 4, 2014 163 Article 3. M. H. Huang, S. Mao, H. Feick, H. Yan, Y. Wu, H. Kind, E. Weber, R. Russo, and P. Yang; Room-temperature ultraviolet nanowire nanolasers; Science 292, 1897 (2001). 4. C. T. Lee, Y. K. Su, and H. M. Wang; Effect of r.f. sputtering parameters on ZnO films deposited onto GaAs substrates; Thin Solid Films 150, 283 (1987). 5. K. L. Chopra, S. Major, and D. K. Pandya; Transparent conductors— A status review; Thin Solid Films 102, 1 (1983). 6. S. Tüzemen and E. 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