Chapter 2 The Areal Field Parameters François Blateyron Abstract The vast majority of surface texture parameters are the field parameters. The term field refers to the use of every data point measured in the evaluation area, as opposed to feature parameters that only take into account specific points, lines or areas. Field parameters allow the characterisation of surface heights, slopes, complexity, wavelength content, etc. They are defined in the specification standard ISO 25178 part 2. In this chapter the ISO areal field parameters will be presented along with limited guidance on their use. 2.1 A Short History of Areal Parameters The first areal surface texture measuring instruments were made available around 1987. Instrument manufacturers such as Zygo, Wyko and others started to provide parameters calculated on the data. Early areal parameters were often simple extrapolations of profile parameters (see Chap. 1 and Leach 2009 for a description of the profile parameters) and were either named simply Ra or sRa, and sometimes calculated using proprietary algorithms, leading to different parameter values on different instruments. The initial work by Stout et al. (1993a, b) leading to the ‘‘Blue Book’’ was covered in Chap. 1. During the same period, ISO technical committee TC 57 introduced a new concept, called Geometrical Product Specification and Verification (GPS for short) in order to unify specification standards dealing with dimensional analysis and surface texture. Then, in 1996 a new committee was created, TC 213, to develop GPS specification standards. One of the first actions of TC 213 was to entrust a group of researchers with the aim of developing the basis F. Blateyron (&) Digital Surf sarl, 16 rue Lavoisier, 25000 Besançon, France e-mail: [email protected] R. Leach (ed.), Characterisation of Areal Surface Texture, DOI: 10.1007/978-3-642-36458-7_2, Springer-Verlag Berlin Heidelberg 2013 15 16 F. Blateyron of areal surface texture parameters. The historical perspective of the SURFSTAND, which led to the so-called ‘‘Green Book’’ (Blunt and Jiang 2003) was covered in Chap. 1. The SURFSTAND results were presented to ISO in January 2002 and officially transferred to TC 213, in order to start the standardisation process. In June 2002, TC 213 voted for the creation of a new working group, which was assigned the task of developing future international standards for areal surface texture. This working group (known as WG 16) met for the first time in January 2003. At the end of 2005, the ISO secretary allocated the number (ISO) 25178 to all areal surface texture standards, thereby giving the standards their official birth. These new standards were motivated by a shift that occurred in surface metrology: the shift of surface measurement from profile to areal and contact to non-contact (Jiang et al. 2007). The work allocated to WG 16, which would be implemented in the ISO 25178 standards, contained two parts: • to define the content of the areal surface texture standards, for specification and verification; and • to revise the existing profile standards to bring them into line with the new areal standards. The first part of ISO 25178, part 6 on classification of surface texture measuring instruments, was published in January 2010 (ISO 25178 part 6 2010). This was followed in June by a group of documents on instrument techniques: part 601 (ISO 25178 part 601 2010) and part 701 (ISO 25178 part 701 2010) on stylus profilometer and part 602 (ISO 25178 part 602 2010) on confocal chromatic instruments. The main document defining areal parameters, ISO 25178 part 2, was published in September 2012 (ISO 25178 part 2 2012). As highlighted in Chap. 1, more documents will follow in the forthcoming years. 2.2 Naming, Filtering and Calculation Conventions 2.2.1 Naming ISO 25178 part 2 defines symbols for surface texture parameters that have a prefix that is the capital letters S or V followed by one or several small letters that form the suffix. This suffix should not be written as a subscript but on the same line as the prefix. However, the final version of ISO 25178 part 2 uses subscripts in parameter names to comply with ISO, which states that symbols should only contain one letter and optional subscripts. The prefix S is used for the majority of parameters (for example, Sq, Sdr, Smr), the alternative being volume parameters that start with the letter V (for example, Vmp, Vvc). 2 The Areal Field Parameters 17 2.2.2 Filtering Conditions Profile parameters are named after the type of surface profile from which they are calculated, for example R-parameters (Ra, Rsk, etc.) are calculated on the roughness profile, W-parameters (Wa, Wsk, etc.) are calculated on the waviness profile, while P-parameters are calculated on the primary profile (see ISO 4287 2000; Leach 2009). The type of surface is not taken into account with areal parameters. The Sa parameter can be calculated on a primary surface or a filtered surface—it will be called Sa in all cases. Therefore, it is important to provide the filtering conditions together with the parameter value. 2.2.3 Sampling Area Profile parameters are defined based either on a sampling length or the evaluation length. If a parameter is defined on a sampling length, it is (by default) calculated on each sampling length (ISO 4288 1996) and a mean value calculated (the default number of sampling lengths is five). With surfaces and areal parameters, the concepts of sampling and evaluation areas are still defined but the default is one sampling area per evaluation area. This simply means that parameters are calculated on the measured surface without segmenting the surface into small sub-areas that depend on the sampling length. If the user wants to use more sampling areas in the evaluation of a surface, several surfaces can be measured, either contiguous or separated, and a statistical evaluation of the parameters calculated on each surface (mean, standard deviation, etc.). 2.2.4 Centred Heights In surface texture parameter equations, the height function, z(x,y) must be centred. This means that the mean height calculated on the definition area is already subtracted from the heights. This leads to a simplified version of the parameter equations as it is possible to express the equation as, for example sffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffi ZZ 1 z2 ðx; yÞdxdy; ð2:1Þ Sq ¼ A A rather than sffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffi ZZ 1 Sq ¼ ½zðx; yÞ z2 dxdy A A where z is the mean height of the surface on the definition area, A. ð2:2Þ 18 F. Blateyron In practice, the above simplification can lead to rounding errors because heights are usually coded with integer numbers and the average height is, therefore, rounded to the closest integer. Each value in the sum is slightly biased, leading to rounding errors in the result, especially when high order powers are involved in the calculation, as is the case with Ssk (see Sect. 2.4.2.1) or Sku (see Sect. 2.4.2.2). A correct digitisation of heights with a small quantisation step makes it possible to reduce the uncertainty due to rounding errors. In the rest of this chapter, heights z(x,y) are understood to be already centred. 2.3 Continuous Against Discrete Definitions In modern specification standards, parameter definitions are always given for the continuous case, i.e. expressed with integrals, although in practice measured profiles and surfaces are always sampled and digitised. The use of continuous definitions ensures the correctness of the definition and does not imply any numerical approximation. National Metrology Institutes (NMIs) can implement the most accurate versions of the parameter definitions without taking into account the need for calculation speed (Harris et al. 2012a). However, software engineers providing commercial products will implement an algorithm that has appropriate speed and accuracy. A simple discrete implementation uses summations. For example, in the case of the parameter Sa (see Sect. 2.4.1.2), on a surface sampled with ny lines of nx points, the equation will be approximated by 1 Xny 1 Xnx 1 f Sa ¼ jzðx; yÞj: y¼0 x¼0 n x ny ð2:3Þ This simple implementation provides sound results providing that the data density is sufficiently high. Figure 2.1 shows a classical representation of a profile where data points are joined by line segments. In 3D, data points are connected through a triangular facet. However, when parameters are calculated, the approximation method replaces integrals by summations and, therefore, corresponds more to the representation shown in Fig. 2.2. Fig. 2.1 Sampled data points represented as a series of line segments 2 The Areal Field Parameters 19 Fig. 2.2 Integration using a simple summation of heights Fig. 2.3 Integration using linear interpolation Fig. 2.4 Integration using a spline interpolation This simple summation of heights approximation can be used when the density of points is high enough, that is to say, for most amplitude parameters where zero crossing is not involved. Linear interpolation gives a lower value for the Sa parameter as shown in Fig. 2.3, since the area enclosed between the profile and the horizontal axis is smaller around the zero crossings compared to the simple summation (Fig. 2.2). Figure 2.4 shows a spline interpolation (Unser 1999), which is usually closer to the continuous profile (Harris et al. 2012a). In this case, the value of the Sa parameter will be more accurate and will lie somewhere in between the values calculated in the cases shown in Figs. 2.2 and 2.3. The drawback of spline interpolation is that it generates overshoots around peaks and tends to give excessive values for peak-to-valley parameters. However, certain varieties of splines do not have overshoot compared to simple cardinal splines (Catmull and Rom 1974). Software implementations of surface texture parameters can be tested independently from instrument contributions by testing the calculation algorithms against areal software measurement standards (Chap. 1; ISO 25178 part 71 2012; ISO/CD 25178-72 2012; Harris et al. 2012b). 20 F. Blateyron 2.4 Height Parameters The definitions of the height parameters are given in the following sections. 2.4.1 Mean Height of the Surface 2.4.1.1 Root Mean Square Height, Sq The root mean square height or Sq parameter is defined as the root mean square value of the surface departures, z(x,y), within the sampling area, A. sffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffi ZZ 1 Sq ¼ zðx; yÞdxdy ð2:4Þ A A 2.4.1.2 Arithmetic Mean Height, Sa The arithmetic mean height or Sa parameter is defined as the arithmetic mean of the absolute value of the height within a sampling area, ZZ 1 Sa ¼ ð2:5Þ jzðx; yÞjdxdy: A A The Sa and Sq parameters are strongly correlated to each other (Blunt and Jiang 2003). The Sq parameter has more statistical significance (it is the standard deviation) and often has a more physical grounding than Sa, for example, Sq is directly related to surface energy and the way light is scattered from a surface (Leach 2009). 2.4.2 Skewness and Kurtosis 2.4.2.1 Skewness, Ssk Skewness is the ratio of the mean of the height values cubed and the cube of Sq within a sampling area, ZZ 1 1 z3 ðx; yÞdxdy: ð2:6Þ Ssk ¼ 3 Sq A A This parameter can be positive, negative or zero, and is unit-less since it is normalised by Sq. The Ssk parameter describes the shape of the topography height distribution. For a surface with a random (or Gaussian) height distribution that has symmetrical topography, the skewness is zero. The skewness is derived from the 2 The Areal Field Parameters 21 amplitude distribution curve; it is the measure of the profile symmetry about the mean line. This parameter cannot distinguish if the profile spikes are evenly distributed above or below the mean plane and is strongly influenced by isolated peaks or isolated valleys. Skewness represents the degree of bias, either in the upward or downward direction of an amplitude distribution curve. A symmetrical profile gives an amplitude distribution curve that is symmetrical about the centre line and an unsymmetrical profile results in a skewed curve. The direction of the skew is dependent on whether the bulk of the material is above the mean line (negative skew) or below the mean line (positive skew). As an example, a porous, sintered or cast iron surface will have a large value of skewness. A characteristic of a good bearing surface is that it should have a negative skew, indicating the presence of comparatively few peaks that could wear away quickly and relatively deep valleys to retain lubricant traces. A surface with a positive skew is likely to have poor lubricant retention because of the lack of deep valleys in which to retain lubricant traces. Surfaces with a positive skewness, such as turned surfaces, have high spikes that protrude above the mean line. The Ssk parameter correlates well with load carrying ability and porosity. 2.4.2.2 Kurtosis, Sku The Sku parameter is a measure of the sharpness of the surface height distribution and is the ratio of the mean of the fourth power of the height values and the fourth power of Sq within the sampling area, ZZ 1 1 z4 ðx; yÞdxdy: ð2:7Þ Sku ¼ 4 Sq A A Kurtosis is strictly positive and unit-less, and characterises the spread of the height distribution. A surface with a Gaussian height distribution has a kurtosis value of three. Unlike Ssk, use of this parameter not only detects whether the profile spikes are evenly distributed but also provides a measure of the spikiness of the area. A spiky surface will have a high kurtosis value and a bumpy surface will have a low kurtosis value. The Ssk and Sku parameters can be less mathematically stable than other parameters since they use high order powers in their equations, leading to faster error propagation. 2.4.3 Maximum Height of the Surface The Sp parameter represents the maximum peak height, that is to say the height of the highest point of the surface. The Sv parameter represents the maximum pit height, i.e. the height of the lowest point of the surface. As heights are counted from the mean plane and are signed, Sp is always positive and Sv is always negative. 22 F. Blateyron The Sz parameter is the maximum height of the surface, i.e. is sum of the absolute values of Sp and Sv, Sz ¼ Sp þ jSvj ¼ Sp Sv: ð2:8Þ The maximum height parameters are to be used with caution as they are sensitive to isolated peaks and pits which may not be significant. However, Sz can be pertinent on surfaces that have been filtered with a low-pass filter (S–F surfaces with a large S nesting index or in other words, waviness surfaces—see Chap. 4) to characterise the amplitude of waviness on the workpiece. Also, maximum height parameters will succeed in finding unusual conditions such as a sharp spike or burr on the surface that may be indicative of poor material or poor processing. Alternative parameters that could be used as more robust versions of a maximum height parameter are the feature parameter S10z (see Chap. 3) and Sdc (see Sect. 2.5.2.4). 2.5 Function Related Parameters The definitions of the function related parameters are given in the following sections. 2.5.1 Height Distribution and Material Ratio Curve The height distribution can be represented as a histogram of the surface heights that quantifies the number of points on the surface that lie at a given height. The material ratio curve is the cumulative curve of the distribution. The material ratio curve is counted from the highest point on the surface (where the curve equals 0 %) to its lowest point (where the curve reaches 100 %) (Fig. 2.5). In the case of profiles, the material ratio is calculated using a cutting depth c which is counted from the highest peak (ISO 4287 2000). This is not the most 0 5 5 4 4 3 3 2 2 1 1 0 0 -1 -1 -2 -2 -3 -3 -4 -4 -5 -5 µm 0 0.5 1 1.5 2 2.5 % 10 20 30 40 µm Fig. 2.5 The height distribution (left) and material ratio curve (right) 50 60 70 80 90 100 % 2 The Areal Field Parameters 23 robust solution as it may be affected by outliers. In areal analysis, the value c is counted on a surface from the mean plane, and this reference provides a more robust definition for material ratio parameters. 2.5.2 Material Ratio Parameters 2.5.2.1 Areal Material Ratio, Smr The areal material ratio is the ratio of the material at a specified height c to the evaluation area expressed as a percentage (see Fig. 2.6). The heights are taken from the reference plane. The Smr(c) function gives the material ratio p corresponding to a cutting height c given as a parameter. 2.5.2.2 Inverse Areal Material Ratio, Smc The Smc(p) function evaluates the height value c corresponding to a material ratio p given as a parameter (see Fig. 2.7). 2.5.2.3 Peak Extreme Height, Sxp The Sxp parameter (see Fig. 2.8) is aimed at characterising the upper part of the surface, from the mean plane to the highest peak without taking into account a small percentage of the highest peaks that may not be significant, Sxp ¼ Smcð2:5%Þ Smcð50 %Þ: Fig. 2.6 Smr(c) is the material ratio p corresponding to a section height c 0 5 4 3 2 1 0 -1 -2 -3 -4 -5 µm 10 20 30 40 50 ð2:9Þ 60 70 80 90 100 % 24 F. Blateyron Fig. 2.7 Smc(p) is the height section c corresponding to a material ratio p 5 0 10 20 30 40 50 60 70 80 90 100 % 70 80 90 4 3 2 1 0 -1 -2 -3 -4 -5 µm Fig. 2.8 Peak extreme height Sxp defined as the height difference between two inverse material ratios at 2.5 and 50 % 5 0 10 20 30 40 50 60 100 % 4 3 2 1 0 -1 -2 -3 -4 -5 µm The values 2.5 and 50 % are defined as the default values (ISO 25178-3 2011) and can be set to other values depending on the application (they should be close to these default values as this parameter is specifically defined for peak characterisation). For more general height differences, the Sdc parameter should be used (see Sect. 2.5.2.4). 2.5.2.4 Surface Section Difference, Sdc This parameter is not strictly defined in ISO 25178 part 2 (2012) but it is a simple extension of the Rdc parameter that was part of ISO 4287 (2000) (and see Leach 2009) 2 The Areal Field Parameters 25 Sdc ¼ Smcð pÞ SmcðqÞ ð2:10Þ where p and q are two material ratios that can be chosen freely depending on the application. The Sdc parameter can be used to give the maximum height of the surface when the extreme peaks and valleys are removed or a threshold is applied, for example, with p = 2 % and q = 98 %. 2.5.3 Characterisation of Stratified Surfaces ISO 13565 part 2 (1998) is based on the German standard DIN 4777 (1990) that was the first to introduce functional parameters based on a graphical construction on the Abbott-Firestone curve (Whitehouse 2011). These parameters, Rk, Rvk, Rpk, Mr1 and Mr2, are extracted from a filtered surface using a robust filter specially designed for stratified surfaces. The parameters Sk, Spk, Svk, Sr1 and Sr2 are the areal equivalent of the parameters defined in ISO 13565 part 2 when the Abbott-Firestone curve is built from an areal surface (see Fig. 2.9). The surface may be filtered prior to the calculation of these parameters, preferably using a robust Gaussian filter (ISO/CD 16610 part 71 2011; Muralikrishnan and Raja 2009, and see Chap. 4). ISO 13565 part 3 (2000) defines three further parameters that are extracted: Spq, Smq and Svq. These parameters are calculated on the probability curve and are specifically designed for the evaluation of plateau honed surfaces (Malburg and Raja 1993). Fig. 2.9 Graphical construction of Sk parameters Spk Sk Svk 0 10 Smr1 20 30 40 50 60 70 80 90 100 % Smr2 26 Fig. 2.10 Void volume Vv below a section height defined by a material ratio mr F. Blateyron mr 0 10 20 30 40 50 60 70 80 90 100 % Vv (mr) 2.5.4 Volume Parameters 2.5.4.1 Void Volume, Vv The void volume or Vv(mr) parameter is the void volume calculated for a material ratio mr. This parameter is calculated by integrating the volume enclosed above the surface and below a horizontal cutting plane set at a height h = Smc(mr). This can be expressed by the following Z 100% ½Smcðmr Þ SmcðqÞdq ð2:11Þ VvðmrÞ ¼ k mr where k is a factor to convert the volume into the required unit, either [lm3], [lm3/ mm2] or [ml/m2]. Void volume can be represented on the Abbott-Firestone curve as shown in Fig. 2.10. For mr = 100 %, the void volume is zero. For mr = 0 %, the void volume is a maximum (the cutting plane below the lowest point). Void volume calculations are often useful to evaluate the surface texture of mechanical components that are used in contact with other surfaces. 2.5.4.2 Material Volume, Vm The material volume or Vm(mr) parameter is the material volume calculated for a material ratio mr. The parameter is calculated by integrating the volume enclosed 2 The Areal Field Parameters Fig. 2.11 Material volume above the section height defined by a material ratio mr 27 mr 0 10 20 30 40 50 60 70 80 90 100 % Vm (mr) below the surface and above a horizontal cutting plane set at a height h = Sdc(mr). This parameter can be expressed by the following Z mr ½SmcðqÞ SmcðmrÞdq: ð2:12Þ Vmðmr Þ ¼ k 0% The material volume can be represented on the Abbott-Firestone curve as shown in Fig. 2.11. For mr = 100 %, the void volume is a maximum. For mr = 0 %, the void volume is zero (the cutting plane above the highest point). 2.5.4.3 Peak Material Volume, Vmp The peak material volume or Vmp parameter is the material volume calculated at a fixed material ratio mr, Vmp ¼ Vmðmr1Þ ð2:13Þ where mr1 = 10 % by default. The ratio mr1 may be changed for specific applications and will always be specified together with the value of Vmp. The Vmp parameter can be used for the same purpose as the Spk parameter, i.e. to characterise the volume of material which is likely to be removed during running-in of a component. 28 F. Blateyron 2.5.4.4 Core Material Volume, Vmc The core material volume or Vmc parameter is the difference between two material volume values calculated at different heights Vmc ¼ Vmðmr2Þ Vmðmr1Þ ð2:14Þ where mr2 = 80 % and mr1 = 10 % by default. The Vmc parameter represents the part of the surface material which does not interact with another surface in contact, and which does not play any role in lubrication. 2.5.4.5 Core Void Volume, Vvc The core void volume (the difference in void volume between the mr1 and mr2 material ratios) is given by Vvc ¼ Vvðmr1Þ Vvðmr2Þ ð2:15Þ where mr2 = 80 % and mr1 = 10 % by default. 2.5.4.6 Dales Void Volume, Vvv The dale volume at mr2 material ratio is given by Vvv ¼ Vvðmr2Þ ð2:16Þ where mr2 = 80 % by default. 2.5.4.7 Examples of Volume Parameters Figure 2.12 shows the four volume parameters Vmp, Vmc, Vvc and Vvv calculated from two bearing ratio levels mr1 and mr2. Volume parameters have shown good correlation with functional requirements in several applications; see Waterworth (2006) for a thorough treatment. Volume parameters have replaced the functional indices Sbi, Sci and Svi (Stout et al. 1993a, b) as they have proved to be more stable while providing the same type of information (see Sect. 2.9.1 and Jiang et al. 2000). The Vvv parameter characterises the volume of fluid retention in the deepest valleys of the surface. This parameter is not affected by wear processes applied on the surface. The Vmp parameter characterises the volume of material located on the highest peaks of the surface which is removed during a wear process. On a used mechanical component, after several hours of function, the highest peaks are cut 2 The Areal Field Parameters Fig. 2.12 Definition of volume parameters on the bearing areal ratio curve 29 mr2 mr1 0 10 20 30 40 50 60 70 80 90 100 % Vmp Vvc Vmc Vvv out or plastically deformed, and the corresponding particles of material are captured by the deepest valleys, so that the behaviour of the surface is more likely described by Vmc and Vvc. 2.6 Hybrid Parameters The hybrid parameters are defined in the following sections. 2.6.1 Root Mean Square Gradient, Sdq The gradient of a surface point is defined for each axis x and y by oz=ox and oz=oy: The implementation of these gradients on a sampled surface is given elsewhere (Whitehouse 2011). The root mean square gradient is then calculated on the whole surface with sffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffi ffi ZZ 2 1 oz oz 2 dxdy ð2:17Þ þ Sdq ¼ A ox oy where A is the projected area of the surface. The Sdq parameter has a unit-less positive value. Optionally, it can be expressed in [lm/lm] or [lm/mm], or even as an angle by calculating the arctangent of Eq. (2.17). The Sdq parameter is useful 30 F. Blateyron α Fig. 2.13 Orientation b and inclination a of a surface facet β for assessing surfaces in sealing applications and for controlling surface cosmetic appearance. The Sdq parameter is also associated with two plots that represent the distribution of the horizontal and vertical angles a and b (and see Fig. 2.13) 0sffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffi1 oz 2 oz 2 A a ¼ tan1 @ ; ð2:18Þ þ ox oy 1 b ¼ tan oz2 oy oz2 ox ! : ð2:19Þ The angle a characterises the steepest gradient in the vertical plane, and is given as an angle between 0 and 90, 0 being a horizontal facet and 90 a vertical facet. The angle b, when calculated on the whole surface, characterises the mean orientation of the surface facets and is an evaluation of the texture direction. It is given as an angle between 0 and 360, with 0 in the direction of the x axis, counter clockwise. 2.6.2 Developed Interfacial Area Ratio, Sdr The developed interfacial area of a surface is calculated by summing the local area when following the surface curvature. It can be approximated by the mean area of two triangles formed between four adjacent points. Referring to Fig. 2.14, the area of a triangle is half the cross product of two vectors, 2 The Areal Field Parameters 31 P11: z(x+1,y+1) P11: z(x+1,y+1) P01 : z(x,y+1) P01: z(x,y+1) P00: z(x,y) P10: z(x+1,y) P00: z(x,y) P10: z(x+1,y) Fig. 2.14 Area between four adjacent points calculated by the average of two triangulations A00 2 ! ! ! ! 3 1 P00 P01 P00 P10 þ P11 P01 P11 P10 162 7 ¼ 4 þ 5: 2 1 ! ! ! ! 2 P10 P00 P10 P11 þ P01 P00 P01 P11 ð2:20Þ As most surfaces are globally flat (the topography is seen only by expanding the z axis), the developed area is usually slightly larger than the projected area—this is why the Sdr parameter is expressed as the excess value above 100 %, thus PP Aij A Sdr ¼ ; ð2:21Þ A where Aij is the mean area calculated at a point, and A is the projected area calculated by the product of the lengths in x and y. Note that ISO 25178 part 2 (2012) defines the Sdr parameter for the continuous case, i.e. with integrals instead of summations. The Sdr parameter can be given as a unit-less positive number or as a percentage. It will usually produce a value of several percent (typically between 0 and 10 %). A perfectly flat and smooth surface would have Sdr = 0 %. The Sdr parameter is used as a measure of the surface complexity, especially in comparisons between several stages of processing on a surface, and it can provide useful correlations in adhesion applications (Löberg et al. 2010; Barányi et al. 2011; Reizer and Pawlus 2011). The Sdr parameter is greatly influenced by the sampling scheme (number of points and spacing in the x and y axes). 2.7 Spatial Parameters The spatial parameters are defined in the following sections. 32 F. Blateyron 2.7.1 Autocorrelation Function The autocorrelation function (ACF) evaluates the correlation of a part of an image with respect to the whole image. The ACF is defined as a convolution of the surface with itself, shifted by (sx, sy) RR zðx; yÞz x sx ; y sy dxdy ACFðsx ; sy Þ ¼ : ð2:22Þ RR zðx; yÞ2 dxdy Fig. 2.15 Surface with PCB vias (left) and its autocorrelation plot (right) Fig. 2.16 Abrasive surface with quartz grains (left) and its autocorrelation plot (right) 2 The Areal Field Parameters 33 Fig. 2.17 Surface of a DVD stamper (left) and its autocorrelation plot (right) Fig. 2.18 Using autocorrelation for detecting surface patterns. When the image of the circuit (left) is correlated with this pattern, it creates an image with correlation peaks at positions where the pattern is found in the image (right) The ACF corresponds to the autocovariance normalised by Sq2 [the denominator in Eq. (2.22)]. The ACF produces a value between -1 and +1 for each point on the surface. An ACF of +1 means a perfect correlation and zero means no correlation. 34 F. Blateyron The maximum of the ACF is always at the centre (for a zero shift). Figures 2.15, 2.16, 2.17 show several examples of surface textures and their autocorrelation plots. The ACF is used to study periodicities on a surface, i.e. when a texture motif is reproduced several times on the surface (see Fig. 2.18), or is used to assess the isotropy of a surface (see also Sect. 2.7.3). 2.7.2 Autocorrelation Length, Sal The autocorrelation length, Sal, is defined as the horizontal distance of the ACF(tx, ty) which has the fastest decay to a specified value s, with 0 B s \ 1. The Sal parameter is given by Fig. 2.19 Autocorrelation peak with an applied threshold of 0.2 (white part above the threshold) Fig. 2.20 Shortest radius measured from the centre to the contour of the thresholded lobe on the autocorrelation plot 2 The Areal Field Parameters 35 Sal ¼ min pffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffiffi tx2 þ ty2 : ð2:23Þ Figure 2.19 shows the autocorrelation of a textured surface. The white part on the central lobe is above the threshold s. A radius is calculated from the centre to the perimeter of the lobe and the shortest radius is kept for Sal (see Fig. 2.20). For all practical applications involving relatively smooth surfaces, the value for s can be taken as 0.2 (ISO 25178 part 3 2012), although other values can be used and will be subject to forthcoming areal specification standards. For an anisotropic surface, Sal is in the direction perpendicular to the surface lay. A large value of Sal denotes that that surface is dominated by low spatial frequency components, while a small value for Sal denotes the opposite case. The Sal parameter is a quantitative measure of the distance along the surface by which a texture that is statistically different from that at the original location would be found. The contour of the central lobe is measured from the centre and the shortest radius is identified. This radius gives the value of the Sal parameter. 2.7.3 Texture Aspect Ratio, Str The texture aspect ratio parameter, Str is one of the most important parameters when characterising a surface in an areal manner as it characterises the isotropy of the surface. The Sal parameter is calculated from the minimum radius on the central lobe of the ACF. The Str parameter is calculated from the minimum, rmin, and maximum radii, rmax (see Fig. 2.21), found under the same conditions, on the autocorrelation plot after applying a threshold of 0.2 Fig. 2.21 Minimum and maximum radii measured on the central lobe of the autocorrelation plot r max r min 36 F. Blateyron Str ¼ rmin rmax ð2:24Þ The Str parameter is unit-less and its values lies between 0 and 1. It can also be expressed as a percentage between 0 and 100 %. The Str parameter is an evaluation of the surface texture isotropy. If Str is close to unity, then the surface is isotropic, i.e. it has the same properties regardless of the direction. On an isotropic surface, it is possible to assess the surface texture using a 2D (profile) surface texture measuring instrument. If Str is close to 0, then the surface is anisotropic, i.e. it has a dominant texture direction. In this case, the parameter Std will give the direction angle of the texture. Fig. 2.22 Surface of artificial leather (left) and its Fourier spectrum (right) Fig. 2.23 Radial integration of frequency amplitudes of the Fourier spectrum 2 The Areal Field Parameters 37 Fig. 2.24 Polar spectrum graph representing the texture directions 2.7.4 Texture Direction, Std The texture direction parameter, Std, is assessed from the Fourier spectrum of the surface. The Fourier spectrum gives the energy content of each spatial frequency on the surface and is usually represented as a plot where amplitudes are coded with a colour or grey level (see Fig. 2.22). When moving from the centre to an edge of the spectrum in a given direction, the spatial frequencies go from the lowest to the highest value. The frequency at the centre corresponds to the continuous value in z (frequency of zero or infinite wavelength). When the surface is centred, this offset is zero. Frequency amplitudes along the radius at a given direction h can be integrated between two selected spatial frequencies, fmin and fmax, in order to calculate a value A(h) that represents the spatial frequency content in that direction (see Fig. 2.23). By repeating this integration for all angles between 0 and 180, a polar spectrum is obtained that can be represented with a semi-circular graph (see Fig. 2.24). The maximum value of the graph shown by Fig. 2.24 is called the main texture direction, or Std. The Std parameter is given in degrees between 0 and 180, and should be considered as insignificant if the isotropy factor Str is below 0.6 and 0.8 (depending on the application). The definition of Std in ISO 25178 part 2 specifies that the angle can be given from a reference angle s. The Std parameter is a convenient parameter on surfaces showing scratches and oriented texture (Schulz et al. 2010; McGarigal et al. 2009). 38 F. Blateyron 2.8 Areal Parameters from ASME B46.1 The US specification standard ASME B46.1 introduced areal parameters in its 1995 edition. The latest 2009 edition contains a set of areal parameters that is similar to that in ISO 25178 part 2 (2012). ASME B46.1 (2010) defines the following parameters identically to ISO 25178 part 2: Sa, Sq, Sp, Sv, Ssk, Sku, Sdq, Str and Std. However, one parameter in ASME B46.1 is named differently: St corresponding to Sz in the ISO standard. Two other parameters, not defined in the ISO standard, are specific to the ASME B46.1 standard: SWt: peak to valley height of the waviness surface. This parameter can be emulated with an ISO parameter by calculating Sz on an S-L surface with the L nesting index set at the same value as kc. Sdq(h): directional root mean square slope. This parameter corresponds to Pdq (as per ISO 4287 2000 and see Leach 2009) calculated on a profile extracted along the h direction. The 2002 edition of ASME B46.1 also defined SDa(h), which it is not in the 2009 edition. 2.9 Areal Parameters from Earlier Reference Documents 2.9.1 European Project Report EUR 15178 EN (1993) The European project report EUR 15178 EN (Stout et al. 1993a, b) established a list of areal parameters grouped into several families: amplitude parameters, spatial parameters, hybrid parameters and functional parameters (see Table 2.1). The parameters in Table 2.1 are still widely used in some industries and in scientific publications, although updated and improved parameters have been available for a long time (De Chiffre et al. 2000). 2.9.2 Basis for 3D Surface Texture Standards ‘‘SURFSTAND’’ The aim of the European project SURFSTAND was to improve areal parameters defined in EUR 15178 EN (Stout et al. 1993a, b), investigate their correlation with surface function, and to prepare the basis of an international specification standard (now ISO 25178 part 2 2012). The parameter set developed in SURFSTAND is, therefore, based on the ISO parameter set but with several modifications given below. Sdr Stp Smr Svr Sbi SDq Ssc Sds Str Std Sal Sku Sz Ssk Equivalent (see note 1) Renamed (see note 6) Renamed (see note 7) Renamed (see note 7) Specific Equivalent (see note 1) Different (see note 5) Different (see note 3) Equivalent Equivalent (see note 4) Equivalent Equivalent (see note 1) Different (see note 2) Equivalent (see note 1) Equivalent (see note 1) Equivalent (see note 1) Sa Sq Arithmetic mean deviation Root-mean-square deviation Ten point height Skewness of topography height distribution Kurtosis of topography height distribution Density of summits Texture aspect ratio Texture direction Fastest decay autocorrelation length Root-mean-square slope Arithmetic mean summit curvature Developed interfacial ratio Surface bearing ratio Material volume ratio Void volume ratio Surface bearing index Compatibility Table 2.1 Parameters from EUR 15178 EN (Stout et al. 1993a, b) Symbol Parameter name Hybrid Area & Volume Area & Volume Area & Volume Functional Hybrid Hybrid Spatial Spatial Spatial Spatial Amplitude Amplitude Amplitude Amplitude Amplitude Family (continued) * * * * * * * * * * * * B’14* 2 The Areal Field Parameters 39 Core fluid retention index Valley fluid retention index Functional parameters from DIN 4777 Sk, Spk, Svk, Sr1, Sr2 Parameter name Specific Specific Equivalent (see note 8) Compatibility Functional Functional Functional Family ð2:25Þ * * B’14* In order to discriminate significant peaks and valleys, only one peak and one valley should be found per autocorrelation area, with side length equal to twice the fastest autocorrelation decay Sal Note 3 Sds corresponds to Spd in ISO 25178 part 2 but the discrimination method is different Note 4 Std is defined in EUR 15178EN with the origin 0 on the y axis while in ISO 25178 part 2 it is defined with an origin s that can be set at any angle Note 5 Ssc corresponds to Spc in ISO 25178 part 2 but the discrimination method is different Note 6 Stp corresponds to Smr in ISO 25178 part 2 Note 7 Smr corresponds to Vm in ISO 25178 part 2 (should not be confused with the bearing ratio parameter that has the same name); Svr corresponds to Vv in ISO 25178 part 2 Note 8 These parameters are extensions in 3D of the parameters defined in ISO 13565 part 2 (1996). The Sr1 and Sr2 parameters have been renamed Smr1 and Smr2 in ISO 25178 part 2. The standard also includes Spq, Svq and Smq from ISO 13565 part 3 (1996) * These parameters are part of the so-called ‘‘Birmingham 14 parameters’’ P5 P5 zpi þ i¼1 jzvi j : Sz ¼ i¼1 5 Note 1 Parameter equations are all given for the discrete case, but their definitions are compatible with those of ISO 25178 part 2 (2012) Note 2 This parameter is defined here from the five highest peaks and the five deepest valleys Sci Svi Sk … Table 2.1 (continued) Symbol 40 F. Blateyron 2 The Areal Field Parameters 41 • Sp and Sv are now introduced as maximum surface peak height and maximum surface valley depth. • Sz is defined as the maximum height i.e. the sum of the absolute values of Sp and Sv. The old ten-point height parameter Sz of the previous report is here renamed as S10z. • Ssc, Sds and S5z, which are parameters related to peaks, are now calculated from peaks detected after a segmentation and Wolf pruning of 5 % of Sz (see Chap. 3). The SURFSTAND report (published as a book, Blunt and Jiang 2003) also introduces several new parameters given below. • Sfd is the fractal dimension calculated from the volume-scale plot where the volume is calculated between two morphological envelopes (see Chap. 6). • Vmp and Vmc are introduced as material volume (see ISO 25178 part 2 2012), respectively peak material volume and core material volume. • Vvc and Vvv are introduced as void volume (see ISO 25178 part 2 2012), respectively core void volume and valley void volume. It is interesting to note that in the SURFSTAND report, the Sa parameter was removed from the parameter list although it was part of the earlier work. The authors of the study wanted to avoid encouraging people to use Sa in the same way they use Ra on profiles, without really knowing if the parameter is the best correlated parameter for their needs. However, during the preparation of the ISO 25178 standard, some experts of WG 16 lobbied strongly in order to reintegrate Sa, and it was finally added to the draft. References ANSI/ASME B46.1 (2010) Surface texture, surface roughness, waviness and lay. American National Standards Institute Barányi I, Czifra A, Kalácska G (2011) Height-independent topographic parameters of worn surfaces. Sustain Constr Des 2(1): 35–40 Blunt LA, Jiang X (2003) Advanced techniques for assessment surface topography. Kogan Page Science, London Catmull E, Rom R (1974) A class of local interpolating splines. Compt Aided Geom Des 317–326 (Academic Press) De Chiffre L, Lonardo P, Trumpold H, Lucca DA, Goch G, Brown CA, Raja J, Hansen HN (2000) Quantitative characterisation of surface texture. Ann CIRP 49:635–652 DIN 4777 (1990) Metrology of surfaces; Profile filters for electrical contact stylus instruments; Phase-corrected filters Harris PM, Smith IM, Leach RK, Giusca CL, Jiang X, Scott PM (2012a) Software measurement standards for areal surface texture parameters: Part 1—Algorithms. Meas Sci Technol 23:105008 Harris PM, Smith IM, Wang C, Giusca CL, Leach RK (2012b) Software measurement standards for areal surface texture parameters: Part 2—Comparison of software. Meas Sci Technol 23:105009 42 F. Blateyron ISO 13565 part 2 (1998) Geometrical product specification (GPS)—surface texture: Profile method—surfaces having stratified functional properties—height characterization using material ratio curve. International Organization for Standardization ISO 13565 part 3 (2000) Geometrical product specification (GPS)—surface texture: Profile method—surfaces having stratified functional properties—height characterization using material probability curve. International Organization for Standardization ISO 25178 part 2 (2012) Geometrical product specification (GPS)—surface texture: areal— part 2: Terms, definitions and surface texture parameters. International Organization for Standardization ISO 25178 part 3 (2012) Geometrical product specification (GPS)—surface texture: areal— part 3: Specification operators. International Organization for Standardization ISO 25178 part 6 (2010) Geometrical product specification (GPS)—surface texture: areal— part 6: Classification of methods for measuring surface texture. International Organization for Standardization ISO 25178 part 601 (2010) Geometrical product specification (GPS)—surface texture: areal— part 601: Nominal characteristics of contact (stylus) instruments. International Organization for Standardization ISO 25178 part 602 (2010) Geometrical product specification (GPS)—Surface texture: areal— part 602: nominal characteristics of non-contact (confocal chromatic probe) instruments. 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