This article appeared in a journal published by Elsevier. The attached copy is furnished to the author for internal non-commercial research and education use, including for instruction at the authors institution and sharing with colleagues. Other uses, including reproduction and distribution, or selling or licensing copies, or posting to personal, institutional or third party websites are prohibited. In most cases authors are permitted to post their version of the article (e.g. in Word or Tex form) to their personal website or institutional repository. Authors requiring further information regarding Elsevier’s archiving and manuscript policies are encouraged to visit: http://www.elsevier.com/copyright Author's personal copy Available online at www.sciencedirect.com Thin Solid Films 517 (2008) 1214 – 1218 www.elsevier.com/locate/tsf Multi-component nanostructure design by atomic shadowing C.M. Zhou, H.F. Li, D. Gall ⁎ Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY, 12180, USA Available online 4 June 2008 Abstract This paper presents a method for multi-component three dimensional nanostructuring during physical vapor deposition, termed simultaneous opposite glancing angle deposition (SO-GLAD), which exploits atomic shadowing effects to control both the shape and the composition of nanorods parallel (in-plane) and perpendicular to the rod-axis. Periodic arrays of ~ 200-nm-wide Si–Ta two-component rods are grown by SOGLAD onto monolayers of self-assembled close-packed 260-nm-diameter silica spheres. Simultaneous deposition of Si and Ta from opposite sides on a stationary substrate yields nanorods consisting of laterally separated Si and Ta components, since atomic shadowing causes deposition only onto the sphere-sides that are exposed to the respective deposition fluxes. Sequential deposition with a stationary and rotating substrate results in zigzag two-component nanosprings and vertical multilayer nanorods, respectively. A checkerboard arrangement is achieved by simultaneous deposition with intermittent 180° substrate rotations. © 2008 Elsevier B.V. All rights reserved. Keywords: Atomic shadowing; Glancing angle deposition (GLAD); Nanorods; Silicon; Tantalum 1. Introduction Multi-component nanostructures such as nanolayered and coaxial nanowires [1,2] exhibit great potential as opto-electronic and mechanical nanodevice building blocks, exploiting dissimilar materials interfaces at the nanoscale. Chemical methods, including the vapor–liquid–solid growth, have been successfully employed to synthesize nanolayered and branched heterostructures [1–3], while physical vapor deposition techniques are used to create nmscale structures along the growth direction perpendicular to the substrate by subsequent deposition of multiple materials [4,5]. Other approaches yield nanocomposite thin films with nanograins, rods, or platelets embedded in a homogeneous second phase [6,7]. However, lateral (in-plane) nanostructuring remains a great challenge despite various successes in nanopatterning research. Glancing angle deposition (GLAD) [8] exploits atomic selfshadowing effects to create complex 3D nanostructures by continuously adjusting the polar and azimuthal angles between the substrate surface normal and the incident deposition flux. GLAD nanostructures have been engineered into a wide range of shapes including nanopillars [9–13], zigzags [14,15], nanospirals ⁎ Corresponding author. E-mail address: [email protected] (D. Gall). 0040-6090/$ - see front matter © 2008 Elsevier B.V. All rights reserved. doi:10.1016/j.tsf.2008.05.049 [16–18], nanotubes [19], and branched nanocolumns [20–22], with potential applications as photonic crystals [16–18], sensors [15,23], catalyst supports [24,25], magnetic storage media [26,27], radiation resistant coatings [28], and field emitters [29,30]. Most reported GLAD nanostructures are built from a single material. Exceptions include the off-axis co-evaporation or co-sputtering of Co and Cr [31,32], Fe and Cu [33], Bi and Te [34], and Pt and metal-oxides [35], as well as recent reports on multilayer GLAD nanostructures consisting of different materials that are stacked vertically along the growth direction [36–38]. In this paper, we demonstrate that both lateral and vertical stacking of components within nanostructures is possible by simultaneous and sequential physical vapor deposition from two opposite oblique angles. This technique, referred to as Simultaneous Opposite Glancing Angle Deposition (SO-GLAD) [39], exploits atomic shadowing effects to cause site-selective deposition. Regular arrays of Si and Ta two-component nanostructures are grown by SO-GLAD onto self-assembled close-packed monolayers of 260-nm-diameter silica spheres. The nanostructures develop into nanorods with laterally separated components or zigzag two-component nanosprings during simultaneous or sequential deposition onto a stationary substrate, respectively. Sequential deposition with a rotating substrate results in vertical multilayer nanorods while simultaneous Author's personal copy C.M. Zhou et al. / Thin Solid Films 517 (2008) 1214–1218 1215 the magnetrons prevents cross contamination of the targets, and a collimating plate, 3 mm above the substrate surface, inhibits nondirectional deposition flux from impinging onto the substrate and also determines the average deposition angle α = 84°. The patterned Si substrates were attached to a Mo block, introduced through a loadlock, and placed onto a rotatable sample stage. Depositions were done in 99.999% pure Ar at 3 mTorr (0.39 Pa) at a substrate temperature of 40 ± 20 °C. A constant power of 300 W was applied to both Ta and Si sources, yielding a column growth rate for simultaneous deposition of ~7 nm/min. The morphologies and microstructures were investigated by scanning electron microscopy (SEM, JEOL JSM-6335 Field Emission, operated at 5 kV with an emission current of 12 μA) and transmission electron microscopy (TEM, JEOL JEM-2010, operated at 200 kV). TEM samples were prepared by scratching nanorods, including the attached silica spheres, off the surface onto ethanol wetted Cu TEM grids with a lacy carbon coating membrane. 3. Results and discussion Fig. 1. Chamber schematic for simultaneous opposite glancing angle deposition. deposition with intermittent rotation yields checkerboard nanorods. These results demonstrate the potential of SO-GLAD for creating uniquely shaped multi-component nanostructures built from a wide range of materials systems that are joined in a single deposition process. 2. Experimental The Si substrates were patterned by self-assembly of 260-nmdiameter silica nanospheres that form close-packed monolayers during drying of a colloidal suspension on tilted hydrophilic surfaces in a temperature and humidity controlled environment, as described in detail in Ref. [40]. Nanostructure arrays were grown onto the nanosphere patterns in a load-locked ultrahigh vacuum (UHV) stainless steel dc magnetron sputter deposition system [36]. Fig. 1 shows the chamber schematic which is designed for SO-GLAD. The 5-cmdiameter Ta (99.95%) and Si (99.95%) targets were positioned at 7.5 cm from the substrate, with the plane of the substrate surface perpendicularly intercepting both target centers. A shield between The schematic in Fig. 2(a) illustrates the growth of twocomponent nanorods with laterally separated components by the SO-GLAD technique: Si and Ta are simultaneously deposited from oblique deposition angles α. Atomic shadowing causes selective deposition only on the side of the initial nanosphere or the growing rod surface that is exposed to the respective deposition flux. This leads to columnar growth where each column consists of the two materials which are laterally separated. All columns are identical with respect to the polar axis, that is, Si is for all columns on the left and Ta is on the right. Fig. 2(b) is a typical plan-view SEM micrograph from an array of well-separated Si–Ta nanorods grown on a patterned substrate by simultaneous opposite glancing angle sputter deposition. The nanorods exhibit a regular hexagonal array, replicating the closepacked pattern of the silica nanospheres, which indicates that each nanosphere acts as a nucleation site for one Si–Ta nanorod. The rods are 220 ± 40 nm wide and have a measured inter-rod (center-to-center) separation of 280 ± 20 nm. This is close to the nominal diameter D = 260 nm of the nanospheres. The array morphology is rather regular, indicating that column competition is relatively weak or negligible. This is attributed to the relatively large 60-nm-wide average gap between neighboring rods, which Fig. 2. (a) Schematic, (b) plan-view SEM micrograph, and (c) cross-sectional TEM micrograph of a nanorod array grown on silica spheres, where the two rodcomponents (Si and Ta) are laterally stacked. Author's personal copy 1216 C.M. Zhou et al. / Thin Solid Films 517 (2008) 1214–1218 limits long-range inter-rod shadowing interactions. Previous studies from nanorod arrays grown at high temperatures or with smaller interspacings have reported considerable size variations associated with a competitive growth mode that ultimately lead to column extinction [41,42]. Fig. 2(c) is a cross-sectional transmission electron micrograph from the same array of Si–Ta two-component nanorods as shown in Fig. 2(b). The rods are 480 nm tall and 225 ± 20 nm wide, which is in good agreement with the value obtained from the plan-view SEM image. The orientation of this cross-sectional sample is along the deposition axis, such that for the orientation of this micrograph, the Si deposition source is on the left and the Ta source on the right. The Si and the SiO2 spheres appear bright, while the Ta is dark, as labeled in the image. This strong compositional contrast is due to the much stronger electron scattering in the crystalline high-Z Ta (Z = 73) than in the amorphous Si (Z = 14) and SiO2. The left half-rods (Si) have a measured average width of 100 ± 20 nm, while the right sides (Ta) are 125 ± 16 nm wide. This indicates a slightly larger deposition rate for Ta which, in turn, also results in a slight tilt of the rods towards the Ta source, as observed in Fig. 2(c). All rods exhibit relatively sharp vertical interfaces that separate the Si and Ta sides. A detailed discussion of theoretical and measured interface sharpness for such systems is reported in Ref. [39]. During deposition, Si (Ta) atoms impinge from the left (right) and only deposit onto the left (right) side of the growing nanorods, which is exactly the envisioned SO-GLAD process which yields laterally stacked two-component nanorods, as illustrated in Fig. 2(a). Fig. 3 illustrates the potential of the SO-GLAD technique for controllably arranging the components within the nanorods both vertically and laterally by modifying both the deposition sequence (sequentially or simultaneously) and the substrate rotation (stationary, continuous, or intermittent). In addition to the nanorod arrays with laterally stacked Si–Ta components shown in Fig. 2, the schematics in Fig. 3(a–c) show vertically stacked rods, twocomponent nanosprings, and checkerboard nanorods, respectively. Nanorods consisting of vertically stacked components, as illustrated in Fig. 3(a), are obtained by alternate deposition from different sources with continuous substrate rotation around the polar axis. The width of each component-layer is controlled by the particular deposition time and can be varied externally. The micrograph in Fig. 3(d) shows, as an example, a Si–Ta nanolayered rod consisting of alternating 100 and 150-nm-thick Si and Ta layers. The continuous substrate rotation results in an effectively circular symmetric deposition flux, causing the rods to grow perpendicular to the substrate surface. The growth front has an approximately spherical shape, which causes the interfaces between the stacked layers to also exhibit a curved rather than a flat morphology. Zigzag shaped two-component nanosprings, as shown in Fig. 3(b), are obtained when sequentially utilizing oppositely positioned deposition sources while keeping the substrate Fig. 3. Schematics of (a) nanorods with vertically stacked components, (b) two-component zigzag nanosprings, and (c) checkerboard nanorods. (d–f) TEM micrographs from Si–Ta two-component nanostructures grown on silica spheres, corresponding to the schematics in (a–c), respectively. Author's personal copy C.M. Zhou et al. / Thin Solid Films 517 (2008) 1214–1218 stationary. GLAD on stationary substrates typically yields slanted rods that tilt towards the deposition flux with a tilt angle that increases with α, as studied by various researchers [43,44]. When the deposition source is switched (e.g. from right to left), the nanorod continues to grow with a tilt in the opposite direction, yielding ultimately zigzag nanosprings. Fig. 3(e) is a TEM micrograph of a Si–Ta two-component nanospring. Its first arm, appearing dark in the micrograph, is a 120-nm-wide and 360-nm-tall Ta rod, followed by a second brighter 360-nmtall Si arm which forms an approximately right angle with the Ta rod. The micrograph shows clearly that a noticeable fraction of the Si deposition flux reaches the Ta rod on the left side rather than the rounded top, causing the first arm to broaden and develop into a two-component rod similar to what is observed in Fig. 2. Correspondingly, the third deposition sequence with Ta impinging from the right side, leads to the right surface of the Si arm being covered by a Ta layer which exhibits an increasing thickness for increasing height. We attribute this deposition on the side-surfaces to incomplete geometric shadowing which is most prominent right after each deposition-source switch. The degree of shadowing is also affected by the orientation of the pattern with respect to the deposition flux direction. That is, if the close-packed direction of the hexagonal pattern is misaligned with the deposition flux, the inter-rod shadowing is controlled by the 2nd or 3rd nearest neighbors, which yield less shadowing than the 1st nearest neighbors and allows the deposition flux to reach the side of the growing nanostructure, as observed in Fig. 3(e). Fig. 3(c) is a schematic of a nanorod array where two components are stacked in a checkerboard arrangement. This structure is obtained by simultaneous deposition from opposite sides, using a stationary substrate that is intermittently rotated by 180°, such that, from the perspective of the substrate, the left and right deposition sources exchange their positions. The Si–Ta checkerboard nanorod shown in Fig. 3(f) was fabricated using four SOGLAD growth sequences between which the substrate was rotated by 180°. The resulting nanorod consists of ~100 × 100 × 100 nm3 Si and Ta blocks that are stacked both horizontally and vertically. The interfaces between the Si and Ta sections are relatively abrupt. They are curved, similarly to those in Fig. 3(d), reflecting the spherically shaped growth front. In addition, the micrograph also indicates that a fraction of the deposition flux impinges on the nanorod sides. For example, the right surface of the first section (with Ta on the right), is covered with a ~25-nm-wide Si layer that was deposited during the second growth sequence. In summary, the micrographs in Fig. 3(d–f) demonstrate the diverse 3D nanostructure shaping that can be achieved by SO-GLAD, which relies only on geometrical shadowing effects. Therefore, the presented technique is applicable to a wide range of materials systems and provides a powerful tool for nanomanufacturing of complex multi-component structures in a single deposition process. 4. Conclusions Periodic arrays of Si–Ta nanorods with both laterally and vertically stacked Si and Ta components were grown by simultaneous opposite glancing angle deposition (SO-GLAD) 1217 onto silica nanosphere monolayer patterns. TEM characterizations show that each nanorod consists of Si and Ta components with relatively sharp horizontal and vertical interfaces. This is attributed to atomic shadowing which causes site-selective growth during line-of-sight deposition from the oppositely positioned sputtering sources. 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