Product Introduction
MX269010A
Mobile WiMAX Measurement Software
MS2690A/MS2691A/MS2692A
Signal Analyzer
MS2690A/MS2691A/MS2692A Signal Analyzer
MX269010A
Mobile WiMAX Measurement Software
Introduction Note
(Version 1.00)
Anritsu Corporation
Slide 1
MX269010A-E-L-1
All-in-one Tx/Rx Evaluation Tests
The all-in-one MS2690A supports the functions required for RF
measurements, including Tx/Rx evaluation tests for R&D and manufacturing.
[Main Unit] Signal Analyzer (MS2690A/MS2691A/MS2692A)
Adjacent channel leakage power, spectrum emission mask, etc.
Tx
Tests
‹Mobile WiMAX Measurement Software (MX269010A)
Modulation accuracy, frequency error, Tx power, spectral flatness, etc.
Analysis
Tx
RF Output
Rx
BER Measurement
Rx
Tests
Mobile WiMAX
Wireless Unit
Data/Clock
‹Vector Signal Generator (MS2690A-020/MS2691A-020/MS2692A-020)
Output Mobile WiMAX signals, BER measurement function
‹Mobile WiMAX IQproducer (MX269905A)
Generate Mobile WiMAX Signals
Slide 2
MX269010A-E-L-1
MX269010A Mobile WiMAX Measurement Software
The MX269010A Mobile WiMAX Measurement Software supports
measurement of IEEE802.16e RF signal characteristics when installed in
the MS269xA Signal Analyzer.
MS269xA
Signal Analyzer
MX269010A　Mobile WiMAX Measurement Software
Install
Measurement Functions
Measurement Functions
Modulation Accuracy
Frequency Difference
Tx Power
Spectral Flatness
Occupation Bandwidth
Channel Power
Adjacent Channel Leakage Power
Spectrum Emission Mask
Slide 3
MX269010A-E-L-1
MX269010A Product Specifications
Slide 4
MX269010A-E-L-1
Main Display
The following Main screen is displayed when the MX269010A is selected at
the MS269xA. Various measurements are performed using the [Measure]
button after setting parameters, such as frequency, bandwidth, and input
level.
Status
Window
Downlink Measurement
Uplink Measurement
Parameter Settings
Measurement
Results
Slide 5
MX269010A-E-L-1
Status Window
The Status Window displays the current parameter settings and
measuring instrument status.
Set Frequency
Set Attenuation
Under Remote Control
Measurement Pause
Bandwidth [MHz]
Sync Analysis Error
Oven Cold
ANT 0/ANT 1
Overflow (excessive input)
Pre-amp On/OFF
DL /UL
Single/Continuous
Synchronized with internal reference clock
Not synchronized with internal reference clock
Synchronized with reference clock input from external sources
Not synchronized with reference clock input from external sources
Slide 6
MX269010A-E-L-1
Downlink Measurement
Various analyses can be performed without difficult parameter settings
by using the function for analyzing the DL-MAP parameters and autosetting the instrument.
Frequency, Bandwidth and
Input Level Settings
Automatic Parameter setting using DL-MAP Analysis
(Note)
DL-MAP Analysis
DIUC Setting
Downlink analysis
requires inclusion of
FCH, and DL-MAP
burst in signals.
Various Downlink Signal Analyses
★Modulation
★I/Q Received
★Map Information
★EVM vs. Subcarrier
★EVM vs. Symbol
★Spectral Flatness
Slide 7
MX269010A-E-L-1
Downlink Measurement—Modulation Display (1/3)
The Subcarrier Spectrum Display displays the power distribution of
each subcarrier at a specified symbol; the Time Domain Display
displays the IQ level change over time per frame.
Subcarrier Spectrum Display
Time Domain Display
Subcarrier
1 frame (5 ms)
Slide 8
MX269010A-E-L-1
Downlink—Modulation Display (2/3)
The constellation of each symbol can be displayed. This is useful for
finding symbol-dependent constellation faults.
Logical Sub channel
Symbol (0/28)
Symbol (6/28)
Symbol (12/28)
16QAM
QPSK
QPSK
64QAM
16QAM
Symbol
Slide 9
MX269010A-E-L-1
64QAM
Symbol (24/28)
Downlink—Modulation Display (3/3)
Measurement results such as frequency error, EVM, power, etc., are
displayed as text.
Text Display
Parameter
Frequency Offset
Timing Error
Total EVM (rms)
Preamble Excluded
Total EVM (peak)
Preamble EVM
Avg Pilot EVM
Symbol EVM
CINR
Preamble Power
DL Average Power
Outline
Displays difference between specified center frequency and input signal center frequency
Displays difference between trigger input and frame header position
*W hen trigger mode is Free Run, [--] is displayed .
Displays EVM rms average value for all downlink segments
Displays EVM rms average value for downlink segments excluding preamble
Displays
Displays
Displays
Displays
Displays
Displays
Displays
peak EVM, its symbol and subcarrier position in all downlink segments
preamble EVM
EVM of pilot symbol when setting symbol is 0
EVM of setting symbol when setting symbol not 0
CINR (Carrier to Interference and Noise Ratio)
preamble power
average power in all downlink segments
Slide 10
MX269010A-E-L-1
Downlink Measurement—I/Q Received Display (1/2)
I and Q data at specified symbols are displayed in three formats:
Constellation; Table; and Subcarrier Domain.
Constellation
Table
Subcarrier Domain
Slide 11
MX269010A-E-L-1
Downlink Measurement—I/Q Received Display (2/2)
This can be used to check for I and Q data subcarrier dependence at
specified symbols.
Constellation Display
Subcarrier Domain Display
Preamble
Symbol (0/28)
FCH and DL-MAP
Part
Symbol (1/28)
Data Burst Part
Symbol (3/28)
Slide 12
MX269010A-E-L-1
Downlink Measurement—Map Information Display (1/5)
The distribution (map) of the DL burst is displayed with logical subchannel
on the vertical axis and symbol on the horizontal axis. The burst
information and modulation accuracy are displayed for the specified burst.
DL Burst Distribution Map
Logical
subchannel
Symbol
Burst/Zone Info
Slide 13
MX269010A-E-L-1
Downlink—Map Information Display (2/5)
Various Preamble information and measurement results (Frequency Error
and EVM) are displayed.
Preamble Information
Specifies Preamble (Burst Index: 0)
Slide 14
MX269010A-E-L-1
Downlink Measurement—Map Information Display (3/5)
Various FCH information and measurement results (EVM) are displayed.
FCH (Frame Control Header) Information
Specifies FCH (Burst Index: 1)
Slide 15
MX269010A-E-L-1
Downlink Measurement—Map Information Display (4/5)
Various DL-MAP message information and DL-MAP burst (EVM)
measurement results are displayed.
DL-MAP Information
Specifies DL-MAP (Burst Index: 2)
Slide 16
MX269010A-E-L-1
Downlink—Map Information Display (5/5)
Various DL-MAP data burst information and data burst measurement results
(EVM) are displayed.
Data Burst Information
Specifies data burst (Burst
Index: after 3)
Slide 17
MX269010A-E-L-1
Downlink—EVM vs. Subcarrier Display
EVM
The EVM distribution of each subcarrier at the specified symbol is
displayed. This can be used to find instantaneous subcarrier-dependent
EVM degradation.
Subcarrier
Slide 18
MX269010A-E-L-1
Downlink Measurement—EVM vs. Symbol Display
EVM
The EVM distribution for each symbol is displayed. This can be used to
find instantaneous symbol-dependent EVM degradation.
Symbol
Slide 19
MX269010A-E-L-1
Downlink Measurement—Spectral Flatness Display (1/2)
The Absolute Flatness Display indicates the difference between the
average power and power of each subcarrier; the Differential Flatness
Display indicates the power difference between adjacent subcarriers.
Differential Flatness Display
Subcarrier
Power difference in adjacent
Power difference in average
Absolute Flatness Display
Slide 20
MX269010A-E-L-1
Subcarrier
Downlink Measurement—Spectral Flatness Display (2/2)
The difference in the average power between each of four subcarrier
segments, and the maximum power difference, DC offset power, and
average power between adjacent subcarriers in all sections are displayed.
Subcarrier
Slide 21
MX269010A-E-L-1
Uplink Measurement
The Uplink signal can be analyzed by setting basic parameters, such as
frequency, bandwidth, and input level, and unique UL parameters.
Sets Frequency, bandwidth
and input level
Sets UL parameters
Uplink Signal Analysis
★Modulation
★Spectral Flatness
Slide 22
MX269010A-E-L-1
Uplink Measurement—Measurement Range Setting
The target measurement range can be set using four parameters: Zone
Offset; Num of Symbols; Duration; and Subchannel Offset.
Sets measurement range
Subchannel Offset
(Number of Offset slots)
Subchannel
: 1slot ( = 3symbol )
Zone
Offset
Duration
(Number of slots in
analysis section)
Number of Symbols
(Symbol interval of
measurement target)
Symbol
Slide 23
MX269010A-E-L-1
Measurement
target
: 1symbol
Uplink Measurement—Modulation Display (1/2)
The Subcarrier Spectrum Display displays the power distribution of
each subcarrier at a specified symbol; the Time Domain Display
displays the IQ level change over time per frame.
Subcarrier Spectrum Display
Time Domain Display
Subcarrier
1 Frame (5 ms)
Slide 24
MX269010A-E-L-1
Uplink—Modulation Display (2/2）
Measurement results, such as frequency error, EVM, power, etc., are
displayed as text.
Text Display
Slide 25
MX269010A-E-L-1
Uplink Measurement—Spectral Flatness Display (1/2)
The Absolute Flatness Display indicates the difference between the
average power and power of each subcarrier; the Differential Flatness
Display indicates the power difference between adjacent subcarriers.
Differential Flatness Display
Subcarrier
Power difference adjacent
Power difference average
Absolute Flatness Display
Slide 26
MX269010A-E-L-1
Subcarrier
Uplink Measurement —Spectral Flatness (2/2)
The difference in the average power between each of four subcarrier
segments, and the maximum power difference, and DC offset power
between adjacent subcarrier in all segments are displayed.
Subcarrier
Slide 27
MX269010A-E-L-1
MIMO Measurement (1/2)
Both MIMO signal ANT 0 and ANT1 can be measured by switching ANT 0
and ANT 1.
Procedure (ANT 1)
(1) Measure ANT 0, and memorize ANT 0 parameter information.
(2) Switch the cable connection from ANT 0 to ANT 1.
(3) Measure ANT 1 using an external trigger.
*An external trigger is required to measure ANT 1 because there is no preamble signal at
the ANT-1 side.
MS269xA
External trigger
(ANT 1 measurement)
ANT 0
SW
DUT
ANT 1
Slide 28
MX269010A-E-L-1
MIMO Measurement (2/2)
The modulation accuracy, frequency error, Tx power, spectral flatness, etc.,
of both MIMO signal ANT 0 and ANT 1 can be measured.
Map Display (ANT 0)
Modulation Display (ANT 0) Flatness Display (ANT 0)
Map Display (ANT 1)
Modulation Display (ANT 1) Flatness Display (ANT 1)
Slide 29
MX269010A-E-L-1
High-Speed Modulation Analysis
All Measure screens (DL: 6 displays, UL: 2 displays) can be measured at
once at high speed. Using an External or SG Marker trigger makes
measurement even faster.
Measurement Time at Each Measurement Condition
Measurement Condition
DL
UL
Ext. Trigger
Map Info. Display
26 symbols
Free Run
Modulation Display
35 symbols
Ext. Trigger
Flatness Display
6 symbols
Free Run
Modulation Display
21 symbols
Band: 5 MHz Band: 10 MHz
0.8 s
1.5 s
1.2 s
2.2 s
0.4 s
0.9 s
0.9 s
2.5 s
Slide 30
MX269010A-E-L-1
Simple Zoom Function using Mouse
Constellation and spectrum displays can be zoomed for easy viewing
using the mouse.
Zoom
Zoom
Slide 31
MX269010A-E-L-1
MS269xA Main Unit—Spectrum Analyzer Function
Various measurements (channel power, occupied bandwidth, adjacent
channel leakage power and spectrum emission mask) can be performed
for the signal burst-on part, using the Gate Sweep function.
Channel Power
ACP
Gate Sweep Function
Occupied Bandwidth Spectrum Emission Mask
On
On
Specify target burst-on part of
signal using Gate Sweep
function.
Slide 32
MX269010A-E-L-1
MS269xA Main Unit—Signal Analyzer Function
In-band measurement in the 31.25-MHz range (125 MHz as option) is
many times faster than using a sweep-type spectrum analyzer.
Channel Power
Occupied Bandwidth
Slide 33
MX269010A-E-L-1
ACP
Note
Slide 34
MX269010A-E-L-1
Specifications are subject to change without notice.
Anritsu Corporation
5-1-1 Onna, Atsugi-shi, Kanagawa, 243-8555 Japan
Phone: +81-46-223-1111
Fax: +81-46-296-1264
• U.S.A.
Anritsu Company
1155 East Collins Blvd., Suite 100, Richardson,
TX 75081, U.S.A.
Toll Free: 1-800-267-4878
Phone: +1- 972-644-1777
Fax: +1-972-671-1877
• Canada
Anritsu Electronics Ltd.
700 Silver Seven Road, Suite 120, Kanata,
Ontario K2V 1C3, Canada
Phone: +1-613-591-2003
Fax: +1-613-591-1006
• Brazil
Anritsu Eletrônica Ltda.
Praca Amadeu Amaral, 27 - 1 Andar
01327-010-Paraiso-São Paulo-Brazil
Phone: +55-11-3283-2511
Fax: +55-11-3288-6940
• Mexico
Anritsu Company, S.A. de C.V.
Av. Ejército Nacional No. 579 Piso 9, Col. Granada
11520 México, D.F., México
Phone: +52-55-1101-2370
Fax: +52-55-5254-3147
• U.K.
Anritsu EMEA Ltd.
200 Capability Green, Luton, Bedfordshire, LU1 3LU, U.K.
Phone: +44-1582-433200
Fax: +44-1582-731303
• France
Anritsu S.A.
16/18 avenue du Québec-SILIC 720
91961 COURTABOEUF CEDEX, France
Phone: +33-1-60-92-15-50
Fax: +33-1-64-46-10-65
• Germany
Anritsu GmbH
Nemetschek Haus, Konrad-Zuse-Platz 1
81829 München, Germany
Phone: +49-89-442308-0
Fax: +49-89-442308-55
• Italy
• Singapore
Via Elio Vittorini 129, 00144 Roma, Italy
Phone: +39-6-509-9711
Fax: +39-6-502-2425
60 Alexandra Terrace, #02-08, The Comtech (Lobby A)
Singapore 118502
Phone: +65-6282-2400
Fax: +65-6282-2533
Anritsu S.p.A.
• Sweden
Anritsu Pte. Ltd.
Anritsu AB
• India
• Finland
Unit No. S-3, Second Floor, Esteem Red Cross Bhavan,
No. 26, Race Course Road, Bangalore 560 001, India
Phone: +91-80-32944707
Fax: +91-80-22356648
Borgafjordsgatan 13, 164 40 KISTA, Sweden
Phone: +46-8-534-707-00
Fax: +46-8-534-707-30
Anritsu AB
Teknobulevardi 3-5, FI-01530 VANTAA, Finland
Phone: +358-20-741-8100
Fax: +358-20-741-8111
• Denmark
Anritsu A/S
Kirkebjerg Allé 90, DK-2605 Brøndby, Denmark
Phone: +45-72112200
Fax: +45-72112210
• Spain
Anritsu EMEA Ltd.
Oficina de Representación en España
Edificio Veganova
Avda de la Vega, n˚ 1 (edf 8, pl 1, of 8)
28108 ALCOBENDAS - Madrid, Spain
Phone: +34-914905761
Fax: +34-914905762
• Russia
Anritsu EMEA Ltd.
Representation Office in Russia
Tverskaya str. 16/2, bld. 1, 7th floor.
Russia, 125009, Moscow
Phone: +7-495-363-1694
Fax: +7-495-935-8962
• United Arab Emirates
Anritsu EMEA Ltd.
Dubai Liaison Office
P O Box 500413 - Dubai Internet City
Al Thuraya Building, Tower 1, Suit 701, 7th Floor
Dubai, United Arab Emirates
Phone: +971-4-3670352
Fax: +971-4-3688460
Anritsu Pte. Ltd.
India Branch Office
• P.R. China (Hong Kong)
Anritsu Company Ltd.
Units 4 & 5, 28th Floor, Greenfield Tower, Concordia Plaza,
No. 1 Science Museum Road, Tsim Sha Tsui East,
Kowloon, Hong Kong
Phone: +852-2301-4980
Fax: +852-2301-3545
• P.R. China (Beijing)
Anritsu Company Ltd.
Beijing Representative Office
Room 1515, Beijing Fortune Building,
No. 5, Dong-San-Huan Bei Road,
Chao-Yang District, Beijing 10004, P.R. China
Phone: +86-10-6590-9230
Fax: +86-10-6590-9235
• Korea
Anritsu Corporation, Ltd.
8F Hyunjuk Building, 832-41, Yeoksam Dong,
Kangnam-ku, Seoul, 135-080, Korea
Phone: +82-2-553-6603
Fax: +82-2-553-6604
• Australia
Anritsu Pty. Ltd.
Unit 21/270 Ferntree Gully Road, Notting Hill,
Victoria 3168, Australia
Phone: +61-3-9558-8177
Fax: +61-3-9558-8255
• Taiwan
Anritsu Company Inc.
7F, No. 316, Sec. 1, Neihu Rd., Taipei 114, Taiwan
Phone: +886-2-8751-1816
Fax: +886-2-8751-1817
Please Contact:
080423
Printed on Recycled Paper
No. MX269010A-E-L-1-(1.00)
Printed in Japan
2008-4
AKD