B.R.S. Simpson and W.M. van Wyngaardt National Metrology Institute of South Africa Your measure of excellence Your measure of excellence Introduction • Measurements made for the 32P international comparison • Utilized liquid scintillation counting (LSC) • Three phototube detection system • Method: followed the decay, with the following variations • collected double- and triple-coincidence data • fresh counting sources weekly → rates per unit mass analyzed • established the counting efficiency by two independent methods, namely: 1) Efficiency tracing with a quench-matched Ni-63 source 2) TDCR efficiency calculation Most of the uncertainty was due to the analysis (fitting). Your measure of excellence Method, results and uncertainties at time t : λ • 33P count rate at time t : C2(t) = C2 exp(-λ2t) • 35S count rate at time t : C3(t) = C3 exp(-λ3t) • All we can do is measure the total count rate C(t) : • C(t) = C1(t) + C2(t) + C3(t) …………………………………….(1) • Therefore must follow the decay over time and determine the best fit to the data using expression (1). This extracts the count rates C1, C2 and C3 at the reference date chosen. Your measure of excellence wi[Ci – C1 exp(-λ1ti) – C2 exp(-λ2ti) – C3 exp(-λ3ti) ]2 Q is minimised by differentiating with respect to the coefficients C1, C2 and C3 and equating to zero. This gives rise to a set of linear algebraic equations that can be expressed in matrix form. The solution is given by a matrix inversion technique. This gives the values and uncertainties for the three coefficients C1, C2 and C3. Your measure of excellence Thus = i.e. X⋅c=v where X11 = Σ wi exp(-2λ1 ti), etc. (wi are the weights = 1 and V1 = Σ wi Ci exp(-λ1 ti), etc. The are estimates of C1, C2 and C3 giving the best fit. Solving, c = X-1 ⋅ v such that X-1 = . Variances: var(C1) = c11 , var(C2) = c22 , var(C3) = c33 cov(C1, C2) = c12 = c21 cov(C2, C3) = c23 = c32 , cov(C1, C3) = c13 = c31 Your measure of excellence ) decay constant λ = 0.693 ½ alf-life. 32P: T½ = 14.284 days, λ = 0.0485, N1 = 25000 c/s at time t = 0 33P: T½ = 25.383 days, λ = 0.0273, N2 = 1800 c/s at time t = 0 35S: T½ = 87.32 days, λ = 0.0079, N3 = 555 c/s at time t = 0 Days 32P 33P 35S Total 28 6425 838 444 7712 35 4574 692 420 5685 42 3257 572 398 4221 49 2319 472 376 3171 56 1651 390 356 2396 63 1176 322 337 1836 70 837 266 318 1422 Program gives: 32P = 25147 33P = 1683 35S = 579 178 c/s 140 c/s 28 c/s Your measure of excellence COUNTING SYSTEM Electronic modules for pulse processing and the data acquisition system (CAMAC interval timer and 32-channel scaler under computer control). Your measure of excellence EXPERIMENTAL DATA These are double-tube coincidence rates. Count rate per unit mass (s-1 g-1) 96000 95500 95000 94500 94000 93500 93000 0.0 0.2 0.4 0.6 0.8 1.0 Time interval (days) This plot shows the cluster of data points collected on day one. Expressed as count rate given by the master solution. Your measure of excellence Extracted double count rate concentrations (s-1 g-1) : N1 = 93970 N2 = 2355 N3 = 134 Count rate per unit mass (s-1 g-1) 1e+5 LOCAL ref. date: 09-03-05 (36.0 days after comparison ref. date) 8e+4 6e+4 4e+4 2e+4 0 0 10 20 30 40 50 Time interval (days) A plot of the 106 data points collected over six weeks. Red line: 32P Blue line: 33P Black line: 32P + 33P + 35S (Reduced Chi-square = 1.28) Your measure of excellence The uncertainties from counting statistics/fitting are: 32P 33P 35S 93970 2355 134 173 ( 0.18 %) 231 ( 9.8 %) 75 (56.0 %) cov(32P, 33P) = -39360 cov(32P, 35S) = 12512 cov(33P, 35S) = -17250 Correlation coeff. r(32P, 33P) = - 0.9875 r(32P, 35S) = + 0.9627 r(33P, 35S) = - 0.9921 Your measure of excellence Other main contributors to the uncertainty budget Half-life For 32P: T1/2 = 14.284 0.036 This bound changes the 32P activity by 0.18 %. For 33P: T1/2 = 25.383 0.040 This bound changes the 32P activity by 0.004 %. For 35S: T1/2 = 87.32 0.16 This bound changes the 32P activity by 0.0001 %. Adsorption A correction of 0.2 % was made to account for adsorption to the counting vials. Uncertainty taken as %. Your measure of excellence A quench-matched 63Ni source was used to characterize the system in terms of the figure-of-merit P. Using P, the efficiencies εd (and εt) were determined: 32P = 99.39 % (99.26), P-32 33P = 84.6 % (81.6), Double Activity Triple rate conc. rate (s-1 g-1) (Bq/g) (s-1 g-1) Activity conc. (Bq/g) 93970 94547 93862 173 172 94562 35S = 75.2 % (70.6) Impurity as fraction of P-32 (%) P-33 2355 231 2783 1708 230 2093 2.2 – 2.9 (1.0 – 1.4) comp. ref. date S-35 134 75 179 311 75 441 0.2 – 0.5 (.04 – .11) comp. ref. date Your measure of excellence Then ε t (P ) N t = ε d (P ) N d is solved for P. Activity conc. (Bq g) Alternative 32P efficiency determination by the TDCR technique Triple and 96000 double rates corrected for 95500 33P and 35S 95000 contributions. 94500 94000 93500 93000 0 Mean efficiency = 0.9951 Mean activity conc. = 94490 10 20 30 Time interval (days) 44 Bq/g Your measure of excellence 40 50 UNCERTAINTY COMPONENTS FOR 32P weighing % of activity conc. (1σ) 0.02 dead time 0.01 background 0.01 resolving time 0.005 adsorption to vial 0.10 tracer 0.006 half life 0.18 fit to decay data sets 0.18 satellite pulses 0.015 COMBINED 0.28 Your measure of excellence CONCLUSIONS • Application of the decay method successfully extracted the 32P activity content in the presence of pure beta-emitting impurities. • The two schemes adopted to convert count rates into activities produced consistent results. • The main contributions to the uncertainty were due to the fit to the decay data sets, the uncertainty in the half-life and adsorption of radioactive material to the glass counting vials. Your measure of excellence Publication: B.R.S. Simpson and W.M. Van Wyngaardt, Activity measurement of phosphorus-32 in the presence of pure beta-emitting impurities. South African Journal of Science, July/August 2006 – Vol. 102, No. 7 / 8, 361-364. Electronic reprint available from: [email protected] Your measure of excellence
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