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Authors requiring further information regarding Elsevier’s archiving and manuscript policies are encouraged to visit: http://www.elsevier.com/copyright Author's personal copy Chemical Physics 389 (2011) 75–80 Contents lists available at SciVerse ScienceDirect Chemical Physics journal homepage: www.elsevier.com/locate/chemphys Dipolar disorder formalism revisited Andrey Tyutnev ⇑, Vladimir Saenko, Evgenii Pozhidaev Moscow State Institute of Electronics and Mathematics, Bol. Trechsvyatitel. per., 3, Moscow, Russia a r t i c l e i n f o Article history: Received 31 May 2011 In final form 3 August 2011 Available online 23 August 2011 Keywords: Charge carrier transport Molecularly doped polymers van der Waals disorder a b s t r a c t The dipolar disorder formalism (DDF) of Borsenberger and Bässler has been further developed based on a unified approach treating the van der Waals and the dipolar disorder energies as being proportional to mean intersite distance in a certain power. Tested against real molecularly doped polymers with the concentration of the dopant changing in a wide range, this approach gives values of the exponent lying in the interval from 1.5 to 2.5. The total disorder is represented by an algebraic combination of four material parameters relating to the dopant and the polymer matrix weighted by their relative weight concentrations. What is important, we seem to get able to explain the near constancy of the total disorder when the concentration of the polar dopant changes. Until recently, this unusual behavior of the total disorder defied any reasonable explanation. Ó 2011 Elsevier B.V. All rights reserved. 1. Introduction The dipolar disorder formalism (DDF) has been proposed by Borsenberger and Bässler in 1991 [1] to explain a strong polarity dependence of the charge mobility in molecularly doped polymers (MDPs) [2]. It was based on the Gaussian disorder model (GDM) [3] and in particular, considered the main parameter of the model r (the total disorder energy) as consisting of two independent contributions: the dipolar rd and the van der Waals rvdW constituents: The dipolar disorder rd relates to the polar molecules of the dopant and the polymer matrix (repeat units in the last case). Their dipole moments are treated as point, randomly oriented dipoles occupying sites of a simple cubic lattice with probability f „ c, which is equal to the relative weight concentration of the dopant [5]. Under such conditions the corresponding rd relating to the dopant (rdd) or the polymer (rdp) may be estimated using the following expressions [5,6] (r in eV, p in D, a and b in nm): rdd ¼ r2 ¼ r2v dW þ r2d : ð1Þ The first term on the right hand side of this equation is the old r in the original GDM accounting for the static fluctuations of the polarization energy P of a unit charge placed on a hopping center. It has long been established that this polarization energy is of universal nature, constitutes about 1–1.5 eV in organics (both ordered and disordered) and accounts for the lowering of the ionization potential of a molecule in a condensed phase compared with the gas phase by approximately 2P [4]. The second term accounts for the static fluctuations of the electrostatic energy arising from the presence of various dipolar molecules. One extracts r from experiment while rd comes from the theoretical estimations. The total disorder r appears in the temperature 2 dependence of the zero-field mobility lð0; TÞ ¼ l0 exp 49 kr2 T 2 found by extrapolating the mobility field dependence ln l vs F1/2 to F = 0 at each temperature. At present, r is known for almost every MDP [2]. ⇑ Corresponding author. E-mail address: [email protected] (A. Tyutnev). 0301-0104/$ - see front matter Ó 2011 Elsevier B.V. All rights reserved. doi:10.1016/j.chemphys.2011.08.003 0:0707p 0:5 c ea2 ð2Þ or rdp ¼ 0:0707p eb2 ð1 cÞ0:5 : ð3Þ Here e is the dielectric constant of the MDP in question, p is the respective dipole moment of the dopant or the repeating unit of the polymer; a is the lattice constant computed in the lattice gas model for the dopant (c ? 1.0 in Eq. (2)) while b is the same for the polymer matrix (c ? 0 in Eq. (3)). The problem with the DDF is that so far there is no way to find rvdW independently (see Section 4). Instead, Eq. (1) has been used for this purpose. Generally, the DDF proved to be highly successful in explaining polarity effects in the charge carrier mobility. But, one aspect is glaringly defying a reasonable explanation. We mean r staying almost constant (to within some percent) for concentration c of a polar dopant changing from 0.1 to 0.7. Clearly, Eq. (2) predicts that rdd should rise by more than 2.5 times and this, according to Eq. (1), should not go unnoticed by r. The standard explanation is to assume that rvdW behaves in such a way as to exactly compensate the expected variation of rdd [7]. This line of reasoning was criticized in [8] and various compensating mechanisms Author's personal copy 76 A. Tyutnev et al. / Chemical Physics 389 (2011) 75–80 were discussed in the follow-on article [9], but still without success. The aim of the present work is to rationalize the DDF and resolve the above mentioned controversy. 2. Formulation of the problem To start with, we split r for a two component MDP into four independent parts, and namely, the dipolar disorder of the dopant (rdd) and the polymer (rdp) as well as the van der Waals disorders relating to each of these (rvdW,d and rvdW,p, respectively). Next, we introduce four material constants relating to a pure dopant (c ? 1.0) and a pure polymer (c ? 0) to be designated as corre_ sponding symbols with hats (for example, rdp ). As c-dependence for the dipolar disorder is known [5] it is easy to find the composite expression for the total dipolar disorder rd in the MDP under consideration (see [10]) _ _ r2d ¼ cr2dd þ ð1 cÞr2dp : ð4Þ Van der Waals interactions are also of the electrostatic nature but unfortunately their c-dependence is not known (see Section 4). Assuming that rvdW / cm/3 (in the case of a dipolar disorder m = 1.5) we arrive at the general formula for r for a two-component MDP _ _ _ _ r2 ¼ cr2dd þ ð1 cÞr2dp þ c2m=3 rv2 dW;d þ ð1 cÞ2m=3 rv2 dW;p : Fig. 1. Experimental (1) and calculated (2–5) dependence of r on the dopant concentration c for TAPC:PC. Parameter m is equal to 1.25 (2), 1.5 (3), 2.0 (4) and 3.0 (5). ð5Þ One should keep in mind that Eq. (5) has been derived under condition that neither the dielectric constant, nor the density of the MDP under question undergoing a c-changing experiment do change. Unfortunately, this aspect of the problem was totally neglected in literature. As we show in Section 4 these assumptions are a good approximation and we intend to use them as well. Below the dielectric permittivities for polystyrene (PS) and polycarbonate (PC) are taken to be 2.6 and 3.0 while their respective densities are 1.05 and 1.2 g/cm3. These values will be used initially in calculations of r in the analyzed MDPs. Now we are going to apply Eq. (5) to experimental data starting with those featuring r(c) dependence to extract material parame_ ters ri and m for the most common polymer binders and dopants. In fact, the problem is the standard trial and error procedure of fitting the existing MDP data with Eq. (5). Of paramount importance are the tables of the digitized r(c) values with the claimed accuracy of about 1–3%. This data is indispensible for finding m. 3. Data analysis Let us first consider TAPC:PC system investigated in [11] for c changing in extremely broad range from 10% to 80% including TAPC glass itself (c = 100%) with r falling from 0.136 to 0.067 eV (Fig. 1). _ _ Fitting procedure shows that rv dW;p ¼ 0:137 eV (rdp is equal to _ 0.047 eV as in [10]). As for TAPC we find rv dW;d ¼ 0:056 eV and _ rdd ¼ 0:036 eV (p = 1.4 D). It is gratifying that the experimentally found r in TAPC glass is 0.067 eV [12] and coincides with its value for TAPC:PC in the limit c ? 1.0. As we see later, this result is unique and in other systems it holds only approximately. Fig. 1 shows that the best value of parameter m is 1.5 (good agreement gives 1.25 as well). Larger values (2.0 or 3.0) should be rejected, especially the last one. It is important to note that in this case we deal with a MDP, in which dipole moments of dopant molecules and polymer repeating units (1.0 D) are close. In TTA:PC system studied in [13] the experimental data for m is _ bracketed by 1.25 and 1.5 (Fig. 2). For m = 1.5 parameter ðrv dW;d _ equals 0.057 eV (rdd ¼ 0:041 eV, see [10]). Here, we kept disorder parameters for PC the same as in a previous example. Fig. 2. Experimental (1) and calculated (2–4) dependence of r on the dopant concentration c for TTA:PC. Parameter m is equal to 1.25 (2), 1.5 (3) and 2.0 (4). Most investigations refer to doped PS, in which p = 0.4 D, _ b 0.55 nm, so that rdp 0:037 eV (see [10]). In TTA:PS [13], we _ have r = 0.106 eV at c = 0.1 to give rv dW;p ¼ 0:110 eV. With m = 2.5 (the best fit on Fig. 3) we arrive at the experimental r _ _ (0.077 eV) at c = 0.5 for rv dW;d ¼ 0:057 eV (rdd ¼ 0:041 eV as in [10]). From now on, we use the above-cited values for PC and PS in analyzing the published data relating to various MDPs. An interesting information has been provided by the studies of the hole transport in TPM doped PS at fixed dopant concentrations (35% and 45%) and in the respective TPM glasses [14–16]. Dipole moments of the TPM molecules vary from 1.33 to 3.2 D. Let us consider extracted data for 3 TPM molecules. In TPM-A glass (p = 1.33 _ _ D) r = 0.093 eV and rdd ¼ 0:043 eV, so that rv dW;d ¼ 0:082 eV. In two other glasses TPM-D (p = 2.1 D) and TPM-E (p = 3.2 D) the corresponding numbers are 0.106, 0.062, 0.087 eV, and 0.123, 0.093, 0.081 eV. Van der Waals disorders are rather close while dipolar disorder rises with increasing p. Based on m = 1.5 we calculate r for 3 respective 35% TPM:PS in the same order (in brackets, experimental values): 0.106 (0.106), 0.108 (0.110) and 0.113 (0.115) eV. The agreement between experimental and calculated values is satisfactory. Author's personal copy A. Tyutnev et al. / Chemical Physics 389 (2011) 75–80 0.12 77 Fig. 4. Experimental (1) and calculated (2) dependence of r on the dopant concentration c for ENA-D:PS. Parameter m is equal to 2.5 (2). Br-substituted TTA (TPA-4) is given in [20]. Our calculations reproduce experimental data rather closely (Fig. 5). The flat r(c) dependence for TPA-4 is very reminiscent of the similar dependence found in DEH, DEASP and DTNA doped PS and PC, which we are now going to consider (see [8,9]). First of all, there is a need for the reliable information to assess the van der Waals disorder energy in typical polar dopants such as DEH, DEASP and DTNA whose dipole moments rise in that order. There is data published for the first two glasses [21,22] but it _ arouses serious suspicions. In them rd exceeds r: 0.115 and 0.125 eV compared to 0.104 and 0.103 eV, respectively. Clearly, there is no room left for the van der Waals disorder energy in this case. This finding seems rather unphysical. In [23] data has been presented for 45% HDZ:PS. Two hydrazones used (HDZ-C and HDZ-F (DEH) with dipole moments 2.27 and 3.16 D, respectively) are of special importance. Reported r values were 0.100 and 0.113 eV in that order. As data for PS is known as well as dipole moments and molecular weights for both dopants (468 and 343), we are able to make evaluation of their van der Waals disorders (0.06 eV), which fits the above experimental data exactly. Let us try analogous assessment for moderately doped 50% DEH:PS [24,25]. In both papers r equals 0.113 eV. Evaluated _ r v dW;d is 0.056 eV. In 50% DEASP:PS [25] r = 0.129 eV, so _ rv dW;d ¼ 0:070 eV. Both numbers make sense and we use them in calculations. Let us now consider the c-changing experiment for DEH:PS described in [24]. The range of concentrations extends from 7 to 65 wt.% (Fig. 6). Also shown on the figure are all disorder components in this MDP and their change with the concentration of the dopant. Fig. 7 presents analogous data for DEASP:PC. It is seen that general agreement between experimental and calculated results is satisfactory and a flat r(c) dependence is reproduced. The above argumentation allows one to understand the reasons for unusual behavior of r in c-changing experiments, in which it stays nearly constant when polar dopant concentration varies in a wide range (for DTNA:PS and DEASP doped PS and PC see Figs. 1 and 2 in [8]). Exactly these results forced authors of the review [8] to conclude ‘‘that dipolar disorder does not contribute to the temperature dependence of the mobility’’. This conclusion has been challenged in [9] on the ground that in reality dipolar disorder could not escape contributing to the temperature dependence In ENA-D:PS [17] the best choice of m is 2.5 (Fig. 4). In this sys_ tem rv dW;p ¼ 0:10 eV (slightly less than customary) and _ rv dW;d ¼ 0:085 eV. The dipolar moment of the dopant (0.38 D) is very close to that of the repeating unit in PS, so no changes of e should be expected in a c-changing experiment. This way, we succeeded in accounting for a mild decrease of r from 0.100 to 0.078 eV for c rising from 0.07 to 0.65. So far, we dealt with MDPs in which increasing c causes r to decrease. Now we take up MDPs with conspicuously flat r(c) dependence, starting with non-polar dopants in PS. In TASB:PS with non-polar dopant (p = 0.54 D) the findings are as follows [18]. The observed constancy of r (0.102 ± 0.002 eV) _ was reproduced for rv dW;d ¼ 0:10 eV and the estimated _ rdd ¼ 0:014 eV. Even in the electron non-polar conductor DPQ:PS r = 0.118 ± 0.001 in the range of c 0.2–0.6 [19]. Dipole moment _ of DPQ molecule is 0.4 D. Here, by assuming rv dW;d of the dopant _ to be equal to 0.120 eV (rdd ¼ 0:017 eV), we come to the constancy of r (0.118 ± 0.001 eV) in the whole range of c tested (to achieve _ this we assumed slightly smaller rv dW;p ¼ 0:10 eV for m = 1.5). An interesting example of a strikingly different behavior of the r(c) dependence for PS doped with TTA (TPA-1) and a more polar Fig. 5. Experimental (1, 4) and calculated (2, 3, 5) dependence of r on the dopant concentration c for TPA-4:PS (1–3) and TTA:PS (4, 5). Parameter m is equal to 1.75 (2, 3) and 2.5 (5). For curve 3 the dielectric permittivity at c = 0.5 was taken to be 2.8 (see Section 4). 1 TTA:PS 2 0.11 3 0.10 σ, eV 5 4 0.09 6 0.08 1 0.07 0 10 20 30 40 50 60 c, wt.% Fig. 3. Experimental (1) and calculated (2–5) dependence of r on the dopant concentration c for TTA:PS. Parameter m is equal to 1.25 (2), 1.5 (3), 2.0 (4), 2.5 (5) and 3.0 (6). Author's personal copy 78 A. Tyutnev et al. / Chemical Physics 389 (2011) 75–80 It may be said that concentration dependence of r is generally defined by the interplay of four material parameters: _ _ _ _ rv dW;p ; rv dW;d ; rdp and rdd (their values are given in Table 1). Linear combination of their squares (coefficients depend on the concentration c) defines r2 as has been demonstrated above. First two and the last of them are crucial for polar dopants and here the net result of r const is readily achieved. The compensation of rising rdd is effected mainly through decreasing rvdW,p (the role of the second (rvdW,d) and the third (rdp) contributions are minor and, to certain extent, they tend to compensate each other). Figs. 6 and 7 illustrate how each of these four disorder constituents changes with the dopant concentration. Also shown are their partial combinations (dipolar rdt and van der Waals rvdW,t) as well as the resulting total disorder r. 4. Discussion Fig. 6. Concentration dependence of the various computed components of the disorder energy in DEH:PS including the experimental as well as the calculated r. Fig. 7. Concentration dependence of the various computed components of the disorder energy in DEASP:PC including the experimental as well as the calculated r. Table 1 Materials disorder parameters used in this work (except when stated otherwise). Material p, D PS PC DEH DEASP TTA TAPC TPD TPM-A TPM-D TPM-E DPQ TASB ENA-D TPA-4 DTNA 0.4 1.0 3.16 4.34 0.9 1.4 1.52 1.33 2.1 3.2 0.4 0.54 0.38 2.6 5.78 _ rdd ; eV 0.115 0.125 0.041 0.036 0.046 0.043 0.062 0.093 0.017 0.014 0.016 0.104 0.19 _ rv dW;d eV _ rdp eV _ 0.037 0.047 0.110 0.137 rv dW;p eV 0.056 0.070 0.057 0.056 0.06 0.082 0.087 0.081 0.12 0.10 0.085 0.06 0.07 (or r) but no plausible compensation mechanism to offset the rising dipolar contribution of the dopant molecules (rdd in our terminology) has been found. The central idea of the DDF is that two kinds of disorder (the dipolar and the van der Waals, both electrostatic in nature) add up quadratically to give the square of the total disorder r. The most important observation concerns the fact that total disorders in polymer binders determined in the limit c ? 0 is strikingly large (0.145 eV in PC and 0.116 eV even in non-polar PS) as Figs. 1–3 show. Since dipolar contributions in them do not exceed 0.05 and 0.04 eV in that order we conclude that the van der Waals parts clearly dominate. Now diluting these polymers with non-polar or slightly polar dopants is expected to decrease r if their van der Waals disorders are appreciably smaller than that of a polymer (TAPC, TTA, ENA-D, TTB, TPD to name just a few) or almost not to change if these are comparable (TASB, DPQ). For polar DEH and DEASP r stays almost constant due to compensation of the falling rvdW,p with rising rdd in c-changing experiments in both PC and PS. Now let us discuss the problem of a gradual increase of e with rising concentration of the polar dopant. It has been shown that in 30% TTA:PS e = 2.652 compared to 2.54 in pure PS (4% rise) [26]. Adding TAP (p = 6.6 D) to original MDP further raises e to 2.676 (2 wt.%), 2.805 (4 wt.%) and lastly to 3.011 at 8 wt.% (almost 20% increase compared with PS). Even more striking effect has been found in 33 wt.% TPA:PS as adding of 6.2% of o-DNB increased e from initial value of 2.9 to 3.3–3.6 [26] or even 4.9 [27]. But 6 wt.% data point is even smaller than the starting concentration in a typical c-changing experiment. In this precarious situation, we had to rely mostly on common sense in evaluating results of such experiments. In this situation, we made preliminary measurements of e in PS and PC doped with polar dopants (Table 2). The samples have been prepared at Kodak using Ni-coated PET substrates. Diameter of Al electrodes (about 7 nm thick) were 32 or 23 mm. Thickness of the samples varied between 16 and 35 lm and free surfaces were Table 2 Dielectric constants of MDPs. MDP e (Error bars = 0.05) 50% 30% 70% 30% 70% 70% 50% 70% 3.0 2.65 2.85 2.95 3.3 3.0 3.1 3.15 DTNA:PS DEH:PS DEH:PS TPA-4:PS TPA-4:PS DEASP:PS DEH:PC DEASP:PC Pure polymers PS PC 2.6 3.0 Author's personal copy 79 A. Tyutnev et al. / Chemical Physics 389 (2011) 75–80 either mirror-like or rather rough with point defects. TPA-4:PS samples were not properly dried and stayed rather sticky exhibiting high dark conductivity. Processing was done with due care for all these interfering factors. In pure PS and PC the dielectric permittivity was close to 2.6 and 3.0 as expected (measurements made at 103 Hz). Table 2 shows that e does not change in any significant way (610%) except in TPA-4:PS (polymer in a rubber state) and 50% DTNA:PS or 70% DEASP: PS (15%). The increase of e should appreciably reduce the dipolar disorder as Eq. (2) requires (rd / 1/e). According to P. Parris [28] in a medium containing randomly distributed polarizeable spherical molecules (number density q3) we have rv dW / q3=2 / c1=2 : ð6Þ On the other hand, the same problem formulated for a lattice leads to rather different result. In this case, rvdW = 4PK [3] where K is the relative average fluctuation of the intermolecular separations (in units of the lattice constant a). Now as P is proportional to a4, we finally obtain that rv dW / a4 / c4=3 : ð7Þ Dependences (6) and (7) are substantially different so the best way in this situation is to use c-dependence with an adjustable parameter m (rvdW / cm/3) to fit the experiment. Exactly this approach has been adopted in the present work (see Eq. (5)). Much stronger dependence should occur for the van der Waals disorder as now rvdW / 1/e2 [28]. To accommodate e variation we used the modified Eq. (5) _ _ _ _ r2 ¼ n2 cr2dd þ k2 ð1 cÞr2dp þ n4 c2m=3 rv2 dW;d þ k4 ð1 cÞ2m=3 r2v dW;p : ð8Þ Here the correction coefficients n and k are the ratios of the permittivities in the limit c ? 1.0 (n) and c ? 0 (k) to that in the MDP with the given concentration c. The permittivity is assumed to change linearly with concentration of the polar dopant from that of the polymer (c ? 0) to that (em) at the highest dopant concentration cm used in experiment eðcÞ ¼ ep þ em ep c=cm : ð9Þ Curve 3 on Fig. 5 serves to confirm that the flat r(c) dependence stays almost intact when e variation is taken into account. Fig. 8 presents r(c) curves (both computed and experimental) in DEH:PS (1), DEASP:PC (2) and DTNA:PS (3). Calculations use Eqs. (8) and (9) and data presented in Tables 1 and 2. Note that material disorder parameters were determined independently (see Table 1). Contrasted with the first two MDPs, the third one exhibits strongly rising r(c) dependence even in a limited range of 20–60 wt.% contrary to the experiment [7]. It is a challenge to the DDF. In this context, it should be reminded that mobility measurements in [7] clearly refer to the non-equilibrium transport (see Fig. 2 in the cited paper). To account for this fact thebasic formula 2 for retrieving r has been changed: lð0; TÞ ¼ l0 exp 14 kr2 T 2 . This formula should be compared with a similar one given in the Introduction section. Obviously, experimental data for DTNA:PS should be revisited. Theoretical findings of the paper [29] regarding accuracy of Eq. (2) are worth mentioning. It has been shown that e-dependence of the dipolar disorder is practically absent for e changing in the range from 2.0 to 4.0 while the magnitude of the rdd is approximately 1.6 times smaller than that given by Eq. (2) for e = 1.0. It is possible that such implications are also expected for e-dependence of the rvdW as well. Future theoretical work in this direction is highly desired. 5. Summary The central idea of the dipolar disorder formalism suggesting that the van der Waals rvdW and dipolar disorder rd energies combine as independent components to form total disorder energy r according to Eq. (1) seems quite reasonable. We have shown that treating rvdW for a polymer and a dopant as being algebraically proportional to their fractional mass densities enables one to rationalize data for PS and PC doped with weakly polar dopants such as DAS-A, TASB, TTA, TTB, TPD, etc. (p = 0.3 to 2.2 D). The case of polar dopants (TPA-4, DEH and DEASP) featuring unusually flat r(c) dependence can also be explained (at present, DTNA defies this approach). Thus, the long-standing controversy about a flat r(c) dependence in polar MDPs has been resolved in the framework of the modified dipolar disorder formalism without making use of any extraordinary assumptions unsuccessfully sought in literature [9]. Molecular glasses of polar dopants still present a challenge to the above approach. Future theoretical work to account for the permittivity dependence of both the dipolar and the van der Waals disorder energies in the spirit of the paper [29] is necessary. Acknowledgements The authors would like to acknowledge fruitful discussions with late Lawrence Schein and Paul Parris. The authors would also like to thank D. Weiss for preparation of the samples of PS and PC doped with polar dopants. Appendix A Definition of Initials used in this paper DEASP Fig. 8. Calculated total disorders r in DEH doped PS (1), DEASP doped PC (2) and DTNA:PS (3), filled symbols. Experimental values of r are denoted by primed numbers (empty symbols). DEH DTNA DNB DPQ ENA-D HDZ-C HDZ-F 1-Phenyl-3((diethylamino)styryl)-5-(p(diethylamino)phenyl)pyrazoline p-Diethylaminobenzaldehyde diphenylhydrazone Di-p-tolyl-p-nitrophenylamine Dinitrobenzene 3,30 -Dimethyl-5-50 -di-t-butyldiphenoquinone N(2,2-Diphenylvinyl)-diphenylamine 4-Ditolylaminobenzaldehyde diphenylhydrazone =DEH (continued on next page) Author's personal copy 80 A. Tyutnev et al. / Chemical Physics 389 (2011) 75–80 Appendix A (continued) PC PS TAP TAPC TASB TPA TPA-4 TPM-A TPM-B TPM-C TPM-D TPM-E TPM-F TPD TTA TTB Bisphenol-A-polycarbonate Polystyrene t-Amylphthalonitrile 1,1-Bis(di-4-tolylaminophenyl)cyclohexane Bis(ditolylaminostyryl)benzene Tri-p-phenylamine 1-Br(Substituted) p-tritolylamine Bis(4-N,N-diethylamino-2-methylphenyl)-4methylphenylmethane Bis(4-N,N-diethylamino-2-methylphenyl)(4-propylphenyl) methane Bis(4-N,N-diethylamino-2-methylphenyl)(4-phenylphenyl) methane Bis(4-N,N-diethylamino-2-methylphenyl)(4-phenyl) methane Bis(4-N,N-diethylamino-2-methylphenyl)(4-methoxyphenyl) methane Bis(4-N,N-diethylamino-2-methylphenyl)(4-chlorophenyl) methane N,N0 -diphenyl-N,N-bis(3-methylphenyl)-[1,10 biphenyl]-4,40 diamine Tri-p-tolylamine N,N0 ,N00 ,N000 -Tetrakis(4-methylphenyl)-(1,10 biphenyl)-4,40 -diamine References [1] P.M. Borsenberger, H. Bässler, J. Chem. Phys. 95 (1991) 5327. [2] P.M. Borsenberger, D.S. 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