Separation Methods Utilizing Oxalate‐HCl on Anion Exchange Resins Dan McAlister and Phil Horwitz Eichrom Workshop October 31, 2012 Anion Exchangers H C C H2 CH3 CH2N+ CH3 ClCH3 - Cl R1 + R2 N CH3 R3 R1 + N H Cl R2 R3 Strong Base Anion Exchange Resin (1x8) 1.2 meq/mL TEVA (Quaternary Amine) 0.65 meq/mL Weak Base (Tertiary Amine) 0.65 meq/mL Anion Exchange TcO4‐, ReO4‐, MoO42‐, WO42‐ Th(NO3)5‐, UO2Cl42‐, FeCl4‐ O - O O - + HCl O Strelow, et al., Analytical Chemistry, 44(14), pp 2352‐2356, 1972. + Speciation of 0.05 M Oxalic Acid vs [H ] 100 O % Species 80 O O- HO 60 O - pKa1 = 1.2 O O- O pKa2 = 3.7 40 O 20 O HO OH 0 1 10 0 10 -1 10 -2 -3 10 10 + [H ], M -4 10 -5 10 -6 10 Increasing HCl Concentration O - O O O - O HO Mn+ O O → MCl - O HO → MClx‐ Chloride competition for extraction O OH Example #1 Metal Mg Al Ga In Ion Charge 2+ 3+ 3+ 3+ 1 2.76 6.2 6.4 6 Oxalate logK 2 3 11.4 12.3 11.4 15.8 17.8 14.5 1 0.2 ‐1.0 0.01 2.3 Chloride logK 2 3 3.6 11.4 4.0 14.5 1x8 5 Weak Base TEVA Dw Mg < 1 Dw Mg < 1 10 In Ga Al 4 10 3 10 2 Dw 10 1 10 0 10 Dw Mg < 1 -1 10 -2 10 -1 10 0 10 HCl, M 1 -2 10 10 -1 10 0 10 HCl, M 1 -2 10 10 -1 10 0 10 HCl, M 1 10 o Elution on 2mL Cartridge of 1x8 Resin (50-100 m), 21(1) C, 2mL/min 3 10 2 10 0.05M Oxalate 1.0M HCl Al Mg 1 10 mg/L 0.05M Oxalate 0.5M HCl 0.05M Oxalate 0.01M HCl 1.0 M HNO3 Ga In 0 10 -1 10 -2 10 -3 10 0 5 10 15 20 Bed Volumes 25 30 35 o Elution on 2mL Cartridge of TEVA Resin (50-100 m), 21(1) C, 2mL/min 3 10 0.05M Oxalate 0.5M HCl 0.05M Oxalate 0.01M HCl 2 10 0.05M Oxalate 1.0M HCl Al 1 mg/L 10 In Ga Mg 1.0 M HNO3 0 10 -1 10 -2 10 -3 10 0 5 10 15 20 Bed Volumes 25 30 35 o Elution on 2mL Cartridge of Weak Base Resin (50-100 m), 21(1) C, 2mL/min 3 10 2 10 0.05M Oxalate 1.0M HCl Al Mg 1 10 mg/L 0.05M Oxalate 0.5M HCl 0.05M Oxalate 0.01M HCl 1.0 M HNO3 In Ga 0 10 -1 10 -2 10 -3 10 0 5 10 15 20 Bed Volumes 25 30 35 Example #2 1x8 5 Weak Base TEVA 10 U(VI) Nb(V) Ni(II) V(V) 4 10 3 10 2 Dw 10 1 10 0 10 Dw Mn(II) < 1 Dw Mn(II) < 1 Dw Ni and Mn < 1 -1 10 -2 10 -1 10 0 10 HCl, M 1 -2 10 10 -1 10 0 10 HCl, M 1 -2 10 10 -1 10 0 10 HCl, M 1 10 o Elution on 2mL Cartridge of 1x8 Resin (50-100 m), 21(1) C, 2mL/min 3 10 2 10 0.05M 0.05M 0.05M Oxalate Oxalate Oxalate 0.2M HCl 1.0M HCl 4.0M HCl 0.05M Oxalate 0.01M HCl Ni(II) Mn(II) 1 Nb(V) V(V) 10 mg/L 1.0 M HNO3 U(VI) 0 10 -1 10 -2 10 -3 10 0 5 10 15 20 25 Bed Volumes 30 35 40 45 o Elution on 2mL Cartridge of Weak Base Resin (50-100 m), 21(1) C, 2mL/min 3 10 2 10 0.05M 0.05M 0.05M Oxalate Oxalate Oxalate 0.2M HCl 1.0M HCl 4.0M HCl 0.05M Oxalate 0.01M HCl 1.0 M HNO3 U(VI) 1 Nb(V) V(V) Mn(II) 10 mg/L Ni(II) 0 10 -1 10 -2 10 -3 10 0 5 10 15 20 25 Bed Volumes 30 35 40 45 o Elution on 2mL Cartridge of TEVA Resin (50-100 m), 21(1) C, 2mL/min 3 10 2 10 0.05M 0.05M 0.05M Oxalate Oxalate Oxalate 0.2M HCl 1.0M HCl 4.0M HCl 0.05M Oxalate 0.01M HCl U(VI) V(V) Mn(II) 1 1.0 M HNO3 Nb(V) 10 mg/L Ni(II) 0 10 -1 10 -2 10 -3 10 0 5 10 15 20 25 Bed Volumes 30 35 40 45 Example #3 1x8 5 Weak Base TEVA 10 4 10 3 10 Cu(II) Ti(IV) Mo(VI) 2 Dw 10 1 10 0 10 Dw Co(II) < 1 Dw Co(II) < 1 Dw Co(II) < 1 -1 10 -2 10 -1 10 0 10 HCl, M 1 -2 10 10 -1 10 0 10 HCl, M 1 -2 10 10 -1 10 0 10 HCl, M 1 10 o Elution on 2mL Cartridge of 1x8 Resin (50-100 m), 21(1) C, 2mL/min 3 10 0.05M Oxalate 0.5M HCl 0.05M Oxalate 0.01M HCl 2 10 0.05M Oxalate 2.0M HCl Ti(IV) 0.5M NH4OH 1.0 M NH4NO3 Cu(II) Mo(VI) 1 10 mg/L Co(II) 0 10 -1 10 -2 10 -3 10 0 5 10 15 20 25 Bed Volumes 30 35 40 o Elution on 2mL Cartridge of Weak Base Resin (50-100 m), 21(1) C, 2mL/min 3 10 0.05M Oxalate 0.5M HCl 0.05M Oxalate 0.01M HCl 2 10 Ti(IV) Cu(II) Co(II) 1 0.05M Oxalate 2.0M HCl 1.0 M NH4NO3 Mo(VI) 10 mg/L 0.5M NH4OH 0 10 -1 10 -2 10 -3 10 0 5 10 15 20 25 Bed Volumes 30 35 40 o Elution on 2mL Cartridge of TEVA Resin (50-100 m), 21(1) C, 2mL/min 3 10 0.05M Oxalate 0.5M HCl 0.05M Oxalate 0.01M HCl 2 10 Ti(IV) Cu(II) Co(II) 1 0.05M Oxalate 2.0M HCl 1.0 M NH4NO3 Mo(VI) 10 mg/L 0.5M NH4OH 0 10 -1 10 -2 10 -3 10 0 5 10 15 20 25 Bed Volumes 30 35 40 1x8 5 Weak Base TEVA 10 4 10 3 10 Dw Li, Na, K, Rb, Cs < 1 2 Dw 10 Dw Li, Na, K, Rb, Cs < 1 Dw Li, Na, K, Rb, Cs < 1 1 10 0 10 -1 10 -2 10 -1 10 0 10 HCl, M 1 -2 10 10 -1 10 0 10 HCl, M 1 -2 10 10 -1 10 0 10 HCl, M 1 10 1x8 5 Weak Base TEVA 10 4 10 3 Pd(II) Pt(II) Au(I) Pb(II) 10 2 Dw 10 1 10 0 10 Dw Mg, Ca, Sr, Ba, Mn(II) <1 Dw Mg, Ca, Sr, Ba, Mn(II) <1 -1 10 -2 10 -1 10 0 10 HCl, M 1 -2 10 10 -1 10 0 10 HCl, M Dw Mg, Ca, Sr, Ba, Mn(II) <1 1 -2 10 10 -1 10 0 10 HCl, M 1 10 1x8 5 Weak Base TEVA 10 Zn(II) Cu(II) Be(II) Cd(II) 4 10 3 10 2 Dw 10 1 10 0 10 Dw Be, Mg, Ca, Sr, Ba, Mn(II) <1 Dw Be, Mg, Ca, Sr, Ba, Mn(II) <1 -1 Dw Be, Mg, Ca, Sr, Ba, Mn(II) <1 10 -2 10 -1 10 0 10 HCl, M 1 -2 10 10 -1 10 0 10 HCl, M 1 -2 10 10 -1 10 0 10 HCl, M 1 10 1x8 5 Weak Base TEVA 10 4 10 3 10 2 Dw 10 1 10 Bi(III) In(III) Fe(III) Ga(III) Al(III) 0 10 -1 10 -2 10 -1 10 0 10 HCl, M 1 -2 10 10 -1 10 0 10 HCl, M 1 -2 10 10 -1 10 0 10 HCl, M 1 10 1x8 5 Weak Base TEVA 10 4 10 3 10 2 Dw 10 1 10 Sn(IV) Ti(IV) Zr(IV) Hf(IV) 0 10 -1 10 -2 10 -1 10 0 10 HCl, M 1 -2 10 10 -1 10 0 10 HCl, M 1 -2 10 10 -1 10 0 10 HCl, M 1 10 1x8 5 Weak Base TEVA 10 4 10 3 10 2 Dw 10 1 10 Ta(V) Nb(V) V(V) 0 10 -1 10 -2 10 -1 10 0 10 HCl, M 1 -2 10 10 -1 10 0 10 HCl, M 1 -2 10 10 -1 10 0 10 HCl, M 1 10 1x8 5 Weak Base TEVA 10 4 10 3 10 2 Dw 10 1 10 W(VI) Mo(VI) U(VI) 0 10 -1 10 -2 10 -1 10 0 10 HCl, M 1 -2 10 10 -1 10 0 10 HCl, M 1 -2 10 10 -1 10 0 10 HCl, M 1 10 k' on Weak Base Resin Oxidation Element State Sn IV W VI Pd II Group 14 6 10 0.01 4 >10 9800 4 >10 4 0.10 4 >10 9900 4 >10 0.20 4 >10 9600 4 >10 Mo VI 6 >10 >10 4 >10 Bi III 15 5000 5000 >10 Pt Ta Cd In Nb II V II III V 10 5 12 13 5 >10 N/A N/A 8100 1200 4 >10 3400 2100 9000 1500 4 U Zn Ti Fe Zr Hf Ga Pb V Al Cu Ni Th VI II IV III IV IV III II V III II II IV An 12 4 8 4 4 13 14 5 13 11 10 An >10 N/A 9300 N/A N/A N/A 2000 N/A 9486 7983 263 85 ppt 4 >10 50 2000 4 >10 6900 1200 1800 4.0 1300 200 17 0.5 ppt 4 3 M, HCl (0.05M Oxalic acid) 0.50 1.0 2.0 4 4 4 >10 >10 >10 9800 710 150 4 >10 9500 5000 4 >10 4 >10 4 >10 >10 5400 3000 8300 1000 4 >10 170 1400 4 >10 930 600 1100 4.4 400 340 8.0 <0.5 ppt 4 4 >10 >10 4500 4000 420 870 4 >10 9000 380 2600 260 570 140 15 14 3.7 0.5 <0.5 ppt 4 3 3 >10 < 0.5 1800 Re VII 7 N/A >10 >10 >10 Cr III 6 N/A < 0.5 < 0.5 < 0.5 Au I 11 2300 2800 2700 2300 k' Co, Mn, Be, Mg, Ca, Sr, Ba, Li, Na, K, Rb, Cs <0.5 for all HCl concentrations 4 >10 4 >10 >10 4500 3700 41 91 4 3.0 4 >10 78 2500 4 >10 4 >10 >10 44 4900 51 5.8 4 >10 920 130 19 66 27 4.3 22 0.5 < 0.5 0.6 <0.5 ppt 4 3 >10 < 0.5 970 4.0 4 >10 130 1100 4 >10 4 4 >10 >10 45 4800 110 2.3 4 >10 33 4900 250 1.4 180 4 >10 12 200 1.0 1.2 92 25 0.5 < 0.5 3.2 <0.5 3.2 8200 4 >10 1.8 4 >10 0.2 <0.5 970 18 0.4 < 0.5 13 <0.5 < 0.5 >10 4 >10 0.8 4 >10 0.4 <0.5 1200 10 0.7 < 0.5 31 <0.5 < 0.5 3 >10 < 0.5 900 3 >10 < 0.5 830 4 4 4 3 k' on TEVA Resin Oxidation Element State Group M, HCl (0.05M Oxalic acid) 0.50 1.0 2.0 0.01 0.10 0.20 4 4 4 4 4 3.0 4 4.0 4 Sn W Pd IV VI II 14 6 10 N/A 9800 9800 >10 9600 9200 >10 9200 9100 >10 4900 5000 >10 510 4800 >10 110 1300 >10 40 450 >10 45 180 Mo VI 6 9600 9300 9200 9900 9600 5100 >10 4 >10 Bi III 15 5100 4800 >10 4 >10 4 400 4 4 4 4 4 4 4 4 >10 4 >10 >10 4 4 Pt Ta Cd In Nb II V II III V 10 5 12 13 5 N/A N/A N/A 8300 1000 >10 2100 650 250 1500 >10 2200 1200 180 1400 >10 3800 2000 38 310 >10 51 2900 16 29 >10 40 4800 25 6.1 >10 38 4100 47 4.1 >10 14 4300 78 2.3 U Zn Ti Fe Zr Hf Ga Pb V Al Cu Th VI II IV III IV IV III II V III II IV An 12 4 8 4 4 13 14 5 13 11 An 2100 N/A 2300 N/A N/A N/A 4200 N/A 3000 2700 18 ppt 2100 48 1400 6500 3800 6000 3000 0.7 310 110 2.2 ppt 1300 100 870 8800 2300 670 180 6.0 55 16 0.7 ppt 130 320 300 45 53 19 9.7 14 4.7 0.7 < 0.5 ppt 23 450 90 4.3 2.2 1.4 0.4 18 0.4 < 0.5 < 0.5 ppt 70 7700 6.7 130 0.4 1.0 55 19 0.4 < 0.5 < 0.5 40 350 9300 1.5 1100 0.2 <0.5 1500 12 0.6 < 0.5 < 0.5 36 >10 4600 0.4 1100 0.1 <0.5 3200 7.3 1.3 < 0.5 < 0.5 <0.5 3 3 3 >10 < 0.5 4600 3 >10 < 0.5 3400 3 >10 < 0.5 2300 3 >10 < 0.5 2300 Re VII 7 N/A >10 >10 >10 Cr III 6 N/A < 0.5 < 0.5 < 0.5 Au I 11 1400 3900 4500 4600 k' Co, Mn, Be, Mg, Ca, Sr, Ba, Li, Na, K, Rb, Cs <0.5 for all HCl concentrations 4 3
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