Thermal Issues in Emerging Technologies, ThETA 1, Cairo, Egypt, Jan 3-6th 2007 DJOSER: ANALYTICAL THERMAL SIMULATOR FOR MULTILAYER ELECTRONIC STRUCTURES. THEORY AND NUMERICAL IMPLEMENTATION Paolo Emilio Bagnoli (1), Claudio Casarosa (2), Fabio Stefani (1). (1) (2) Dept. of Information Engineering, University of Pisa, Via Caruso 10, Pisa, Italy. Department of Energetics, University of Pisa, Via Diotisalvi 2, 56100 Pisa, Italy. ABSTRACT This paper presents a steady-state thermal simulation strategy called DJOSER, which is dedicated primarily but not exclusively to packaging structures for electronic devices. It is applicable to structures that can be likened to a set of homogeneous layers stacked one on top of the other and possibly separated by thermal contact resistances, where the dissipated powers are due to two-dimensional heat sources distributed on the interfaces between the layers. A broad range of contour conditions and types of dissipated powers is included to make the models as close as possible to the typical structures of modern assembly technologies. Flow and temperature distributions are obtained via a system of integral equations that can be translated directly, with the usual squaring techniques, into a linear algebraic system. 1. INTRODUCTION The analytical strategy for thermal simulation of electronic packaging structures has been widely used to solve particular problems and under given boundary conditions both in the static and dynamic regimes [1,2,3,4,5]. The thermal simulation tool suggested in the present paper and called DJOSER1 is based on the possibility it offers to numerically approximate the analytic solution to a particular conduction problem. The main model, which is a multilayer stepped pyramidal structure, the 2D meshing at the layer interfaces used for the description of thermal functions and a set of boundary conditions which may be inserted makes this simulation tool useful to accurately simulate nearly all the assembling structures of power devices. The approach used results in some advantages with respect of finite-elements method (FEM), in terms of number of variable reduction and hence of the computing time and memory usage while is comparable in terms of accuracy. Thanks to these advantages and the easier model description, the present simulation system is particularly useful for fast thermal evaluations and as a thermal solver in cyclic electro-thermal simulations [6]. Elsewhere presented and validated as a prototype [7,8,9], the DJOSER program is here fully exposed in its final and complete form, including the FIG. 1 – Pyramidal multi-layer structure, including thin soldering or attaching layers; To is the heat sink temperature, eventually not uniform; Ta is the environment one. mathematical terms of the problem, and its solution via a linear algebraic system. 2. THEORETICAL BASIS The multi-layer structure shown in Fig. 1 consists of a stack of physically homogeneous prismatic elements: rectangular-faced parallelepipeds of various thicknesses with their edges parallel to each other. The base of each element is smaller (or at least no larger) than the top of the one below, and its top is larger (or at least no smaller) than the base of the one above. The result is a sort of stepped pyramid in which the steps are of various heights, and it is not necessarily possible to identify symmetry planes. The thermal analysis of the multi-layer pyramidal structure is based on knowledge of the solution to a steady-state heat-conduction problem formulated for a generic prismatic element. On the lateral faces of the prism, a heat exchange by convection with the environment at constant temperature is established. The environment is assumed to be the zero reference for the temperature, so that the boundary conditions at the lateral faces are type-3 linear and homogeneous [10]. Likewise, a convective heat exchange is assumed for the bases of the prismatic element, but for each base the external temperature at the interface is considered variable from point to point. As a result, the contour conditions are again type-3 linear, but not homogeneous. In formal terms, assuming the coordinates shown in Fig. 2, the problem is as follows: ∇2T = 0 for 0<x<Lx; 0<y<Ly; 0<z<Lz ∂T − h 1T = 0 for x = 0 ; 0<y<Ly; 0<z<Lz ∂x ∂T k + h 2 T = 0 for x = Lx; 0<y<Ly; 0<z<Lz ∂x k 1 Djoser was the 3rd-dynasty Egyptian sovereign who built the stepped pyramid at Saqqara. 1/8 DJOSER: Analytical Thermal Simulator for Multi-layer…, P.E.Bagnoli et al. ∂T − h 3 T = 0 for 0<x<Lx; y = 0; 0<z<Lz ∂y ∂T k + h 4 T = 0 for 0<x<Lx; y = Ly; 0<z<Lz ∂y (1) k ∂T − h 0 T = -f(x, y) for 0<x<Lx; 0<y<Ly; z = 0 ∂z ∂T k + h 5 T = g(x, y) for 0<x<Lx; 0<y<Ly; z = Lz ∂z k where for now the functions f(x,y) and g(x,y) are considered assigned to the two faces. The problem can be solved if we first identify two subproblems, each with homogeneous contour conditions, except for one of the two bases, i.e. z=0 or z=Lz. If we apply the variables-separation method to the two subproblems, it is easy to see that they share both eigenvalues and eigenfunctions. In particular, once we introduce the nondimensional Biot's numbers: Bi(j)=hjLj/k where L0 =L5 =Lz , L1 = L2 = Lx , L3 =L4 =Ly (2) the eigenvalues for Bi(j)+Bi(j+1) ≠ 0 are solutions for the following transcendent equation: ctg(ξ ) = Bi(j) ⋅ Bi(j + 1) ξ − Bi(j) + Bi(j + 1) [Bi(j) + Bi(j + 1)] ξ j = 1 ξ n = β n Lx j = 3 ξ m = µ mLy (3) while for Bi(j)+Bi(j+1) = 0 they are: FIG. 2 – Diagram of the individual layer: (a) and (b) are the section and plan, showing the boundary conditions; (c) is the section with the known variables ˆ , P , P*) and the unknown variables (T, q). ( q̂ , T ξ = 0, π , 2π , 3π ,.......(n − 1)π . The corresponding eigenfunctions are: X(β n x) = β n L x cos(β n x) + Bi(1) sen (β n x) (4) Y(µ m y) = µ m L y cos(µ m y) + Bi(3) sen (µ m y) T(x,y,z) = and the respective norms are [5]: N(β n ) = N(µ m ) = 1 2 2 (β n L x ) + Bi(1) 2 [ = Bi(2) ⋅ 1 + + Bi(1) 2 2 (β L ) + Bi(2) n x ] [ ] 1 Bi(4) 2 2 + Bi(3) (µ m L y ) + Bi(3) ⋅ 1 + 2 2 2 (µ m L y ) + Bi(4) [ ] [ ] (5) Starting from the eigenfunctions and particularly from their well-known orthogonal properties, we construct the solution [4] that contains a double series obtained from the Fourier transform of the function f(x,y) or g(x,y), depending on the base at which we have positioned the nonhomogeneous boundary condition to which the subproblem refers. The sum of the two solutions is the solution to the starting problem. Assuming υ n, m = β 2n + µ 2m [ ] S(n, m) = (υ n, m L z ) + Bi(0) ⋅ Bi(5) ⋅ sinh(υ n, m L z ) + 2 the solution is: + [Bi(0) + Bi(5)](υ n, m L z ) ⋅ cosh(υ n, m L z ) (6) Lz ∞ ∞ X(βn x) ⋅ Y(µm y) υn, mLz cosh υn, m (Lz -z) + Bi(5)sinh υn, m (Lz -z) ⋅ ∑∑ ⋅ k n=1 m=1 N(βn ) ⋅ N(µm ) S(n,m) 1 Lx Ly ⋅ 1 Lx Ly Lx Ly ∫ ∫ f(x′,y′)X(β x′)Y(µ n m y′) dx′dy′ + υn, mLz cosh(υn, mz) + Bi(0)sinh(υn, mz) 0 0 Lx Ly ∫ ∫ g(x′,y′) ⋅ X(β x′) ⋅ Y(µ n 0 0 m S(n,m) y′) dx′dy′ (7) In order to extent the result for one element to the thermal analysis of the pyramidal structure, we must first identify the functions f(x,y) and g(x,y), starting from the physical schematization of the structure. While convective heat exchange with the external environment occurs on the lateral faces of a generic prismatic element, the factors present on the bases will generally be as follows: on base z = 0: a plane heat generation per unit of surface and time; the heat flux that crosses contact interface à from the element above the one we are examining; and convective heat exchange, which is present only on the part (A–Ã) of the surface that is in direct contact with the external environment; 2/8 ⋅ DJOSER: Analytical Thermal Simulator for Multi-layer…, P.E.Bagnoli et al. on base z = Lz: heat exchange by conduction to the underlying element, possibly with the presence of a contact resistance between the two elements; and, if such a contact resistance is present, another plane source of heat generation per unit of surface and time. From the analytic standpoint, the greatest difficulty arises on the upper base z = 0 of the prismatic element, where – as we have seen – the contour conditions are mixed: one of the second type on (x,y)∈à and the other of the third type on (x,y)∈(A–Ã) [5]. If we use the term P(x,y) to denote the plane heat generation due, for example, to the Joule effect related to the passage of current in semiconductors junctions or in metal interconnections; q̂(x,y) for the heat flow from the overlying element, nil for (x,y) ∈ (A–Ã); and T(x,y,0) for the temperature on the top of the prismatic element we are examining, then the function f(x,y) on base x=0 will be: ~ f(x, y) = P(x, y) + qˆ (x, y) + h 0 T(x, y,0) for (x, y) ∈ A , z=0 ~ (8) f(x, y) = P(x, y) for (x, y) ∈ (A − A) ; z =0 T(x, y,0) = Bi(0) ∫∫ T( x ′, y′,0) G11 (x ′, y′ | x, y)dx ′dy′ + ~ A L + z k [ ∫∫ [P(x ′, y′) + q̂(x ′, y′)] G A 11 (11a) (x ′, y′ | x, y)dx ′dy′ ] + ∫∫ R *P* (x ′, y′) + T̂(x ′, y′) G12 (x ′, y′ | x, y)dx ′dy′ A ------------------------------------- q(x, y, L z ) = h 0 ∫∫ T( x ′, y ′,0) G 21 (x ′, y ′ | x, y)d x ′dy ′ + ~ A + ∫∫ [P( x ′, y′) + q̂(x ′, y ′)] G 21 (x ′, y′ | x, y)d x ′dy ′ A k − Lz ∫∫ [R ] * * P (x ′, y′) + T̂ (x ′, y ′) G 22 (x ′, y ′ | x, y)d x ′dy ′ A (11b) where the functions Gij(x’,y’x,y) are the Green ones structured as follows for this case: 1 Lx Ly G11 (x ′, y′ | x, y) = D11 (n, m) X(β n x ′) ⋅ Y(µ m y′) ⋅ ⋅ N(β n ) ⋅ N(µ m ) n =1 m =1 S(n, m) ∞ ∞ ∑∑ ⋅ X(β n x) ⋅ Y(µ m y) -------------------------- Accordingly, when h0 ≠ 0, the boundary condition for face z=0 implies a convective exchange identically nil on the (x,y)∈à part and, with the environment temperature at 0, not nil on the remaining part, (x,y) ∈ (A–Ã). This position obviously does not solve the difficulty created by the existence of mixed contour conditions. In fact, even assuming that the functions P(x,y) and q̂(x,y) are assigned, the temperature T(x,y,0) remains altogether unknown, which implies that an integral equation is present in the double Fourier series. The situation on the lower base of the element, z=Lz is simpler. If we use the term P*(x,y) to denote the further plane heat generation due to the aforesaid phenomena, T̂(x, y) for the temperature of the interface with the underlying layer, and R* for the contact thermal resistance between the element being examined and the one below it, the function g(x,y) will be: Tˆ (x, y) for (x, y) ∈ A , z =Lz g(x, y) = P (x, y) + R* * 1 Lx Ly ∞ ∞ ∑∑ υ n,m Lz ⋅ n =1 m =1 Bi(5) X(β n x ′) ⋅ Y(µ m y′) ⋅ S(n, m) N(β n ) ⋅ N(µ m ) ⋅ X(β n x) ⋅ Y(µ m y) -------------------------- (12) G 21 (x ′, y ′ | x, y) = G 12 (x ′, y ′ | x, y) ------------------------- G 22 (x ′, y ′ | x, y) = ⋅ 1 LxLy ∞ ∞ ∑∑υ n, m Lz ⋅ n =1 m =1 D 22 (n, m) ⋅ S(n, m) X( β n x ′) ⋅ Y( µ m y ′) ⋅ X( β n x) ⋅ Y( µ m y) N( β n ) ⋅ N( µ m ) since we have assumed that D11 (n, m) = υ n, m L z cosh (υ n, m L z ) + Bi(5)sinh (υ n, m L z ) D 22 (n, m) = υ n, m L z sinh (υ n, m L z ) + Bi(0)cosh(υ n, m L z ) . (13) (9) It should be noted that the contact thermal resistance entails a linear heat exchange like the convective one, which is thus: R* = 1 / h5 G 12 (x ′, y′ | x, y) = (10) Based on the physical schematization of the structure with which the functions f(x,y) and g(x,y) were identified, it is clear that while the plane heat generation terms P(x,y) and P*(x,y) are assigned functions, the terms q̂(x,y) and T̂(x, y) – related respectively to the examined element's upper and lower interface – are unknown; to the contrary, they depend on the thermal fields of the overlying and underlying elements. The next step in the thermal analysis of the pyramidal structure is to replace the functions f(x,y) and g(x,y) in the solution T(x,y,z) and its derivative for z with functions (8) and (9). We then operate so as to express the temperature in z=0 and the heat flow in z=Lz in the following form: As mentioned above, (11a) is a second type Fredholm linear integral equation [11], where the temperature T(x,y,0) acts as an unknown function and the Green G11 function as a nucleus. At any rate, it is easy to see that the equation would remain an integral one even if Bi(0)=0. Indeed, both (11a) and (11b) are by nature integral, because the functions q̂(x,y) and T̂(x, y) in the integrals on their right-hand sides are unknown. We assign a numerical index to each of the stack's generic prismatic elements, from 1 for the top element to n for the bottom one. The index appears to the lower right of the various magnitudes or, in parentheses, to the upper right. With these notations, the conservation of the heat flow and the continuity of the temperature on the interfaces of a generic "i-th" element translate into the following equations: qˆ (x, y) := qˆ i -1 (x, y) = Pi*-1 (x, y) + q i-1 (x, y, L(iz-1) ) for z=0 Tˆ (x, y) := Tˆ i+1 (x, y) = Ti +1 (x, y,0) (14) for z= L(i)z 3/8 DJOSER: Analytical Thermal Simulator for Multi-layer…, P.E.Bagnoli et al. In this way, for a generic prismatic element we have a pair of linear integral equations in the following four functions: q̂ i -1 ( x, y) ; q̂ i ( x, y) ; T̂i ( x, y) ; T̂i + 1 ( x, y) . In the resulting system of linear integral equations, the number of equations is equal to the number of unknown functions. If we use the letter n to denote the number of layers contained in the structure, a more accurate count, however, gives 2(n-1) as the number of equations and of unknown functions. In fact, since the parallelepiped at the top of the stack does not underlie any other, its upper face lacks the à part for which we would otherwise have to calculate the temperature integrals T(x,y.0). As a result, this temperature disappears from the right-hand side of the pair of equations for the first element, and both the function and the equation corresponding to it, being nonessential, are excluded from the system. The same conclusion is reached for the heat flow through the lower face of the bottom element, for it is easy to see that this flow does not appear on the right-hand side of the pair of equations for any other element. Thanks to these observations, both the number of functions and the number of equations decrease by two. Lastly, while the flow q̂(x,y) is obviously nil for the top layer in the stack, the function T̂(x, y) at the lower interface of the bottom layer is the temperature of the heat sink on which the stack rests; that is, an assigned To(x,y) function. Based on the foregoing, the system of linear integral equations is: q̂1 (x, y) = P1* (x, y) + ∫∫ P (x′, y′) G 1 (1) 21 (x ′, y′ | x, y)dx ′dy′ + (15a) A(1) [ ] k1 * * (1) − (1) ∫∫ R1 P1 (x′, y′) + T̂2 (x′, y′) G 22 (x′, y′ | x, y)dx′dy′ L z A(1) ------------------------------------------------------------------------------------------(j) T̂i (x, y) = Bi i (0) ∫∫ T̂i (x ′, y′) G11 (x ′, y′ | x, y)d x ′i dy′ + FIG. 3 – Diagram showing the indices of the layers, coordinates and grids used in the numerical treatment. coordinates in equations that refer to different elements are usually not identical: while the axes in the systems they describe are all parallel, their origins do not necessarily coincide. In principle, the system's solution provides the heat flux and temperature functions at the interfaces. Once these factors are known, we can determine the f(x,y) and g(x,y) functions for each prismatic element. The solution to the conductive problem can thus be used with convective boundary conditions factored in, and the thermal field throughout the structure can be calculated layer by layer. As it would be unthinkable to try to solve the integralequation system analytically, what we need is an approximate solution. If we calculate the integrals numerically, we can convert the integral system into a linear algebraic system, which we can then solve with the aid of the usual electronic computing tools. 3. ALGEBRAIC FORMULATION A(i -1) + + L(i)z ki (i) ∫∫ [Pi (x ′, y′) + q̂ i -1 (x′, y′)]⋅ G11 (x′, y′ | x, y)dx′dy′ + (15b) A(i) ∫∫ [R ] * * i (i) Pi (x ′, y′) + T̂i +1 (x ′, y′) G12 (x ′, y′ | x, y)d x ′dy′ A(i) ---------------------------------------------q̂ i (x, y) = Pi* (x, y) + h (i) 0 ∫∫ T̂ (x′, y′) G i (i) 21 (x′, y′ | x, y)dx′dy′ + A(i-1) (15c) (i) ∫∫ [Pi (x′, y′) + q̂i-1 (x′, y′)] G21 (x′, y′ | x, y)dx′dy′ + A(i) − ∫∫ [R P (x′, y′) + T̂ ki L(i)z * * i i i +1 ] ′ ′ ′ ′ (x′, y′) G (i) 22 (x , y | x, y)dx dy A(i) ------------------------------------------------------------------------------------------Tˆ n (x,y) = Bi n (0) ∫∫ + ∫∫ A(n) ∫∫ Φ(x′, y′) ⋅ G (n) Tˆ n (x ′,y′) G11 (x ′,y′|x,y)dx ′dy′ + A(n-1) L(n) + z kn A single Fredholm linear integral equation, being formulated on a finite interval, can be reduced to a system of algebraic equations. The equation must be verified at a finite number of points, and the defined integral must be approximately squared with the values assumed by the unknown function at the same points (5). This method can be directly extended to systems of linear integral equations; in particular, it can be applied to system (15), to which it provides an approximate solution. Before proceeding, we note that all the integrals appearing in the system's equations are of the same type and that for a generic function Ф, they can be expressed as follows: ∞ ij n =1 m=1 A (15d) ∫∫ [ Pn (x′,y′) + qˆ n-1 (x′,y′)] ⋅ G (x′,y′|x,y)dx′dy′ + (n) 11 A(n) (n) R *n Pn* (x ′,y′) + To(x ′,y′) G12 (x ′,y′|x,y)dx ′dy′ It must be kept in mind that each of the above equations refers to one base of one element, and that the x,y ⋅ 1 Lx Ly ∞ (x′, y′ | x, y)dx′dy′ = ∑∑Ci j (n,m) X(βn x)Y(µ m y) ⋅ Lx Ly ∫ ∫ Φ(x′, y′) X(β x′ )Y(µ n m y′)dx ′dy′ (16) 0 0 Once we have chosen the technique of approximate squaring in two dimensions and identified in domain A an appropriate grid of N points on which to calculate the function Ф, we have: 4/8 DJOSER: Analytical Thermal Simulator for Multi-layer…, P.E.Bagnoli et al. 1 Lx Ly LxLy ∫ ∫ Φ(x′, y′) X(β x′ )Y(µ n N m y′)dx ′dy′ ≅ ∑ Bn,m (x k , y k ) ⋅ Φ(xk , y k ) k =1 0 0 (17) where the coefficients Bn,m depend on the chosen type of squaring as well as on the values assumed at the grid points by the primitives of the eigenfunctions. For example, if we use the parallelepiped-squaring technique on a rectangle whose sides are labeled 2a and 2b, we approximate the function Ф with the value it assumes at the centre point obtaining: B n, m (x k , y k ) = 4 ⋅ sen( β n a)sin( µ m b)[cos( β n x k ) + + Bi(1) Bi(3) sin( β nx k)] ⋅ [cos( µ m y k ) + sin( µ m y k )] βnLx µmLy (18) Fig. 4 – Diagram of the algebraic system (4 layers). I is the identity matrix; T.N. is the column vector of known terms. The blank submatrices are null matrices. In any case, assuming ∞ ∞ φij (x k , y k | x, y) = ∑∑Cij (n, m) ⋅ Bn,m (x k , y k ) ⋅ X(β n x)Y(µ m y) n =1 m=1 (19) we can always write ∫∫ Φ(x′, y′) ⋅ G A N ij (x ′, y′ | x, y)dx ′dy′ ≅ ∑ φ ij (x k , y k | x, y) Φ(x k , y k ) k =1 (20) To introduce this approximation into the system of integral equations (15), we must clarify an important point: Each element in the stack has a system of coordinates of its own to which the points on faces z=0 and z=Lz(i) refer, but the squaring grids identified on the two geometrically identical faces usually differ in mesh size and number of points (see Fig. 3). At the contact interfaces, though, the grids on two contiguous elements must be identical, matching perfectly with each other. As a rule, the coordinates of a point we think of as being on the bottom surface of the overlying element will naturally differ from the coordinates of the same point when we think of it as being on the top surface of the element underneath. Accordingly, since each of the equations in system (15) applies to all the points on the face to which the equation refers, each equation needs to be verified only for the grid points used for the squaring. This process gives rise to an equal number of algebraic equations. Their ensemble constitutes the linear algebraic system into which the integral system has been converted. The notations x(i) and y(i) refer to the coordinates of a generic element in the stack, to highlight the fact that they are usually not identical: xt(i) , yt(i) are the points on the top surface z=0 of the i-th element, and xb(i), yb(i) are the points on the bottom surface z=Lz(i) of the i-th element. Moreover, to make it clear that the summations refer to integration grids that generally differ, the symbols k and p are used for the N(i) and M(i) points on the grids drawn, respectively, on surfaces Z=0 and z=Lz(i) of the i-th element, and the symbol j is used for the contact interface A between two contiguous elements. The points on the interface are M(i-1), because, in general, the grid on surface z=Lz(i-1) of the overlying element matches the grid on surface z=0 of the i-th element only in part; of all the N(i) points on the grid on surface z=0 of the i-th element, only the M(i-1) points match exactly. The notations are shown in Fig. 3. Using the notations described above and equations (19) and (20) for converting the dual integrals, the equation (15) system is transformed into an algebraic system made up of 2[M(1)+M(2)+....+M(n-1)] equations for the same number of unknowns. Its normal form, written concisely and with the unknown variables isolated on the left-hand side, is as follows: M(1) ∑ω N(1) M(1) k =1 p =1 *(1) (1) (1) * *(1) ⋅ Tp(2) + q (1) + ∑ φ (1) b = Pb kb ⋅ Pk − ∑ ω pb ⋅ R 1 ⋅ Pp (1) pb p =1 with b =1,2,3...M(1) ------------------------------------------------------------------------------------------------------------------------------------- Tt(i) − M(i -1) ∑h (i) 0 M(i) M(i -1) p =1 j=1 (i +1) ψ (i)j t ⋅ Tj(i) + ∑ φ (i) − p t ⋅ Tp j=1 N(i) M(i) k =1 p =1 ∑ψ (i) jt ⋅ q (ij-1) = (i) (i) * *(i) = ∑ ψ (i) k t ⋅ Pk + ∑ φ p t ⋅ R i Pp with t =1,2,3...M(i-1) ≤ N(i) ------------------------------------------------------------------M(i -1) − ∑h (i) 0 M(i) M(i -1) p =1 j=1 (i +1) φ (i)j b ⋅ Tj(i) + ∑ ω (i) − p b ⋅ Tp j=1 N(i) M(i) k =1 p =1 ∑φ (i) jb ⋅ q (ij-1) + q (i) b = * *(i) (i) (i) = Pb*(i) + ∑ φ (i) k b ⋅ Pk − ∑ ω p b ⋅ R i Pp with b =1,2,3...M(i) ------------------------------------------------------------------------------------------------------------------------------------- Tt(n) − M(n -1) M(n -1) j=1 j=1 ∑ h (0n ) ψ (n)j t ⋅ Tj(n) − N(n) M(n) k =1 p =1 ∑ψ (n) j t [ ⋅ q (nj-1) = (n) (n) * *(n) = ∑ ψ (n) + Fp k t ⋅ Pk + ∑ φ p t ⋅ R n Pp with t =1,2,3...M(n-1) ≤ N(n) ] (21) 5/8 DJOSER: Analytical Thermal Simulator for Multi-layer…, P.E.Bagnoli et al. where (i) (i) (i) (i) ; (i) ˆ i (x (i) ; (i) Tk(i) ≡Tˆ i (x (i) k , y k ) Pk ≡ P i (x k , y k ) k , y k ) q k ≡q (i) (i) ; *(i) ≡ Pi*(x(i) ; Pp*(i) ≡ Pi* (x(i) p , y p ) Pp p , yp ) Fp ≡ F(xp , y p ) (22) and ψ (i) kt ≡ L(i)z (i) (i) (i) (i) (i) φ11 (x k , y k | x t , y t ) ki (i) (i) (i) (i) (i) (i) (i) (i) (i) (i) φ (i) p t ≡ φ 12 (x p , y p | x t , y t ) = φ 21 (x p , y p | x t , y t ) (i) (i) (i) (i) (i) (i) (i) (i) (i) (i) φ (i) kb ≡ φ 21 (x k ,y k |x b ,y b ) = φ 12 (x k ,y k |x b ,y b ) k i (i) (i) (i) (i) (i) (23) ω (i) φ 22 (x p , y p | x b , y b ) pb ≡ L(i)z The quantities defined by (23) are the coefficients of the individual rectangular submatrices in the principal matrix of the algebraic system, organized as shown in Fig. 4. The system's solution enables us to know the grids of flow and temperature values on all of the structure's inner interfaces. With these data in hand, we can then calculate the flow and temperature at every point of the assembly, thereby obtaining a complete three-dimensional map. 4. THERMAL SIMULATION TESTS In order to demonstrate how the simulator works and how the temperature calculation procedure converges, some simulation tests were performed on purposely designed virtual samples, representing a typical assembling structure of an electronic power device. Fig. 5 shows the top and lateral views of the two samples together with the power generation map (top of figure) localized on the top surface of the second layer. Table I also reports the geometrical and material data for the layers of the two samples. TABLE I: Geometrical and material data of the layers composing the samples A and B used for the simulation tests. LAYER PLASTIC SILICON METAL Lx mm 8 8 12 Ly mm 4 4 8 Lz µm 800 600 2000 k W/m°C 0.3 135 100 R* mm2°C/W 2 10 The layer sequence is the following starting from top: a plastic-epoxy coverage layer, a silicon die and wider generic metal heat spreader with thermal conductivity k = 100 W/m°C. In order to figure the presence of soldering or attaching layers, two contact thermal resistances per unit area R* were placed below the silicon layer and the metal heat spreader in contact with the underlying heat sink. The two layers have the same power generation density located on the top silicon surface, organized in three islands, each uniformly dissipating 8 W. since the center island has a larger area, its power density is lower than the others. In order to slightly increase the heat transfer by convection, the bottom heat sink temperature was set to To = 20° C FIG. 5 – Top and lateral views of the virtual samples A and B. The power generation on the top silicon surface is shown on the top of the figure. while that of the surrounding environment was set to Ta = 0 °C. The B sample differs from A for the position of the upper layer only: sample A is fully axisimmetrical while in B the plastic and silicon layers are aligned with the south-west corner of the metal spreader. This difference was set in order to show how the temperature distributions are influenced not only by the layer thickness and thermal conductivity but also by their relative positions. Fig. 6 shows the color-scaled temperature maps of the three layers of sample A calculated using the DJOSER simulator under the adiabatic condition. In each map the corresponding maximum and minimum temperature are reported. As expected, the maximum temperature of the system is on the top silicon surface. Fig. 7 also shows the comparison between the temperature plots of samples A (red) and B (blue) along the medium horizontal (a) and vertical (b) symmetry axes of the silicon. The continuous lines are for silicon while the dashed ones are for the top plastic layer. These plots clearly demonstrate the effects of the geometrical configuration of the layer below the power dissipation plane on the upper temperature distributions. 6/8 DJOSER: Analytical Thermal Simulator for Multi-layer…, P.E.Bagnoli et al. FIG. 7 – Temperature plots along the medium horizontal (a) and vertical (b) symmetry axes of samples A and B, for the top silicon surface and for the plastic one in the adiabatic condition. FIG. 6 – Color-scaled maps of temperatures (dark red are the higher values, dark blue the lowers) calculated for all the layers of sample A in the adiabatic condition. The plots of sample B are not only higher but they have also different shapes, notwithstanding the power generation density is the same. This behavior is fully due to the different position on the metal spreader, inducing a different heat flux displacement at the silicon-metal interface. In fact, a fully asymmetrical position on the metal is a net geometrical disadvantage for the heat flux spreading, hence causing a temperature increase in the layers above. Fig. 8 shows the results of the simulation tests of the structures in presence of a heat exchange by convections at the external surfaces in contact with the external environment whose temperature was set at 0 °C. Fig. 8a is referred to the medium x symmetry axis of the top silicon surface in sample A at which the same heat convection coefficient H was applied to all the surfaces. The progressively decreasing curves correspond to H values ranging fro 0 to 5000 W / m2 °C. However only the curves of the last five H values were drawn; in fact the cooling effect on silicon of the convection exchange is quite weak in comparison to the thermal conduction path tough the heat sink, so that lesser H values practically produces curves not distinguishable from the adiabatic one. Instead Fig. 8b is referred to the top plastic layer of sample B (medium x symmetry axis) at which the H coefficient was applied to the southern and western lateral surfaces only of all the three layers. This is to demonstrate the capability of the implemented simulation system to impose different boundary conditions at the model surface. The temperature FIG. 8 – a) Temperature plots for sample A along the x-axis and for several values of the convection coefficient H applied to all the exposed surfaces. b) Temperature plots of top plastic surface along the xaxis of sample B; the convection was here applied to the southern and western lateral surfaces only. plots are fully consistent with this particular boundary condition, since the cooling effect is evident on the western side only. Furthermore, in this last case in which the plastic surface is strongly isolated from the main thermal conduction path, the used H range is one order of magnitude lower than in the previous experiment, allowing observing the cooling effect also with low convective exchange. The aim of the last simulation experiment was to verify the convergence of the calculation method and to evaluate the temperature error as a function of the two main free parameters of the calculation procedure. The first one is Nmn, that is the maximum number of the eigenvalues in the x and y directions used for the calculation of the harmonic series in equations (16), (19) and hence (23). This parameter must be set for every layer in the structure. In the calculation we always used an ensemble of eigenvalues forming a square matrix with Nmn as dimension. 7/8 DJOSER: Analytical Thermal Simulator for Multi-layer…, P.E.Bagnoli et al. based on the numerical implementation of a full analytical strategy, instead of the usual 3-D discretization of the heat conduction equation. For the first time its all mathematical and numerical details were completely exposed. The demonstrative simulation tests showed a rather good convergence characteristic which, in any case, is a function of some internal parameters. As far as the calculation time is concerned, we must emphasize that the calculation procedure, implemented in not compiled MATLAB 7.0 system, is still far to be optimized from this point of view and much work must be done to improve it. However, for a 1.6 GHz laptop computer, the best compromise for the above parameters, which can be Nmn = 70 and a cell density of 9 mm-2, needed a calculation time of about 200 seconds whose 65% was devoted to the coefficient matrix calculation: this matrix can be memorized and used for different tests with other power charges since it does not contain the power data. These performances are at least encouraging to make the DJOSER simulation strategy faster and more convenient of the finite-element-based programs, at least for the thermal simulation of electronic devices. FIG. 9 – Maximum and average absolute temperature error bar-diagrams calculated for sample A as a function of the maximum number for side of used eigenvalues (a) and of the cell densities used on the silicon and metal surfaces. The second source of error is the grid cell densities used at the layer interfaces to describe the temperature and flux functions. These grids were used to numerically calculate the 2-D integrals with the rectangular method. The increase of both these two parameter generally leads to a quadratically increasing of the whole procedure computing time. In order to evaluate the temperature errors due to these parameters we obtained the silicon temperature maps of sample A using a very high number of eigenvalues (Nmn=180) and a very high cell densities for all the layers (100 mm-2), assuming the temperature data of this test as a reference. Then we performed several simulation tests with lower values calculating the maximum and average error percentages with respect to the reference data over the whole silicon surface. The results of these tests are reported in the Fig. 9 in terms of bar diagrams. Fig. 9a shows the results as a function of the number of eigenvalues Nmn, using cell densities of 9 mm-2. As can be seen the errors are decreasing functions with increasing Nmn and are well below 1% for numbers greater than 50. However the bardiagram does not seem to be monotonic, showing two peaks perhaps due to a sort of error resonance among the various layers. Instead Fig. 9b shows the results for the tests as a function of the cell densities using a number of eigenvalues Nmn = 70. Also in this case, the error percentages are decreasing functions of the cell density, although the errors are much more consistent, showing the importance of this factor in limiting the temperature accuracy of the calculation procedure. 6. CONCLUSIONS In this paper a steady-state thermal simulation method for particularly shaped multilayer structures was presented. It is 6. REFERENCES [1] V. Kadambi, J. Abuaf , “An analysis of the thermal response of power chip package”, IEEE Trans. Electron Devices, ED3 (1973), 1024-1033. [2] C.C. Lee, A.L. Palisoc, J.M.W. Baynham, “Thermal analysis of solid-state devices using the boundary element Method”, IEEE Transactions on Electron Devices, ED-35, (1988), 1151-1153 [3] C.C. Lee, , A.L. Palisoc, Y.J. Min, “Thermal analysis of integrated circuit devices and packages”, IEEE Transaction on Components, Packaging, and Manufacturing Technology, Vol. 12, (1989), 701 - 709 [4] M. Pesare, A. Giorgio and A.G. Perri, “Analytical approach for thermal and electrical design of multilayer structure integrated devices”, Electronics Letter, Vol. 36, No. 13, (2000), 1020-1021. [5] N. Rinaldi, “Thermal analysis of solid-state devices and circuits: An analytical approach”, Solid State Electronics. Vol. 44, no. 10, (2000), 1789-1798. [6] P.E. Bagnoli, C. Casarosa, S. di Pascoli, “Electro-thermal Simulation of Hot-Spot Phenomena in Cellular Bipolar Power Transistors: the Influence of Package Thermal Resistance”, Proceedings of IPACK2001, IPACK200115547, Kauai, Hawaii, USA, July 2001. [7] Bagnoli, P.E., Bartoli, C., Pasquinelli, G. and Stefani, F., “DJOSER: Verifica teorica e sperimentale dell’accuratezza del simulatore termico per l’elettronica di potenza”. In Proceedings of the 23rd National UIT Conference, Parma, June 20-22, 2005. [8] Bagnoli, P.E., Montesi, M., Casarosa, C. and Pasquinelli, M., “Fast analytical thermal modelling of electronic devices and circuits with multi-layer stack mountings”. 5th EPTC Conference, Singapore, December 2003. [9] Montesi, M., Bagnoli, P.E., Casarosa, C., Pasquinelli, M., “Steady-State thermal mapping of electronic devices with multi-layer stack mountings by analytical relationships”. ITSS II ASME–ZSIS Conference, Bled, Slovenia, June 1316, 2004. [10] Ozisik, M. N., Heat conduction, J.Wiley & Sons, New York, 1980. [11] Krasnov, M.L, Kiselev, A.I. and Makarenko, G.I., Integral Equations, Ed. MIR, Moscow, 1980. 8/8
© Copyright 2026 Paperzz