ANALELE ŞTIINŢIFICE ALE UNIVERSITĂŢII “AL. I. CUZA” IAŞI Tomul III, s. Biofizică, Fizică medicală şi Fizica mediului 2007 INTERFEROMETRIC METHOD TO EVIDENCE THE WATER POLLUTION WITH HYDROPHOBIC SUBSTANCES Nicoleta Puica Melniciuc1, Dana Ortansa Dorohoi2, Servilia Oancea1 KEYWORDS: interference on thin layers. A method permitting to appreciate the thickness of the hydrophobic pollutant layers on the Seas and Oceans waters is described here. The position of the maxima obtained by the Sun light interference on the transparent hydrocarbon layers depends on their thickness and a spectrometer can be used to establish the spectral composition in the interference field. 1. INTRODUCTION Pollution of Oceans’ or Seas’ waters by hydrocarbons is essentially caused of the frequent loses of carburant. The pollution consists from a great surface covered by a thin film of hydrocarbons. In the Sun white light these films become colored, functioning as layers of constant thickness that divide the radiation beams. Light propagation in the sea is a function of both the quantity and optical quality of suspended particles in the water. Water pollution can be studied using different techniques [1-4]. In this paper we intend to analyze the influence of the thickness pollutant layer on the aspect of interference fringes obtained for small angles of reflection. Interference fringes of equal inclination, obtained in white light, under small incidence angles, are colored. Their color is dependent on the layer thickness. The spectral composition of the radiations reflected by the varnish is governed by the interference on thin layers [5]. The interaction between two or more beams is known as interference. The spatial area in which the beams simultaneously exist and interfere is called interference field. The flux density distributions within the interference field can be characterized by means of surfaces having constant flux densities. r ϕ(R ) = const. 1 2 University of Agricultural Sciences and Veterinary Medicine, Iasi, Romania Faculty of Physics, “Al.I.Cuza” University, Iasi, Romania (1) 74 Nicoleta Puica Melniciuc, Dana Ortansa Dorohoi, Servilia Oancea r r where ϕ( R ) is the energetic flux density in a point P( R ) within the interference field. r r r The flux density ϕ(R ) can be expressed as a function of e R , the resultant electric () r field intensity of radiations interfering in the P(R ) point, by the following relationship: () () r r r ϕ R = χ〈 e 2 R 〉 (2) where: 1 (3) cμ 0 Experiments prove that the interference field often contains level surfaces of extreme values: r (4) ϕ M (R ) = C M r (5) ϕ m (R ) = C m r r where ϕ M (R ) and ϕ m ( R ) are the maximum and the minimum of flux density, respectively. The distributions of maxims and minims are known as interference r fringes. In the close vicinity of a point P(R ) within the interference field (Fig.1), the r interference fringes are described by the interfringe and the visibility, V( R ) . χ= Fig. 1: Interference of radiations coming from punctual source, reflected by thin layers. r According to the definition given by Michelson (1890), the visibility V(R ) within the interference field, can be expressed as: ϕ ( Rr ) − ϕ ( Rr ) r m (6) V(R ) = M ϕ ( Rr ) + ϕ ( Rr ) M m 75 INTERFEROMETRIC METHOD TO EVIDENCE… where the maximum and minimum flux densities are measured in the vicinity of r P( R ) point. The visibility is a measure of the interference fringes observability. r The value: V(R ) = 0 resulting from the condition: ϕ ( Rr ) = ϕ ( Rr ) shows that m M the fringes cannot be seen. r r The value: V(R ) = 1 resulting from the condition: ϕ m R = 0 expresses the optimum situation for fringes observation. By subtracting the path differences between the two rays interfering in r point P(R ) , the overall path difference between rays SI1 and SIx is obtained. It depends on the thickness of the covering layer, on its refractive index and on the light incidence angle on the covering surface. (7) Δ12 = 2 ⋅ n 2 ⋅ h ⋅ cos r () In the present case, the reflections on the two separating surfaces, Σ1 and Σ 2 are equivalent, which results in a null supplemental path difference. Maximum value of flux density of the reflected beam is given by the condition: 1⎞ ⎛ (8) 2 ⋅ n 2 ⋅ h = ⎜ 2p + ⎟ ⋅ λ max ; p = 0, 1, 2, ... 2⎠ ⎝ while the minimum value is obtained when: λ (9) 2 ⋅ n 2 ⋅ h = 2p ⋅ min ; p = 0, 1, 2, ... 2 2. MATERIALS AND METHODS In order to argue that the pollution with hydrocarbons can be evidenced by interferometric method, we analyzed the interference field obtained with these substances on a thick water layer. An optical system with optical fibber assured the light entrance in a spectrometer able to analyze the interferometric field. When an initial etalonation is made, the apparatus directly displays the thickness of the pollutant layer [6]. The same method is applied when a sea or a portion of ocean are polluted by hydrocarbons. 3. RESULTS AND DISCUSSIONS The number of the maxims of interference obtained when a thin layer of hydrocarbon pollutant (n=1.52) laying on the water surface (n=1.35) is observed at a small angle of incidence, depends on the thickness of the pollutant layer, as relation (8) predicts for the maxima of interference. This assertion is sustained by the Figs. 2-4 in which the reflected flux by a thin layers observed at normal incidence is shown for different thickness of the hydrocarbonic layers on water. In relation (8) the difference between the two reflections of air/hydrocarbon and hydrocarbon/water surfaces was taken into 76 Nicoleta Puica Melniciuc, Dana Ortansa Dorohoi, Servilia Oancea consideration by the supplementary pathway introduced at reflections from a more dense to a few dense transparent materials. Φ (R) 120 100 80 60 40 20 0 403 421 441 463 487 514 545 579 617 661 712 772 λ (nm) Fig. 2: Reflected radiations in maxims of flux density, at normal incidence, on a hydrocarbon layer (n= 1,543) with 3μm thickness. Φ (R) 120 100 80 60 40 20 0 385 411 441 475 514 561 615 686 771 λ (nm) Fig. 3: Reflected radiations in maxims of flux density at normal incidence on a hydrocarbon layer (n= 1,543) with 1μm thickness. Only three monochromatic radiations are reflected by when the pollutant layer is of 1μm thickness, at normal incidence. Only one monochromatic radiation from the visible range is reflected by a hydrocarbon layer of 0,5μm thickness at the normal incidence. Φ (R) 120 100 80 60 40 20 0 386 441 543 617 772 λ (nm) Fig. 4: The reflected radiations in maxims of flux density at normal incidence on a colophony layer (n= 1,543) with 0,5μm thickness. INTERFEROMETRIC METHOD TO EVIDENCE… 77 The spectral composition of the reflected at normal incidence light is poor when the pollution layer is smaller than 1μm. The monochromatic radiations giving minims of interference on the colophony layer do not contribute at visual observation. From data presented in figures 2-4 it results that at normal incidence, the number of interference maxims grows with thickness the pollution layer increasing. The graphs were realized for normal incidence. For angles of incidence others than the normal one, relation (8’) show us that a smaller number of maxima can appear by interference. ⎛ 1 ⎞ λ 2 ⋅ n 2 ⋅ h ⋅ cos⎜⎜ sin i ⎟⎟r = (2p + 1) ⋅ ; p = 0, 1, 2, ... (8’) n 2 2 ⎝ ⎠ For each incidence angle, the researcher can predict the thickness of the pollution layer and then, appreciating its area, can estimate the volume of the lost hydrocarbons and can decide the protective actions. 4. CONCLUSIONS The thickness of transparent insoluble in water layers from the water surface determine the aspect of the interference fringes obtained in white Sun light for small angles of reflection. When the covering layer is very thin, it can function such as interferential filter. From the color of reflected radiation one can estimate the thickness of the layer. REFERENCES 1. 2. 3. 4. 5. 6. Szermer M., Daniel M., Napieralski A., 2003. Design and Modelling of Smart Sensor Dedicated for Water Pollution Monitoring, Nanotech, 1:110-114. Devolder S., Leroy O., Wevers M., De Meester P., 1994. Relation between phase differences and small layer thicknesses, Ultrasonic Symposium, 1994, Proceedings 1994 IEEE, 1085-1090. Balin I., 1999. 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