Optical, scintillation and storage luminescence properties of
Zn3(PO4)2-Al(PO3)3 glass doped with Sn2+
Shotaro Hirano1,*, Go Okada1, Noriaki Kawaguchi1,
Takayuki Yanagida1
1Nara Institute of Science and Technology
POSTER presentation
Abstract
400
undoped
Sn 0.1%
Sn 0.3%
3000 Sn 1.0%
Sn 3.0%
Sn 10.0%
2000
1000
0
200
[2]
[3]
1
0.8
0.6
0.4
0.2
0
100 200 300 400
200
100
300
400
500
Wavelength (nm)
600
Fig. 1 Scintillation spectra of
Sn-doped 50Zn3(PO4)2-50Al(PO3)3.
[1]
undoped
Sn 0.1%
Sn 0.3%
Sn 1.0%
Sn 3.0%
Sn 10.0%
300
Intensity (a. u.)
Intensity (a. u.)
Ionizing radiation detectors using phosphor materials are applied in many fields such as medicine, security and
personal dose monitoring. There are two types of luminescence phenomena used for radiation measurements.
One is called scintillation which is a large scale of quantum cutting via the energy migration from the host to
emission centers, and is defined as the conversion of a single ionizing radiation photon/particle into a large
number of low energy photons such as ultraviolet and visible light instantly. The other is storage luminescence
in which incident radiation energy absorbed is temporarily stored and then released as light emission by thermal
or optical stimulation to read out the signal. However, most of these materials used in practice are single crystal
or crystalline powder, and there are much fewer reports on the study of scintillation and storage luminescence
properties in glass.
Previous studies clarified that Sn-doped zinc phosphate glasses (effective atomic number; Zeff = 23) showed
high photoluminescence quantum yields [1] and effective X-ray induced luminescence [2,3]. It is often
preferred in dosimetry applications that phosphor materials have low Zeff to be equivalent to biological tissue.
Therefore, in this study, we have modified the above glass compositions to lower Zeff as 50Zn3(PO4)250Al(PO3)3 (Zeff = 21.5) which is more preferable for dosimeter applications and characterized the optical,
scintillation and thermally-stimulated luminescence (TSL) properties as a function of concentrations of Sn (0,
0.1, 0.3, 1.0, 3.0 and 10.0 mol%).
The glass samples were synthesized by the melt-quenching method. Fig. 1 shows scintillation spectra of the
undoped and Sn-doped samples under X-ray irradiation. A single broad emission was observed over a wide
spectral range from 300 to 700 nm. The emission intensity was enhanced with increasing the Sn concentration.
Fig. 2 shows TSL glow curves of the undoped and Sn-doped samples after X-ray irradiation. In TSL, compared
with the undoped sample, the intensities of the Sn-doped samples were effectively enhanced. For the Sn
concentrations higher than 1.0 %, the TSL intensity decreased as a function of the concentration while the
intensity of scintillation emission increased.
0
100
200
300
Temperature (°C)
400
Fig. 2 TSL glow curves of Sn-doped 50Zn3(PO4)2-50Al(PO3)3.
H. Masai, Y. Takahashi, T. Fujiwara, S. Matsumoto, T. Yoko, High photoluminescent property of lowmelting Sn-doped phosphate glass, Appl. Phys. Express. 3 (2010).
H. Masai, T. Yanagida, Y. Fujimoto, M. Koshimizu, T. Yoko, Scintillation property of rare earth-free
SnO-doped oxide glass, Appl. Phys. Lett. 101 (2012).
T. Yanagida, Y. Fujimoto, H. Masai, Radiation induced luminescence properties of pure and Sn-doped
60ZnO.40P2O5 glass, Phys. Chem. Glas. Eur. J. Glas. Sci. Technol. Part B. 57 (2016) 161–165.
Brief Biographical Notes
Shotaro Hirano received B.Eng. degree from the School of Engineering, University of
Hyogo, Hyogo, Japan in 2016. He is currently in the second year of M.Sc. program at
the Graduate School of Materials Science, Nara Institute of Science and Technology
(NAIST), Nara, Japan, specializing development of phosphor materials for ionizing
radiation measurements.