X-Ray Interaction with Matter: Absorption, Scattering and Diffraction David Attwood University of California, Berkeley (http://www.coe.berkeley.edu/AST/srms) X-Ray Interaction with Matter: Absorption, Scattering and Diffraction, EE290F, 18 Jan 2007 Basic Ionization and Emission Processes in Isolated Atoms (b) Photoionization (a) Electron collision induced ionization Primary electron (Ep) Scattered primary ′) electron (Ep e– e– +Ze e– K Secondary electron (Es) L Photon (ω) Photoelectron (E = ω – EB) e– +Ze K L M M (c) Fluorescent emission of characteristic radiation (d) Non-radiative Auger process e– KLL Auger electron ω +Ze K +Ze L M Professor David Attwood Univ. California, Berkeley X-Ray Interaction with Matter: Absorption, Scattering and Diffraction, EE290F, 18 Jan 2007 K L M Ch01_F02VG.ai Electron Binding Energies, in Electron Volts (eV), for the elements in their Natural Forms www.cxro.LBL.gov Professor David Attwood Univ. California, Berkeley X-Ray Interaction with Matter: Absorption, Scattering and Diffraction, EE290F, 18 Jan 2007 ApxB_1_47_Jan07_lec2.ai Fluorescence and Auger Emission Yields Fluorescence and Auger yields 1.0 0.9 0.8 K-shell Auger 0.7 0.6 K-shell fluorescence L3-subshell Auger 0.5 0.4 0.3 L3-subshell fluorescence 0.2 0.1 0 0 20 40 60 80 Atomic number 100 (Courtesy of M. Krause, Oak Ridge) Professor David Attwood Univ. California, Berkeley X-Ray Interaction with Matter: Absorption, Scattering and Diffraction, EE290F, 18 Jan 2007 Ch01_F03VG_2005.ai Electron Mean Free Paths As a Function of Energy (a) (c) 4 Al (b) Mean free path (nm) 3 100 2 1 0 4 10 Au 3 1 2 1 0 0 10 101 102 103 0.1 104 1 10 Energy above Fermi level (eV) 100 1000 Courtesy of: Penn (a & b), Seah and Dench (c) Professor David Attwood Univ. California, Berkeley X-Ray Interaction with Matter: Absorption, Scattering and Diffraction, EE290F, 18 Jan 2007 Ch01_F05VG.ai Photoabsorption by Thin Foils and Isolated Atoms (a) (b) 106 ρ I = e–ρµx I0 cm2 105 g ω 104 ω (e) 103 x 10 (c) (d) na ω Ι0 10 100 Cu atom Mb 10 atom ω Professor David Attwood Univ. California, Berkeley 0.01 Exponential decay (e–ρµx) Distance, x 3p 3d 1 0.1 x 100 1000 Photon energy (eV) σabs Ι(x) Ι0 2 Intensity Ι(x) Ι0 Cu foil 4s 10 3s 2p 2s I = e–naσabsx I0 100 1000 Photon energy (eV) X-Ray Interaction with Matter: Absorption, Scattering and Diffraction, EE290F, 18 Jan 2007 Ch01_F08VG_Aug05.ai Atomic Energy Levels and Allowed Transitions in the Bohr Atom Equate Coulomb Force Ze2/4π0r2 to the centripetal force mv2/r: 1 mZ 2 e 4 En = 32π 2 20 2 n 2 rn = 4π0 2 me 2 Z · n2 (1.4) (1.5) (1.6) me 4 1 – 1 Z2 ω = Ei – Ef = 32π 2 0 2 n f2 n 2i 13.6 eV a0n2 rn = Z Professor David Attwood Univ. California, Berkeley ; a0 = 0.529 Å X-Ray Interaction with Matter: Absorption, Scattering and Diffraction, EE290F, 18 Jan 2007 (1.9) Ch01_Eqs4_5_6_9VG.ai Quantum Mechanics Based on a Probabilistic Wave Function, Ψ(r, t) ∂Ψ(r, t) 2 2 – ∇ Ψ(r, t) + V(r, t)Ψ(r, t) = i ∂t 2m (1.10) P(r, t)dr = Ψ ∗ (r, t) Ψ(r, t)dr (1.13) r= rP(r, t)dr = Ψ ∗ (r, t)rΨ(r, t)dr (1.15) quantum numbers: n, , m, ms selection rules for allowed transitions: ∆ = ± 1 ∆j = 0, ± 1 Professor David Attwood Univ. California, Berkeley X-Ray Interaction with Matter, Scattering and Diffraction, EE290F, 18 Jan 2007 Ch01_Eqs10_13_15VG.ai Professor David Attwood Univ. California, Berkeley Time Probability Oscillation amplitude Radiative Decay Involves An Atom Oscillating Between Two Stationary States at the Frequency if = (Ei – Ef) / 1 0 Lower state Upper state Time X-Ray Interaction with Matter: Absorption, Scattering and Diffraction, EE290F, 18 Jan 2007 Ch01_F09VG.ai Probabilistic Radial Charge Distribution (e/Å) in the Argon Atom Radial charge density distribution 20 1s 15 2p 10 5 2s 3p 3s 0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 Normalized radius, r/a0 Courtesy of Eisberg and Resnick, Quantum Physics of Atoms, Molecules, Solids, Nuclei, and Particles. Professor David Attwood Univ. California, Berkeley X-Ray Interaction with Matter: Absorption, Scattering and Diffraction, EE290F, 18 Jan 2007 Ch01_F12VG.ai Energy Levels, Quantum Numbers, and Allowed Transitions for the Copper Atom n j 4 4. .. 4 3 3. .. 0 7/2 5/2 . .. N . VII 4f7/2 . N .. IV 4d3/2 N 1/2 Absorption edges for copper (Z = 29): NI 4s EN1, abs = 7.7 eV MV MIV MIII MII MI 3d5/2 3d3/2 3p3/2 3p1/2 3s . . EM3, abs = 75 eV . EM1, abs = 123 eV M α1 3 3 3 3 3 2 2 1 1 0 5/2 3/2 3/2 M 1/2 1/2 Lα1 Lα2 Lβ2 2 1 3/2 2 1 1/2 L 2 0 1/2 Kα1 Kα2 EL3, abs = 933 eV EL2, abs = 952 eV EL1, abs = 1,097 eV K EK, abs = 8,979 eV (1.381Å) Kβ1 Kβ3 Kγ 3 1 0 1/2 K Cu Kα1 = 8,048 eV (1.541Å) Cu Kα2 = 8,028 eV (1.544Å) Cu Kβ1 = 8,905 eV Professor David Attwood Univ. California, Berkeley LIII 2p3/2 LII 2p1/2 LI 2s Cu Lα1 = 930 eV Cu Lα2 = 930 eV Cu Lβ1 = 950 eV 1s X-Ray Interaction with Matter: Absorption, Scattering and Diffraction, EE290F, 18 Jan 2007 Ch01_F11VG_Jan07.ai Scattering, Diffraction, and Refraction (a) Isotropic scattering from a point object (b) Non-isotropic scattering from a partially ordered system λ λ (c) Diffraction by an ordered array of atoms, as in a crystal (d) Diffraction from a well-defined geometric structure, such as a pinhole λ λ D θ θ null d θ θ null = 1.22λ d mλ = 2d sinθ (e) Refraction at an interface λ (f) Total external reflection λ θ<θ c n = 1–δ+iβ n=1 Professor David Attwood Univ. California, Berkeley n = 1–δ+iβ X-Ray Interaction with Matter: Absorption, Scattering and Diffraction, EE290F, 18 Jan 2007 Ch01_F13VG.ai Chapter 2 RADIATION AND SCATTERING AT EUV AND SOFT X-RAY WAVELENGTHS a Θ Professor David Attwood Univ. California, Berkeley sin2Θ X-Ray Interaction with Matter: Absorption, Scattering and Diffraction, EE290F, 18 Jan 2007 Ch02_F00VG.ai Maxwell’s Equations and the Wave Equation Maxwell’s equations: (2.1) (2.2) (2.3) (2.4) (2.5) (2.6) The wave equation: (3.1) Professor David Attwood Univ. California, Berkeley X-Ray Interaction with Matter: Absorption, Scattering and Diffraction, EE290F, 18 Jan 2007 Ch02_Maxwls_WavEqs.ai Scattering, Refraction, and Reflection Single scatterer, electron or atom, in vacuum. (Chapter 2) Many atoms, each with many electrons, constituting a “material”. (Chapter 3) n = 1– δ + β n=1 λ λ • How are scattering, refraction, and reflection related? • How do these differ for amorphous and ordered (crystalline) materials? • What is the role of forward scattering? Professor David Attwood Univ. California, Berkeley X-Ray Interaction with Matter: Absorption, Scattering and Diffraction, EE290F, 18 Jan 2007 Ch02_ScatRefrReflc.ai Maxwell’s Equations Wave Equation ) um u ac r 2) v (in apte h (C Radiation by a single electron (“dipole radiation”) Scattering cross-sections Scattering by a free electron (“Thomson scattering”) Scattering by a single bound electron (“Rayleigh scattering”) Scattering by a multi-electron atom Atomic “scattering factors”, Professor David Attwood Univ. California, Berkeley f0′ and f0′′ (in (C am ha pte ate r3 ria ) l) Refractive index with many atoms present Role of forward scattering Contributions to refractive index by bound electrons Refractive index for soft x-rays and EUV n = 1 – δ + iβ (δ, β << 1) f0′ f0′′ Determining f0′ and f0′′ ; measurements and Kramers-Kronig Total external reflection Reflectivity vs. angle Brewster’s angle X-Ray Interaction with Matter: Absorption, Scattering and Diffraction, EE290F, 18 Jan 2007 Ch02_Eqs_1VG.ai Atomic Scattering Factors for Silicon (Z = 14) σa(barns/atom) = µ(cm2/g) × 46.64 E(keV)µ(cm2/g) = f20 × 1498.22 Energy (eV) f10 f20 µ(cm2/g) 30 70 100 300 700 1000 3000 7000 10000 30000 3.799 2.448 –5.657 12.00 13.31 13.00 14.23 14.33 14.28 14.02 3.734E–01 5.701E–01 4.580E+00 6.439E+00 1.951E+00 1.070E+00 1.961E+00 4.240E–01 2.135E–01 2.285E–02 1.865E+04 1.220E+04 6.862E+04 3.216E+04 4.175E+03 1.602E+03 9.792E+02 9.075E+01 3.199E+01 1.141E+00 10 Silicon (Si) Z = 14 Atomic weight = 28.086 15 10 f10 5 0 –5 –10 10 7 µ(cm2/g) 1000 10000 100 1000 E (eV) 10000 101 105 f20 103 10 100 100 10–1 1 10–1 10 100 Edge Energies: K 1000 E (eV) 1838.9 eV 10000 10–2 10 L1 149.7 eV L2 99.8 eV L3 99.2 eV (Henke and Gullikson; www-cxro.LBL.gov) Professor David Attwood Univ. California, Berkeley X-Ray Interaction with Matter: Absorption, Scattering and Diffraction, EE290F, 18 Jan 2007 Ch02ApC_Tb1F07_9.05.ai Chapter 3 WAVE PROPAGATION AND REFRACTIVE INDEX AT EUV AND SOFT X-RAY WAVELENGTHS k′ n = 1 – δ + iβ n=1 φ k Professor David Attwood Univ. California, Berkeley k′′ X-Ray Interaction with Matter: Absorption, Scattering and Diffraction, EE290F, 18 Jan 2007 Ch03_F00VG.ai Multilayer Mirrors Satisfy the Bragg Condition mλ = 2d sinθ Mo Si Mo d Si Mo Si Mo Si ne θ λ For normal incidence, θ = π/2, first order (m = 1) reflection λ = 2d d = λ/2 if the two layers are approximately equal ∆t λ/4 a quarter-wave plate coating. Professor David Attwood Univ. California, Berkeley X-Ray Interaction with Matter: Absorption, Scattering and Diffraction, EE290F, 18 Jan 2007 Ch04_MltlyrMirBragg1.ai Scattering by Density Variations Within a Multilayer Coating Mo/Si (T. Nguyen, CXRO/LBNL) Professor David Attwood Univ. California, Berkeley X-Ray Interaction with Matter: Absorption, Scattering and Diffraction, EE290F, 18 Jan 2007 Ch04_F01_Sept05.ai Multilayer Mirrors Have Achieved 70% Reflectivity 0.8 Mo/B4C/Si 70% at 13.5 nm FWHM = 0.55 nm 50 bilayers 0.7 Reflectivity 0.6 0.5 0.4 0.3 0.2 0.1 0.0 12.0 12.5 13.0 13.5 Wavelength (nm) 14.0 14.5 ˇ Bajt, LLNL. Courtesy of Sasa Extreme Ultraviolet Lithography Professor David Attwood Univ. California, Berkeley X-Ray Interaction with Matter: Absorption, Scattering and Diffraction, EE290F, 18 Jan 2007 Ch04_MltlyrMirReflc.ai The Derivation of Bragg’s Law mλ = 2d sinθ mλ θ θ θ d The path difference of radiation “reflecting” off sequential planes must be equal to an interger number of wavelengths. The angle θ is measured from the crystal plane, and the distance between planes is referred to as the “d-spacing”. From A.H. Compton and S.K. Allison, X-Rays in Theory and Experiment (D.Van Nostrand, New York, 1926), p.29. Also see M. Siegbahn, The Spectroscopy of X-Rays (Oxford University Press, London, 1925), p.16. Professor David Attwood Univ. California, Berkeley X-Ray Interaction with Matter: Absorption, Scattering and Diffraction, EE290F, 18 Jan 2007 DerivationBraggsLaw.ai Bragg Scattering, or Diffraction, Seen as a Reflection from Crystal Planes θ θ inθ ds inθ θ d ds θ Constructive interference occurs when the additional path length is equal to an integral number of wavelengths: (Bragg’s Law) mλ = 2d sinθ (m = 1, 2, . . . ) R.B. Leighton, Principles of Modern Physics (McGraw-Hill, New York, 1959), section 12.4. Professor David Attwood Univ. California, Berkeley X-Ray Interaction with Matter: Absorption, Scattering and Diffraction, EE290F, 18 Jan 2007 BraggScattDiffrac.ai X-Rays are Refracted Entering a Crystal Refraction of x-rays at a crystal surface requires a small correction to the Bragg condition: 2 4δd mλ = 2d sinθ (1 – 2 2 ) m λ λ θ θ d λ θ θ R.B. Leighton, Principles of Modern Physics (McGraw-Hill, New York, 1959), p. 456. Professor David Attwood Univ. California, Berkeley X-Ray Interaction with Matter: Absorption, Scattering and Diffraction, EE290F, 18 Jan 2007 XRsRefracEnterCrystal.ai Face-Centered Cubic Crystal Structure Primitive vectors: a = ai, b = aj, c = ak z 8 4 Crystal Rocksalt Na Sylvine K Ag Mg Galena Pb Pb Pb Cl Cl Cl O S Se Te a(Å) 5.64 6.28 5.54 4.20 5.97 6.14 6.34 3 a d x 2 6 7 1 Coordinates of atoms within unit cell: 1: (0,0,0) 2: (0,0,a/2) 3: (a/2,0,a/2) 4: (a/2,0,a) 5: (a/2,a/2,0) 6: (a/2,a/2,a/2) 7: (0,a/2,a/2) 8: (0,a/2,a) y 5 Nearest neighbor distance d = a/2 From R.B. Leighton, Principles of Modern Physics (McGraw-Hill, New York, 1959), section 12.4. Professor David Attwood Univ. California, Berkeley X-Ray Interaction with Matter, Scattering and Diffraction, EE290F, 18 Jan 2007 FaceCenterCubicrCrystal.ai Diffraction of Polychromatic X-Rays from the Various Bragg Planes of a Given Crystal Each reflection results in monochromatic x-rays in the given direction – the basics for a crystal monochromator. F.K. Richtmyer, E.H. Kennard, and T. Lauritsen Introduction to Modern Physics (McGraw-Hill, New York, 1955), chapter 8. Professor David Attwood Univ. California, Berkeley X-Ray Interaction with Matter: Absorption, Scattering and Diffraction, EE290F, 18 Jan 2007 DiffracPolychromXRs.ai
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