OLYMPUS Automated Filter Analysis System
for the accurate detection, counting, classification, and measurement
of residue/particulates according to ISO and USP standards
Olympus Automated Filter Analysis System
OLYMPUS Automated Filter Analysis System
for the accurate detection, counting, classification, and measurement
of residue/particulates according to ISO and USP standards
3
TABLE OF CONTENTS
1. Introduction
2.
Hardware components and available accessories
Introduction
2.1 The frames
2.2 Objectives
2.3 Illumination
2.4 Digital cameras
2.5 High-power control
2.6 Motorized stage and stage controller
2.7 Filter insert
2.8 Particle normal
3. CONTROL CENTER: THE SYSTEM SOFTWARE
Introduction
3.1 Adapted to Filter Inspection workflows
3.2 Overall system settings
3.2.1 Scan geometry and scan area
3.2.2 Scan diameter
3.2.3 Diameter of flow-through area
3.2.4 Batch mode
3.2.5 Assort frames
3.2.6 Minimal particle area
3.2.7 Preview
3.2.8 Report template
3.2.9 Scan area options
3.3 Flexible focus solutions
3.4 Frame independent detection
3.5 Particle detection and analysis
3.6 Advanced particle analysis
3.7 Metal and non-metal particles
3.8 Particle analysis output documents
3.9 Classification
3.10 Approval features
3.11 Revision of particle analysis
3.12 Archiving
3.13 Reporting
3.14 User rights and security issues
4. Established standards, function lists and specifications
Introduction
4.1 Established standards
4.1.1 Established standards
4.1.2 Details in ISO 16232
4.1.2 Company and industrial standards
4.2 Specifications
4.2.1 XM10
4.2.2 XC10
4.3 Function list Olympus Automated Filter Analysis System
Olympus Automated Filter Analysis System
1. Introduction
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Cleanliness - a sign of quality
Material contamination by the tiniest particles has become a focus of modern quality assurance.
Initially it was the pharmaceuticals and semiconductor industries that have been occupied with material
contamination in the thousandth millimeter range. However, as functional density of parts/components
has increased and the expectations on production sequences and quality have grown, this topic has
also caught the eye of the automobile, aircraft, and clean energy industries along with their supplier
industries. Tough global competition has made identifying contamination sources and subsequent
elimination a decisive competitive advantage. The extremely rigorous demands of national, international
or company-specific standards clearly demonstrate just how critically important the cleanliness level has
become - one tremendously important step in the whole value-creating production process.
In the spotlight: contamination residues
Due to the speedily increasing demands on cleanliness of components, modules, oils and fuels, documented technical
cleanliness has become enormously significant. Cleanliness has become an important, frequently decisive and functional
quality aspect. In principle, every production process and every product has specific cleanliness requirements. This is not
surprising as cleanliness is a factor which clearly affects the life span and functionality of technical parts. Any time hard,
solid particles turn up in oils or fuels in high concentration, for example, these can lead to immediate damage to motor
components or hydraulic and lubrication systems. The degree of damage depends, among other things, on the material
and size of the contaminant particles as well as the operating pressure. The same applies to the parts themselves
havingcontaminant residues. Particularly in the production of precision parts and products in fine-mechanical and
micromechanical ranges, rigorous requirements govern the permissible amount of minimum residue contamination.
Such systems are usually used in sensitive areas of the shipping, aviation and aerospace industries, as well as in the
automotive industry and in medical technologies. Due to the increasing functional density of parts and components, the
damage caused by any possible contaminant residues can have catastrophic consequences and in extreme cases, lead
to a total system breakdown. Filter analysis is used, for example, for determining the contamination of lubricants, hydraulic
fluids, fuels, soot particles in diesel emissions and for monitoring the cleanliness of engine blocks, transmissions,
camshafts and crankshafts.
Microscopic residue analysis
Microscope-based residue analysis is a method for determining the degree of contamination of components or
system parts down to a few µm. This analysis means particles can be quantified and then classified in compliance
with the relevant standards. The analysis usually takes three steps. The object is first cleansed with a rinsing fluid.
This is then filtered and the retained residues optically quantified. The particle count can range from just a few all
the way up to several million particles. The Olympus microscope-based system solution, the Automated Filter
Analysis System, offers fully automatic, standard-compliant and reproducible optical analysis, classification and
documentation of residues on filter media. The system consists of the microscope, digital camera, motor stage
with insertion plate and special filter holder along with a PC, controller and filter inspection software. It is optimized
for providing speedy analysis even at high resolutions, intuitive user-friendly operation, and great flexibility for
facilitating multiple filter analysis.
Olympus Automated Filter Analysis System
1. Introduction
7
A solution for meeting today’s
technical cleanliness demands
An automated system for development, manufacturing and production
Exact information on the nature of the contamination such as number of particles, particle size distribution
and particle composition are all of decisive significance for the life span of parts and components. Counting,
analysis and classification of the often microscopically tiny contaminant and foreign particles has grown
enormously important for all processes: development, manufacturing and production as well as quality
control of the final product. Without a doubt, demand is high for comparable, reproducible and reliable
data and measurements on technical cleanliness.
Hardware components and6–13
available accessories
The effective standards concerning technical cleanliness are for a fully
automated system. A system of this kind consists of components such as
a microscope, digital camera, motorized stage and filter holder and each of
these must fulfill the dedicated requirements and specifications.
Control center: the system software
14–19
A central part of the system are the internationally valid standards. These
make dedicated system software specifications essential. The data must be
evaluated in compliance with standards using automated data collection and
residual particle counting with operator influence kept to a minimum.
Established standards, function lists
and specifications
20–23
The standard version of the Automated Filter Analysis System includes
numerous national and international standards and measurement
specifications for particle evaluation. Olympus Automated Filter Analysis
System software also offers a formula editor whose operation is convenient
and intuitive. This makes it easy for users and companies to define their
own standards and integrate them with the evaluation. Furthermore these
pages give an overview of the specifications and function lists of the system
components used in the systems.
Olympus Automated Filter Analysis System
2. Hardware components and available accessories
Hardware components and
available accessories
Much more than the sum of its parts
The Automated Filter Analysis System is a comprehensive system of hardware and software components.
Each were selected with the following in mind: complying with the standards’ requirements; optimizing speed,
flexibility and automation of the components used to reduce complexity; and increasing throughput. Other selection
criteria were high configurability, user-friendliness as well as being extendible and expandable.
The final result is a highly integrated comprehensive hardware unit consisting of a microscope (Olympus MX®
series, Olympus BX®2M series, Olympus SZX®2 series), a digital camera (XM10, XC10, etc.), motorized stage with
controller, PC, the Automated Filter Analysis System software and a filter holder. The filter holder is included in
standard delivery of the product. The Automated Filter Analysis System software and hardware components have
been developed to interact perfectly, guaranteeing highly precise and reproducible measurement results.
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The Automated Filter Analysis System is built on the highly flexible
Olympus ‘optical bench’ microscopy concept, enabling each system to
be exactly right for every requirement. Every component is made to the
highest standards and ready for use in any task.
B.1
Frames
Frames from the Olympus BX2M series or
the SZX2 series, such as the SZX10 or the
SZX7, are also microscopes of choice for the
Automated Filter Analysis System.
2.1 The frames
B.1 Microscopes of the Olympus MX, BX2M and SZX2 series are the
microscopes of choice for the Automated Filter Analysis System.
This includes the extraordinary optical performance and their logical
structure. They all offer properties which meet the standard requirements for
automated residue analysis: eg, these standards require a resolution equal
to 1/10 of the size of the smallest particles.
In addition, numerous motorized components and the unique modular,
ergonomic design ensure maximum efficiency. Furthermore, the microscopes
of the Olympus MX, BX2M and SZX2 series can be expanded according to
the customers’ needs and requirements via our many optimal components.
Each motorized component can be directly controlled, monitored and
automated using the software.
2.2 Objectives
B.2 The objectives used with the Automated Filter Analysis System are
from the advanced Olympus UIS2 series, offering excellent transmission
across the entire spectrum. All objectives are plan-corrected and offer
optimized contrast. The Olympus UIS2 aims to be the world’s premium quality
objective lens with a broad selection of magnifications and numerous
features for a wide range of applications. The unique wavefront aberration
control and neutral color reproduction provide even greater optimization of
key image performance - for direct eye viewing and digital imaging. The UIS2
objective lens series provides the optimal image for every kind of imaging.
2.3 Illumination
B.3 Standards require homogeneous illumination for all magnifications. The
microscopes used in the Automated Filter Analysis System come with the
100 Watt halogen light source. This light source provides high-fidelity bright
light observation and can be polarized using the correct filters. The stability
and quality of the light provided by these illumination systems coupled with
the imaging camera produce unmatched image reproduction. This makes
the image quality of high-end microscope optics conveniently available on
users’ computer monitors.
2.4 Digital camera
B.4 / B.5 The Peltier-cooled XC10 digital camera or the Peltier-cooled
XM10 monochrome camera are the cameras of choice for the Automated
Filter Analysis System. Both offer the features a system for automated
residue analysis needs: high resolution, fast frame rates, high sensitivity, an
excellent signal-to-noise ratio, broad dynamic range and superior image
quality. According to the relevant standards, the smallest particle must equal
10 pixels. With a 1376 x 1032 pixel CCD chip and 14-bit analog-digital
conversion for each channel, both cameras meet this requirement.
In combination with the Peltier-cooling, the superior properties of the
CCD chip ensure images that are rich in detail and contrast and that have
extraordinarily low noise.
B.2
Objectives
The advanced UIS2 objectives used in the
Automated Filter Analysis System offering
excellent transmission across the entire
spectrum.
B.3
Illumination
The 100 W light source provide homogeneous
illumination for all magnifications and highfidelity bright light observation.
B.4
XC10
The Peltier-cooled XC10 digital color
camera is one of the cameras of choice
for the Automated Filter Analysis System.
Olympus Automated Filter Analysis System
2. Hardware components and available accessories
B.5
XM10
The Automated Filter Analysis System can
also be equipped with the XM10, a Peltiercooled monochrome camera.
B.6
Filter insert
The highly precise motorized XYZ stage
provides superb accuracy and reproducibility.
Olympus offers a stage insert which can have
up to 9 filters mounted on it simultaneously.
B.7
Particle normal
This validation tools allows to calibrate
and check the calibration, the evaluation
algorithms and the measurements precision.
High-power control
In order to meet the high demands on the Automated Filter Analysis System,
the workstation has been equipped to provide optimal speed, reliability and
performance. A premium specification PC-based workstation provides all
the power required for complex control and processing of both microscope
and analysis functions. The large, high-resolution monitor is driven by a
dedicated graphic board and a multiformat DVD burner provides easy-touse optical storage.
2.5 Motorized stage and stage controller
B.6 To fulfill the rigorous accuracy that standards require, the Automated
Filter Analysis System comes with a highly precise motorized XYZ
stage. The stage provides the system with superb accuracy and
reproducibility within the range of even the smallest particles. A dedicated
stage controller board ensures optimal performance. The stage scans the
complete filter and assures reliable relocation of positions. The complete
integration of the motorized stage with the software offers flexible focus
solutions. On the one hand, there‘s a semi-automatic solution using the
motorized focus drive in conjunction with the focus map with a nearly
unlimited number of focus points – if necessary. On the other hand, there’s
the fully automatic approach using hardware autofocus: ie, for BX61, MX61
as a high-end solution. Camera and stage must be aligned parallel to the
direction the stage moves. If this is not the case, individual images in the
overview image will appear twisted with respect to one another.
2.6 Filter insert
B.6 The Automated Filter Analysis System comes with a dedicated
stage insert. This facilitates fast and precise filter positioning. The round
component stretches the filter with 3 screws and clips itself into the
rectangular stage insert. The Automated Filter Analysis System also offers
a special multi-filter holder. With this device, sample mountings of several
filters can be applied for doing serial inspections. Olympus offers an insert
which can have up to 9 filters mounted on it simultaneously. The analysis
is then conducted and evaluated automatically providing considerable time
savings compared with filter analysis using just one filter holder.
2.7 Particle standard
B.7 The Automated Filter Analysis System offers a Particle standard, an
integrated validation tool for checking the following: calibration, particle
parameter evaluation algorithms, and measurement precision. This tool is
divided up into octants. Each individual octant is for monitoring a specific
particle parameter. These include shapes such as the circles and ellipses
of varying size, varied object shapes and angles, along with distended and
spiral particles. Using bar codes (with varied line thicknesses and distances
from one another) the camera, stage rotation, precision of stage movement,
and individual image overlap for panorama images can all be monitored –
and calibrated if necessary.
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Olympus Automated Filter Analysis System
3. Control Center: The system software
Control center - the System Software
Make it fit: scan the sample, revise the scan, and make a report
The user-friendly software of the Automated Filter Analysis System guides users through the entire analysis process. As
with all products of the Olympus Automated Filter Analysis System, the software of the System is renowned for its intuitive
operation with a large-button concept and extensive flexibility. This is why even inexperienced users can carry out complex
analyses successfully in just a few steps. And it takes no time at all to learn how to do so. All basic settings are defined
just once when the system is configured. These settings include tilt compensation, determination of analysis parameters,
selection of the relevant standard, determination of the report template, etc. The settings can be managed by an
administrator who sets up the corresponding user profiles for the employees. These parameters, which cannot be
modified by the users themselves, are loaded at the click of a button. Just a simple click of the mouse after positioning
the filter starts the entire process. Results can be revised, documentation of inspection results is automatically generated
and then archived – all integrated.
C.1
The intuitive user interface of the Automated
Filter Analysis System matches the workflow
of a typical filter inspections.
C.2 Big button control bar
The process flow of the whole filter inspection
is determinted by the buttons in the control bar
of the system.
The Automated Filter Analysis System software is user-friendly and guides
the user step-by-step through the entire analysis procedure. As do all
products of the Automated Filter Analysis System, the Automated Filter
Analysis System software offers intuitive usability with its large-button
concept and enormous flexibility. The Automated Filter Analysis System’s
user interface is also intuitive. After system setup, a complete filter scan can
be done in just three clicks of the mouse: 1) define a new scan, 2) define the
thresholds of the particles to be detected, and 3) start the process.
The entire filter will be scanned in just a few minutes and documented with
a mouse click according to your templates. Then the particle scan can be
revised using extensive tools. Earlier scans can be re-classified using new
standards.
The Olympus Automated Filter Analysis System is a powerful scan engine
for detecting all kinds of particles. The Automated Filter Analysis System is
the solution for handling residue analysis and cleanliness measurements.
The Inclusion Inspector Module is for rating non-metallic inclusions in steel.
The Cast iron Inspector Module is for graphite analysis in cast iron.
The Inspector series has a workflow-oriented GUI (Graphical User Interface)
for all series products. Large buttons with self-explaining captions, located
on the left-hand side guide the user through the whole process. This
guarantees that routine work can be done with a few mouse clicks on
those buttons without any tedious setup required. Although it is easy-touse for everybody, the concept of the Olympus Inspector Series is also
flexible enough for executing complex tasks as well.
3.1 Adapted to the filter inspection workflows
C.1 The intuitive user interface of the Automated Filter Analysis System
matches the workflow of a typical filter inspection. The GUI is userfriendly, easy-to-learn and mirrors actual lab workflows. Furthermore, the
GUI is optimized for graphical display of cleanliness codes. Settings and
routine user handling are kept distinctly separate by the software. The
Automated Filter Analysis System control bar is located on the left. When
the Automated Filter Analysis System is opened, the document area shows
the image window only where all images and the live image in particular are
displayed. The remaining space in the document area is reserved for the
filter inspection results.
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C.2 The process flow of a filter inspection is determined by the buttons
in the Filter Inspector control bar. When the system is correctly configured,
a filter is investigated in three steps. The Automated Filter Analysis System
comes with two sets of large buttons: one set for the scan, and the other
for scan revision. Both go from top to bottom. The Scan button bar offers
everything needed for the scan. Just a few clicks of the mouse are then
necessary to complete full filter evaluation. The Revision button bar offers
all functions for revising scan results.
3.2 Over all system settings
All base settings of sub tasks are wizard-controlled: scan path, scan area,
definition of tilt compensation or focus map, standard selection, analysis,
evaluation, archiving, selection of a report template, etc. These settings
can be saved to a profile and password-protected if so desired. Only
the administrator is able to reconfigure the setup. Users can then only
work according to their user-profile. The Automated Filter Analysis
System software allows fine tuning via a general settings dialog. Further
modification is not needed once the setup has been defined. The settings
offer adjustment of the following:
3.2.1 Scan geometry and scan area
C.3 The scan geometry of the Automated Filter Analysis System is always
a circular area. Within the definition of the scan area the user can also
define the tilt compensation or focus map.
C.3 Scan geometry
The scan geometry of the Automated Filter
Analysis System is always a circular area
C.4 Scan area
The Automated Filter Analysis System always
scans a circular area.
3.2.2 Scan diameter
This includes definition of a gap if the position only varies slightly from one
filter sample to another. Diameters can also be defined during the process
via a wizard.
Tilt compensation: flexible focus solutions such as a focus map, tilt
correction or hardware auto focus guarantees the sample remains in
focus range when a sample is tilted.
3.2.3 Diameter of flow-through area
Definition of the diameter of the nozzle flushing the rinse fluid through the
filter.
C.4 Flow-through area
This is the area, shown in black, in which the
residue particles can be found.
3.2.4 Batch mode
Definition and administration of a multiple filter scan for high throughput
filter analysis to increase efficiency. Residues can be spread on multiple
filters and analyzed in one sequence The scan process can be fine-tuned.
Other image operations can be added before particle detection (eg,
morphological filtering). Standards can be modified with respect to all
relevant parameters and user-defined parameters. Definition of document
layouts for each inspection item (eg, always maximize image window,
show class sheet on top of revision mode). Definition of overview image
resolution (this is only for documentation – the inspection is not based on
this image).
Olympus Automated Filter Analysis System
3. Control Center: The system software
C.4 Tilt compensation
3 points with planar regression, suited for
polished metallic samples
3.2.5 Assort frames
The number of images to review after scanning in order to acquire images
of the largest particles. The frames can be acquired automatically or after
prompting.
3.2.6 Minimal particle area
This saves memory. Particles smaller than considered in the standard are
to be ignored during detection.
3.2.7 Preview
This function enables actually viewing the threshold settings while
scanning. This is an ideal monitoring tool. Disabling this function may
increase the acquisition rate for low performance systems.
C.5 Frame-independent detection
This method guarantees full reconstruction of
particles at the image border.
3.2.8 Report templates
Report templates can be combined with standards. Enabling a combination
will generate the respective report when “Report” is pressed on the main
button bar.
3.2.9 Scan area options
The Automated Filter Analysis System always scans a circular area.
3.4 Flexible focus solutions
C.4 A precisely focused image is essential for the whole workflow
process. The Automated Filter Analysis System offers a flexible focus
solutions. The tilt correction uses 3 points with a planar regression and
is suited for polished metallic samples.
C.6 Measurement parameters
The Automated Filter Analysis System
includes a huge list of measurement
parameters for the frame-independent
particle analysis.
3.5 Speedy detection
The Automated Filter Analysis System is optimized for speed, a high
number of particles and for accuracy. The system can scan and analyze
the sample at 5 images per second, including stage movement and
detection. A simple batch administration of multiple filters means larger
jobs can be analyzed as well.
3.6 Frame-independent detection
C.5 Standards dictate that a residue-analysis system must be able to
reassemble images without any gap or overlaps. This means that the total
effective filtration area must be analyzed and taken into account. Such a
multiple image analysis ensures full reconstruction of particles at image
borders. The Automated Filter Analysis System can analyze particles just
a few microns in size up to particles the size of the entire filter. Thanks to
the frame-independent detection of the Automated Filter Analysis System,
particle analysis is not restricted to a single image. It continues across the
border from one image to another. Adjacent images are reassembled
without gaps or overlaps. This frame-independent particle detection
guarantees full reconstruction of particles at the image border. Particles
are counted and analyzed only once. This is why particles that may be
the same size as the filter itself are quantified accurately – even at the
micrometer level.
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3.7 Particle detection and analysis
C.6 One of the Automated Filter Analysis System software’s core
functions is the detection, measurement and evaluation of particles on
the filter. This analysis is a very complex process requiring numerous steps
ranging from the control of the microscope stage, acquiring the image,
and the actual particle analysis. The Automated Filter Analysis System
automatically scans the filter, classifies in accordance with all established
and selected standards, generates a report for documentation and includes
a database for archiving purposes. Before the system can find and
measure the particles, the particles have to be defined. Therefore the user
has to select the gray value threshold for the particle measurements. This
is easily done via the “Threshold” button on the large buttoned control
bar. Preview functions, online histogram, and numerical input are available
to define a suitable intensity value range before each particle detection.
It is recommended to monitor the gray level threshold setting at several
points of the effective area because the standards require it. Measurement
parameters are quantities measured of the particles detected. The system
comes with a sizeable list of measurement parameters available for particle
analysis. Because dedicated standards for residue analysis require certain
measurement parameters, these parameters are reselected by the system
depending on the respective standard. All measured parameters are listed
in a dedicated particle result sheet. Up to several billion particles can be
detected and evaluated per filter. The Automated Filter Analysis System
offers a twofold monitoring of particle results. On the one hand, there’s
a live overview during the filter scan. And on the other, there’s a detailed
inspection of the unique particle map following the scan.
C.7 Particle analysis
The Automated Filter Analysis System
analyzes and classifies in accordance with
all established standards
C.7 Various output documents
Output files like e.g. a diagram about the
cleanliness and a sheet with the particle
analysis results are displayed automatically.
3.8 Advanced particle analysis
The software of the Automated Filter Analysis System also offers the option
of separating fibers and the remaining particles.
3.9 Metal and non-metal particles
The software can also distinguish between metal and non-metal particles.
This separation of reflecting and non-reflecting particles is achieved with
a polarizer/analyzer unit. When using the polarization mode, it is possible
to differentiate between reflecting and non-reflecting particles. When the
polarizer is in a perpendicular position, all of the particles will be visible as
dark objects. The reflected particles become apparent when the polarizer is
in the parallel position. Those particles then appear lighter.
3.10 Particle analysis output documents
C.7 Standards stipulate binding rules for characterizing residue. Each
standard defines specific criteria for sorting residue particles into classes.
Depending on the standard selected, the user gets varying diagrams and
sheets with class results.
The most critical output value is the cleanliness code as defined by the
standards. After scanning the whole filter a diagram of the cleanliness code
is automatically displayed in the document area of the Automated Filter
Analysis System software.
A particle result sheet with all parameters specified and needed for
standardized inspections is created for every filter inspection, including all
residue particles found during the filter inspection. The measured particle
parameters are preset and depend on the standard selected. The sheet
containing the particle results is linked to the particle map
Olympus Automated Filter Analysis System
3. Control Center: The system software
C.8 Output documents
Particle map, with original camera resolution
of the whole filter. After scanning, any particle
can be revisited in live mode using this map.
The particles are dyed in the color of their size
classification
C.8 The particle map is an image with the original camera resolution of the
whole filter. This overview image is created and saved automatically along
with measurement results. After scanning, any particle can be reviewed in
the live mode using this map. The particles are shown in the color of their
size class. The particle map is created and saved for documentation
purposes.
There’s more than just a particle map and particle result sheet automatically
created following the scan. The system also automatically acquires images
of the largest particles. To make the acquisition, the microscope moves the
stage back to the appropriate position. These images can be inserted into
the report.
3.10 Classification
Particle results can be classified according to a wide range of standards:
VDA 19 (ISO 16232-10), ISO 4406-87, ISO 4406-99, ISO 4407-91,
NF-E-48-651, NF-E-48-655 and SS 2687. They can all be customized.
The Automated Filter Analysis System also allows classification of many
standards simultaneously. An easy-to-use formula editor offers definition
of company-defined and user-defined standards.
Assortment frames. At the end of the
scan, pictures of the biggest particles are
automatically acquired driving the microscope
stage back to the corresponding positions
3.11 Approval Features
C.9 With this feature the result of a filter scan with billions of particle
detected is reduced to the binary value of OK or NOT OK. The filter has
passed the inspection or failed.
3.12 Revision of particle analysis
C.10 Particle scans can be revised using an extensive array of tools.
The revision tools mean that earlier scans can be reclassified according to
new(-er) standards. A giant revision mode allows viewing single particles
in the “inspection map” and the “live image” at the same time. The stage
will track any particle the user has selected in the result sheet. The revision
mode enables users to separate, delete and draw particles. All revision
functions are no-risk operations because they can be undone.
C.9 Approval features
With this feature the result of a filter scan with
billions of particle detected is reduced to the
binary value of OK or NOT OK.
3.13 Archiving
The Automated Filter Analysis System software automatically archives
all inspection results directly into the integrated system database. Any
filters archived in the database can be reexamined with regard to newly
established standards.
3.14 Reporting
C.11 Once the filter inspection is done, Automated Filter Analysis System
automatically generates a report with all the relevant measurement results
for the standard selected. A standard report has three pages. The first page
has the data that the user entered for the filter inspection along with the
particle map (overview map). The second page has the measurement results,
the graphic diagram of the cleanliness code, the classes of particle size and
the parameters of the largest particle. The third and final page shows an
overview of the largest particle.
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3.15 User rights and security issues
The Automated Filter Analysis System offers extensive options regarding
security issues. All system settings can be password protected by the
system administrator. This means the system administrator is able to create
setup scenarios for different tasks. Users are then only allowed to select
scenarios, but cannot change them. Such scenarios include all settings:
such as scan area, standard definition, report template, database/camera
settings and lamp voltage.
C.10 Revision of particle analysis
For the revision of particle scans the
Automated Filter Analysis System offers an
extensive array of tools.
C.11 Reporting
The report templates are predefined by the
standard or can be easily adapted to individual
tastes and needs.
Olympus Automated Filter Analysis System
4. standards, Function lists, and Specifications
Compliant to all standards
4.1 Established standards, company and industrial standards
Today’s customer expectations (long-lasting products, performance, efficiency, etc.) have led to increasing component
complexity and networking. This, in turn, generates more extensive inspection and analysis requirements. Anyone saving at the
wrong end here risks expensive recall campaigns and damage to their reputation. It is crucial to implement preventive efforts
beforehand as opposed to facing a recall later.
All solid surfaces are contaminated by anorganic or organic substances and with particles during their processing and usage
life span to a greater or lesser extent. This is referred to as residual contamination. This contamination affects wettability
performance, friction properties, electrical conductivity, corrosion potential and the optical properties of material
surfaces. The consequences can be devastating as changing any of these parameters will cause interference to subsequent
production steps; or may contribute to product failure later on when the product has been distributed. This is why international
standards define the parameters for investigating the cleanliness of oils and components. The cleanliness of all contaminantsensitive components is specified by international and national standards. These standards help the industry to obtain exact
information on the nature of the contamination: such as number of particles, particle size distribution and particle composition
– all of decisive significance with regard to the life span of parts and components. Counting, analysis and classification of the
often microscopically tiny contaminant and foreign particles has grown enormously important for all processes: development,
manufacturing, production and quality control of the final product.
4.1.1 Established standards
The mandatory regulations for characterizing contamination are defined in
corresponending standards for the respective branches of industry. All these
standards are ready for digital imaging, means that the particle’s number of
pixels is already taken into account into the standards. The Automated Filter
Analysis System offers user the option of adding standards and detection
instructions with respect to the following standards thus far:
• VDA 19 (ISO 16232-10)
• ISO 4406-87
• ISO 4406-99
• ISO 4407-91
• NF-E-48-651
• NF-E-48-655
• SS 2687
• USP 788
4.1.2 Details on ISO 16232
New standards as the ISO 16232 are not using the magnification as a
criterion of choice since with modern image analysis systems,
measurements are automatically calibrated. E.g. the ISO standard
define a strict rule (5.2.2.1.2): The magnification, the resolution and the
depth of field are selected according to the optical lens available. The key
parameter for a precise measurement is the optical resolution (and not the
magnification) of the standard lens. This value is depending on the light
wavelength and the numerical aperture of the lens. Objective should be
selected so that their optical resolution is equal or below 1/10th of the
smallest particle size one wants to measure. In case of particle below 20 µm,
the standard accepts that the resolution is only 1/5th of the smallest size.
19
D.1
As an example: For a measurement of a particle with 100 µm, a numerical
aperture of 0.2 is sufficient.
The measured parameter within the ISO 16232 is the Maximum Feret
Diameter: the longest possible distance between two tangential parallel lines
to the
Type
of particle.
microscope
Light microscope
SEM
Standard Microscope
Stereo Microscope
Particle measurement
range
> 1 µm (dependent of
the objective lens)
> 25 µm
> 20 nm
Detection principle
Brightness contrast
Brightness contrast
Material contrast
Depth of field
low
high
high
Light Microscopes
Selection of the best imaging device
according to the required resolution.
Stereo microscopes from the Olympus SZX2 are best for
particle sizes > 25 µm
ISO 16232 - Magnification selection
4.1.3 Company and industrial standards
One of the distinctive features of the Automated Filter Analysis System is
that it can be retrofitted to comply with additional standards. Within the
Automated Filter Analysis System it is possible to adapt or arbitrarily
define other classification rules that are given e.g. via a standard or internal
company-standards. These standards can be applied to previously
conducted filter analyses.
Microscopes from Olympus MX and BX2 series are best
for particle sizes > 1 µm
Olympus Automated Filter Analysis System
4. standards, Function lists, and Specifications
D
XM10
The Automated Filter Analysis System can
also be equipped with the XM10, a Peltiercooled monochrome camera.
4.2.1 XM10
G The XM10 offers all of the properties required to provide
dependable microscopy images: high resolution, extremely fine
sensitivity, a cooled CCD chip, variable exposure times and an
optional external trigger function.
The XM10 uses a 1.376 x 1.032-pixel CCD chip cooled to 10 ˚C (at 25 °C
ambient) with a 14 bit analog digital conversion. It offers three binning
modes: 2x, 4x and 8x, resulting in increased sensitivity and frame rates
of up to 80 fps in live mode. This makes it easier to focus and locate areas
of interest while conserving highly sensitive fluorescence samples. At full
resolution, the XM10 is ideal for all fluorescence acquisitions since it is
extremely sensitive, low in noise and supports long integration times of up
to 160 seconds. The chip has a pixel size of 6.45 µm x 6.45 µm, which,
in combination with the camera cooling, ensures the XM10 is ideal for
recording even the faintest fluorescence signals in your specimen.
The XM10 makes a great addition to any microscopy system not only
because of its great features, but also since it is easy to integrate using
a standard C-mount adaptor to connect to the microscope and the
high-speed data transfer and power capabilities of the FireWire™ interface.
The XM10 is fully supported by the Olympus imaging software families,
ensuring that whatever the application, the information is not only fully
collected, but also properly analysed, processed and displayed.
21
4.2.2 Xc10
D
XC10
The Peltier-cooled XC10 digital color
camera is one of the cameras of choice for
the Automated Filter Analysis System.
H With an excellent image quality, high sensitivity and long
integration times, the XC10 Peltier-cooled color camera offers
every user a flexible general-purpose imaging set-up. The XM10
supports the Olympus True Color (OTC) technology for color fidelity.
The powerful 1.376 x 1.032 pixel CCD chip offers the clarity of 14 bit
analog digital conversionl and has the ability to provide very high frame
rates via the use of pixel binning. In the 2x binning mode, the camera
provides more than 23 fps, which increases to nearly 40 fps when using
4x binning. These make the XM10 ideal for applications that require fast
image acquisition of dynamic objects. In addition, the high image frequency
can be used to focus samples or locate areas of interest directly on the
PC screen.
The high sensitivity of the XC10 is the result of a large pixel size of
6.45 x 6.45 µm. This defines the camera’s ability to be a well-equipped
all-rounder; not only perfect for color imaging, but also to meet high
expectations in sensitive fluorescence applications. The Peltier-cooled CCD
maintains a temperature of 10° (at 25 °C ambient temperature), enabling
this multifunctional camera to provide colour and black and white images
that are rich in detail and contrast with extraordinarily low background
noise. Also adding to the XC10’s appeal is the extensive exposure time
range (100 µs–160ms), ensuring that both strong and weak signals are
captured with equal fidelity.
With the ease of both C-mount optical coupling and FireWire™ data and
power connectivity, integrating the XC10 into your imaging system is easy.
Black-and-white cameras
Universal cameras
XM10
XC10
Image sensor
Monochrome CCD
Image sensor
Color CCD
Sensor type
Sony ICX 285 AL
Sensor type
Sony ICX 285 AQ
Sensor size
2/3 inches
Sensor size
2/3 inches
Resolution (max.)
1,376 x 1,032 pixels
Resolution (max.)
1,376 x 1,032 pixels
Pixel size
6.45 µm x 6.45 µm
Pixel size
6.45 µm x 6.45 µm
Binning
2x, 4x, 8x
Binning
2x, 4x
Readout speed
24.5 MHz
Readout speed
20 MHz
ADC*1
14 bit
ADC*1
3 x 12 bit
Exposure time
0.1 ms –160 s
Exposure time
0.1 ms –160 s
Live frame rates*2
25 fps at 688 x 516
Live frame rates*2
12.4 fps at full resolution
50 fps at 344 x 258
22.9 fps at 2x binning
25 fps at 172 x 129
39.3 fps at 3x binning
80 fps at 172 x 129 pixels
Cooling system
Peltier 10 °C at 25 °C ambient
Cooling system
Peltier 10 °C at 25 °C ambient
Readout noise
<10 e¯
Readout noise
<10 e¯
External trigger
Optional
External trigger
Optional
Data transfer
FireWire™ IEEE 1394a
Data transfer
FireWire™ IEEE 1394a
Yes
OTC support*
Yes
Partial readout
Yes
Remarks
–
Operating system
Windows XP/Vista
OTC support*
3
Partial readout
Remarks
Remarks
Operating system
–
3
Yes
–
Windows XP/Vista
*1 Analog Digital Conversion. Actual bit depth of the camera is depending
on used software
*2 Conditions for performance measurement
Dual Ahtlon AMD 2,6 GHz with ICC profiles at 1 ms exposure time
*3 Olympus True Color optimization algorithms
Olympus Automated Filter Analysis System
4. standards, Function lists, and Specifications
4.3 Function list
•
Particle Inspector
•
Filter Inspector
Image Acquisistion
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
Camera interfaces
FireWire IEE 1394*, USB2*, Framegrabber*, TWAIN; (*specified)
Olympus Camera Control
Special Tool window for Olympus cameras
Olympus True Color
Image formats
*.tif, *.jpg, *.bmp, *.pcd, *.eps, *.png, etc.
Image types
Binary 8-bit gray, 8-bit color palette, 16-bit gray, true color (24-bit RGB)
Movie recorder
Making movies of single images or from the live image
Overlays
Use text, arrows, etc. for labelling (in live image too)
Basic Image Processing and Measurement
Intensity
Maximize and equalize contrast; modify gray values, etc.
Changing bit depth
8/16 bit, color 8/24 bit, binarize
Color modification
Color spaces: RGB, HSI, color separation, RGB Studio, etc.
Filters with preview function
Sharpen, Edge Enhance, Mean, Median, Sobel, Roberts, NxN,
Low pass, Rank, Differentiate x, Differentiate y, Connectivity, Sigma
DCE, Shading correction; Seperator
Standard measurement
Count, Distances (vertical, horizontal, arbitrary), intensity profile
Result display
sheets, statistics, diagrams, classification
Device Control
Olympus microscopes
IX®, BX, AX, MX, SZX
Autofocus
Autofocus with external Z-drives
Customization
Workflow assistant
Customized workflows with big buttons
Special Setup
•
•
DualScreen
Second monitor support
NetCam
Internet live streaming
Extended Measurement
•
Extended measurement
Angle, polygon, size, shape, etc., Magic Wand
Archiving & Documentation
•
•
•
•
•
•
•
•
•
•
Database
Structured image database
Reports
Report generator
Extended Acquisition
•
•
Macro recorder
Scripts and playing back sequences
Multiple Image Alignment
Panorama image function
Motorized stage
Stage Navigator
Automated XY-scan
Extended Focal Imaging
Infinite depth of focus, Instant EFI
Data Output
•
Graph
Visualize, process and analyze diagrams
Extended Image Processing and Measurement
•
•
•
•
•
•
•
•
•
•
•
VoxelViewer/SliceViewer
Display and navigation through image stacks
3-D display
3D-Perspective, 3D Animation, Height lines, Texture
Image “pocket calculator”
Addition, subtraction, multiplication, division, and, or, XOR, absolute amount
Chain measurement
Chain measurement
Phase analysis
Phase percentages, absolute areas
ROI selection
Polygon, rectangle, virtual ROI, etc.
Particle detection
Number, position, size, shape
Morphological filters
Erosion, Dilation, Open, Close, Top Hat, Skeleton, etc.
23
4.3 Function list
•
Particle Inspector
Filter Inspector
Automation
Automater
•
•
•
Image Sequence Processing
Object tracking
Automatic Caliper Tool
Automation of image acquisition, image processing, measurement,
report generation, archiving
Time-lapse acquisition of image sequences
Track objects through image sequences
Automatic measurement of any geometric shape via edge detection
•
FFT
FFT
Fast-Fourier-Transformation
•
Programming
Imaging C
Environment for developing modules
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
Special Inspector Features
Filter inspection
Inclusion inspection
Cast iron inspection
Big button workflow
Frame-Independent Detection
Interactive particle map
Circular scan path definition
Extended scan path definition
Revision mode
Auto Report
Tilt Correction
Focus map
Separation metallic-non-metallic
Password protection
Multi-user
Residue analysis (ISO 4406, ISO 4407, ISO 16232, NF E 48-65, SS 2687)
Full determination of degree of steel purity (ASTM E45, DIN 50602, EN 10247,...)
Cast iron analysis (ASTM A 247, EN ISO 945, GB 9441-88, JIS G 5502)
Access to all Inspector functionality via “Big Buttons”
Joining of particle at image borders
Particle-sheet link incl. stage movment for revision
Scan path definition by 3-point circle method
Scan path definition by 2-point circle, 2-point rectangle, 4-point rectangle
pie selection, ring shaped path
Add, delete, join, seperate particles, incl. Undo- and Redo function
Automatic report generationbased on pre-defined, customizable report templates
Focus correction based on 3-point method, planar regression
Focus correction based on n-point method, surface reconstruction
Evaluation of the amount of glitter within the particles
Password protection for all inspector settings
User profiles
Extension Modules
Chart Navigator
Micro hardness testing
Layer thickness measurement
Grain size analysis (intercept)
Inclusion analysis
Dendrite arm spacing
Decarburization depth
Weld measurement
Grain size analysis (planimetric)
Cast iron analysis
Inclusion analysis (worst field)
Layer thickness measurement (calopreps)
Hone angle
Heating stage
LEXT extensions
Filter Inspector
Cast Iron Inspector
Inclusion Inspector
Chart comparisons using live image
Micro hardness testing (Vickers, Knoop)
Determining layer thickness using cross-sectional specimens
Intercept method for determination of grain size
Determining of purity of steel via “ASTM E1245”
Dendrite arm spacing measurement
Determining depth of decarburization
Measurement of weld cross-sections
Planimetric method for determination of grain size
Cast iron analysis (graphite, ferrite, pearlite determination)
Determining of purity of steel via “worst field” method
Calopreps for determining layer thickness
Determining hone angle
Heating stage control (LINKAM)
Import and export of OLA3000 images
Residue analysis (ISO 4406, ISO 4407, ISO 16232, NF E 48-65, SS 2687)
Cast iron analysis (ASTM A 247, EN ISO 945, GB 9441-88, JIS G 5502)
Full determination of degree of steel purity (ASTM E45, DIN 50602, EN 10247,...)
Olympus Automated Filter Analysis System
FLTRSYSBRO_09 04
www.olympusamerica.com
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E-mail: [email protected]
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