PERGAMON Solid State Communications 116 (2000) 631±636 www.elsevier.com/locate/ssc XPS comparison between nanocrystalline g-alumina and a new high pressure polymorph C.E. Mof®tt*, B. Chen, D.M. Wieliczka, M.B. Kruger Department of Physics, University of Missouri-Kansas City, 5110 Rockhill Road, Kansas City, MO 64110, USA Received 12 April 2000; received in revised form 25 August 2000; accepted 29 August 2000 by F.J. Di Salvo Abstract High surface area, nano-phase materials exhibit many interesting properties quite different from their bulk counterparts, and are the focus of much technical investigation and engineering development based on these properties. Earlier experiments using X-ray diffraction have indicated that a new phase of alumina exists upon non-hydrostatic compression of 67 nm particles of galumina to above 35 GPa and quasi-hydrostatic compression to pressures over 50 GPa. This phase is quenchable on decompression to 0 GPa, allowing for additional analysis that are unmanageable in the diamond anvil cell (DAC). For the present paper, imaging X-ray photoelectron spectroscopy (XPS), which is ideally suited for surface chemistry measurements of the small samples required in the DAC, is used. The collection of Bremsstrahlung excited Auger electrons in combination with photoelectrons allows for a better comparison of chemical shifts, through the Auger parameter. No dramatic change was observed, as is the case with many alumina polymorphs, but slight differences between the gamma phase and the new highpressure phase are noted, supporting the earlier X-ray results. Additionally, an extremely low adventitious carbon level was observed on a g-phase sample and is discussed. q 2000 Elsevier Science Ltd. All rights reserved. Keywords: D. Phase transitions; E. Photoelectron spectroscopies PACS: 81.05.Ys; 79.60.-I; 07.35.1k; 81.05.Je 1. Introduction There is currently avid interest in nanocrystalline (particle size less than roughly 100 nm) materials due in part to some of their extreme properties, as well as the ability to tailor speci®c characteristics by selection of particle sizes. Surface effects can be signi®cant due to the large surface area to volume ratios inherent to nano-particles, and can result in dramatic differences in material properties. Physical properties such as hardness and strength may be signi®cantly enhanced due to the fact that the nanometer range is the largest size that perfect crystals with no defects can be grown. Electronic changes associated with the dominance of quantum effects at small particle sizes are also being explored. The ability to regulate physical and electronic properties, through control of particle size, will be increas- * Corresponding author. Tel.: 11-816-235-5443; fax: 11-816235-5221. E-mail address: mof®[email protected] (C.E. Mof®tt). ingly exploited in the future. Thus, a deeper understanding of fundamental aspects of nanoparticle materials is essential. Recent high pressure studies on a-alumina have demonstrated that under high pressures and temperatures it transforms into the Rh2O3 (II) structure [1]. More recent high pressure, room temperature X-ray diffraction experiments on nanocrystalline g-alumina have shown that it transforms into another high-pressure phase at pressures greater than ,35 GPa. This phase is quenchable and can therefore be studied under ambient conditions [2]. The interest in pressure-induced structural changes extends across many ®elds, including geology, chemistry and materials science. The ability to extract phase-change information and determine potential new pathways for materials development merits the dif®cult preparation and analysis of the small samples, required for diamond anvil cell (DAC) pressure experiments. As surface properties are inherently important in catalytic reactions, so they are in the general context regarding the properties of large surface area materials. Until recently, surface analytical techniques that can 0038-1098/00/$ - see front matter q 2000 Elsevier Science Ltd. All rights reserved. PII: S 0038-109 8(00)00367-7 632 C.E. Mof®tt et al. / Solid State Communications 116 (2000) 631±636 extract chemical information, such as X-ray photoelectron spectroscopy (XPS or ESCA), were restricted to use on samples of roughly one centimeter in size or larger. Advances in imaging and small area measurement now push the limit beyond the 1 mm region, allowing chemical state information to be recorded from relatively small samples using monochromatic laboratory X-ray sources. The higher energy resolution afforded by standard Al-Ka monochromatic sources, as compared to ¯ood type sources, has one inherent drawback in the analysis of aluminum compounds. The photon energy cannot excite the 1s level, which is required to stimulate the Al KLL Auger transition. The Bremsstrahlung emitted by laboratory ¯ood sources does, however, excite this particular transition. These spectra have become quite important when analyzing aluminum compounds, since the development of the Auger parameter, for chemical state identi®cation [3,4]. 2. Experimental Nanocrystalline g-Al2O3 was obtained (Nanophase Technologies Corporation, IL) with an average particle size of 67 nm. Compression of samples was performed non-hydrostatically in a Mao±Bell type DAC, at room temperature. The sample chambers in the gaskets (spring steel and rhenium) were ,180 mm in diameter, with the diamonds having 350 mm culets. Pressure calibration of the cell was made using ruby ¯uorescence, and ruby was included on one side of certain test samples to ensure the transition pressure had been reached. This transition pressure for the new phase was determined from the previous X-ray diffraction work. Originally, spring steel gaskets were used, but after preliminary XPS measurements indicated that the oxygen signal from the potentially complex oxide on the gasket could not be fully eliminated from the collected spectrum, a rhenium gasket was used to minimize possible overlap and give a second level for comparison. Samples of the 67 nm g-Al2O3 starting material were prepared and measured in three ways; in the cavity of a steel gasket similar to the high pressure set-up, mounted on doublesided adhesive tape, and pressed into an indium coated sample stub. The samples in the steel gasket were not as reliably ®xed in the opening as the high-pressure phase, and after transfer had regions with no material fully intact at the surface of the cavity in the indentation. The additional samples on the tape and indium allowed for much better signal to noise ratios at the same settings, and also allowed for spectra to be taken that did not incorporate additional oxygen signals that were present from the sample in the steel gasket. XPS measurements were performed on a Kratos Axis-HS at a base pressure of , 2 £ 10210 Torr: A ¯ood type Mg-Ka source was used for excitation, so that the Al KLL transition could be studied along with the core levels. Calibration of the spectrometer is made measuring the Ag 3d5/2 at 368.26 eV binding energy and the Ag M4NN at 895.75 eV apparent bind- ing energy from a silver standard, which assures calibration over a broad energy range. Most spectra were collected with the analyzer set at a pass-energy of 80 eV, which yields a FWHM of just over 1.4 eV for the 3d 5/2 line from an Ag standard. The reason for lower resolution operation stems from the small area settings in the mode of collection. To achieve higher spatial resolution, magnetic lensing coupled with a selected area aperture in the lens stack are used, which limit signal strength. The 1 mm aperture used for these measurements yields the width of a sharp edge in the range of 50±60 mm. Operating in this mode, the collection time necessary to achieve good signal to noise resolution was 10 sweeps through core level regions at 0.1 eV steps and 300 ms dwell per step. For the Al KLL spectra, and when valence band measurements were made, this required an increase to 30 sweeps through the particular region, maintaining the same step size and dwell time. The high-pressure phase was best measured in the physical arrangement in which it was formed, which was compacted alumina surrounded by a metal gasket. The indention of the gasket material below the surface required that the sample be slightly tilted, to ensure full illumination of the recessed alumina sample with X-rays. Aluminum emissions were the only features unique to the sample, since oxygen and carbon were also evident on the gasket material, particularly so on the spring steel gaskets. Maps based on the actual sample emissions were used to set the selected area analysis positioning for collection of spectra from the center of the alumina sample. The magnetic mode of operation used in the imaging tends to induce more sample charging in measurements on insulators. A proprietary method of compensation, using an electron ¯ood gun in the ®eld of the magnetic lens, allows for the neutralization of the surface. Generally, referencing to the adventitious carbon 1s energy position at 285.0 eV can be used to further address sample charging issues [5]. Optimal compensation was somewhat dif®cult to assess on most of the high-pressure phase samples, due to the unavoidable collection of some electrons emitted from carbon on the grounded gaskets. Fortunately the use of the Auger parameter is independent of sample charging, and becomes an invaluable aid in addressing samples such as these. 3. Results and discussion As mentioned in the experimental detail section, some problems associated with measurements of samples in steel gaskets, due to the unavoidable detection of oxygen and carbon signals emanating from the steel surface, were experienced. Slight image shifting from the standard sample position was also noted and is thought that this might be related to changes in magnetic ®eld near the spring steel. Some overlap of the oxygen and carbon spectral contributions from the steel limited the use of these core level spectra for charge referencing. The aluminum spectra, however, C.E. Mof®tt et al. / Solid State Communications 116 (2000) 631±636 Fig. 1. Al 2p photoelectron map zooming in on sample region. The X labeled as p1 marks the center of the analysis region where core spectra were collected. were only assumed to emanate from the sample itself, and the Auger (modi®ed) parameter can be used to deduce chemical state information without knowing the exact charge corrected positions of the peaks [3,4,6]. To minimize any magnetic interactions and the spectral contribution from the oxide on the gasket, a sample made in a rhenium gasket was also investigated. The process for analyzing the samples is discussed and illustrated for the high-pressure phase sample in the rhenium gasket. Initially, a photoelectron map was formed using the intensity distribution of electrons with a 40.5 eV binding energy, the observed position of the Re 4f 7/2 transition. Taking a core level Al 2p spectrum from the center of the low intensity region revealed some signal. A corresponding map was then generated based on collected electron intensity from the maximum of the Al 2p peak at 73.1 eV binding Fig. 2. Carbon 1s spectra taken using selected area aperture with center of collection region at p1 in Fig. 1, showing charging shift of components on alumina sample and adjacent grounded Re gasket material. 633 energy. The step size was then reduced to 16 mm and a new map centered on the high Al concentration was formed, while still maintaining the same 50 mm selected area aperture setting (Fig. 1). All of the maps required the collection and subtraction of a background map taken at a binding energy just lower than the respective core level. Finally, core levels from the aluminum sample were collected, with the center of the collection marked by the X, labeled p1, in Fig. 1. The images are not shown, but a similar process was used to locate and map the samples prepared in steel gaskets, using maps based on Fe 2p, O 1s, and Al 2p energies. Core level spectra were obtained from the center of the region of high aluminum photoelectron intensity, as was the case for the Re gasket sample. For one sample, the use of a smaller selected area aperture (,25 mm edge measurement) was attempted, but the signal to noise ratio of the spectra was extremely poor for a reasonable collection time, particularly for the aluminum Auger spectrum. The photoelectron and Auger electron spectra used for analysis were collected with the same 50 mm selected area aperture used in the mapping. This aperture setting would ideally only allow for collection of electrons emanating from the samples, which were roughly 150 mm across, but it was observed that both Fe and Re signals, as well as additional oxygen signals were collected in all instances. It was thought that the lower oxygen level on rhenium, as opposed to that on the spring steel, would give an indication of which oxygen signal was from the alumina and which was from the gasket. The primary assumption in the analysis is that the collected carbon and oxygen signals originate from both the alumina sample and the gasket material, while the aluminum signals only originate from the sample region. As mentioned in the introduction, the carbon 1s position is Fig. 3. Rhenium 4f spectra taken with both charge neutralization settings and after sputtering, showing the constancy of the peak positions. 634 C.E. Mof®tt et al. / Solid State Communications 116 (2000) 631±636 Table 1 Position of peak components from Re gasket sample with and without the charge neutralizer; core level photoelectron peaks are given in binding energy and Auger peaks in kinetic energy. The bracketed designation of Y or N indicates whether or not the particular peak is associated with the alumina sample Peak Position (eV) Without charge neutralization C 1s-1 [Y] 287.60 C 1s-2 [N] 285.31 O 1s-1 [Y] 533.79 O 1s-2 [N] 532.38 O 1s-3 [N] 535.30 Al 2p [Y] 77.18 Al KLL [Y] 1384.53 With charge neutralization C 1s-1 [Y] 283.61 C 1s-2 [N] 284.93 C 1s-3 [N] 287.62 O 1s-1 [Y] 529.80 O 1s-2 [N] 531.63 Al 2p [Y] 73.34 Al KLL [Y] 1388.39 Charge corrected position for alumina related peaks (eV) 285.0 531.19 74.58 1387.13 a 1461.71 eV 285.0 531.19 74.73 1387.0 a 1461.73 eV generally used as the charging reference to determine actual photoelectron binding energies and Auger kinetic energies of peaks from insulating samples. To properly use this method when analyzing regions of different possible potential, the contribution from the particular region of interest must be identi®ed. The enclosure of an insulating sample by a grounded metallic gasket made this distinctly feasible. Fig. 2 shows the carbon spectra from the region centered on the point marked with an X and labeled p1 in Fig. 1, both with and without the use of the charge neutralizer. The peak that is shifted to the highest binding energy without the charge neutralizer is assumed to originate from the alumina sample, and allows for the correction of the other peaks to account for charging effects. With the charge neutralizer on, the surface of the alumina is over compensated and this peak resides at lower binding energy than the adventitious carbon on the gasket. The carbon associated with the rhenium gasket also exhibits a shift with the different charge neutralization conditions, although the rhenium 4f peak shows no shift, indicating that it is well grounded. The Re spectra are shown in Fig. 3 in both charge neutralization states and after sputtering. Sputtering appears to have deposited rhenium across the entire sample (Fig. 3), and it is observed that the binding energy after sputtering to exposed fresh metal is unchanged. Using the information from the manipulation of the sample charging allows for the more precise assignment of Al 2p binding energy and Al KL23L23 kinetic energy. The carbon spectrum without charge neutralization (Fig. 2) is ®t with two Gaussian±Lorentzian functions with 30% Lorentzian composition on a Shirley background [6]. Neither the carbon nor the oxygen peaks could be ®t in the charge neutralized state by simply letting the component positions change and using the exact ®tting parameters used for the spectra without charge neutralization. This may be indicative of varied differential charging and compensation [7,8], since peak widths can appear to broaden with varying charge compensation within the sampling volume. The difference between the higher binding energy carbon Table 2 Al 2p and Al KLL peak positions and the combined Auger parameter from the different low pressure (g) and quenched high-pressure (hp) phases; the second number in parentheses indicates the charge corrected value to the carbon 1s at 285.0 eV binding energy, when it could be applied due to the ability to distinguish the peak origins Sample Al 2p binding energy (eV) Al KLL kinetic energy (eV) Auger parameter a (eV) g-Al2O3 on Tape g-Al2O3 in Fe gasket g-Al2O3 on In 74.49 (74.19) 72.93 74.01 1387.02 (1387.32) 1388.54 1387.39 1461.51 1461.47 1461.39 Average 1461.46 72.91 72.67 1388.76 1389.09 1461.67 1461.76 77.41 1384.26 1461.67 73.34 (74.73) 1388.39 (1387.0) 1461.73 77.18 (74.58) 1384.53 (1387.13) 1461.71 Average 1461.71 Hp-Al2O3 in Fe gasket #1 Hp-Al2O3 in Fe gasket #2 with charge neutralization Hp-Al2O3 in Fe gasket #2 without charge neutralization Hp-Al2O3 in Re gasket with charge neutralization Hp-Al2O3 in Re gasket without charge neutralization C.E. Mof®tt et al. / Solid State Communications 116 (2000) 631±636 peak position and 285.0 eV is then assumed to be the correction factor for the peaks of the alumina constituents. This is fairly straightforward for the aluminum peaks, which only appeared to have one component. The O 1s peak, however, had large asymmetries that required a second ®tting peak. The source of the required second peak was assumed to be from the gasket. The asymmetry changes with charge neutralization, in commensurate directions to the carbon shifts, indicating that the dominant peak in the oxygen spectrum is from the alumina sample. The positions of the dominant component peak, as obtained in the curve ®tting results, are then shifted by the same amount required for the C 1s peak from the sample region to be moved to 285.0 eV. Using this requirement, the addition of a third peak on the higher binding energy side was necessary to obtain a good ®t. The contribution of this peak was small but not negligible, and without its use the dominant peak became unreasonably wide, but still did not yield better ®tting results. The sum of the areas of the two smaller peaks was restricted to contribute the same amount to the combined spectrum as that of the non-dominant peak from the charge-neutralized spectrum. The position of the oxygen on the Re gasket, away from the sample, shifted with changes in charge neutralization, similar to the position changes of the gasket associated component of the combined oxygen spectrum from the sample region, further con®rming the assessment that it was associated with the gasket material. Table 1 gives the values obtained by curve ®tting the spectra from the sample in the Re gasket, both with and without charge neutralization and also shows the ®nal charge corrected values. Table 2 then gives the Al 2p and Al KLL positions (not charge corrected in most instances) and the Auger parameters calculated from them for both of the alumina phases. The binding energy of the Al 2p peak for the g-alumina, using carbon referencing on the tape substrate sample, is somewhat higher, and the Al KL23L23 position somewhat lower, than those reported in the literature [9]. The Auger parameters for all of the g-alumina samples are, however, near the reported value. Additional spectra were obtained from this tape sample with higher energy resolution (20 eV pass energy, which corresponds to the measurement of the width of the Ag 3d5/2 line ,0.9 eV). The higher resolution spectra indicated a distinct shoulder on the higher binding (lower kinetic) energy side of the Al 2p (KLL) peaks which produced a roughly 0.1 eV higher Auger parameter than the main peak with an intensity of ,20% of the combined spectrum. The surface of aluminum oxides grown on metal substrates is known to have some degree of hydroxylation if exposed to atmosphere [10±12]. The third oxygen peak in Table 1, required on the Re gasket sample without charge neutralization, might represent a hydroxyl contribution to the O 1s spectra [10,11]. This would be obscured by the non-alumina associated peak with charge neutralization, which closely coincides with an oxygen peak taken from a 635 point on the Re gasket far away from the sample. On the other high-pressure samples it is dif®cult to determine whether the origin of additional oxide peaks and asymmetries is the alumina sample or a region of the gasket material. A second higher binding energy peak, with lower intensity than the main peak, was also observed on all the g-alumina samples. This tends to indicate that some Fig. 4. Spectra from g-Al2O3 pressed on In coated sample stub, which has no appreciable C 1s peak from adventitious carbon though it had been exposed to atmosphere and never sputtered. 636 C.E. Mof®tt et al. / Solid State Communications 116 (2000) 631±636 degree of surface hydroxylation could be present on all the samples, which could not be deconvolved from the Al 2p and KLL spectra and contributes to the shifted energies. This second oxygen peak contributes less than 25% to the total O 1s peak collected in all instances, but could be responsible for the shifted aluminum electron energies. Argon sputtering of some samples was performed to determine whether the possibly hydroxylated surface could be removed. Apparent in Fig. 3 is the effect of deposition of gasket material across the sample surface. Preferential sputtering of one element in a compound and the formation of intermediate compounds are both possible consequences of ion sputtering. The sample in the rhenium gasket developed a second Al KLL peak after sputtering. A sample in a spring steel gasket appeared to maintain individual aluminum peaks with quite similar Auger parameters, and the oxygen peak did not change appreciably, so differentiation between the gasket oxygen peak and that from the alumina could not be conclusively made. The recessed nature of the indentation in the gaskets may have limited the ion rate through shadowing in this case. Sputtering, then, did not appear to address the hydroxylation concerns. A fairly unique phenomenon was observed in the XPS analysis of the g-alumina pressed in indium, whose spectra, using the charge neutralizer with no sputtering whatsoever, are shown in Fig. 4. The absence of any resolvable C 1s peak from a sample exposed to atmosphere is quite unusual. This is after 10 sweeps through the region using the same settings as the other spectral regions, which were also obtained with 10 sweeps, except for the valence band and that required 30 sweeps. These were obtained using the same settings used on the small samples. The lack of an In 3d peak indicated that the analysis was in a region with good alumina coverage. One seemingly plausible explanation for this is that, if the pressed sample were jolted during transfer, some rearrangement of the powder may have occurred exposing a different surface to the vacuum. However, this sample was formed from powder that had been exposed to atmosphere itself and all the surfaces should have some level of carbon on them, so this explanation appears incorrect. The other possible explanation is that the high surface area of the known catalytic phase has some unusual properties affecting the adsorption of hydrocarbons from the atmosphere. This behavior was not observed on the tape-mounted sample, but this could be due to a different source of carbon contamination or some collection of electrons from the tape material itself. 4. Conclusions A new high-pressure polymorph of Al2O3 was analyzed with imaging XPS and it was observed that the Auger parameter of this metastable phase was between 0.2 and 0.3 eV higher than that of the nanocrystalline g-Al2O3 starting material. Modi®cation of charge neutralizer settings allowed for the difference in charging between the sample and the gasket material to be resolved, thus allowing the assessment of the sample peak positions. Some level of hydroxylation of both alumina phases appeared likely from additional peak components on all of the samples, but a clear relationship could only be asserted on certain samples due to partial collection of electrons originating from the gasket. The use of a rhenium gasket facilitated the analysis due to its different surface oxide level, contrasting that of an oxidized spring steel gasket. An unusual lack of adventitious carbon on one g-Al2O3 sample was unexpected and may have implications regarding high surface area materials, especially known catalytic phases. Acknowledgements This work was partially supported by the National Science Foundation and the ACS Petroleum Research Fund. References [1] N. Funamori, R. Jeanloz, Science 278 (1997) 1109. [2] B. Chen, D. Penwell, L.R. Benedetti, W. Caldwell, R. Jeanloz, M.B. Kruger, in preparation. [3] C.D. Wagner, H.A. Six, W.T. Jansen, J.A. Taylor, Appl. Surf. Sci. 9 (1981) 203. [4] S.D. Waddington, in: D. Briggs, M.P. Seah (Eds.), Practical Surface Analysis, 2nd Edition, Auger and X-ray Photoelectron Spectroscopy, Vol. 1, 1990, pp. 588±594. [5] M.P. Seah, in: D. Briggs, M.P. Seah (Eds.), Practical Surface Analysis, 2nd Edition, Auger and X-ray Photoelectron Spectroscopy, Vol. 1, 1990, pp. 541±554. [6] D.A. Shirley, Phys. Rev. B 5 (1972) 4709. [7] J.B. Metson, Surf. Interface Anal. 27 (1999) 1069. [8] B.J. Tielsch, J.E. Fulghum, Surf. Interface Anal. 25 (1997) 904. [9] C.D. Wagner, in: D. Briggs, M.P. Seah (Eds.), Practical Surface Analysis, 2nd Edition, Auger and X-ray Photoelectron Spectroscopy, Vol. 1, 1990, p. 602. [10] B.R. Strohmeier, Surf. Interface Anal. 15 (1990) 51. [11] E. McCafferty, J.P. Wightman, Surf. Interface Anal. 26 (1998) 549. [12] Wefers, K., Misra, C., Oxides and Hydroxides of Aluminum. Alcoa Technical Paper no. 19 (revised), Alcoa Laboratories, Alcoa Center, Pennsylvania, 1987, p. 66.
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