Infosheet Scanning Electron Microscopy

tiny structures for big ideas
FEI XL30-ESEM FEG scanning electron
microscope
The Research Centre for Microtechnology operates
a JEOL JSM-7100F scanning electron micro-scope.
The equipment is able to generate magnified
images of a broad range of samples – electrically
conducting or insulating samples, samples
containing a high fraction of water and biological
samples. It is not necessary to apply a conductive
coating to insulating materials to analyze them.
The results provided by the analytical capabilities of
this instrument are interpreted by an experienced
materials scientist. Elemental analysis and elemental
mapping often provide a clue to a causal Fractured corner valve
explanation for defects in components. This
instrument and the scientific consulting connected
with it are offered as a service to local industry.
Services
• SEM images of samples
• Magnification X 10 to X 1.000 000
• Fracture analysis requiring depth of focus
• Elemental analysis, elements with fraction
• Elemental mapping, local distribution of elements
• Consulting
Ant
Silicone impregnation of cotton fibers
Fields of applications
• Conductive, insulating, wet and biological
samples
• Inorganic samples: free of oil and lubricants
• Qualitative elemental analysis from B (atomic
number 5) to Pb (atomic number 82)
• Quantitative elemental analysis from Na (atomic
number 11) upwards
• Weight fraction of element to be analysed should
be > 0.5 %
Physical characteristics
• Typical sample size: between a grain of sand and
a cork
• Maximum sample size: 100*100*50 mm
• Traversing range of sample holder: circle of 50
mm diameter
• Diameter of z-axis: 25 mm
SEM image of the fractured corner valve
…
Element mapping of the fracture site
der Bruchstelle
Examples
Examples
Microparts, surface structures, coatings, fractures of
all kinds, corrosion and its by-products, inclusions,
fibres, preparation of layered materials
Brazing solder
Contact
Fachhochschule Vorarlberg
(Vorarlberg University of Applied Sciences)
Prof. (FH) Dipl.-Ing. Dr. Heinz Duelli
Hochschulstrasse 1
6850 Dornbirn, Austria
Tel: +43 (0)5572 792 1008
[email protected]
http://www.fhv.at/fhv-science/microtechnology
Elemental analysis of the material