LED TESTER
Turnkey System for Production
Two Global Leaders.
One Complete Solution.
Our story
Two Global Leaders.
One Complete Solution.
Konica Minolta Sensing Americas provides
advanced optical technology that precisely
measures the elements of color and light. Their
products have become a staple in research and
manufacturing environments, helping organizations
to meet product quality and operational goals with
less waste, time, and effort. This commitment
to creating value for customers is the core
principle behind the Konica Minolta brand, and
has led them to develop the world’s first portable
spectrophotometer and the first light meter used on
board a spacecraft (Apollo 8). It’s also the driving
force behind the high level of quality and precision
built into each of their products. These are some of
the reasons why Konica Minolta is regarded as the
technological leader in color and light measurement
solutions today.
Based in Germany, Instrument Systems develops
and produces high-quality optical test and
measurement instruments for a broad spectrum
of applications. Their extensive product range
includes spectrometers, imaging photometers
and colorimeters, goniophotometers, integrating
spheres, and turnkey system solutions.
Instrument Systems is dedicated to working with
standardization committees and associations
such as ICDM and CIE. They also cooperate with
leading national metrology institutes.
Now, these two experts have combined
their knowledge and tools together to offer
the complete solution for the most accurate
measurement of light and color available in the
market today.
Your total light and display sensing solution.
Product Highlights
Optical measurements with high-performance CCD
Spectrometer CAS140CT
Measurement adapters (in conformity with CIE-127) for
luminous intensity and luminous flux
Electrical measurements with Keithley 2400/2600
Sourcemeter
The CAS140CT, the successor to the industry proven CAS140B,
guarantees maximum accuracy and reproducibility, even for
critical measuring parameters, e.g. dominant wavelength and
color coordinates of white LEDs. The Keithley 2400/2600 facilitates
much faster measurements than has been possible to date. The
diagram shows that customers are benefiting from substantial
reductions in testing times for electrical measurements,
particularly in the case of longer test sequences.
User-configurable testing of all optical and electrical
parameters of LEDs
Simple connection to handler systems and wafer probers
New: fast LED wafer inspection with MultiDie Testing
High-Accuracy LED Measurements:
Now Even Faster!
The proven LED Tester from Instrument Systems has been
completely re-engineered. To meet the enhanced requirements
for measuring accuracy and speed in LED production the new
CAS140CT CCD array spectrometer from Instrument Systems and
the fast Keithley 2600 series current/voltage source have been
integrated. At the same time Instrument Systems is continuing to
supply the proven Keithley 2400 Sourcemeter. The LED Tester can
be used to test all relevant optical parameters of LEDs:
Luminous intensity [cd] and radiant intensity (W/sr)
Luminous flux [lm] and radiant power [W]
Dominant, centroid and peakwavelength [nm]
Color coordinates, color temperature and
color rendering index
Forward voltage and reverse current
Measuring LED parameters in production presents particular
challenges for metrology equipment, because CIE-compliant
measuring adapters have a very low light throughput. At the
same time, short measuring times are necessary to ensure that
equipment can operate profitably. There is also a wide diversity
of LEDs to be tested, ranging from small SMT designs to highpower LEDs.
Test sequence 1 includes one optical and one electrical test, whereas sequence 2
includes one optical and five electrical tests.
The software was also fully updated in line with the hardware
enhancements. A new flexibly configurable user interface
has been combined with a considerably expanded array of
functions to meet all requirements. New features are provided
by statistical analyses and overviews, as well as a dedicated
module for wafer probing.
Your total light and display sensing solution.
LED Wafer Inspection: Maximum
Front-End Requirements
In LED production, the finished LED chip presents the first
opportunity to determine the properties of what will become an
LED. The LED chip is a key component, representing 40% of the
value of an LED. Accurate measurements of optical and electrical
parameters exhibited by the dies on the wafers are essential
for ensuring high quality of the finished LEDs.
MultiDie Testing: 70,000 Dies an Hour
Instrument Systems joined forces with Süss Microtec AG to
develop the fastest wafer probing system on the market.
The MultiDie Testing procedure allows up to 16 dies to be tested at
once using a specially developed probe card. Since the electrical
switching times are significantly shorter than the traverse times
of the probers, this
significantly increases
throughput. Based on
the fast probers in the
BlueRayTM Series and the
LED Tester from Instrument
Systems, MultiDie Testing increases the throughput by a factor of
four compared with conventional systems.
The LED Tester from Instrument Systems is ideal for meeting
the special front-end measuring challenges and now includes a
dedicated wafer mapping software module. The CAS140B/CT CCD
array spectrometer and fast series 2600 current sources from Keithley
guarantee maximum accuracy and very short measuring times.
The EKT-10x fiber-optic measuring adapter was specially
developed for taking measurements on wafers. It features
particularly high light throughput and permits very short
measuring times, even for wafers where light levels are low due
to the missing optical packaging. The compact design enables it
to be positioned between the measuring microscope and wafer
without compromising visual inspection of the contacts.
Your total light and display sensing solution.
The Turnkey System for
Industrial Applications
CAS140CT Array Spectrometer:
The Core of the LED Tester
The LED Tester comprises the following components:
The CAS140CT Array Spectrometer is the successor to the proven
CAS140B model. It was developed to meet special requirements
for taking measurements at LEDs.
CCD Array Spectrometer CAS140B/CT
LED Measurement Adapters
Keithley 2400/2600 Sourcemeter
Scanner (optional)
I/O Card
Connection Box for Handler
Industrial PC
LED Tester Software
The CAS140B and CAS140CT array spectrometers are used for
optical measurements, guaranteeing maximum accuracy for all
LED wavelengths including white. Optical probes meeting the
recommendations of CIE127 are used in conformity with the measuring
task at hand. The system is connected via flexible fiberoptic
cables and allows users to position the LED Tester as necessary.
The industry proven Keithley current units provide electrical
measurements. The new series 2600 Sourcemeter permits fast
and accurate recording of current and voltage values. Additional
channels of the Keithley 2600 can be used optionally to measure
LEDs with several chips. A scanner (e.g. Keithley 7001) facilitates
the particularly fast MultiDie testing of LED wafers.
The supplied software permits users to define a dedicated
configurable sequence of optical and electrical measurements of LEDs
with up to eight chips. All the results of these measurements can be
used individually or together for the purpose of classifying LEDs.
A reliable interface using an optocoupler allows the tester to be easily
connected to LED sorting machines and wafer probers from a wide
range of manufacturers. Up to 256 bins can be addressed.
It is also possible to exchange data between the LED handler and
wafer prober via an RS232 interface, e.g. batch or article numbers,
or wafer coordinates required to generate a wafer map. Specified
software functions can also be remotely controlled.
No moving parts are required in the entire measuring sequence
thanks to simultaneous measurement over the entire spectral
range. This enables very short measuring times and yields a
particularly robust and compact setup that can be used in all
production environments. By contrast, filter-based measuring
systems such as photometers and radiometers are limited
to determining only a single measured value (photometric or
radiometric). These systems are unable to record spectral data,
such as peak wavelengths.
This is the big advantage of spectrometers: within milliseconds
all parameters for the LED can be calculated from a single
measurement: i.e. spectral characteristics (peak wavelength,
full width at half maximum, etc.) as well as all photometric
characteristics (luminous intensity or luminous flux), radiometric
characteristics (radiant intensity or radiant power), and
colorimetric characteristics (dominant wavelength, color
coordinates, color temperature, etc.).
Most of these optical parameters are determined by integration of
the measuring signal over the entire spectral range. Particularly
in the case of narrowband LEDs, the result of analysis can be
negatively affected by an unwanted background signal (stray light,
detector noise, etc.). Thus, the CAS140CT has an even further
improved signal dynamic range compared with the CAS140B. This
guarantees the same high level of measuring accuracy over the
entire spectral range, unlike with typical low-cost spectrometers.
The lower dynamic range of the latter and the high level of straylight cause substantial measuring errors with red, blue, and in
particular white LEDs.
Cooled, back-illuminated CCD sensors are therefore exclusively
used as detectors in the CAS140B/CT. By contrast, with
conventional CCDs these are characterized by a much higher
signal sensitivity and very low signal noise.
The LED Tester is available in two configurations: as a turnkey
system installed in a robust 19-inch rack or as individual
components with a standard PC.
Your total light and display sensing solution.
Four CAS140CT models are available for
various spectral ranges:
CAS140CT-151
360nm – 830nm
CAS140CT-152
200nm – 800nm
CAS140CT-153
380nm – 1040nm
CAS140CT-154
250nm – 1050nm
The CAS140B/CT is supplied with a motorized shutter that permits
automatic darkcurrent measurement without interrupting the test
process. A filter wheel is also installed as standard. It features
four neutral-density filters (OD1 to OD4) and is controlled by the
software. All the filters are calibrated so that it is a simple matter to
switch from low light levels to high-power LEDs using the software.
Measurement Adapters:
CIE compatible
Special adapters are available for use in production for luminousintensity (ILED,B) measurements in conformity with CIE127.
The measuring adapters for taking measurements of luminous intensity (ILED,B) are
positioned at a defined distance from the LED tip. Shortened versions for mounting
above the test specimen are available for use in production scenarios.
Integrating spheres with different diameters (75 mm and 150 mm)
are supplied for luminous flux measurements and are available
with a protective glass cover to prevent contamination with dirt.
Instrument Systems also has extensive know-how in the design of
integrating spheres for a wide range of applications.
150 mm integrating sphere for measuring luminous flux in production settings. A
protective glass cover prevents ingress of dirt and contaminants.
A special EKT series fiber-bundle adapter has been developed
for wafer probing applications. It permits a particularly high light
throughput, and the compact design facilitates observation using
the inspection microscope.
All measuring adapters are connected to the spectrometer using
flexible optical fiber bundles. This allows adapters to be changed
quickly and gives users flexibility when assembling the adapters
and setting up the tester.
Your total light and display sensing solution.
Calibration: the Basis for Accurate
Optical Measurements
The Flexible Interface:
Simple Connection to All Handlers
Each spectrometer is carefully calibrated at Instrument
Systems together with the associated measuring adapters. All
calibrations are directly traceable to PTB and NIST national
standards. This is the only way to guarantee uniform quality
and reproducible measurements.
The LED Tester places minimal requirements on the LED
Handler. This means it can be easily connected to most
handler systems.
LED Handler
Ismeca (Switzerland)
Nihon Garter (Japan)
MBL (Germany)
ASM (Hong Kong)
Waferprober
Suss Microtec AG (Germany)
(MultiDie Testing)
Wentworth (UK)
Dong Wu (Korea)
Reliable Current Sources:
Keithley 2400/2600 and Scanner
The proven Keithley 2400/2600 sourcemeters are used to
power LEDs and to take all electrical measurements. The LED
Tester can perform any number of electrical measurements
in the forward and reverse direction, independently of any
optical measurements taken.
If the connected handler fails to ensure the correct orientation
of the LED, the polarity of the LED can be tested and the
electrical connection can be reversed as necessary.
Keithley 2600 Sourcemeter und 7001 Scanner
Several channels of the Keithley 2400/2600 can be used to take
measurements at multichip LEDs. This setup means that power
can be supplied independently to as many as eight chips at the
same time. No limits are imposed on the setup of the LEDs. The
LED chips can be individually wired or wired with a common
cathode or anode.
A fast scanner is required for MultiDie testing. This permits serial
tests to be carried out on up to 16 dies. Since the switching times
of the scanner are only a few milliseconds, throughput is ramped
up significantly compared with conventional wafer probing.
It is also possible to perform all measurements in four-wire
configuration in order to enhance measuring accuracy and
eliminate line effects.
All communication is carried out via a digital I/O card. The handler
specifies a Start Of Test signal (SOT) once the LED has been positioned
and contacted. The computer of the LED Tester then takes control,
carrying out the defined measurements and classifying the LED
accordingly. The sorting result is output as a function of the handler bin
number at five to eight digital outputs (32 to 256 bins). At the same time,
an End Of Test Signal (EOT) prompts the handler to position the next LED.
This means a complete test cycle can be performed in less than 50 ms.
Your total light and display sensing solution.
Tester Software:
The tester software was developed from scratch in order to
provide operators with a flexible but easy-to-use interface,
delivering a wide range of functions. All settings can be accessed
from a user-friendly menu. Depending on the application, users
can select various results and determine how they are displayed
on the monitor.
One of many options for displaying results, e.g. with bin frequencies, failure
statistics, spectrum and CIE diagram.
Hardware setup allocates a dedicated page to each unit for
configuring parameters and settings.
The results can be sorted to users’ requirements on the basis of a
decision tree. A software wizard assists in setting up the decision
tree quickly.
Menu for configuring the sorting criteria in the form of a decision tree. The
previously defined measurement and the desired test result are selected on the
right-hand side and assigned limit values. The flow chart generated in this way
is shown on the left-hand side. The table below gives a quick overview on the
sorting criteria.
A dedicated module is available for wafer probing which includes a
versatile display for the wafer map. Distribution over the wafer can
be displayed for all the selected results.
Settings for the Connector Box of the LED Tester: Stored configurations can
be called up for various handler and wafer prober types so that installation
expenditure is minimized.
Wafer mapping: All results – intensity distribution across the wafer is shown here
– can be displayed as a colorcoded overview card.
Your total light and display sensing solution.
Functions in Detail
Hardware settings
CAS140CT/CAS140B
Keithley 2400/2600 Sourcemeters
Scanner
Handler interface
Default selection for known handlers and wafer probers
Polarity test
User-configurable data communication via RS232
Multi chip LEDs (optional)
MultiDie probing (optional, together with wafer probers from Süss Microtec)
Measurement parameters
Optical and/or electrical measurements
Current/voltage mode
Current/voltage limits for protecting the LED
Current flow times for thermal stabilization of the LED
Density filter
Range for spectral evaluations
Noise suppression
Sorting criteria
Setting upper and lower limits for sorting each measured value
Formula editor for calculations that can also be used for sorting
Sorting by color ranges in the CIE chromaticity space
User definition of color ranges as polygone lines
Any AND/OR links for all sorting criteria
Optional assignment of sorting bins
Allocation of colors and names to each bin
Grouping several bins in a bin group
Selection of statistical samples
User-friendly editor with copy & paste functions
Reporting results
List of measuring results
LED spectra
Bar chart of bin sorting
Sorting criteria with frequencies
Failure statistics as histogram or pareto diagram
Display of all results in a wafer map
User selection and configuration of all displays
Other functions
Superuser mode for protection against unauthorized changes
Storage of jobs with all settings, sorting criteria, etc.
Report builder with company logo
Your total light and display sensing solution.
Ordering Information
Order Number
Description
LEDTEST-100
LED-Tester with rugged 19“ enclosure; incl. industry-grade Windows 2000 PC, Keithley 2400 Sourcemeter, tester software with CAS-DLL, and
complete wiring
LEDTEST-110
LED-Tester; including desktop Windows 2000 PC; Keithley 2400 Sourcemeter, tester software with CAS-DLL, and complete set of cables
LEDTEST-300
Scanner Option for testing LEDs with up to 5 chips in one packaging; includes Keithley2700 scanner and software extensions
Model
Spectral range
Spectral resolution
Data point interval
CAS140CT-151
360 to 830 nm
2.2 nm
0.4 nm
CAS140CT-152
200 to 800 nm
2.7 nm
0.6 nm
CAS140CT-153
380 to 1040 nm
2.8 nm
0.8 nm
CAS140CT-154
250 to 1050 nm
3.7 nm
0.8 nm
LED-Tester basic system (without CAS140B/CT spectrometer) *1
CAS140CT Spectrometer
Measurement adapter
LED-433-15
ILEDB measurement adapter for luminous intensity; incl. fiber bundle; shortened version for handler; (380 to 1050 nm)
LED-434-15
ILEDB measurement adapter for luminous intensity; incl. fiber bundle; shortened version for handler; (190 to 1050 nm)
ISP75-250 *2
Integrating sphere for luminous flux measurement, incl. fiber bundle; (380 to 1050 nm)
ISP75-251 *2
Integrating sphere for luminous flux measurement, incl. fiber bundle; (240 to 1050 nm)
CAL-120
Calibration of radiant and luminous intensity; 360 to 1050 nm
CAL-121
Calibration of radiant and luminous intensity; 200 to 780 nm
CAL-140
Calibration of radiant and luminous flux; 360 to 1050 nm
CAL-141
Calibration of radiant and luminous flux; 240 to 780 nm
Calibrations
Remarks:
1) For optional configurations for testing at Multi Chip LEDs or MultiDie Testing of wafers please contact Instrument Systems or your local representative.
2) For implementation on a handler system customized changes of the integrating sphere may be necessary
Instrument Systems is continually working to develop and improve products. Any technical changes, errors or misprints
do not form grounds for compensation. The company`s Terms of Delivery and Payment apply in all other respects.
Contact information
Instrument Systems - Operating Globally, Acting Locally
Instrument Systems is the premier company for light measurement. As a subsidiary company of Konica Minolta we have access to
resources over the long term and to a global network – our mission is your solution, anytime and anywhere.
World-class customer support is rewarded with customer loyalty - a top priority at Instrument Systems.
Neumarkter Str. 83
D-81673 München, Germany
Phone: +49 (089) 45 49 43 - 0
Fax: +49 (089) 45 49 43 - 11
[email protected]
www.instrumentsystems.com
Konica Minolta Sensing Americas
Konica Minolta Sensing, Americas represents Instrument Systems in North America and Canada with a high level of expertise in marketing
optical measuring instruments. High-quality customer support is based on a track record of close cooperation and constant exchange of
information and know-how.
101 Williams Drive
Ramsey, NJ 07446 USA
Phone: 201-236-4300
Toll Free: 888-473-2656
Fax: 201-785-2480
[email protected]
sensing.konicaminolta.us
Your total light and display sensing solution.
Technical Specifications
LED-Tester
Measurement cycle
Shortest measurement with 1-Chip-LED
32 msec *1
Shortest measurement with 3-Chip-LED
140 msec *1
Interface to handler
Digital Inputs
End of Test
Digital Outputs
Start of Test, Busy, End of Sequence (MultiDie Testing), Bin-results (8x)
Connections
Optical isolation of all In-/Outputs
General data
Size and weight
553 mm x 660 mm x 600 mm (W x H x D); 76kg
Operating conditions
15°C to 35°C; relative humidity max. 70%
Power consumption
200W at 230V; 175W at 115V
Electrical measurements with Keithley 2600 & Scanner
Keithley 2600 *2
Current range
0 to ± 3.0 A
Voltage range
0 to ± 40 V
Number of channels
1 to 8 optional
Max. output power
0 to 40W
Scanner (for Multidie Testing)
Number of Chips
Up to 16
connections
Common cathode/anode
or separate connections
2- or 4-wire measurement for all single chips; automatic test of polarity
Optical measurements with CAS140CT
Model
CAS140CT-151
CAS140CT-152
CAS140CT-153
CAS140CT-154
Spectral range
360 to 830 nm
200 to 800 nm
380 to 1040
250 to 1050
Spectral resolution *3
2.2 nm
2,7 nm
2,8 nm
3.7 nm
Wavelength accuracy
0.3 nm
Detector
Back-illuminated CCD, 1024 x 128 Pixel (binning mode)
Integration time
9 ms to 65 s
Photometric measurements
Luminous intensity
Luminous flux
Measurement range
0.02 mcd to 500 cd *4
0.2 mlm to 3000 lm *5
Accuracy *6
± 4%
± 5%
Reproducibility of single system
± 0.5%
Reproducibility system to system *7
± 1.5%
Colorimetric measurements
Accuracy
Reproducibility
Single system
System to system *7
Dominant wavelength *8
± 0.5 nm
± 0.01 nm
± 0.1 nm
Color coordinates (x,y) *8
± 0.002
± 0.0001
± 0.0013
Notes:
*1 SOT to EOT with Keithley 2600, integration time 9 ms without polarity test. The polarity test requires roughly an additional 60 ms.
*2 Other ranges possible with the Keithley 261x models; for MultiChip LEDs up to 8 channels of the Keithley 260x can be used.
*3 Applicable to 100 μm standard slit. Other values for optional 50 μm or 250 μm slit.
*4 Applicable to a signal-to-noise ratio of 10:1, for yellow LED with 585 nm and with LED433 adapter.
*5 Applicable to a signal-to-noise ratio of 10:1, for yellow LED with 585 nm and with ISP75 adapter.
*6 Immediately after calibration, relative to the calibration standard, for diffuse LEDs and without density filter.
*7 For the same combination of CAS140B/CT model and measurement adapter. The value applies to a single standard deviation.
*8 For adequate signal dynamic range and after calibration. The values relate to twice the standard deviation.
In the interest of the continuous development and improvement of our products, we reserve
all rights to make technical changes to the information contained in our printed material.
Such changes, errata and printing mistakes do not constitute grounds for claims for
damages. The LumiCam series of measurement cameras may only be used for luminance
and chromaticity measurements of self-illuminating objects.
SAFETY PRECAUTIONS
For correct use and for your safety, be sure to read
the instruction manual before using the instrument.
Always connect the instrument to the specified
power supply voltage. Improper connection may
cause a fire or electric shock.
Certificate No : LRQ 09600941A
Registration Date : March 3, 1995
Certificate No : JQA-E-80027
Registration Date : March 12, 1997