Introduction
Thank you for your interest in JEOL products and services. JEOL designs and manufactures scientific instruments for high-level research and development activities . Our customers include scientists and engineers working in leading-edge academic and
industrial laboratories around the world. JEOL products and services enable them to pursue a variety of R&D applications that require high resolution imaging and analytical capabilities such as: basic observa­
tion and analysis, environmental science, information technology, semiconductor production, biotechnology, nanotechnology, and a broad range of industrial endeavors. Experts involved in the studies of medicine, biology, biochemistry, agriculture, materials science , metallurgy, ceramics, chemistry, petroleum, pharmacy, semicon­
ductors and electronic materials have been using JEOL products for 60 years . Our new products are easier-to-use than ever before and contribute to a high level of quality assurance and quality control during the production process. This Product Guide presents the most current high performance solutions from JEOL to meet your R&D requirements for electron optics, analytical, semiconductor, indus­
trial, and medical instruments and equipment. For more detai,ls or information about any of our products, please contact your nearest JEOL office. JEOL Ltd.
oSome instrument photographs include optional attachments. oSpecificotions subject to chonge without notice. oThis catolog includes products not affered to some territories . oWindows is a registered trademark of Microsoft Corp . in the U.S. and other countries; Macintosh is trademark of Apple Computer Inc., registered in the U.S. and other countries; UNIX is a regi stered trademark of X/Open
Corp . of the USA; NetWore is a registered trademark of Novell Inc. in the U.S. and other countries; NetWare
Lite is a trademark of Novell Inc. in the U.S. and other countries ; Pentium is a registered trademark of Intel
Corp . of the USA
oOther trademarks referenced in this catalog and marked with* are the property of our allied companies.
02 I Produc t G uide
Product
Name:
JEOL Ltd. [I'-JIHON DEI'-JSHI KABUSHIKI KAISHA)
President:
Gon-emon Kurihara
Guide Establishment: May 30,1949
Capital:
6,740 million yen
Employees:
Consolidated 2,709
Electron Microscopes
Transmission Electron Microscopes (TEM] .......... . .... . .
Scanning Electron Microscopes
Energy Filter Electron Microscopes Scanning Electron Microscopes (SEM] ................ ....... . .......... . ........... . ........... ........ 6 Ion Beam Application Equipment
Analytical Scanning Electron Microscopes MultiBeam System .............................................................. . .................. . ... ....... 8 ···· · ·· · ··········· · ···········4 Focused Ion Beam System Cross Section Polisher Ion Slicer Peripherol Equipment .................. •.................. •.•.. . .. .... •.•.... •.... •.•.. .. . .... . .... ... ....... 10 Surface Analysis Instruments
Electron Probe Microanolyzers ........................ . .......... ....... . .... . .................... . ...... 11 Photoelectron Spectrometers (XPS) X-ray Fluorescence Spectrometers
Semiconductor Equipment
Auger Microprobes Energy-Dispersive X-roy Fluorescence Spectrometers· .......................................... ····12 Electron Beam Lithogrophy Systems (0 varioble-shoped electron beom) ......... . ........... 13 Electron Beam Lithogrophy Systems (a spot beam lithogrophy system] NMR Spectrometers
Mass Spectrometers
NMR Spectrometers················································································· . ·. ······· 14 Time-oF-Flight Moss Spectrometers (TOFMS) ................. . ........... . ........... . ................. 16 Gas Chromatograph Mass Spectrometer Liquid Chromatograph Mass Spectrometers ESR Spectrometers········································ .................................................... 17 ESR Spectrometers
Electron Beam and plasma
Application Equipment
Electran Beam Evaparation Source ............. . ........... . ...... . ........... . ........... . ... .. .. ..... 18 Clinical Chemistry Analyzers
Clinical Chemistry Analyzers ................................................... ···························19 High-Power Electron Beam Source Built-in Plasma Source Producl Guide I 03
Electron Microscopes -3 OOF
IJEM- RM1300
Ultra High Voltage Electron Mi croscope
Fi eld Emission Electron Microscope
Using a high voltage electron beam giving
Modern electron microscopes can integrate
high transmission, this microscope permits
variou s imaging devices and analyzers for
the direct observation of the 3-D structure
nano-area analysis of morphology, structures
of thick specimens, Ihe direct observation
and chem ical states. This advantag e is
of beam damage and the observation of
drawi ng increasing expectation s from
sensitive biological specimens with little
researchers. The JEM-31 OOF achieves high­
damage. It features great operational ease
reso lution im ag ing and nan o-probe
a nd s t ab il it y. Th e JEM-ARM 1300 is
formation. Also, the JEM-3100F has user­
essential for atomic level structural imaging
hiendly operation tools for smooth operation
and 3-D observations.
of the TEM with various devices and a new
p, ,
control system for system expandability. This
0.10 nm (with top entry slage)
0.12 nm (with side entry stage)
400 to 1,300 kV
x200 to 1,500,000
advanced analytical TEM all ows high­
accu racy, eHicient acquisition of valuable
infonmation from nano-materials.
0.17 nm
:R . 100,200,300 kV
X60 to 1,500,000
I JEM-3200FS
I JEM-ARM200F
Fi eld Emission Electron Microscope
Atomic Reso lution Analytical Electron Microscope
(Equipped with In -Co lumn En ergy Filter)
The JEM-ARM200F, incorporating a STEM
Cs COrTector and a microscope column with
A fi eld emission electron microscope that
gives full play to not only high-resolution
dramatically improved mechanical and
im ag ing, but also nanoarea ana lys is.
electrical stability, achieves the wo rl d's
Equi pp ed with a 300 kV FEG and an
highest STEM (HAADF) reso lution of 0.08
in-colu mn energy filter. Incorporation of a
nm as a commerci a l TEM . Th e
new, rotation-free image-forming optical
Cs-co rrected extremely small elec tron
system facilitates acquisition of TEM images
probe achieves a remarkab ly increased
and diffraction patterns as well as provides
current density, one order magnitude larger
stable spectra. The combination of the 300
than conventional TEMs. Thus, the JEM­
kV FEG and the energy filter oHers new
ARM200F provides ultimate atomic -level
many solutions for a wide range of research
analysis and also higher throughput w ith
fields.
dramatically shortened measurement time.
~
_
Ai: - ~III
n
Q17nm
J VC,l "". Max 300 kV
,\>L'(Jrlllallic
I
Pc t I
0.08 nm (STEM)
0. 19 nm (rEM)
0.11 nm (With TEM Cs corrector)
X 100 to 1,500,000
I VCi! JG . 80 kV, 200 kV
x50 to 2 ,000,000
I JEM-2200FS
Field Emission El ectro n Microscope
JE
-2100F
Fie ld Emission Electron Microscope
(Equ ipped 'with In -Colu mn Energy Filter)
The field emission electron gun (FEG), which
A field emission electron microscope
brightness and high coherence. is essential
and a new in-column energy filter, which is
for high-resolution observation and nano
optimally configured for analytical functions,
area analysis. The JEM-2100F, featuring
such as element analysis analysis and stage
advanced digital operation, is an integrated
analysis. The use of a new, rotation-free
TEM th at g ives full play to its various
image-forming optical system makes it easy
functions.
to compare TEM images and diffraction
P " lr'
patterns. Since the microscope allows
~.cC68T<!llf'n 'm tage
observation of wide- fi eld energy- filt ered
'v1a:.; .tCBt
images, combinatio n w ith the op tio nal
tomography function enables acquisition of
three-dimensional information with a w ide
field and a high contrast.
04 I Produ CI Guide
provides an elec tro n bea m w ith high
equipped with a 200 kV field emission gun
1: O. 19nm
11
I
160 kV, 200 kV
x50 to 1,500,000
...:
I
,
.
"
:11.
:..L
..~
.
EM-~800
•
•
1
EM 2100
Multi-Purpose Analytical Electron Microscope
Electron Microscope
The JEM-2800 is a new TEM that achieves
The JEM-2100 is a new-generation, 200 kV
nano-area analysis through Automation and
analytical electron microscope. The JEM­
Convenience, while being Easy- to-use so
2100, which incorporates an integrated PC
that expert results can be achieved by
system for various functions WITh excellenl
operators of any skill level. Its advanced
cost performance, supports research and
electron optical system makes IT possible to
development in wide scienlific fields, ranging
periorm high-resolution TEM and STEM
from biotechnology to materials science.
imaging , EDS, EELS, tomography and
in-sit u observation on the same sample
wilhout sacrificing any of Ihese capabilities.
-
'
r__•
: 0.2 nm (STEM)
0.1 nm (rEM)
1 '
100 kV, 200 kV
x 100 to 200,000,000
Pont. "liJt...;I\ 0.19 nm
~=I nl!ng vr'l, qe 80 10 200 kV
I.lagnl ' 11 X50 to 1,500,000
I JED-2300T JEM-1400Plus
Electron Microscope
Energy Dispersive X-ray Spectrometer
The JEM-1400Plus is a versatile
The JED-2300T, installed on a TEM, can
transmission electron microscope (rEM) for
easily pe rform qualitative/q uantitative
a wide range of applications inc luding
analysis and line /a rea analysis of
biology, polymers, nano technology, and
advanced materials.
The JEM-1400Plus uses a single camera for
/
• ..!
microareas, WITh high energy resolution. This
EDS employs a JEOL's unique ultra-thin
window detector with gate valve protection
imaging for view area seach (x10) to data
mechanism, making it possible to obtain
aquisition.
high-sensitivity analysis data particularly
New operation panels with the organic EL
from light elements.
buttons give yo u simpl e and intut ive
Ivl I
operation.
p~
:
f""
." r::;-
.... ,,"'
',-,11')(1 0.2 nm
'u
'.
(;d.,
_,
-II(I"/~'
Qualitative/quantITative analysiS, line/area analysis
AI 'If,'"llt>ie elements: Be to U, B to U or Na to U
.40 10120 kV
x l0tol,2oo,OOO
Prod u c l G u ide
I 05
-
~
.-
':
.
-
­
-
.....--;,.
-
~-
.
-
Scanning Electron Microscopes JSM 7800F
Field Emission Scanning Electron Microscope
The JSM-7800F, equipped with a newly developed super hybrid objective lens, is a
cutti ng-edg e thermal FE- SEM that successfully combines ultrahigh-resolution
imaging with fast and high-accuracy elemental analysis. Magnetic specimens can
be observed and analyzed at high magnification. The JSM-7800F also enables
researchers various analyses such as EDS, WDS, EBSD and CL.
•0.8 nm (15 kV), 1.2 nm (1 kV)
0.01 to 30 kV . x25 to 1,000,000 I JSM-7600F
JSM.. 7500F
Field Emission Scanning Electron Microscope
Field Emission Scanning Electron Microscope
The JSM-7600F is a state-of-the-art thermal
The JSM-7500F. developed for
FE-SEM th at s u ccessfu ll y combines
nanostructure characterization. is equipped
I(~
ultrahigh-resolution imagi ng with optimized
analytical functionality such as high-speed,
with the Gentle B eam function, which
~ .'~tn~ ~=--
high-accuracy analyses.
1.0 nm (15 kV), 1.5 nm (1 kV)
0.1 to 30 kV
x 25 to 1.000.000
-
-' rr
-
x 100,000 magnification even with 100 V
low electron energy.
-
- .­
o
G
enables researchers observation at
1.0 nm (15 kV), 1.4nm (1 kV)
-di',y ,'Ollaqb 0. 1 to 30 kV
'Wll
X25 to 1,000,000
Jll
f.
~.
-,
JSM-7 OOF
Field Emi ss ion Scanning El ectron Microscope
The JSM-7100F is a versatile high performance analytical FE SEM . The electron
optics produces the maximum 200 nA probe c urrent w ith the patented in-lens
thermal FEG and a small probe diameter even at large probe curren ts w ith the
patented aperture angle optimizing lens.
The objective lens is the field free type. This lens is suitable for high precision EBSD
analysis and characterization of a magnetic specimen.
The vacuum system employing a TMP combined and a specimen exchange airlock
chamber. A life of emitter is prolonged by the high quality vacuum in the gun
l
I
chamber.
8
II I
I lilllll
06 I Producl Guide
>=\ -
II
1111
111111
11111111
1.2nm (30 kV), 3.0nm (1 kV)
. 0.2 to 30 kV
. x 10 to 1.000,000
­
I SM-6510
I )SM-66 0
Scanning Electron Microscope
Scanning Electron Microscope
The JSM-6510 is a high-performance SEM
The JSM-6610 is a high-performance SEM
__-,
{, .~\
__I that is equipped with a superb electron
that is equipped with a superb electron
optical system and a general-purpose large­
optical system same as the JSM-6610 and
specimen chamber to accommodate a
a general-purpose specimen chamber to
specimen up to 200 mm diameter. The
accommodate a specimen up to 150 mm
JSM-6610 incorporates newly designed
diameter. The JSM-651 0 incorporates
software for easier SEM operations in a
newly designed software for easier SEM
variety of applications.
operations in a variety of applications.
II
1
3.0 nm
r.r TJ '01 "q& 0.5 to 30 kV
<,r--
M~1fII\C3IKlr
I J5M-A/LA series
x5 to 300,000
J5 -LV series
Low Vacuum SEMs
Analytical Scanning Electron Microscopes
The JED-2300, EDS developed by JEOL, is
The low vacuum SEM consists of a
embedded in the compact SEMs. The
conventional high vacuum mode and a low
footprint is same as that of the basic SEM.
vacuum (LV) mode. One can select the
The SEM and EDS are operated as one
vacuum mode with a click on the menu.
seamless system to provide comfortable
The LV mode enables one to observe and
and efficient operation. A SDD type EDS
analyze non-conductive specimens. The
detector does not require liquid nitrogen.
specimen chamber is kept at low vacuum
EDS analysis is ready whenever you need it.
so that highly out-gassing specimens can
be easily observed.
1-!lh'lIt\
3.0 nm
Resolution HV
LV
4.0nm
Magnification
Accelerating voltage
Resolution HV
x5 ­
0.5 ­
30 kV
----
LV
4.0nm
300,000
Low vacuum range
0.3 ­
3.0 nm
- - - -10-270
-4.0 nmPa
30 kV
I JASM-6200 C airScor e™
Atmospheric Scanning Electron Microscope
The JASM-6200 allows high-resolution light microscope/SEM observation at
atmospheric pressure. A. specimen is held at normal atmospheric pressure. Dynamic
observation of physical or chemical reactions can be made in liquid or gas. In addition,
for biological applications, difficult dehydration and drying processes are not needed,
dramatically reducing specimen pre-treatment time.
Bnm I·' 10,20,30 kV I I.. '
Product Guide I 07
JSM-60l0 AILV
InTouchScope
The InTouchScope incorporates a highly intuitive SEM interface with multi-touch
technology. The user can expand application windows and orchestrate aJl functions
just by touching the screen.
)';:!..­
: 4.0 nm (20 kV) : 5.0 nm (20 kV) : 0.5 1020 kV x810 300,000 . .-
JSM-6010LA
I JCM 6000
NeoScopeTM
JCM-6000 NeoScopen~ let you observe a specimen at much higher magnification
than a light microscope with the same simple operation of a light microscope. The
observation image appears automatically when a specimen is inserted, and you can
go up to the maximum magnification of x60,OOO quickly with the automated
operations.
JCM-6000 NeoScopem is equipped with a TMP for quick start.
The installation is easy. The wall outlet (100V AC) is the only utility needed. Cooling
water is not necessary.
F"X.
SI
. X10 10 60,000 Max. 70mm dia. ' -:'
Ion Beam Application Equipment IB-09010 p
IIB-09020C
Cross Section Polisher (CP)
The IB-090 10CP Cross Section Polisher
The IB-09020CP Cross Section Polisher
makes a cross sect ion by irradiating a
(CPIT) creates a cross section in a manner
spec imen with argon ion beam along an
similar to the IB-09010CP Its built-in CCO
edge of a s hield plate placed on a
camera al lows real-time monitoring of a
specimen. This is an innovative specimen
cross-section during polishing.
preparation device for specimens studied in
SEM and EPMA.
08 I Pr oduct Guide
Cross Section Polisher (C PIT)
I J18-4601
Mu Iti Beam System
The JIB-4601 F MultiBeam System unites the unique imaging and analytical capabilities
of the High Power Optics employed in the TFE SEM and a high-performance FIB
column in a highly efficient and powerful system. The JIB-4601 F offers an easy-to-use
tool for highly automated sample preparation combined with high-resolution imaging
and sub-micron analysis of the specimen cross-section.
5 nm (FIB), 1.2 nm (SEM)
0.2 kV to 30 kV
(5 kV sleps) x30 to 1,000,000 (observation / milling) I J18-4000
I J -4501
MultiBeam System
Focused Ion Beam System
The JIB-4501 MultiBeam System achieves
Top of the line high-throughput
surface/internal 3D imaging and analysis
processing
with simple operation. This system also
Compact size for flexible layout ­
has optimum geometry for all functions
Installation space reduced by 20%
from FIB, SEM observation to EDS/EBSD
(compared to JEOL conventional
analyses.
models)
R~
.Iul
A .. " I
Superb performance at low accelerating
5 nm (FIB), 2.5 nm (SEM)
t!lrx]
I' J' 0.3 kV to 30 kV
(5 kV steps)
Magl1lhcnli! X30 10 300,000
(observation / milling)
N,
voltage
Stage Navigation System for fast
determination of observation position
R;-_
lit I 'f1
5 nm
'I.CI;IH~.ltn lJ'.IO
M~Q! I'
I!'
ltJi
1 to 30 kV
x60 (for searching field)
X200 to 300,000
IIB.. 09060CIS
EM-091001S
Ion Slicer
Cryo Ion Slicer
The Ion Slicer can easily prepare thin-film
The IB-09060CIS Cryo Ion Slicer
specimens for TEM without special skill. Prior
incorporates a specimen cooling
treatment required for the Ion Slicer is only to
mechanism in the EM-091001S Ion Slicer,
mechanically polish a specimen to 0.1 mm
for easy preparation of thin films/cross
thick. The optimally set Ar ion beam provides
high-quality thin films. In addition, this
innovative tool suppresses specimen damage
and contamination, such as lattice distortion
induced by mechanical polishing and
oxidation on specimen suriaces by chemical
• I
J
sections even for specimens susceptible
to thermal damage.
J
~.}.
treatment. The Ion Slicer is an echo-friendly,
efficient specimen-preparation tool.
Producl Guide I 09
-
--­
"
_••- . '
'. -,.
-',
-_ •• 1
-.~
[Peripheral Equipment ]
IJIC 410
Ion Cleaner
HDT..400
JEE-420 series
Hydrophilic Treatment Device
Vacuum Evaporators
"O ~
- --=­
The JIC-41 0 Ion Cleaner removes hydrocarbon
The HDT-400 applies hydrophilic treatment on TEM
The JEE-420 vacuum evaporator applies coating on
contamination on TEM specimens by exposing
grids and SEM specimen mounting blocks. The entire
SEM or TEM specimens with a variety of materials
specimens in glow discharge.
operation is automated.
including gold, platinum, carbon, chromium. The JEE­
420 applies shadowing on TEM specimens.
The treated specimens do not build up contamination
during observation in a TEM.
JEC..560
IJFC-1600
Auto Carbon Coater
Auto Fine Coater
%- -
C- Oo­
.......--n:u _ . __ a
0 0 0
o
0
The JEC-560 rapidly applies carbon coating on non-conductive specimens for
The JFC series sputter coater applies metal coating on SEM specimens quickly. Gold, element analysis with a scanning electron microscope or an electron probe micro
gold-palladium, and platinum can be applied. analyzers. JED.. 2300/2300F
Energy Dispersive X-ray Spectrometers
Dry SO Detector
The JED-2300/2300F is installed on a SEM or an EPMA and performs elemental
This unique box type Dry SD detector is designed for JSM-651 0 and JSM-601 0 series
analysis on micro areas. The Dry SD detector, an SDD type detector, is cooled
SEM. The detector is positioned at the optimum position.
electrically. It does not need liquid nitrogen cooling so that maintenance is not
required. Analysis Station, the unique EDS analysis software, is versatile with simple
operation,
System that links observed
images with analysis data
i\n'lIytl('.oIIUI1Chi'1$ Qualitative/quantitative
analysis, line/area analysis
All :/y!
A~Ilr;n
10 I Producl Guide
..
Instruments for Microarea and Surface Analysis X ...8230
IjXA-8530F
Field Emission Electron Probe Microanalyzer
Electron Probe Microanalyzer
D.
~) /~
. ~ ) =~=
'.
'j
.f
\
The JXA-8530F features an improved hardware that is used in the JXA-8500F (the first
.
The JXA-8230 is a newly developed EPMA, which succeeds a proven JEOL EPMA
FE-EPMA in the world), as well as newly designed user-friendly PC-GUI windows for
hardware and features newly designed user-friendly PC-GUI windows for efficient
efficient analysis and data operation. The FE gun of the JXA-8530F provides not only a
analysis and data operation. Sophisticated analysis menus are designed so that the
spatial (analysis) resolution of the order of 0.1 IJm, but also high-sensitivity X-ray
user can easily access target material analyses, offering stress-free operations.
detection, at low accelerating voltages and large probe currents.
I jPS-901 0 series
IjPS-9200
Photoelectron Spectrometer (XPS)
Photoelectron Spectrometers (XPS)
------
The JPS-9200 is an XPS that provides microarea analysis. A newly developed micro­
XPS with high-sensitivity and high-resolution is compactly designed on the basis of
tens enables high-sensitivity analysis from macro to microareas. Its stage accepts both
JEOL's many years of basic and application technologies on electrostatic lenses,
standard-size samples (10 X 10X2 mm) and large samples (up to gO mm in diameter).
analyzers, etc. The low-acceleration and large-current ion guns dedicated to permit
The stage-scan mapping method allows the acquisition of photoelectron images
XPS analysis of thin films with different thicknesses from surface atomic layers to
ranging from low magnification (50 x 18 mm) to high magnification (spatial resolution:
micron order thick specimen layers, The specimen chamber and etching chamber are
30lJm).
separated from each other in terms of vacuum, thus completely preventing the
contamination due to sputtering and facilitating the maintenance of ultrahigh vacuum.
I jAMP-9500F
Field Emission Auger Microprobe
fl
A field-emission Auger Microprobe, featuring the world's highest spatial resolution with
the minimum probe diameter of 3 nm (for secondary-electron image) and 8 nm (for
Auger analysis). The new hemispherical electrostatic energy analyzer (HSA) with a
multi-channel detector, optimized for Auger analysis. is suitable for chemical-state
analysis, The neutralizing ion gun allows Auger analysis of insulating materials. Its
specimen stage accommodates a large sample of up to 95 mm in diameter. Also. it is
expandabfe for an UHV-SEM .
ProduCI Guide
I 11
X-ray Fluorescence Spectrometers I ISX
400Rll
Element Analyzer
An energy-dispersive X-ray fluorescence spectrometer for environmental analysis,
./
which helps you comply with environmental regulations for hazardous substances
such as the RoHS and ELV directives in the EU and soil pollution in Japan. You can
easily analyze minute traces of Cd, Pb, Hg, Cr, etc. This analyzer is also suitable for
general analySiS including element analysis and thickness measurement using the FP
(fundamental parameter) method.
I JSX-31 OORll
Element Analyzer
An energy-dispersive X-ray fiuorescence spectrometer for environlnlntal analysis, which helps you
comply with environmental regulations for hazardous substances such as the RoHS and ELV
directives in the EU and soil pollution in Japan. This analyzer inoorporates a JEOL-made electrically
cooled Si(u] detector, making liquid nrtrogen unnecessary, as well as providing high sensitivity for
heavy-element analysis such as Cd, Pb and Hg. This analyzer is also surtable for general analysis
including eement analysis and thickness measurement using the FP (fundamental parameter)
method.
12 I Product Guide
Semiconductor
Eq Ipm nt 2
Electron Beam Lith ography System
Th e JB X -3200MV is a n e lec lro n bea m
lithography system developed for the production
of next generation, ultrahigh-precision masks
and reticles. This system employs a variable­
shaped electron beam o f 50kV and a step &
repeat specimen stage.
H ig h thro ug hp ut ena bl ed b y a new PEG
(Proximity Effect Correction) system
High-speed da la- transfer sys tem for a large
quanti ty data
High-precision design for masklrelicle production
5
Electron Beam Lithography System
Th e JB X-9 500FS is a spot beam
lithog raph y system developed to meet a
wi de range of applications with high
throughput and high precision periormance.
Thi s sys tem covers fields from the nano­
technology research to the production of
leading edge devices.
f . 100kV
_, ZrONV Schotlky emitter
maximum 300 mm wafer
r
Electron Bea m Lithography System
Th e JB X-6300 FS i s a s p o t b ea m
lithog raphy system developed to meet a
w ide range o f ap pli ca ti o ns with hi gh
resolution and high precision periormance.
This system covers fields from the nano­
technology research to the development of
next generation devices.
- -'
~=-~--I -~.
-
~
I
~
~-
25 kVl50 kVl100 kV
ZrONV Schottky emitte<
maximum 200 mm wafe<
.
Prod ucl Gu ide I 13
---------
-_.
-
--=
-~
-
-
-
:=-­ -
NMR Spectrometers I JNM-ECA/ECX series
FT NMR System
The JNM-ECA920 FT NMR System is a 920 MHz high-resolution NMR
spectrometer developed by JEOL. This spectrometer uses the superconducting
magnet, co-developed by National Institute for Materials Science and Kobe Steel
Ltd., which generates the high magnetic field. Created by combining Japan's state­
of-the-art technologies, this FT NMR System marks an important milestone in next
generation biology and nanotechnology, which call for high-magnetic-field, high­
resclution NMR analysis.
JEOL RESONANCE Inc.
,:' .~ :~,. ':
. \ .'\...~
..
.. ~\t..:,.,:.~:-.
.,
~
HNCACB spectrum of 13C(15N labeled
ubiqurtin
10,0
Solid 23Na-MQMAS spectrum of
N3.)P207
920 MHz magnet.
Photo courtesy: Nationallnstrtute of Natural Sciences Institute for
Molecular Science
The JNM-ECNECX series are versatile high-performance FT NMR spectrometer
system that utilize the latest digital and high-frequency technology. The ECA
spectrometer is applicable up to 1GHz and can be used for a wide range of
applications including liquid/solid NMR, protein analysis and diffusion coefficient
measurement.
INM-EC\ .cd"
JOO
Spectrometer
I
SCM Field strength
Bore diameter (mm)
~QO
;0(1
~uo
" 1)0
11110
Oscillator, receiver, power amplifier
Magnet
I
!
7.05T
54
I
I
I
9.39T
11 .74T
14.01T
16.43T
18.8T
54
54
54
54
54
Probe
5 mm Ttl tunable
JEOL RESONANCE Inc.
INM· fO. ".,rie,
.:---­
SCM Field strength
,
,I
7.05T
9.39T
Bore diameter (mm)
I
54
54
Spectrometer
Magnet
Probe
I
)Ol~
;011
~1111
.. ..!'..Oll
Oscillator, receiver, power amplifier
I
11.74T
54
I
14.01T
54
5 mm TH tunable
JEOL RESONANCE Inc.
14 I Produ c t Guide
IJNM-ECS 00 FT NMR System
NMR Systems For Modern NMR Spectroscopy!
The JNM-ECS400 i s a compact two-channel
spectrometer that retains the advanced capabilities of the
JNM-ECAlECX series (required installation space is one­
half compared to c o nventional NMRs) . Programmable
timing sequencers built into each RF and PFG c hannel
can independently control either s y nchronous or
asynchronous operations of each channel. Its standard
tunable broadband gradient probe, w hich integrates all
JEOL's newest technologies, is the high sesitivity room­
tempperature probe.
Ccmpact spectrometer chassis
Innovaten in JEOL NMR digrtal architecture
High-stability and high-accuracy digital spectrometer
High-sensrtivity new tunable probe
Full automalk: NMR with advanced software
•
JEOL RESONANCE Inc.
I ASC Series
Auto Sample Changer
An autom atic sample changer makes it
possible to measure many samples
:A.·'
sequentially by exchanging multiple samples
automatically one by one. Five changer
model s are available for 8 samples, 16
samples, 24 samples, 64 samples and 100
iT.
samples.
.............~.:: . .:....,-.....-­
ASC8 (8 samples)
~
ASC24 (24 samples)
u
ASC16 (16 samples)
JEOL RESONANCE Inc.
:.-...~
I
,
ASC64 (64 samples)
ASC100 (100 samples)
•
IJNM-ECA/ECX series
Solid NMR
=-
~
. . ....
,
:\
!
\
I
!.
"
l
l
,
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0
5ilJ!l
•
•
0
"1. -:-0
MAS conlroller
Solid NMR sampling kit
1(10."
"C/ ppm
'I
Sdid 13C-CPMAS spectrum of cholk: acid
Solid-NMR is a technique that measures solid samples (powder or film -like samples). This technique is also effective for measurement of samples not soluble in solvents (inorganic
samples, etc.) and of crystalline polymorph that is meaningful to measure at the solid state.
JEOL RESONANCE Inc.
Produci Guide I 15
Mass Spectrometers
I JMS-800D UltraFOCUS
Mass Spectrometer Dedicated to Dioxin Anal ysis
JMS- 800D UltraFOCUS is the optimal cho ice for ultra lowlevel race detec tion
app li ca tio n s, suc h as m o ni torin g for dioxins and related co mpoun ds e.g.
I JMS-700 (2) MStation
High resolution M ass Spectrometer
Pet c
::;err,
SIN 400
Polychlorinated Biphenyls (PCBs), Polybrominated Diphenyl Ethers (PBDEs) or drugs
of abuse, by high resolution-selected ion monitoring (HRSIM) gas chromatograph yl
. 60,000 (10 % valley)
: 0.2 ng of methyl stearate,
I~
(CVEI combination ion source)
. ~ a.Je . up to 10kV
mass spectrometry(GC/ MS).
R--""
Sen,t
>n : 80,000 (10 % valley)
Ily : 2, 3, 7, 8-TCDD 100fg S/N>2oo
(6 channels, 100 msec'/ch, Resolution 10000)
N,:,;;_ Jut' J '_'lllgEI : up to 10 kV
JMS-S3000
Matri x Assisted Laser Desorption/Ionization TOFMS
I JMS- T1 OOLP
LC-TOFMS
The JMS-S3000 is a MALOI-TOFMS' incorporating an innovative SpirarrOF ion optical
system. With superior capabilities than conventional MALDI-TOFMS, the JMS-S3000
provides sate-of-the-art anaiylical solutions for a wide range of research areas such as
functional synthetic polymers, materials science, and biomolecules.
'Malrix Assisled Laser Desorpllon/lonization Time·of-Flighl Mass Spectrometer
I JMS- T1 OOLP+DART
TLC-TOFMS
I JMS- Tl OOGCV
GC-TOFMS
"",·l
­
The JMS-T100LP+DART achieves simple and fast TLC/MS analysis. Accurate mass
The JMS-Tl00GCV is a fully automatic Gas Chromatograph -
measurement capabilit y of TOFMS also enables you to determine element
Spect rom eter (GC-TOFMS). This versatile MS system covers wide range of
compositions of the analytes.
applications in GC-MS analysis.
16 I Pr oduc i Gu ide
Time-ot-Flight Mass
~
"
1-
-. 1-:---- - .
I
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,
_
-
-, -
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=---­
=. • ""--.t.J
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I JMS-Ql 050GC
UltraQuad GClMS
The JMS -01050GC is an innovative, quadrupole mass spectrometer (OMS) that
achieves the highest-level sensitivity in OMS. It has a high ability of evacuation due
to the u se of a split flow turbo-molecular pump system (400 Lis) th at
c..JEOL
simultaneously evacuates the ion source and the detector. The use of a high­
accuracy hyperbolic quadrupole mass analyzer provides high resolution.
S-trapHS
Headspace Autosampler
The S-trap is a next-generation headspace autosampler providing ultra-low
concentration measurement, which was not achieved with a heads pace (HS) method
using conventional sample loop. In addition, the HS-GCMS system, combined '!lith a
JMS-01050GC Mkll quaorupole MS, guarantees detection of mold odor in water
down to 1 ppt.
ESR Spectrometers
I ES-CT470
I JES-X3 series
Liquid Helium Variable Temperature Controller
ESR Spectrometers
Recently, it has been widely
acce pted that even ret atively few
unpaired electrons in a sample can
affect the function of the material, so
lower detection limits (high e r
sens itivity) is required of ESR
measurements. JES-X3 Series has
achieved higher sensiti vi ty by
developing a lOIN-noise Gunn
oscillator for its new spectrometer.
JES-X320
JEOL RESONANCE Inc.
The ES-CT470 varies the sample temperature in the temperature range between 2.5 K
and 470 K. Temperature setting is performed by d igital display and the set
temperature is kept constant by automatic control circuits. Combined use with a UV
Irradiation device is possible. A GaAs etement is used as a temperatu re sensor,
\ .i III
\ I!II
a.6ST
1.3T
Maximum Magnetic Field
I
SweepW idth
I --;;;0.0-;-::::: 250mT
Pole Gap
Frequency Range(GHz)
Field Resolution (mT)
Correction by Marker
...
!I _
I. Operating System
_
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).,
1.4T
-- -
±0.01 - 500"m'_T_
'_ _ _--l
.::.
6::cmm
0 = '___ _ _-=60mc:m
'___~_ _'_75
'_::cmm
,:.;,,;.'___ _l
8.750 - 9.650 _ _ _ _ _ _-1
2.35
Standard
enabling high-accuracy temperature setling.
-, : 2.5 K to 470 K
. : ±0.01 K for 2.5 K to 4.2 K
±1% orO.5 K for 4.2 K to 470 K
_: 20 min 10 25 min (rom room temperature
: 0.8 to 2 Uh
_1_---
Windows 7
50Hz/60Hz
:5mm
JEOL RESONANCE Inc.
Produ c t Guide I 17
Industrial Equipm nt for thin-filnl formation and nlatel ial processing •
I
High-power Electron Beam Source
Electron Beam Source
JEBG-3000UB(300kW)
EBG-102UB6S
BS-60060EBS
JEBG-1 OOOUB(1 OOkW)
Electron beam sources for vacuum evaporation of metal and metal-oxide thin-films.
High-power electron beam sources for vacuum evaporation of metal and metal-oxide
We offer a wide variety of electron beam sources and crucibles. They have features of
for wide plastic films or large glass plates that are continuously fed. And they can also
excellent beam spot and energy density, and high-speed sweeping.
be used for vacuum melting of high-melting point metals.
1
.
raes
PG/BS.. 80020CPPS
Plasma Source
RF Generator
t'! ­
-
-
-
- -- -
- - -- -
.. .
0-
~
0 • •• -
BS-8002OCPPS (3kW)
BS-80011 BPG (6kW)
RF-56000 (Controller)
RF-12030 (3kW)
Plasma Sources are installed in a vacuum chamber and generate high-density plasma.
13 .56MHz radio-frequency power supplies for plasma generation and used for
Used as Ion Plating (Plasma Assisted Deposition) and it is possible to improve film
sputtering , CVD, etching and ion-plating. We offer 750W to 6kW generators and
properties for optilcal thin films, protective films and function films. Because high­
matching networks.
density plasma can be generated in a mass space, high-rate deposition to a large area
is possible.
DR
I
RF Induction Plasma System
Powder Feeder
Thermal plasma around 10,000°C (15,000° F) by RF inductive coupling. This thermal
Fine powder feeder that can feed 0.1 to 100 11m size fine powder continuously with
plasma is used for nano powder synthesis, fine powder spheroidization, thick film
carrier gas. We offer optional feeding rate controller and large capacity hopper.
deposition, multi composite membrane synthesis, CVD and harmful gas
decomposition.
18 I Pro duci Guide
Biochemical Analyzers
I JCA-BM series
Clinical Chemistry Analyzer BioMajesty' Series
JEOL's micro volume technology and unique sample pre-dilution mechanism realizes
---
high throughput chemistry analysis with reduced sample and reagent volume.
More than 4,000 systems have been placed in clinical laboratories allover the world.
BioMajesty
Series
lCA-BM 6010
lCA-BM 6050"
lCA-8M 6070
leA-BM 91 30
lCA-BM 8000 Series
• This produc t is distributed outside Japan by Siemens
Heatthcare Diagnostics under the ADVtA® brand name.
JCA-BM6050
I JCA-BMBOOO series
Ultra High Throughput Clinical Chemistry Anal yzer
I JCA-BM601 O/C
Compact & High Performance Clinical Chemistry Analyzer
.;
- ~-I
-!
"4
"
4
. ..
1lI IIIIilllllllllJl nlIlII Ii
JCA-BMB060
e>
JCA-BMSOOO series offer ultra high throughput chemistry analysis. up to 9000 testsl
I
JCA-BM6010/C is a compact, but efficient automatic analyzer that maintains the basic
hour.
concept of BioMajesty series while achieving the excellent capability of microanalysis
The pre-dilution unit, one of the BioMajesty family features, also continues the strong
with sample volume as small as 1 J.1L.
tradition in these series with interconnected multiple analysis modules: the key factors
BM6010/C als o o ffers fully automated HbA1c analysis with on-board hemolysis
that accomplish brilliant high throughput as well as downtime reduction with back-up
(optional). Simultaneous measurement of Glucose and HbA1c improves laboratory
capability.
workflow.
I JCA-BM6070
High Throughput High Performance Clinical Chemistry An alyzer
II. I
A Clinical chemistry analyzer with incomparable speed and accuracy, which achieves
hi gh throughput of 2400 testslhou r (includ ing ISE). The incorporated compact
workstation and user-friendly Interface with excellent operability leads the new trend of
the laboratory testing .
Pro duct Guid e I 19
S~~MCEA"'II:".
;.,.0..J;. \'0014007
$':'
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dEOLIS09001
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~~~
ARGENTINA
Telephone: 54-11-4552-3185
Facsimile: 54-11-4555-3321
AUSTRALIA & NEW ZEALAND
JEOL(AUSTRALASJA) Pty.Ud.
Suite 1, L2 18 Aquatic Drive
- Frenchs Foresl NSW 2086
Australia
Telephone: 61-2-9451-3855
Facsimile: 61-2-9451-3822
&150 14001CenrfiC<lled
INDIA
JEQL INDIA Pvt. Ltd.
Elegance Tower, Level 2, 2128
Old Mathura Road, Jasola Business District Centre,
Near Apollo Hospital Jasola,
New Delhi 110025, India
Telephone: 91-11-6472-2578
Facsimile: 91-11-4060-1235
BLUE STAR LTD. (HQ: Mumbaij
Analyticallnstrments Department,
Sahas' 41412 Veer Savarkar Marg
Prabhadery Mumbai 400 025, India
Telephone: 91-22-6666-4000
Facsimile: 91-22-6666-4001
BLUE STAR LTD. (DelhQ
Analytical Instruments Department,
E-44/12 Okhla Industrial Area,
Phase-II, New Delhi 110 020, India
Telephone: 91-11-4149-4000
Facsimile: 91-11-4149-4005
BANGLADESH
BLUE STAR LTD. (Calcutta)
Analylicallnstruments Department,
7, Hare Street Calcutta 700 001. India
Telephone: 91-33-2213-4133
Facsimile: 91 -33-2213-4102
A.Q. CHOWDHURY SCIENCE & SYNERGY PVT. LTD.
House No.1 2, Road No. 5A
Sector No. 11, Uttara Dhaka - 1230
Bangladesh
Telephone: 880-2-9980790, 8953450, 8953501
Facsimile: 880-2-8854428
BELGIUM
JEOL (EUROPE) B.V.
Planet ll, Gebouw B
Leuvensesteenweg 542,
B-1930 Zaventem
Belgium
Telephone: 32-2-720-0560
Facsimile: 32-2-720-6134
BRAZIL
JEOL Brasillnstrument09 Cienlilicos Llda.
Av. Jabaquara, 2958-5 0 andar-cj. 52
04046-500 Sao Paulo, SP
Brazil
Telephone: 55-11-5070 4000
Facsimile: 55-11-5070 4010
CANADA
JEOL CANADA, INC.
3275 Premier Rue #8,
SI-Hubert, Quebec J3Y 8Y6, Canada
Telephone: 1-450-676-8776
Facsimile: 1-450-676-6694
CHILE
ARQUIMED INNOVAnON
Arturo Pmt 828,Santiago, Chile
Telephone: 56-2-634-6266
Facsimile: 56-2-634-4633
CHINA
JEOL(BEIJING) CO., LTD.
Room Bl0l0/l110, Wantong New Wond Plaza No.2
Fuchengmenwai Street, XIcheng District,
Beijing 100037, P.R.China
Telephone: 86-10-6804-6321
Facsimile: 86-10-6804-6324
JEOL (BEIJING) CO., LTD., SHANGHAI BRANCH
Room 1505/1506, Nol300Xi Kang Road,
Jing an Dis!., Shanghai, 200040, China
Telephone: 86-21-6248-4868/4487/4537/4404
Facsimile: 86-21-6248-4075
BLUE STAR LTD. (ChennaO
Analytical Instruments Department,
No. 46, Garuda Building,
Cathedral Road, Chennai 600 086, India
Telephone: 91-44-4244-4000
Facsimile: 91-44-4244-4190
JEOL (BEIJING) CO., LTD., WUHAN BRANCH
Room A2117, Zhongshang Plaza Office Bldg.,
NO.7 Zhongnan Road, Wuhan,
Hubei, 430071, P.R.China
Telephone: 86-27-8713-2567
Facsimile: 86-27-8713-2567
JEOL LTD. (BEIJING) CO., LTD., CHENGDU BRANCH
1807A Zonglu Building,
NO. 35 Zhongfu Road, Chengdu, Sichuan, 610016
PR. China
Telephone: 86-28-86622554
Facsimile: 86-28-86622564
EGYPT
JEOL SERIVCE BUREAU
3rd Fl. Nile Center Bldg., Nawal Slree!,
Dokkl, (Cairo), Egypt
Telephone: 20-2-3335-7220
Facsimile: 20-2-3338-4186
FRANCE
JEOL (EUROPE) SAS
Espace Claude Monet, 1 Allee de Giverny
78290, Crolssy-sur-Seine, France
Telephone: 33-13015-3737
Facsimile: 33-13015-3747
GERMANY
JEOL (GERMANY) GmbH
Oskar-Von-Miller-Strasse 1a, 85386
Eching, Gennany
Telephone: 49-8165-77346
Facsimile: 49-8165-77512
GREAT BRITAIN & IRELAND
JEOL (U.K.) LTD. JEOL House, Silver Court, Watchmeaci, Welwyn Garden City, Herts AL71LT, U.K. Telephone: 44-1707 -377117 FaCSimile: 44-1707-373254 FARMING LTD.
Unit No.1 009, 1O/F., Prosperity
Mil/ennia Plaza, 663 King's Road
North Point, Hong Kong
Telephone: 852-2815-7299
Facsimile: 852-2581-4635
Facsimile:+81-42-528-3386
SERVICE & INFORMATION OFFICE NORWAY JEQL (Skandinaviska)AB Lorenvangen 23, 0580 Oslo, NORWAY Telephone: 47-2-2-64-7930 Facsimile: 47-2-2-65-0619 FINLAND
JEOL (Skandlnaviska)AB Ylakaupinkuja 2, FIN-02360 Espoo, Finland Telephone: 358-9-8129-0350 Facsimile: 358-9-8129-0351 SINGAPORE
JEOLASIA PTE. LTD. 2 Corporation Road 1't01-12 Corporation Place Singapore 618494 Telephone: 65-6565-9989 Facsimile: 65-6565-7552 SOUTH AFRICA
ADI Scientific (Pty) Ltd. 370 Angus Crescent, Northlands Business Park, 29 Newmarket Road ~~=;~g~~~'2~~1nt~~2_~~~bIlC of South Africa Facsimile: 27- 11 -462-1466 SPAIN
IZASA. SA Argoneses. 13, 28100 Alcobendas, (poligono IndustriaQ, Madrid, Spain Te~phone: 34-91-663-0500 Facsimile: 34-91-663-0545 SWITZERLAND
INDONESIA
JEOL (GERMANY) GmbH PT. TEKNOLABindo Penta Perkasa
Komplek Gading Bukillndah Blok lIll
JI. Bukfl Gading Raya Kelapa Gading Pennai,
Jakarta 14240, Indonesia
Telephone: 62-21-45847057/58/59
Facsimile: 62-21-45842729
Oskar-Von-Miller Strasse 1, 85386 Eching, Germany Telephone: 49-8165-77346 Facsimile: 49-8165-77512 ITALY
JEOL 0TALIA) S.pA
Centro Direzionale Green Office
Via dei Tulipani, 1
20090 Pieve Emanuele (MI) Italy
Telephone: 39-02-9041431
Facsimila: 39-02-90414343
KOREA
JEOL KOREA LTD.
Dongwoo Bldg. 7F, 1443, Yangjae Daero,
Gangdong-Gu, Seoul, 134-010, Korea
Telephone: 82-2-511-5501
Facsimile: 82-2-511-2635
KUWAIT
Ashraf & CO. Ltd. WLL.
PO. Box 3555 Safat 13036, Kuwait
Telephone: 965-1805151
Facsimile: 965-24335373
TAIWAN For EO ProQucts JIE DONG CO" LTD. 7F, 112, Chung Hsiao East Road, Section 1, Taipei, Taiwan 10023 Republic of China Telephone: 886-2-2395-2978 Facsimile: 886-2~2322-4655 For Mass Spectrometer Products:
Mass Solutions Technology Co., Ltd. 5F., No.79, Sec. 1, Xintai 5th Rd Xlzhi Dis\., New Taipei City 221, Taiwan Republic of China Telephone: 886-2-2698-9511 Facsimile: 886-2-2698-9512 For Semiconductor Products:
JEOL TAIWAN SEMICONDUCTORS LTD. 11 F-l, No. 346, Pei-Da Road, Hsin-Chu City 300, Taiwan. Republic of China Telephone: 886-3-523-8490 Facsimile: 886-3-523-8503 MALAYSIA
JEOL(MALAYSIA) SDN.BHD.(3S9011-M) 205, Block A. Mezzanine Floor, Kelana Business Center, 97, Jalan SS 7/2, Kelana Jaya, 47301 Petaling Jaya, Selangor, Malaysia Telephone: 60-3-7492-7722 Facsimile: 60-3-7492-7723 MEXICO
JEOL (BEIJING) CO" LTD., GUANG ZHOU BRANCH
N1601, World Trade Center Building,
371-375, Huan Shi Road East, Guang Zhou,
Guangdong Prov., 510095, PR.China
Telephone: 86-20-8778-7848
Facsimile: 86-20-8778-4268
HONG KONG
m
1-2 Musashino 3-chome Akishima Tokyo 196-8558 Japan Sales Division Telephone:+81-42-528-3381
AUSTRIA
JEOL (GERMANY) GmbH
Oskar-Von-Miller-Strasse 1a, 85386
Eching, Gennany
Telephone: 49-8165-77346
Facsimile: 49-8165-77512
GREECE
AvA ~
http://www.jeol.com/
JEOL Ltd.
COASIN SAC.l.yF.
Virrey del Pino 4071,
1430 Buenos Aires
Argentina
N. ASTERIADIS SA
56-58,S. Trikoupl Str. PO. Box 26140
GR-10022, Athens, Greece
Telephone: 30- 1-823-5383
Facsimile: 30-1-823-9567
II<
MGMT SYS.
Certain products in this brochure are controlled under the "Foreign
Exchange and Foreign Trade Law" of Japan in compliance with
international security export control. JEOL Ltd. must provide the
Japanese Government with "End-user's Statement of Assurance"
and "End-use Certificate" in order to obtain the export license
needed for export from Japan. If the product to be exported is in this
category. the end user will be asked to fill in these certificate forms.
JEOL DE MEXICO SA DE C.V. Arkansas 11 Piso 2 Colonia Napoles Delegacion Benito Juarez, C.P 03810 Mexico D.F., Mexico Telephone: 52-5-55-211-4511 Facsimile: 52-5-55-211-0720 PAKISTAN (KarachI) ANALYTICAL MEASURING SYSTEM (pvn LTD.(AMS LTD.) 14-C Main Sehar Commercia) Avenue Lane 4, Khayaban-e-Sehar, D.H.A-VII, Karachi·75500, Pakinstan Telephone: 92-21-35345581/35340747/35346057-8 Facsimile: 92-21-35345582 PANAMA
PROMED SA Parque Industrial Costa del Este Urbanizacion Costa del Este Apartado 0816-01755, Panama, Panama Telephone: 507-303-3100 FaCSimile: 507-303-3115 PHILIPPINES PHILAB INDUSTRIES INC. 7487 Bagtikan Street, SAY Makati, 1203 Metro, Manila Phillip pines Telephone: 63-2-896-7218 Facsimile: 63-2-897-7732 PORTUGAL Izasa Portugal Lda. A. do Proletariado, 1
2790-138 CARNAXIDE, Portugal
Telephone: 351-21-424-73-00
Facsimile: 351-21-418-60-20
RUSSIA JEOL (RUS) LLC. Krasnoproletarskaya Street, 16, Bid. 2, 127473, Moscow, Russian Federation Telephone: 7-495-748-7791rr792 Facsimile: 7-495-748-7793 SAUDI ARABIA ABDULREHMAN ALGOSAIBI G.T.C. (Riyadh) King Abdulaziz Avenue, P.O. Box 215, Riyadh 11411, Saudi Arabia
Telephone: 966-1-479-3000
Facsimile: 966-1-477-1374
SCANDINAVIA
SWEDEN
JEOL (Skandinaviska)AB
Hammarbacken 6A, Box 716,191 27 Sollentuna
Sweden
Telephone: 46-8-28-2800
Facsimile; 46-8-29-1647
THAILAND
BECTHAI BANGKOK EQUIPMENT & CHEMICAL CO., Ltd.
300 Phaholyothin Rd. Phayathai, Bangkok 10400,
Thailand
Telephone: 66-2-615-2929
Facsimile: 66-2-615-2350/2351
THE NETHERLANDS
JEOL (EUROPE) B.v.
Ureweg 4, NL-2153 PH Nieuw-Vennep,
The Nelherlands
Telephone: 31-252-623500
Facsimile: 31-252-623501
TURKEY
TEKSERAS.
Kayisdagi. )nonu Mah.Kartal Cad. No:55/3
34755 Atasehir / Istanbul, Turkey
Telephone: 90-216-57364 70
Facsimile: 90-216-5736475
UAE
MRS Group Dubai PO.Box: 171612, Rashid Abdulla AI Noami Building Suite No: 306, Damascus Street, AI Qusais-3, Dubai, UAE. Telephone: 971-4-2581141 Facsimile: 971-4-2581151 JEOLGulf POBox: 171612,
•
Rashid Abdulla AI Noami Building Suite No: 306, Damascus Street, AI Qusais-3, Dubai, UAE. Telephone: 971-553964219(mobile) USA
.JEOL USA, INC. 11 Dearborn Road, Peabody, MA 01960, U.SA Telephone: 1-978-535-5900 Facsimile: 1-978-536-2205/2206 JEOL USA, INC. WEST OFFICE ~~s~~~~~,rigAe9~5:,t.~~:'1 10 Telephone: 1-925-737-1740 Facsimile: 1-925-737-1749 VENEZUELA GOMSA Service and Supply CA Urbanizacion Montalban JlI - Resldenclas Don Andres - Piso 7 - Apartomento 74 Avenida 3, entre calles 7 y 6 Montalban, Caracas, Venezuela Telephone: 58-212-443-4342 Facsimile: 58-212-443-4342 VTETNAM TECHNICAL MATERIALS AND RESOURCES IMPORT-EXPORT JOINT STOCK COMPANY(REXCO) Hanoi Branch, No. 13-Lot 12 Trung Yen, Trung Hoa Street, Cau Giay Dist, HanOi, Vietnam Telephone: 84-4-562-0516,17/562-0535 Facsimile: 84-4-853-2511 No. 0205B389C Printed in Japan, Kp