Wire Sample Report

Wire Sample Report
NanoMet Dimensional Analysis, Nanowire Diameter
For:
FullScaleNano
400 Capital Circle, St. 18227
Tallahassee, FL 32301
http://fullscalenano.com
Analysis performed on 2/7/2017 11:10:39 AM
FullScaleNANO, Inc.
400 Capital Circle SE, Suite 18227
Tallahassee, FL 32301
Phone: (888) 980-6266
Email: [email protected]
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Copyright 2016 FullScaleNANO, Inc.
Table of Contents
• Report Overview - 3
• Sample #1 - 1 - 4
• Batch Statistics - 12
• Conclusion - 16
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Copyright 2016 FullScaleNANO, Inc.
Report Overview
Report Description
Description of Analysis
An image of sample batch 02 was received for NanoMet dimensional analysis report generation. This report was
automatically generated with a corresponding raw data spreadsheet containing all measurement information.
Annotated images were created to display the object assignments and measurement locations to correlate each
assignment with corresponding data in the results spreadsheet. The NanoMet algorithms identified and assigned
individual objects, subsequently conducting measurements and outputting results. All data collected is
represented in this report in its entirety. All data has been converted to physical dimensions using NanoMet's
calibration function.
Description of Software
The NanoMet version used to generate this report, 1.0.0 BETA, is a developmental software that has the
functionality to automatically identify and measure objects in an electron microscope image then populate a
correlated database entry and output a final report.Annotated images are automatically produced by NanoMet to
verify and visualize the analysis results.The preprocessing steps and algorithm measurements can be optimized
by threshold parameters to govern the contrast ratio cutoff for conversion of the image to binary format, object
identication according to how much of the object is identied and measurement tolerances. Additional
information containing the measurement location coordinates is recorded in our database and availble for export.
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Copyright 2016 FullScaleNANO, Inc.
Sample #1 - 1
Description: 1
Analysis Date
Original Image Metadata
2/7/2017 4:10:07 PM
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Copyright 2016 FullScaleNANO, Inc.
Object Assignment Annotations
Notes:
Image shows object assignment numbering.
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Copyright 2016 FullScaleNANO, Inc.
Measurement Location Annotations 1
Notes:
Image shows red circles indicating where measurements were taken.
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Copyright 2016 FullScaleNANO, Inc.
Measurement Location Annotations 2 - Heatmap
Notes:
Image shows colored circles coded by diameters.
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Copyright 2016 FullScaleNANO, Inc.
Image Statistics
Wire Tabular Statistics
Minimum
First Quartile
Median
Third Quartile
Maximum
Mean
Std. Deviation
Skewness
Kurtosis
Wire Statistics [nm]
168.46
209.25
255.56
305.79
400.00
259.88
59.15
0.56
-0.06
Number of Measurements
23
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Wire Histogram
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Aggregate Tabular Statistics
Measurement Statistics [nm]
Minimum
106.67
First Quartile
186.67
Median
240.00
Third Quartile
346.67
Maximum
640.00
Mean
269.45
Std. Deviation
97.59
Skewness
0.88
Kurtosis
0.74
Number of Measurements
929
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Aggregate Histogram
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Copyright 2016 FullScaleNANO, Inc.
Batch Statistics
This section of the report will show the processed statistics aggregated for the entire batch.
Wire Tabular Statistics
Batch Statistics [nm]
Minimum
168.46
First Quartile
209.25
Median
255.56
Third Quartile
305.79
Maximum
400.00
Mean
259.88
Std. Deviation
59.15
Skewness
0.56
Kurtosis
-0.06
Number of Measurements
23
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Copyright 2016 FullScaleNANO, Inc.
Wire Histogram
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Copyright 2016 FullScaleNANO, Inc.
Aggregate Tabular Statistics
Batch Statistics [nm]
Minimum
106.67
First Quartile
186.67
Median
240.00
Third Quartile
346.67
Maximum
640.00
Mean
269.45
Std. Deviation
97.59
Skewness
0.88
Kurtosis
0.74
Number of Measurements
929
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Copyright 2016 FullScaleNANO, Inc.
Aggregate Histogram
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Copyright 2016 FullScaleNANO, Inc.
Conclusion
Statistical calculations for batch 02 were obtained from 23 measurements conducted on features identified in 1
image(s). The results for the batch were a median feature size of 255.56 nm, average feature size of 259.88 nm
with standard deviation of 59.15 nm, a maximum of 400.00 nm, a minimum of 168.46 nm.
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Copyright 2016 FullScaleNANO, Inc.