Standard Silicon Nitride Probes
The silicon nitride probes consist of a cantilever integrated with
a sharp tip on the end. The properties and dimensions of the
cantilever play an important role in determining the sensitivity
and resolution of the AFM. For contact mode AFM imaging, it is
necessary to have a cantilever which is soft enough to be deflected
by very small forces (i.e. small force constant) and has a high
enough resonant frequency to not be susceptible to vibrational
instabilities. This is accomplished by making the cantilever short,
to provide a high resonant frequency, and thin, to provide a small
force constant.
Each probe comes in two cantilever lengths and two widths
(usually referred to as thick-legged and thin-legged) attached to
a single substrate. This means there are four different cantilever
geometries, resulting in four possible force (or spring) constants.
Specifications
Force (or Spring) Constants
0.58, 0.32, 0.12, 0.06 N/m*
Nominal Tip Radius of Curvature
20 - 60nm
Cantilever Lengths
100 & 200µm
Cantilever Configuration
V-shaped
Reflective Coating
Gold
Shape of Tip
Square Pyramidal
Tip Half Angle
35°
Parts List
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* Calculated spring constant values are based on the 0.6µm silicon nitride thickness; however, this value
can actually vary from 0.4µm to 0.7µm. Thickness is cubed in the spring constant calculation, thus,
actual values can vary substantially.
Find out more by calling 1.800.776.1602
or visiting www.veecoprobes.com today.
© 2002 Veeco Instruments Inc., all rights reserved. Veeco is a trademark of Veeco Instruments Inc.
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Model NP (1wafer with 500+ probes)
Model NP-20 (1 strip with 20 probes)
Model NP-020 (20 probes for cantilevers without tips)
Model NP-OW (500 tipless probes on one wafer)
Model DNP (1 wafer with 500+ probes)
DNP-20 (1 strip with 20 probes).