Materials Imaging and Dynamics (MID) Instrument
at the European X-ray Free-Electron Laser
[email protected]
Information Day for European XFEL Users' Consortia
April 18, 2011
Coherence in the XFEL TDR
X-ray Holography
Diffraction imaging of nanostructures
Need for time resolution: Metallic grain structures
XPCS with an
XFEL source
XFEL Technical Design Report: www.xfel.eu
Info Day XFEL User Consortia − 18 April 2011 − A. Madsen, European XFEL, Hamburg
The World’s Most Brilliant X-ray Source
Motivation:
Most time resolved X-ray studies are limited by the Brilliance of the sources
Coherent X-ray scattering exp. are limited by the Brilliance of the source
For a SR X-ray source the coherent flux scales like E-2
At XFEL:
The average Brilliance is up by 104 – 105 compared to ESRF
The peak brilliance is another factor of x108 higher!
There’s a large coherent flux up to 25 keV (and beyond on 3rd harm)
Info Day XFEL User Consortia − 18 April 2011 − A. Madsen, European XFEL, Hamburg
Coherence properties of the XFEL
Synchrotron Undulator Radiation:
transverse coherence length
Coherent fraction:
IC
λ2
=
I (4π )2 ε x ε z
(10-4 – 10-3)
XFEL
Coherent fraction >0.9
at 10 keV for ALL bunch charges
Coherent fraction ~0.7
at 25 keV for 250 pC bunch charge
Schneidmiller and Yurkov
Info Day XFEL User Consortia − 18 April 2011 − A. Madsen, European XFEL, Hamburg
Coherence properties of the XFEL
Synchrotron Undulator Radiation:
longitudinal coherence length
λ
2( ∆λ / λ )
Coherence time:
τ0 = 1/(2∆ν)
∆ν) = λ2/(2c∆λ
∆λ)
∆λ
(few nm,
mono needed)
XFEL
Entrance
Exit (saturation)
Not well defined coherence time not well defined long. coh. length
Info Day XFEL User Consortia − 18 April 2011 − A. Madsen, European XFEL, Hamburg
Coherence properties of the XFEL
Some experiments (but not all) require defining the longitudinal coherence better
• Monochromator (like at synchrotrons: C, Si, down to ∆E/E ~1e-5)
• Laser seeding
• Self-seeding
Single crystal scheme: In the 250 pC case 1e-5 BW can be reached (simulations)
G. Geloni, V. Kocharyan, E. Saldin
Info Day XFEL User Consortia − 18 April 2011 − A. Madsen, European XFEL, Hamburg
MID Science case and Techniques
M
I
D
Materials Science. Hard X-ray Diffraction
Imaging (traditional) and Coherent Diffraction Imaging
Dynamics: XPCS and Time-resolved Studies
Science case: Structure and Dynamics of Materials. From atomic (WAXS) to mesoscopic scales (SAXS, Imaging), from femto- to milli-seconds, from liquids to metals.
Surfaces/Interfaces, Critical scattering, Glasses, Magneto-dynamics, Phonons,…
Techniques: X-ray Photon Correlation Spectroscopy(XPCS), Coherent X-ray Diffraction
Imaging (CXDI), Holography, Ptychography, Spatial (angluar) Cross-Correlations and
Time-Resolved SAXS/Diffraction/Imaging
Info Day XFEL User Consortia − 18 April 2011 − A. Madsen, European XFEL, Hamburg
MID Workshop
ESRF, Grenoble. October 28-29, 2009
The Materials Imaging and Dynamics (MID) instrument aims at the investigation
of nano-sized structure and nanoscale dynamics using coherent radiation.
Applications to a wide range of materials from hard- to soft condensed matter
and biological structures are envisaged
Working Group Report: http://www.xfel.eu/sites/site_xfel-gmbh/content/e63594/e63599/
e81232/e64013/e92121/MID-XPCS_Report_230610_eng.pdf
Info Day XFEL User Consortia − 18 April 2011 − A. Madsen, European XFEL, Hamburg
The XFEL facility is taking shape
The underground experimental area indicating the 6 phase-one instruments
(SQS, SCS, SPB, FXE, MID and HED)
Info Day XFEL User Consortia − 18 April 2011 − A. Madsen, European XFEL, Hamburg
Beamline Layout (SASE-2)
Photon beam transport and optics group (H. Sinn)
SASE-2
undulator
3-25 keV
(1st harm.)
experimental
area
offset mirror
1.1 - 3.6 mrad
distribution
mirror 1.3 mrad
HED
MID
lenses
High E offsetmono C(111)
0m
230 m
?
heavy duty
beamstop
320 m 390 m
940 m
Space for beam diagnostics (intensity, timing, coherence,…)
Space for specific optics (focusing, monochromator, delay line,..)
Info Day XFEL User Consortia − 18 April 2011 − A. Madsen, European XFEL, Hamburg
MID Conceptual Design Parameters
Main features
• Energy range 5 – 25 keV (3-5 keV & >25 keV option)
• Pre- and high-res monochromators; possibility for “pink beam” operation
• Focusing by refractive Beryllium lenses, beam size 1 – 100 µm
• 4.5 MHz AGIPD detector; slower 2D detector with high spatial resolution
• Versatile time-resolved SAXS/WAXS setup allowing XPCS & coherent scattering
• Window-less design and multi-purpose sample chamber
• Possibility for users to bring in sample chambers and equipment
Info Day XFEL User Consortia − 18 April 2011 − A. Madsen, European XFEL, Hamburg
Diffract’n Survive Experiments
FLASH experiments: A. Mancuso et al., New J. Phys. 12, 035003 (2010)
integrated
single pulse
Sample: unicellular algae
(Navicula perminuta)
10 fs pulses, λ=8 nm
~1e10 ph/pulse
Integrated vs. single-shot
reconstructions
optical
Comparison
Gabor,
FTH
Info Day XFEL User Consortia − 18 April 2011 − A. Madsen, European XFEL, Hamburg
Diffract’n Survive Experiments
Co/Pt multilayer, λ=20.8 nm (Co M2,3 edge)
Resonant magnetic scattering
single XFEL pulses (30 fs) at FLASH
Non-destructive and
non-perturbative below threshold
C. Gutt et al, PRB 81, 100401(R) (2010)
Info Day XFEL User Consortia − 18 April 2011 − A. Madsen, European XFEL, Hamburg
Bio-CXDI on cells
Single-shot simulation results
8
10with
photons
hitting
sample
(10the
K) sample
ph/pixel
total of 1e7
photons
hitting
-300
Cell model
pixel number
-200
3 µm
E=5 keV
200 µm pixels
Sample – detector : 10 m
80
-100
60
0
40
100
20
200
300
-300 -200 -100
0
100
pixel number
200
300
Info Day XFEL User Consortia − 18 April 2011 − A. Madsen, European XFEL, Hamburg
Bio-CXDI on cells
Single-shot simulation results
8
photons
hitting
sample
(10the
K)sample
ph/pixel10with
total of 1e7
photons
hitting
-300
Cell model
pixel number
-200
3 µm
E=5 keV
200 µm pixels
Sample – detector : 10 m
4
-100
3
0
2
100
1
200
300
-300 -200 -100
0
100
pixel number
200
300
Info Day XFEL User Consortia − 18 April 2011 − A. Madsen, European XFEL, Hamburg
Bio-CXDI on cells
Single-shot simulation results
8
hitting
sample
(10theK)sample
ph/pixel10
withphotons
total of 1e7
photons
hitting
100
pixel number
Cell model
3 µm
Over-sampling
Speckle contrast ~90%
120
4
140
3
160
2
180
1
200
-200
-180
-160 -140
pixel number
-120
-100
Info Day XFEL User Consortia − 18 April 2011 − A. Madsen, European XFEL, Hamburg
Coherent X-Ray Diffraction Imaging
CXDI in Bragg scattering geometry
First demonstration: I. K. Robinson, I. Vartanyants, G. J. Williams, M. A. Pfeifer, J. A. Pitney
Phys. Rev. Lett. 87, 195505 (2001)
1µm Au crystal
(111) Reflection
Data taken at APS, λ=1.65Å
Q
Q⋅⋅R matters
The MID instrument will allow unmatched
small-angle and Bragg CXDI (non-destructive mode)
Sweep through the crystal by
changing Q (rocking scan)
3D information accessible
Info Day XFEL User Consortia − 18 April 2011 − A. Madsen, European XFEL, Hamburg
X-Ray Photon Correlation Spectroscopy
one pixel
I
g (t ) =
(2)
τ
I (τ ) I (τ + t )
I
2
∝ | f (Q, t ) / f (Q,0) |2 +1
Average over ensemble (pixels)
and/or over time
g(2)(t)
Q
Speckle contrast (%)
100
80
60
40
20
0
0
10
Delay τ
t
Info Day XFEL User Consortia − 18 April 2011 − A. Madsen, European XFEL, Hamburg
20
30
XPCS at the European XFEL
time structure of XFEL
Burst
mode
600 µs
0.1 s
2700 pulses (1-100 fs FWHM)
220 ns spacing
t
AGIPD detector
4.5 MHz, 200-500 images stored
Readout between pulse trains
1M pixels, 200 µm pixel size
(U. Bonn, U. Hamburg, PSI & DESY)
Info Day XFEL User Consortia − 18 April 2011 − A. Madsen, European XFEL, Hamburg
Burst-mode XPCS
Simulation of dynamics in a phase-ordering binary alloy
Speckle on super-structure peak (Q = 1 Å-1)
4
3
Few 1000s ph/frame
Speckle contrast ~5%
2
1
20 µm thick foil, 108 ph/pulse (1 K), ∆λ/λ = 10-5, 25 µm beamsize, 8 keV
1M pixels, 200 µm size, 10 m sample – detector distance
Info Day XFEL User Consortia − 18 April 2011 − A. Madsen, European XFEL, Hamburg
XPCS at the European XFEL
Faster than 220 ns in time-resolved scattering and XPCS ?
Possible by split-delay or by custom mode operation of the linac
Bragg crystals:
Split-delay line (Grübel group, DESY)
Grazing incidence mirrors:
Split-delay line, FLASH style auto-correlator
(Zacharias group, Uni. Münster)
Info Day XFEL User Consortia − 18 April 2011 − A. Madsen, European XFEL, Hamburg
SASE-2 Experimental Area
(~940 - 980 m)
TOP VIEW
HED CTRL
MID EXP
HED EXP
HED ELEC
COMMON
LASER LAB
MID
CTRL
COMMON
LAB
MID ELEC
10 m
Info Day XFEL User Consortia − 18 April 2011 − A. Madsen, European XFEL, Hamburg
MID Experimental Hutch
(~953 – 968 m)
TOP VIEW
SASE-2
LASER
Info Day XFEL User Consortia − 18 April 2011 − A. Madsen, European XFEL, Hamburg
MID Multi-Purpose (MMP)
SAXS - WAXS chamber
(~957 m in MID exp. hutch)
SIDE VIEW
10-4 – 10-6 mbar
Full goniometer
Sub-micron prec.
Video microscope
Fluorescence det.
I_0 monitor
Alignment tools
Heating/cooling
Electrical connectors
Optical connectors
Fluid connectors
Gas connectors
Laser
Height adjustment
Movable (on rails)
Info Day XFEL User Consortia − 18 April 2011 − A. Madsen, European XFEL, Hamburg
Other Possible Chambers/End-stations
A few ideas…..
• Materials science chamber e.g. for polycrystalline high E diffraction
• Grazing incidence – Liquid reflectivity chamber
• Bio-imaging chamber for frozen-hydrated samples
• In-situ catalysis studies
• Magnetic scattering, High-fields
• He-cryostat sample environment
• Nano-precision scanning setup
• Setup for ultrafast tomography – phase contrast imaging
• Liquid flow/stop-flow/mixing/microfluidics sample environment
•
•
•
Info Day XFEL User Consortia − 18 April 2011 − A. Madsen, European XFEL, Hamburg
THANK YOU
The floor is open for questions and discussion