Central European Institute of Technology
BRNO | CZECH REPUBLIC
Scanning Near-Field Optical Microscope (NSOM, SNOM)
Instrument description
SNOM is a microscopic tool, which breaks the far-field light resolution limit by mapping the near-field light (evanescent waves) distribution of nanostructures. In order to achieve this, there is a very sharp optical probe (detectors/illuminators), which has an aperture of tens
of nanometers. This scans the sample surface at a distance much smaller than the wavelengths of the light interacting with it. The optical
resolution and structure size resolution is limited by the probe size, not by the wavelength of the incidental light (resolution ~100 nm).
This technique provides for the capabilities of the basic experimental setup – illumination by a SNOM probe set to collect interacting
light in reflection or transmission; to illuminate a sample in transmission or reflection and collection the interacting light via a SNOM
probe.
Instrument: Nanonics MultiView 4000
multi-probe independent Scanning Probe Microscope (SPM) fully integrated
with upright and inverted optical microscope
Features:
• SPM techniques - SNOM, Atomic Force
Microscopy (AFM), conductive AFM,
Scanning Tunneling Microscopy (STM)
• two-independent probe scanning
system, sample scanning
• combined SNOM collection, illumination
with reflection and transmission modes
• probes - bent optical fibres on
tuning fork according to applications
• liquid cell
• optical and acoustic hoods
Application
Hexacomb structure
72.68 nm
21.64 nm
12
12
12
10
10
10
8
[µm]
14
8
8
6
6
6
4
4
4
2
2
2
0
0
0
2
4
6
8
[µm]
10
12
14
0.00 nm
0
2
4
6
8 10
[µm]
12
14
0
0.00 nm
0
collection transmission
14
12
12
10
10
10
[µm]
14
12
8
8
6
6
4
4
4
2
2
2
0
0
2
4
6
8 10
[µm]
12
14
interaction of near-field
illumination with nanometer
scale structure
4
6
8 10
[µm]
12
14
8
6
0
2
collection reflection
14
[µm]
[µm]
44.41 nm
14
illumination reflection
SNOM images
Square of three slits structures
14
[µm]
[µm]
Topography images
Lithographic structure
0
0
2
4
6
8 10
[µm]
12
14
binary sample - transparent
(centers) opaque (corners)
features
0
2
4
6
8
[µm]
10
12
14
four-way evanescent
waves interaction
0.00 nm
Technical specification
SNOM modes:
illumination transmission/reflection
collection transmission/reflection
detectors
s
or
ct
te
de
in con
pu fo
t/o ca
ut l
pu
t
AFM non-contact mode
AFM conductive
STM
lase
inp r fiber
ut
er
r fib
lase ut
p
in
Lasers:
fiber coupler + bandpass filters
Nd:YAG λ = 532 nm - green,
power 20 mW, PGL-020-11-A
HeNe λ = 632.8 nm - red,
power 10 mW, JDSU 1135/P
Detectors:
Avalanche PhotoDiode (APD)
- SPCM-AQR-14 Perkin Elmer
- λ∈<400, 1100> nm
- photoncounting mode
PhotoMultiplier Tube (PMT)
- MP942 Perkin Elmer
- λ∈<165, 650> nm
- photoncounting mode
eye-p
iec
came e,
ra
er
r fib
lase ut
inp
detectors
reflection
path
upright optical
microscope
tuning fork
xyz micromanipulator
tuning fork
xyz scanner 1
xyz micromanipulator
xyz scanner 2
bent optical fiber
bent optical fiber
TOWER 1
TOWER 2
xyz sample
scanner
inverted optical
microscope
Manipulators:
xyz scanner 1:
xyz scanner 2:
xyz sample scanner:
xyz micromanipulators:
40 μm x 40 μm x 30 μm
40 μm x 40 μm x 30 μm
80 μm x 80 μm x 30 μm
5 mm x 5 mm x 10 mm
transmission
path
de
te
c
to
r
s
eye-p
iec
came e,
ra
fiber
laser t
p
in u
in con
pu fo
t/o ca
ut l
pu
t
Optical microscopes:
upright - Olympus BXFM
inverted - Olympus BXFM
objectives - 50x NA 0.45, 10x
confocal input/output module - pinhole 50 μm
Attenuated Total Reflection module
outgoing light
incoming light
fiber probes optimized for selected measurement
Contact
Core Facility: Nanofabrication and Nanocharacterization
Section: Probe Microscopy & Nanomanipulation
Contact person: David Škoda
[email protected]
Detailed information: www.ceitec.eu
Instrument location:
Masaryk University
Faculty of Science
Department of Condensed Matter Physics
Kotlářská 267/2, 611 37 Brno
Czech Republic
www.ceitec.eu